The broken lines of
The broken lines of
Number | Date | Country | Kind |
---|---|---|---|
2012-029392 | Nov 2012 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
2370373 | Muller et al. | Feb 1945 | A |
D173282 | Pike | Oct 1954 | S |
3297284 | Pellerin | Jan 1967 | A |
D223669 | Nishino et al. | May 1972 | S |
3814356 | Coleman et al. | Jun 1974 | A |
3835320 | Helwig | Sep 1974 | A |
4523094 | Rossow | Jun 1985 | A |
D303267 | Takahashi et al. | Sep 1989 | S |
4961003 | Yonezawa | Oct 1990 | A |
D332616 | Hashimoto et al. | Jan 1993 | S |
5350921 | Aoyama et al. | Sep 1994 | A |
D381031 | Miyata et al. | Jul 1997 | S |
6084239 | Miyata et al. | Jul 2000 | A |
D638046 | Noda et al. | May 2011 | S |
D644258 | Noda et al. | Aug 2011 | S |
D687475 | Oonuma et al. | Aug 2013 | S |
20020148961 | Nakasuji et al. | Oct 2002 | A1 |
20050029452 | Furukawa et al. | Feb 2005 | A1 |
Entry |
---|
Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English. |
Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation. |
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new S-5500, Scanning Electron Microscope, Recorded World-Leading Resolution in 30 kV, Oct. 19, 2004 with partial translation. |
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English. |
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English. |
JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation. |