This application relates to electrical connectors, and more particularly to an electrical probe assembly.
An electrical probe may be used to form an electrical connection between two components. Various types of electrical probes are known. For example, probes can be used to facilitate data transmission (e.g. USB cable), or to facilitate sound transmission (e.g. headphone jack).
An example electrical probe assembly includes a flexible circuit. A plurality of electrically conductive regions is on a first side of the flexible circuit. The flexible circuit is arranged about an axis formed by rolling the flexible circuit such that the electrically conductive regions form a plurality of isolated electrically conductive bands.
In another aspect, an example electrical probe assembly includes an axial support member and a flexible circuit. A first layer of the flexible circuit is non-conductive. A second layer of the flexible circuit is conductive and covers portions of the first layer to form a plurality of electrically conductive regions. A third layer of the flexible circuit is non-conductive and covers portions of the portions of the electrically conductive regions to form a plurality of defined contact points. The flexible circuit is arranged around the axial support member to conceal an axially extending portion of each of the plurality of electrically conductive regions, and to expose the plurality of defined contact points around an outer periphery of the electrical probe assembly.
An example method of forming an electrical probe assembly includes forming a plurality of conductive regions on a first side of flexible circuit, coupling a lead wire to each of the plurality of conductive regions via an electrical connection, and arranging the flexible circuit around an axial support member to form a plurality of isolated electrically conductive bands, each electrically conductive band corresponding to a portion of one of the plurality of conductive regions.
These and other features of the present invention can be best understood from the following specification and drawings, the following of which is a brief description.
a schematically illustrates a first example electrical probe assembly.
b schematically illustrates a second example electrical probe assembly.
c schematically illustrates a third example electrical probe assembly.
d schematically illustrates a fourth example electrical probe assembly.
e schematically illustrates a fifth example electrical probe assembly.
f schematically illustrates a sixth example electrical probe assembly.
g schematically illustrates a seventh example electrical probe assembly.
a schematically illustrates a flexible circuit configuration prior to being arranged around the axial support member of
b schematically illustrates a flexible circuit configuration prior to being arranged around the axial support member of
c schematically illustrates a flexible circuit configuration prior to being arranged around the axial support member of
d schematically illustrates a flexible circuit configuration prior to being arranged around the axial support member of
d′ schematically illustrates a close-up view of the configuration of
a schematically illustrates the electrical probe assembly of
a illustrates an example electrical probe assembly 10a. For example, an aircraft engine may have an associated ice protection system that includes two separate heaters embedded within its structure, each requiring a power line in and a power line out. Thus, four six distinct electrical connections are required in a small area. The assembly 10a may be used to provide such a connection. However, as will be described below, the electrical probe assembly 10a has a broad range of other applications.
a-g schematically illustrate exemplary electrical probe assemblies 10a-g. Each of the electrical probe assemblies 10a-g includes a plurality of conductive bands 12. Each conductive band 12 extends around an outer periphery of its associated electrical probe assembly 10, and is electrically connected to a lead wire 14. Using the electrical probe assembly 10a as an example, conductive band 12a is connected to lead wire 14a, conductive band 12b is connected to lead wire 14b, conductive band 12c is connected to lead wire 14c, and conductive band 12d is connected to lead wire 14d. The electrical probe assemblies 10b-f are likewise arranged. The electrical probe assembly 10a may be received into an opening 19, which includes electrical contacts 23. Likewise, the electrical probe assemblies 10b-e of
Each electrical probe assembly 10a-g includes an axial support member 20 that extends along the respective interior. In one example the support member 20 is a dowel that may be made of rubber, metal, or another suitable material. Of course, other axial support members could be used. In the assemblies 10a and 10d-e the axial support members 20a, 20d-e are cylindrically shaped and include a circular cross-section. In the assembly 10b, the axial support member 10b has a triangular cross-section. In the assemblies 10c, 10f and 10g, the axial support members 20c, 20f and 20g have a polygonal cross section. However, axial support members 20 having other cross-section shapes could be used.
In the assembly 10f, the shape of the support member 20f is keyed such that the electrical probe assembly 10f must be inserted into a corresponding opening 19′ in a predetermined orientation for a “mistake proof” installation into. If the electrical probe assembly 10f was rotated 90° about the axial support member 20f, for example, it would not fit in the opening 19′. Thus, the electrical probe assembly 10f aligns with the opening 19′, and the probe assembly 10f and the opening 19′ can mate in only one orientation but not in others. As an example, the axial support member 20f may be designed to have linear sides with one side 28 being longer than another side 29. Of course, other shapes could be used to achieve the same function.
Also, in the assembly 10f, portions 17 of each of the conductive bands 12a-d are concealed with a non-conductive layer to expose defined conductive regions 13a-d which act as defined contact points. Similarly, in the assembly 10g, portions 17 of each of the conductive bands 12 are concealed with a non-conductive layer to expose defined conductive regions 13′ which act as defined contact points. However, in the assembly 10g the defined conductive regions 13′ are spaced axially by a distance “x” along the axial support member 20g.
a-d schematically illustrate a plurality of configurations for flexible circuit 22 that may be arranged around (e.g., wrapped around) one of the axial support members 22a-f to form one of the electrical probe assemblies 10a-f.
An adhesive 24 is applied to a second side of the flexible circuit 22a to bond the flexible circuit 22a to the axial support member 20a (see, e.g.
Each of the conductive regions 16 includes a conductive band portion 12 and a portion 15. The portion 15 extends in a first direction, axially along the support member (see
As shown in
b schematically illustrates a second flexible circuit 22b having a different configuration from that of film 22a. The film 22b includes conductive band portions 12a-d of uniform length such that when the film 22b is wrapped around support member 20, each conductive band 12a-d is formed within a band region 26a-d (see
c schematically illustrates another configuration of a flexible circuit 22c, which may be used to form the electrical probe assembly 10e. As shown in
d schematically illustrates another configuration of a flexible circuit 22d, which may be used to form the electrical probe assembly 10g. As shown in
d′ illustrates a close-up view of the configuration of
In a subsequent stage of manufacture, an overmold 40 may be used to provide retention and handling features for the electrical probe assembly 10.
In a modified example, the overmold 40′ retains two electrical probe assemblies 10. This dual configuration could be useful, for example, in a 7.1 channel surround sound configuration that requires 7 separate speaker connections. The dual probe configuration could include 4 connections on a first probe and 3 connections on a second probe.
The electrical probe assembly 10 has many potential applications, such as aviation electronics, commercial electronics, etc., but is not limited to any particular use. Printed circuit boards, for example, are used in many electronics applications, including computers.
Although embodiments of this invention have been disclosed, a worker of ordinary skill in this art would recognize that certain modifications would come within the scope of this invention. For that reason, the following claims should be studied to determine the true scope and content of this invention.
This invention was in part produced through funding under a U.S. Government sponsored program (Contract No. N00019-02-C-3003) and the United States Government has certain rights therein.
Number | Name | Date | Kind |
---|---|---|---|
2736784 | Gore | Feb 1956 | A |
3333846 | Glass et al. | Aug 1967 | A |
3806801 | Bove | Apr 1974 | A |
3825874 | Peverill | Jul 1974 | A |
D242991 | McKenzie et al. | Jan 1977 | S |
4688878 | Cohen et al. | Aug 1987 | A |
4802092 | Harte | Jan 1989 | A |
4802869 | Maue | Feb 1989 | A |
5207005 | Amos et al. | May 1993 | A |
5479182 | Sydor | Dec 1995 | A |
5994695 | Young | Nov 1999 | A |
6369383 | Cornish et al. | Apr 2002 | B1 |
7110762 | Cameron et al. | Sep 2006 | B1 |
7155812 | Peterson et al. | Jan 2007 | B1 |
7253787 | Liu et al. | Aug 2007 | B2 |
7368907 | Raulerson et al. | May 2008 | B2 |
7411563 | Liu et al. | Aug 2008 | B2 |
20020060289 | Cornish et al. | May 2002 | A1 |
20040039497 | Wood et al. | Feb 2004 | A1 |
20070262915 | Liu et al. | Nov 2007 | A1 |
20090079531 | Zach et al. | Mar 2009 | A1 |
20090084975 | Zach et al. | Apr 2009 | A1 |
Number | Date | Country | |
---|---|---|---|
20110047789 A1 | Mar 2011 | US |