The broken lines of
The broken lines of
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|---|---|---|---|
| 2012-029392 | Nov 2012 | JP | national |
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| Entry |
|---|
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English. |
| Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new S-5500, Scanning Electron Microscope, Recorded World-Leading Resolution in 30 kV, Oct. 19, 2004 with partial translation. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English. |
| JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation. |