This invention relates to isolation technology and more particularly to providing power across an isolation barrier.
Unintentional emissions or incidental emissions from devices can interfere with operations of other electronics devices. Regional authorities issue technical standards regulating how much electromagnetic leakage is tolerable. For example, the Federal Communications Commission of the United States issued Title 47 Code of Federal Regulations Part 15, which includes regulations for unintentional emissions or incidental emissions of electronics devices advertised or sold in the United States. The International Special Committee on Radio Interference (Comitë International Spécial des Perturbations Radioëlectriques (CISPR)) implements similar international regulations. An isolated power transfer system that unintentionally radiates energy must satisfy the regulations applicable in a target market. Accordingly, techniques for controlling electronic emissions from an isolated power transfer product are desired.
In at least one embodiment of the invention, a power transfer device includes an oscillator circuit of a DC/AC power converter responsive to an input DC signal and an oscillator enable signal to generate an AC signal. The oscillator circuit includes a first node, a second node, and a circuit coupled between the first node and the second node. The circuit includes a cross-coupled pair of devices. The oscillator circuit further includes a variable capacitor coupled between the first node and the second node. A capacitance of the variable capacitor is based on a digital control signal. A first frequency of a pseudo-differential signal on the first node and the second node is based on the capacitance. The power transfer device further includes a control circuit configured to periodically update the digital control signal. A second frequency of periodic updates to the digital control signal is different from the first frequency. The control circuit may be configured to generate the oscillator enable signal based on a feedback signal received across an isolation barrier. The oscillator enable signal may regulate an output DC signal of the power transfer device. The control circuit may be configured to generate the digital control signal based on the feedback signal. The control circuit may include a second oscillator circuit configured to generate a clock signal oscillating asynchronously to the pseudo-differential signal. The digital control signal may be generated based on the clock signal.
In at least one embodiment of the invention, a method for controlling electromagnetic radiation of a power transfer device includes converting an input DC signal into a first AC signal. The converting includes biasing an oscillator circuit with the input DC signal. The converting includes selectively enabling the oscillator circuit according to the oscillator enable signal to generate the first AC signal having a first frequency. The converting includes periodically updating a capacitance of the oscillator circuit using a digital control signal. The first frequency is different from a second frequency of periodic updates to the digital control signal. The method may include generating the digital control signal based on a feedback signal received across an isolation barrier. The method may include generating a pseudorandom digital signal and generating the digital control signal based on the pseudorandom digital signal.
In at least one embodiment of the invention, a method for controlling electromagnetic radiation of a power transfer device includes varying a first frequency of power transfer across an isolation barrier. The varying is based on a digital control signal. The method includes updating the digital control signal at a second frequency. The second frequency is different from the first frequency. The power transfer may be controlled based on a feedback signal received across the isolation barrier and the digital control signal may vary pseudo-randomly.
The present invention may be better understood, and its numerous objects, features, and advantages made apparent to those skilled in the art by referencing the accompanying drawings.
The use of the same reference symbols in different drawings indicates similar or identical items.
Referring to
In at least one embodiment, transformer 209 is an air core transformer with a 1:N turns ratio, where N can be approximately one. Referring to
Exemplary EMI standards require radiated emissions to be controlled between 30 MHz and 1000 MHz. For example, in an exemplary application, the isolated power transfer system of
Radiation of power transfer device 200 at both 65 MHz and 130 MHz (second harmonic) must have levels that fall within the applicable specifications (e.g., levels below 30 dBuV/m at 3 m observation and levels below 33.5 dBuV/m at 3 m observation, respectively). Assuming that, in operation, power transfer device 200 radiates fields that are far fields at the point of observation, as distance increases, the radiation field decreases linearly. To cancel far-field electromagnetic radiation, transformer 209 includes magnetically differential loops having current flowing in opposite directions. In addition, an external capacitor coupled between terminal 301 of transformer 209 of
A circuit design technique that reduces electromagnetic radiation of power transfer device as compared to power transfer device 200 of
If the rate of change to the frequency of the injected current (e.g., the frequency of updates to the digital control signal CAP_CTRL) occur at a frequency near the frequency of the injected current, the frequency changes will reduce circuit efficiency (i.e., reduce the power available to the load at the output of rectifier 440, as compared to the total electrical power consumed by the primary side of the transformer). However, the frequency of the injected current should be changed fast enough to prevent oscillator core 402 from generating a current that spends long periods oscillating at the same frequency. Accordingly, a suitable rate for updating the capacitance (i.e., a rate that changes frequently enough to reduce energy in any one frequency band of interest, but not too frequently to reduce efficiency) may be determined experimentally (e.g., a rate of 4 MHz to 6 MHz, which corresponds to an update period of approximately 167 ns to 250 ns).
In at least one embodiment, power transfer device 400 generates digital control signal CAP_CTRL using a divided clock signal (e.g., a 6.25 MHz clock signal) provided by oscillator 436 (e.g., 25 MHz oscillator) and frequency divider 424 (e.g., divide-by-four or divide-by-two). Modulator 426 generates a multi-bit signal (e.g., a triangularly-modulated digital signal) based on the frequency-divided clock signal. Level shifter 428 converts the multi-bit signal and control signal FEEDBACK to digital control signal CAP_CTRL and control signal ENABLE, respectively, having an appropriate signal levels. Digital control signal CAP_CTRL updates variable capacitor 438 at the rate of the divided clock signal with values according to the triangularly-modulated digital signal. As a result, the capacitance of oscillator core 402 varies between a high capacitance level CH and a low capacitance level CL, as illustrated in
Rather than using a fixed rate of update to variable capacitor 438 of oscillator core 402, in at least one embodiment, the feedback signal that controls enabling and disabling oscillator circuit 402 to regulate the output voltage has an appropriate frequency range (e.g., 2 MHz) for varying the capacitance of oscillator core 402. Accordingly, control circuit 401 updates the capacitance of oscillator core 402 by generating digital control signal CAP_CTRL based on control signal FEEDBACK, which is based on a feedback signal received across the isolation barrier. Using this technique to generate digital control signal CAP_CTRL, each time control signal FEEDBACK enables oscillator core 402, oscillator core 402 uses a different value of digital control signal CAP_CTRL (i.e., increases or decreases digital control signal CAP_CTRL), thereby injecting a current having a different frequency each time oscillator core 402 is enabled. However, similarly to the technique that triangularly modulates a divided clock signal, electromagnetic radiation may exhibit side peaks in the energy distribution. In addition, since the frequency of the feedback signal dependent upon the load condition, the reduction in electromagnetic interference depends upon the load condition, which may be undesirable in some applications.
A technique that reduces the side peaks in the energy distribution randomizes the change to the frequency of oscillation using linear-feedback shift register 430 (e.g., a 6-bit linear-feedback shift register) to provide a pseudo-random value for digital control signal CAP_CTRL. Control circuit 401 updates digital control signal CAP_CTRL using a pseudo-random value that is updated using control signal FEEDBACK and is repeated only after a predetermined number of updates, which is based on the width of the linear-feedback shift register. Pseudo-randomly changing the capacitance of oscillator core 402 achieves a flatter energy distribution, as illustrated in
In at least one embodiment, control circuit 401 monitors the load conditions based on the frequency of control signal FEEDBACK and causes select circuit 432 to select between control signal FEEDBACK and the divided clock signal to improve efficiency under some circumstances. Using the divided clock signal only for loads where control signal FEEDBACK has a frequency close to the frequency of oscillator core 402 actually increases efficiency in some applications although generation of the divided clock signal consumes power. The load condition presented to rectifier 400 determines the frequency of control signal FEEDBACK. A load drawing a relatively high current from the rectifier (e.g., a 50 Ohm load coupled to the output of the rectifier), near the upper limit of the power converter may reduce the frequency of control signal FEEDBACK as compared to loads drawing a moderate amount of current (e.g., 100 Ohm-500 Ohm loads). Accordingly, selection of the frequency of the update rate for changing the variable capacitor is a tradeoff between an update rate frequency that is sufficiently spaced from the frequency of oscillator core 402 and an update rate frequency that is high enough to reduce electromagnetic interference. An exemplary range for the update rate is hundreds of kilo-Hertz to tens of Mega-Hertz. Note that since oscillator core 402 is being used in a power transfer application that does not require strict clock edge integrity, the frequency of oscillator core 402 may be modulated as much as +/−10%, unlike a modulated clock application that requires strict clock edge integrity. In other embodiments, control circuit 401 does not include select circuit 432 and only the divided clock signal or the control signal FEEDBACK is used.
In at least one embodiment, the primary-side power converter stage formed by conductive coil 206 and oscillator core 402 operates as a high-efficiency Class-D power amplifier. Class-D operation may cause the pseudo-differential signal on nodes TX+ and TX− to have peak voltage levels (e.g., 15 V) up to, or slightly greater than, 3.2×VDD1. Such voltage levels are not tolerated by conventional CMOS devices (e.g., conventional CMOS transistors operate up to 1.2×VDD1). A conventional oscillator circuit that includes a latch circuit formed from conventional n-type transistors is inadequate to support the high gate-to-source voltage levels and drain-to-source voltage levels of the target specifications for the primary-side power converter stage.
In at least one embodiment, oscillator core 402 includes a latch circuit formed by latch transistor 408 and latch transistor 410, which are n-type transistors cross-coupled to each other and coupled to cascode transistor 404 and cascode transistor 406, which are also n-type transistors. Latch transistor 408 and latch transistor 410 are on the primary side (e.g., low voltage side) of the power transfer device and are configured to pump energy into the LC tank circuit including oscillator core 402 at a frequency that is determined by the passive system elements. Conductive coil 206 (i.e., the primary-side winding of transformer 209) can experience voltages as high as 3×VDD1 due to the Class-D mode operation (e.g., the pseudo-differential signal on nodes VHa and VHb having voltage levels in a range between 2.6×VDD1 and 3.2×VDD1) of oscillator core 402. Oscillator core 402 is selectively enabled via cascode transistor 404 and cascode transistor 406, which can cut off the current path to transformer 209. The Class-D operation of oscillator core 402 reduces transition times between the on (i.e., conducting) portion of oscillator core 402 and the off (i.e., non-conducting) portion of oscillator core 402, which realizes near-instant or near-zero voltage switching in the primary-side power converter stage, thereby increasing efficiency by limiting the time duration in which both n-type transistors consume power, and reducing or eliminating overshoots or undesired transients in the delivery of energy to the secondary-side power converter stage.
In at least one embodiment of oscillator core 402, cascode transistor 404 and cascode transistor 406 are laterally-diffused drain metal oxide semiconductor (LDMOS) transistors engineered for a high breakdown voltage. An exemplary LDMOS transistor can sustain high drain-to-source voltages (e.g., tens of Volts) while having low equivalent on-resistances (Rdson) in response to being driven into the linear mode of transistor operation. In at least one embodiment of the power transfer device, transistor 404 and transistor 406 are 18 V LDMOS n-type transistors, which are available in an exemplary manufacturing process for mixed-signal integrated circuits (e.g., a bipolar-CMOS-DMOS manufacturing process). Other transistors used by oscillator core 402 (e.g., latch transistor 408 and latch transistor 410) are conventional 5 V CMOS devices that have a breakdown voltage that is just over VDD1 (e.g., a breakdown voltage in a range greater than 5 V, but less than 6 V). Cascode transistor 404 and cascode transistor 406 shield the latch circuit from high voltages. The drain terminals of cascode transistor 404 and cascode transistor 406 can support high drain-to-source voltage swings while corresponding gate-to-source voltages are maintained within reliability limits determined by gate oxide thicknesses of the transistors (e.g., Vgs<6 V).
For a voltage level of input DC signal VDD1 equal to 5 V, drains of cascode transistor 404 and cascode transistor 406 will see voltages slightly higher than 3×VDD1=15 V. Cascode transistor 404 and cascode transistor 406 enable fast restart of the oscillator by presenting a sudden large voltage (e.g., a voltage above the latch crossover point, i.e., the point at which the gate-to-source voltage of latch transistor 410 equals the gate-to-source voltage of latch transistor 408) across latch transistor 408 and latch transistor 410. Voltages applied to latch transistor 408 and latch transistor 410 are precisely controlled so that those transistors enter the triode mode of operation and turn off at an appropriate time with little or no crossover time (i.e., the transition time when latch transistor 408 and latch transistor 410 are conducting in the active mode of operation). Each of latch transistor 408 and latch transistor 410 conducts during approximately one half of a cycle of the pseudo-differential signal on nodes VHa and VHb and does not conduct during the other half of the cycle.
Referring to
Referring to
The enable mechanism for controlling oscillator core 402 may include a mechanism that reduces or eliminates excess energy that builds up in the transformer coils upon restart and that can cause flying voltages on the terminals of the transformer (i.e., voltage levels much greater than 3×VDD1 that develop as voltage VHa or voltage VHb as a result of releasing that excess energy to the capacitor(s) of the oscillator (e.g., Cp, Cpa, Cpb) as the oscillator restarts oscillating). Referring to
and force clean, well-bounded oscillation of oscillator core 402. In addition, snubber circuit 420 and snubber circuit 422 return at least part of the excess energy to the power supply. Snubber circuit 420 and snubber circuit 422 may be sized to have a clamping voltage level just above 3×VDD1. In at least one embodiment of oscillator core 402, snubber circuit 420 and snubber circuit 422 each include series-coupled, reverse-biased Zener diodes coupled in series with series-coupled, forward-biased diodes. Accordingly, the clamping voltage level equals N1×VZ+N2×VF, where N1 and N2 are integers greater than zero, VZ is a knee voltage of the Zener diodes, and VF is a forward voltage of the forward-biased diodes. Referring to
Referring to
In general, a Schottky diode (i.e., hot carrier diode) is a semiconductor diode formed by a junction of a semiconductor with a metal and is characterized to have a fast switching speed and low voltage drop. The Schottky diode can sustain high forward currents at lower voltage drops than would exist in typical diffused pn-junction diodes. An exemplary Schottky diode forward voltage is approximately 150 mV-450 mV, while a typical silicon diode has a forward voltage of approximately 600 mV-700 mV. The lower forward voltage requirement improves system efficiency. Typically, Schottky diodes are not available in conventional CMOS manufacturing technologies because their manufacture requires additional mask layers and processing steps. However, Schottky diodes may be available with conventional CMOS devices in an exemplary mixed-signal integrated circuit manufacturing process (e.g., bipolar-CMOS-DMOS manufacturing process). Schottky diode 1202 and Schottky diode 1204 withstand voltages of greater than 10 V in a typical application. The secondary-side half-windings alternate rectifying and adding charge to capacitor C1. Since only half of the transformer delivers power to the output capacitor for a particular half-cycle, the output voltage that can be developed across C1 is limited. However, only one Schottky diode contributes to conduction losses according to which path is conducting at a particular time. Schottky diodes that have high current density and relatively low reverse breakdown voltage may be used to reduce area of the rectifier circuit. If Schottky diodes are not available, regular diodes may be used, but result in a lossier system.
Referring to
Replacing diode 1206 and diode 1208 of the embodiment of
Referring to
After the voltage level of output DC signal VDD2 crosses second threshold voltage VDD2,MIN, comparator 1902 changes the level of its output signal. The change in voltage level is communicated from the secondary side to the primary side across the isolation barrier. That change in level causes the primary side to enable oscillator core 402, which causes the voltage level of output DC signal VDD2 to ramp up again. Output DC signal VDD2 may have a small AC ripple at twice the oscillator frequency caused by the rectifier. That AC ripple is present only when oscillator core 402 is enabled and when the voltage level of output DC signal VDD2 is ramping up to first threshold voltage VDD2,MAX. An inherent delay of the received ON and OFF signals generated by on-off keying signaling causes a small DC offset of output DC signal VDD2 that may be reduced by reducing delay of the feedback channel.
Referring to
Hysteretic thresholds, first threshold voltage VDD2,MAX and second threshold voltage VDD2,MIN are programmed to target levels using a current I1 that is sourced by p-type transistor 1904 or sunk by n-type transistor 1906 to/from the resistor network including resistor R1 and resistor R2:
Accordingly, a hysteretic band of the feedback signal is controlled independently of the voltage level of output DC signal VDD2 by using analog techniques:
VHYS=VDD2,MAX−VDD2,MIN=2×I1×R1.
The power transfer device provides a fixed DC current to the secondary side and the load capacitor. At steady state, when the voltage level of output DC signal VDD2 moves between first threshold voltage VDD2,MAX and second threshold voltage VDD2,MIN, capacitor C1 charges at a constant rate of approximately
and discharges at a constant rate of approximately
At steady-state,
Therefore,
and the frequency of enabling and disabling of oscillator core 402 to achieve voltage regulation is
which is a function of C1, VHYS, and Iload, and may vary according to particular manufacturing conditions. The frequency of the feedback channel may be adjusted by selecting appropriate values for C1 and VHYS for particular load conditions.
Referring to
Contrary to the embodiment described above where the average voltage level of output DC signal VDD2 is defined by
with a symmetrical hysteresis band VHYS=2×I1×R1 evenly distributed around the average voltage level of output DC signal VDD2, the upper and lower hysteresis thresholds of the embodiment of
While circuits and physical structures have been generally presumed in describing embodiments of the invention, it is well recognized that in modern semiconductor design and fabrication, physical structures and circuits may be embodied in computer-readable descriptive form suitable for use in subsequent design, simulation, test or fabrication stages. Structures and functionality presented as discrete components in the exemplary configurations may be implemented as a combined structure or component. Various embodiments of the invention are contemplated to include circuits, systems of circuits, related methods, and tangible computer-readable medium having encodings thereon (e.g., VHSIC Hardware Description Language (VHDL), Verilog, GDSII data, Electronic Design Interchange Format (EDIF), and/or Gerber file) of such circuits, systems, and methods, all as described herein, and as defined in the appended claims. In addition, the computer-readable media may store instructions as well as data that can be used to implement the invention. The instructions/data may be related to hardware, software, firmware or combinations thereof.
Thus, a power transfer device including electromagnetic radiation control has been described. The description of the invention set forth herein is illustrative and is not intended to limit the scope of the invention as set forth in the following claims. Variations and modifications of the embodiments disclosed herein, may be made based on the description set forth herein, without departing from the scope of the invention as set forth in the following claims.
Number | Name | Date | Kind |
---|---|---|---|
7489526 | Chen et al. | Feb 2009 | B2 |
7679162 | Dupuis et al. | Mar 2010 | B2 |
7706154 | Chen et al. | Apr 2010 | B2 |
8861229 | Alfano et al. | Oct 2014 | B2 |
8878560 | Kuo et al. | Nov 2014 | B2 |
9035422 | Khanolkar et al. | May 2015 | B2 |
9537581 | Mills et al. | Jan 2017 | B2 |
9698654 | Santos et al. | Jul 2017 | B2 |
9812989 | Dupuis | Nov 2017 | B1 |
10511273 | Al-Shyoukh | Dec 2019 | B2 |
20020150151 | Krone et al. | Oct 2002 | A1 |
20030091140 | Dupuis et al. | May 2003 | A1 |
20040057524 | Krone et al. | Mar 2004 | A1 |
20040190670 | Dupuis et al. | Sep 2004 | A1 |
20050100104 | Dupuis et al. | May 2005 | A1 |
20060049881 | Rein | Mar 2006 | A1 |
20070075813 | Zhang | Apr 2007 | A1 |
20070080360 | Mirsky | Apr 2007 | A1 |
20070139032 | Dupuis et al. | Jun 2007 | A1 |
20070246805 | Zhang et al. | Oct 2007 | A1 |
20080013635 | Dupuis | Jan 2008 | A1 |
20080025450 | Alfano et al. | Jan 2008 | A1 |
20080031286 | Alfano et al. | Feb 2008 | A1 |
20080119142 | Dupuis | May 2008 | A1 |
20080164955 | Pfeiffer | Jul 2008 | A1 |
20080192509 | Dhuyvetter | Aug 2008 | A1 |
20080260050 | Dupuis | Oct 2008 | A1 |
20080267301 | Alfano et al. | Oct 2008 | A1 |
20090017773 | Dupuis et al. | Jan 2009 | A1 |
20100052826 | Callahan et al. | Mar 2010 | A1 |
20100118918 | Dupuis | May 2010 | A1 |
20140126254 | Al-Shyoukh et al. | May 2014 | A1 |
20140153296 | Pan | Jun 2014 | A1 |
20140177290 | Zhang | Jun 2014 | A1 |
20140375138 | Sako | Dec 2014 | A1 |
20150145446 | Shitabo | May 2015 | A1 |
20150171901 | Dupuis et al. | Jun 2015 | A1 |
20160036340 | Kikuchi | Feb 2016 | A1 |
20170346406 | Bucheru | Nov 2017 | A1 |
20180278229 | Sankaran et al. | Sep 2018 | A1 |
20190068071 | Jia | Feb 2019 | A1 |
Entry |
---|
Analog Devices, Inc., “Dual-Channel, 2.5 kV Isolators with Integrated DC-to-DC Converter,” Data Sheet ADuM5200/ADuM5201/ADuM5202, 2009-2012, 28 pages. |
Analog Devices, Inc., “Hot Swappable, Dual I2C Isolators with Integrated DC-to-DC Converter,” Data Sheet ADM3260, 2013-2016, 19 pages. |
Analog Devices, Inc., “Quad-Channel, 5 kV Isolators with Integrated DC-to-DC Converter,” Data Sheet ADuM6400/ADuM6401/ADuM6402/ADuM6403/ADuM6404, 2009-2012, 28 pages. |
Silicon Laboratories, “1MBPS, 2.5KVRMS Digital Isolators,” Si86xx, 2015, 52 pages. |
Silicon Laboratories, “5 KV LED Emulator Input, Open Collector Output Isolators,” Si87xx, 2014, 39 pages. |
Silicon Laboratories, “Dual Digital Isolators with DC-DC Converter,” Si88x2x, Jul. 2015, 45 pages. |
Tsai, C.T., and Chou, H.P., “A Synthetic Ripple Buck Converter with Dynamic Hysteretic Band Modulation,” International Conference on Power Electronics and Drive Systems, PEDS 2009, pp. 170-174. |
Fanori, L. and Andreani, P., “Class-D CMOS Oscillators,” IEEE Journal of Solid-State Circuits, vol. 48, No. 12, Dec. 2013, pp. 3105-3119. |
Number | Date | Country | |
---|---|---|---|
20190305608 A1 | Oct 2019 | US |