The present disclosure relates to analytical instrumentation and more particularly to electron sources and methods that may be used to facilitate the ionization of samples for analysis using electron sources.
Analytical instruments are being utilized in laboratories as well as the field. The field applications can be those that identify threats that range from criminal, security, and terrorist threats. These field applications take place in airport security, border security, and military settings. Mass analysis can provide the fastest, most detailed information about compositions. However, there is a need for even faster and more detailed information.
The present disclosure provides electron source devices, electron source assemblies, and/or methods for generating electrons. The generated electrons can be used to facilitate spectroscopy, such as mass spectrometry, including mass selection or ion mobility.
Electron source devices are provided that can include: a cathode member operatively aligned with an anode member, both members defining conduits in fluid communication; and a pressure differential extending between the cathode member and the anode member, the pressure differential facilitating fluid flow through the cathode and anode.
Cathode assemblies for an electron source device are also provided. The assemblies can include: a cathode member operatively aligned with an anode member, the cathode member extending along a longitudinal axis, the axis defining a center of the member in one cross section; and a lens conductively associated with the cathode member, the lens defining at least one opening offset from the center.
Lens assemblies for an electron source device are provided as well. The assemblies can include: a pair of lenses conductively associated with a cathode member, the cathode member extending along a longitudinal axis, the axis defining a center of the member in one cross section; and wherein each of the lenses have centers aligned along the axis, wherein one of the pair defines an opening offset from the center, and the other lens defines an opening at the center.
Additionally, electron source devices are provided that can include: a cathode member operatively aligned with an anode member, with both members defining conduits in fluid communication, and wherein the cathode member extends along a longitudinal axis, the axis defining a center of the member in one cross section; a pressure differential extending between the cathode member and the anode member, the pressure differential facilitating fluid flow through the cathode and anode; a first lens conductively associated with the cathode member, the first lens defining at least one opening offset from the center; and a second lens conductively associated with the cathode member and the first lens, the second lens defines an opening within the center of the second lens.
Embodiments of the disclosure are described below with reference to the following accompanying drawings.
This disclosure is submitted in furtherance of the constitutional purposes of the U.S. Patent Laws “to promote the progress of science and useful arts” (Article 1, Section 8).
The present disclosure provides electron source devices, electron source assemblies, and/or methods for generating electrons. The generated electrons can be used to facilitate spectroscopy, such as mass spectrometry, including mass selection or ion mobility.
The present disclosure will be described with reference to
As depicted in
Sample preparation ionization section 14 can include an inlet system (not shown) and an ion source device. The inlet system can introduce an amount of sample 12 into instrument 10. Depending upon sample 12, the inlet system may be configured to prepare sample 12 for ionization. Types of inlet systems can include batch inlets, direct probe inlets, chromatographic inlets, and permeable or capillary membrane inlets. The inlet system may be configured to prepare sample 12 for analysis in the gas, liquid and/or solid phase. In some aspects, the inlet system may be combined with the ion source device.
The ion source device can be configured to receive sample 12 and convert components of sample 12 into analyte ions by exposing the sample to electrons generated by the ion source device. This conversion can include the bombardment of components of sample 12 with the electrons. The ion source device may provide, for example, electron ionization (EI, typically suitable for the gas phase ionization).
Referring next to
A pressure differential 30 can extend between members 24 and 26, with the pressure within conduit 27 being lower than the pressure within conduit 25, thus facilitating fluid flow between member 24 and 26. In accordance with example implementations, this pressure differential can be facilitated by providing a fluid source to conduit 25. The fluid source can be an inert gas such as helium for example, but other gases such as air, nitrogen, and/or carbon dioxide may be utilized. In accordance with other implementations, a vacuum may be provided to conduit 27, perhaps as part of the analysis portion of the instrument. The vacuum can facilitate the flow of fluid operatively connected with conduit 25.
Referring next to
Assembly 32 can also include a lens 36 that is conductively associated with member 34. For example, member 34 and lens 36 can form a portion of the cathode of the electron source device. Lens 36 can be constructed of conductive material such as stainless steel, aluminum, gold, copper, and/or beryllium-copper alloys. Lens 36 can define at least one opening 40 that is offset from the center of member 34. In accordance with example implementations, lens 36 can define additional openings that are offset from the center of member 34, such as an opposing opening or an opening across from the center of member 34.
Cathode member 34 can define sidewalls 35 for example. One or more of the openings within lens 36 can be associated with one or more of these sidewalls. For example, a center axis 42 of opening 40 can be aligned between axis 38 and sidewall 35 for example. In accordance with example implementations, during operation, electrons emanating from sidewalls 35 can be effectively directed to opening 40 associated with the sidewall.
Referring next to
A pair of lens 48 and 50 can be conductively associated with cathode member 44 and may form part of the cathode sharing the conductivity of same. Lens 48 defines at least one opening 54 offset from the center defined by axis 52 and lens 50 defines an opening 56 at the center. This alignment can provide a tortured path for electrons emanating from cathode member 44. With regard to lens 48, additional openings can be defined, and in accordance with some implementations, these openings may be associated with cathode sidewalls when utilized.
Referring next to
Anode assembly 64 can include a flow limiting lens 84 conductively associated with anode member 86. Viton O-rings 78 can be utilized to separate anode assembly 64 from insulator 66. In accordance with example configurations, a pressure of less than 1 torr can be maintained within the conduit of the cathode assembly when providing electrons to a sample to prepare analytes.
Analytes prepared by exposing sample to electrons from the devices of the present disclosure can proceed to analyzer 16. Analyzer 16 can include an ion transport gate (not shown), and a mass separator (not shown). The ion transport gate can be configured to gate the analyte beam of ions generated by the ion source. The ion transport gate can be configured to gate positive or negative analyte ions as generated from the ion source. Analyzer 16 can be any of those described in U.S. Pat. No. 7,582,867 issued Sep. 1, 2009, the entirety of which is incorporated by reference herein.
Analytes may proceed to detector 18. Exemplary detectors include electron multipliers, Faraday cup collectors, photographic and stimulation-type detectors. The detector can be configured as described herein with positive or negative voltages.
The progression of analysis from sample preparation and ionization 14 through analyzer 16 and to detector 18 can be controlled and monitored by a processing and control unit 20. Unit 20 can be configured to provide the specific configurations of the ion source device, the ion transporter, the analyzer and the detector as described herein. These configurations can include the specific polarity of voltages applied to each component.
Acquisition and generation of data according to the present disclosure can be facilitated with processing and control unit 20. Processing and control unit 20 can be a computer or mini-computer that is capable of controlling the various elements of instrument 10. This control includes the specific application voltages and may further include determining, storing and ultimately displaying mass spectra. Processing and control unit 20 can contain data acquisition and searching software. In one aspect, such data acquisition and searching software can be configured to perform data acquisition and searching that includes the programmed acquisition of the total analyte count. In another aspect, data acquisition and searching parameters can include methods for correlating the amount of analytes generated to predetermined programs for acquiring data.
In compliance with the statute, embodiments of the invention have been described in language more or less specific as to structural and methodical features. It is to be understood, however, that the entire invention is not limited to the specific features and/or embodiments shown and/or described, since the disclosed embodiments comprise forms of putting the invention into effect.
This application claims priority to and the benefit of U.S. Provisional Patent Application Ser. No. 62/526,841 filed Jun. 29, 2017, entitled “Electron Source Devices, Electron Source Assemblies, and Methods for Generating Electrons”, the entirety of which is incorporated by reference herein.
This invention was made with Government support under Contract HSHQDC-15-C-B0046 awarded by the U.S. Department of Homeland Security Science & Technology Directorate. The Government has certain rights in the invention.
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5412277 | Chen | May 1995 | A |
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Number | Date | Country | |
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62526841 | Jun 2017 | US |