Electron microscope

Information

  • Patent Grant
  • D958215
  • Patent Number
    D958,215
  • Date Filed
    Wednesday, July 24, 2019
    5 years ago
  • Date Issued
    Tuesday, July 19, 2022
    2 years ago
  • US Classifications
    Field of Search
    • US
    • D10 70
    • D10 1091
    • D10 1092
    • D10 81
    • D16 134
    • D16 130
    • D16 131
    • D16 132
    • D16 135
    • D16 136
    • D16 137
    • D16 202-208
    • D16 245
    • D16 219
    • D24 120
    • D24 113
    • D24 118
    • D24 119
    • D24 121
    • D24 122
    • D24 124
    • D24 125
    • D24 128
    • CPC
    • G01C3/00
    • G01C3/02
    • G01C3/04
    • G01C3/06
    • G01C3/08
    • G01C3/085
    • G01C3/10
    • G01C3/12
    • G01C3/16
    • G01C3/18
    • G01C3/20
    • G01C3/22
    • G01C3/24
    • G01C3/26
    • G01C3/28
    • G01C3/30
    • G01C3/32
    • B60Q1/04
    • B60Q1/26
    • F21S8/026
    • F21S8/04
    • F21V29/004
    • F21V21/02
    • F21V21/04
    • F21V29/2212
    • F21Y2101/02
    • G02B27/026
    • G02B23/16
    • G02B2003/0093
    • G02B3/04
    • H04J11/00
    • H04J13/00
    • E06B9/24
    • G03B17/02
    • C03B2215/46
  • International Classifications
    • 1606
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a front, top and right side perspective view of an electron microscope according to the design;



FIG. 2 is a front view thereof;



FIG. 3 is a right side view thereof;



FIG. 4 is a left side view thereof;



FIG. 5 is a rear view thereof;



FIG. 6 is a top plan view thereof;



FIG. 7 is a bottom plan view thereof;



FIG. 8 is an enlarged view of the portion shown in BOX 8 in FIG. 1;



FIG. 9 is cross-sectional view taken along line 9-9 of FIG. 2; and,



FIG. 10 is an enlarged view of the portion shown in BOX 10 in FIG. 9.


The dashed broken lines in the drawings show portions of the electron microscope that form no part of the claimed design. The dot-dash broken lines in the drawings indicate boundaries of the claimed subject matter that form no part of the claimed design. The dot-dot-dash broken lines in the drawings indicate boundaries of the view indicators that form no part of the claimed design.


Claims
  • The ornamental design for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2019-001638 Jan 2019 JP national
US Referenced Citations (13)
Number Name Date Kind
D591864 Schmidt May 2009 S
D636005 Oonuma Apr 2011 S
D657407 Okamoto Apr 2012 S
D715843 Kawai Oct 2014 S
D723079 Nauli Feb 2015 S
D750989 Shimizu Mar 2016 S
D766762 Kawai Sep 2016 S
D841069 Ihara Feb 2019 S
D872789 Haavisto Jan 2020 S
D886653 Sugie Jun 2020 S
D887295 Carney Jun 2020 S
D895462 Kimura Sep 2020 S
D933730 Kang Oct 2021 S