Information
-
Patent Grant
-
6538399
-
Patent Number
6,538,399
-
Date Filed
Tuesday, November 28, 200024 years ago
-
Date Issued
Tuesday, March 25, 200321 years ago
-
Inventors
-
Original Assignees
-
Examiners
Agents
-
CPC
-
US Classifications
Field of Search
US
- 313 532
- 313 533
- 250 366
- 315 500
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International Classifications
-
Abstract
To prevent the deterioration in sensitivity of the photocathode (20) of an electron tube and maintain stable output for a long time, an ion confining electrode (22) and an ion trap electrode (23) are provided between the photocathode (20) and a first stage dynode (24a). The potential of the ion confining electrode (22) is set higher than that of the first stage dynode (24a), while the potential of the ion trap electrode (23) is set equal to or higher than that of the photocathode (20) and lower than that of the first stage dynode 24a. Since the feedback to the photocathode (20) of the positive ions generated in the vicinity of the first stage dynode can be effectively suppressed, the sensitivity of the photocathode (20) is prevented from decreasing, and stable output is maintained for a long time.
Description
TECHNICAL FIELD
The present invention relates to an electron tube provided with a photocathode for emitting electrons in response to incident light through the photoelectric conversion, and an electron multiplying section for multiplying the emitted electron flow through the emission of secondary electrons.
BACKGROUND ART
A photomultiplier tube, which is one of electron tubes, is used widely for various measurements in such fields as nuclear high-energy physics and nuclear medicine.
FIGS.
1
(
a
) and
1
(
b
) show an example of a conventional photomultiplier tube, including a top view and a cross-sectional view respectively. This photomultiplier tube includes a circular faceplate
11
for receiving incident light; a photocathode
20
formed on the inner surface of the faceplate
11
and held at zero potential; and an electron multiplying section
24
including a plurality of stages of dynodes
24
a
-
24
n.
The first stage through m
th
stage dynodes
24
a
-
24
m
are arranged in continuous stages. An anode
26
is positioned beneath the m
th
stage dynode
24
m.
The final stage dynode
24
n
is disposed directly beneath the anode
26
. The first stage dynode
24
a
has a positive potential in relation to the photocathode
20
. Electrons emitted from the photocathode
20
impinge on the first stage dynode
24
a.
The dynodes
24
a
-
24
m
are formed with a plurality of electron multiplying apertures arranged in a matrix pattern. A focusing electrode
21
is formed with an electron focusing section
21
a,
disposed between the photocathode
20
and the electron multiplying section
24
, and maintain at the same potential as that of the photocathode
20
. Accordingly, photoelectrons emitted from the photocathode
20
are converged by the electron focusing section
21
a
and subsequently emitted onto a prescribed area of the first stage dynode
24
a.
In this type of conventional photomultiplier tube, however, the sensitivity of the photocathode deteriorates after a long period of use. As a result, the output from the photomultiplier tube in response to incident, light declines. This type of problem is particularly prevalent in photomultiplier tubes using a semiconductor photocathode, such as gallium arsenic (GaAs).
DISCLOSURE OF THE INVENTION
In view of the foregoing, it is an object of the present invention to provide an electron tube that has a photocathode and an electron multiplying section and is capable of preventing the deterioration of the photocathode to maintain a stable output over a long period of use.
To achieve these objectives, the inventors investigated the causes for deterioration in the photocathode. They discovered that positive ions were generated by the collision of electrons with a cesium (Cs) cloud formed around. the electron impinging section nearest the photocathode. The positive electrons were accelerated toward the photocathode due to the electric, field present at the site of their generation, resulting in ion feedback colliding with the photocathode. The inventors discovered that this collision caused the photocathode to deteriorate.
It should be noted that the potential of electrodes is defined by the positive or negative potential differential between electrodes rather than the absolute value of potential. In other words, when electrode A has a positive potential in relation to electrode B, the potential of the electrode A is higher than that of the electrode B.
According to one aspect of the present invention, an electron tube includes a photocathode that emits electrons in response to incident light through the photoelectric conversion; an electron multiplying section that multiplies electrons emitted from the photocathode, the electron multiplying section including an electron impinging section positioned nearest the photocathode, wherein the electrons emitted from the photocathode impinge on the electron impinging section; an ion confining electrode provided between the photocathode and the electron multiplying section for confining positive ions generated in the electron multiplying section; and an ion trap electrode provided between the ion confining electrode and the electron impinging section for capturing the positive ions confined by the ion confining electrode. The potential of the electron impinging section is set higher than the potential of the ion confining electrode. The potential of the ion trap electrode is set equal to or greater than the potential of the photocathode and lower than the potential of the electron impinging section.
In this type of electron tube, external light striking on the photocathode is converted to photoelectrons, which are accelerated toward the ion confining electrode having a positive potential in relation to the photocathode. After passing through apertures formed in the ion confining electrode and the ion trap electrode, the photoelectrons strike the electron impinging section of the electron multiplying section. At this time, positive ions are generated near the electron impinging section.
With the electrode configuration of the present invention, the generated positive ions are accelerated toward the photocathode. However, since the ion confining electrode has a positive potential in relation to the electron impinging section, the positive ions cannot pass through the apertures in the ion confining electrode to reach the photocathode. Ultimately, the positive ions are captured by the ion trap electrode which is set at a lower potential than the potential of the ion confining electrode and the electron impinging section, or by the electron impinging section itself, thereby preventing deterioration of the photocathode.
The potential of the ion confining electrode is set higher, within a range in which photoelectron converging from the photocathode to the electron multiplying section is not lost, than that of the electron impinging section at which positive ions are generated. Accordingly, ion feedback and deterioration of the photocathode caused thereby can be effectively suppressed without reducing the photoelectron capturing efficiency.
According to another aspect of the present invention, the electron multiplying section includes a plurality of stages of dynodes for capturing and orderly multiplying the electrons emitted from the photocathode. Here, the first stage dynode functions as the electron impinging section. According to another aspect of the present invention, the electron multiplying section is a microchannel plate having a plate structure formed of a plurality of bundled glass pipes. In this case, the microchannel plate is disposed so that one surface opposes the photocathode to serve as the electron impinging section. The electrons multiplied by the electron multiplying section are output from the anode electrode in the form of an electric current.
The present invention is particularly effective for electron tubes including a photocathode formed from a semiconductor photoelectric conversion material, such as gallium arsenic. However, deterioration of the photocathode caused by ion feedback commonly occurs in electron tubes using other types of photocathodes and affects the life span of such photocathode. Accordingly, the electrode configuration and potential settings of each electrode of the present invention are also effective for electron tubes using photocathodes formed from materials other than semiconductor materials.
According to another aspect of the present invention, the electron tube further includes a focusing electrode disposed between the photocathode and the ion confining electrode for converging the electrons.
According to still another aspect of the present invention, the ion confining electrode and the ion trap electrode can be formed with a row of a plurality of slits for allowing photoelectrons to pass therethrough. Alternatively, the ion confining electrode and the ion trap electrode can be formed with a plurality of channels arranged in a matrix pattern to allow photoelectrons to pass therethrough.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG.
1
(
a
) is a top view of a conventional photomultiplier tube;
FIG.
1
(
b
) is a cross-sectional view of the conventional photomultiplier tube;
FIG. 2
is a cross-sectional view showing the configuration of a photomultiplier tube according to an embodiment of the present invention;
FIG. 3
is a perspective partial view showing an aperture configuration of a focusing electrode, an ion confining, electrode, and an ion trap electrode in the photomultiplier tube of
FIG. 2
;
FIG. 4
is a cross-sectional view showing an example of a potential of each electrode and a calculated trajectory of positive ions between electrodes in the photomultiplier tube of
FIG. 2
;
FIG. 5
is a graph-comparing changes in relative output over time of the photomultiplier tube according to the present invention and a conventional apparatus;
FIG. 6
is a perspective view showing another configuration of a focusing electrode, an ion-confining electrode, and an ion trap electrode of the photomultiplier tube; and
FIG. 7
is a perspective partial view showing configuration of a microchannel plate.
BEST MODE FOR CARRYING OUT THE INVENTION
A photomultiplier tube according to a preferred embodiment of the present invention will be described while referring to the accompanying drawings, wherein parts and components similar to the conventional apparatus described above are designated by the same reference numerals to avoid duplicating description. Dimensional proportions in the drawings may not always conform to the description.
FIG. 2
is a cross-sectional view showing the photomultiplier tube according to the preferred embodiment of the present invention. This photomultiplier tube includes a vacuum vessel
10
and an electron multiplying section
24
having a plurality of dynodes
24
a
-
24
n
disposed inside the vacuum vessel
10
. The vacuum vessel
10
includes a circular faceplate
11
for receiving incident light, a cylindrical metal side tube
12
positioned on the periphery of the faceplate
11
, and a circular stem
13
forming a base section.
A semiconductor photocathode
20
formed from GaAs is formed on the bottom inner surface of the faceplate
11
, and is maintained at zero potential. The faceplate
11
and the metal side tube
12
are joined together using a cold sealing method by an indium seal
14
in order to prevent thermal damage on the GaAs photocathode
20
during assembly. The indium seal
14
is retained by a retaining ring
14
a
disposed therearound.
The electron multiplying section
24
includes metal channel dynodes stacked in seven stages. The metal channel dynodes have a secondary electron emitting surface formed on a prescribed region of a square planar metallic surface. The dynodes
24
a
-
24
m
are formed with a plurality of electron multiplying apertures having a slit shape. An anode
26
and the final stage dynode
24
n
are disposed in this order below the stacked dynodes
24
a
-
24
m.
The final dynode
24
n
is a square metal plate with slits formed therein. The slits formed in the final dynode
24
n
are positioned directly beneath grids of the anode electrode
26
. Electron multiplying surfaces formed between the slits in the final stage dynode
24
n
are positioned directly beneath the slit portions formed in the anode
26
. By positioning the final dynode
24
n
below the anode electrode
26
, the anode electrode
26
is able to read secondary electrons reflected off the final dynode
24
n.
A focusing electrode
21
having an electron focusing section
21
a
that is formed with a plurality of slit-shaped apertures, is disposed between the photocathode
20
and the first stage dynode
24
a.
The focusing electrode
21
is maintained at the same potential as the potential of the photocathode
20
. Accordingly, photoelectrons emitted from the photocathode
20
are converged by the affect of the electron focusing section
21
a
impinged on a prescribed region of the first dynode
24
a.
A special feature of the present embodiment is an ion confining electrode
22
and an ion trap electrode
23
disposed between the focusing electrode
21
and the first stage dynode
24
a.
FIG. 3
is a perspective partial view showing an aperture configuration of the focusing electrode
21
, the ion confining electrode
22
, and the ion trap electrode
23
. The ion confining electrode
22
and the ion trap electrode
23
also are formed with a plurality of slit-shaped apertures corresponding to the slit-shaped apertures of the focusing. electrode
21
forming the electron focusing section
21
a.
It should be noted that configurations other than the aperture configuration, such as that for stacking and holding the contact terminals and electrodes, are omitted from FIG.
3
.
Pins
17
connected to an external voltage terminal penetrate the stem
13
which serves as the base portion, for applying prescribed voltages to the focusing electrode
21
, each dynode
24
a,
24
b,
the ion confining electrode
22
, and the ion trap electrode
23
. Each pin
17
is fixed to the stem
13
by tapered hermetic glass
18
.
FIG. 4
shows the potentials set for the focusing electrode
21
, the ion confining electrode
22
, the ion trap electrode
23
, the first stage dynode
24
a,
and the second stage dynode
24
b.
The focusing electrode
21
is set at zero potential, the same as that for the photocathode
20
. Voltages of 94.1 V and 188.2 V are applied to the first stage dynode
24
a
and the second stage dynode
24
b,
respectively. The potential of the ion trap electrode
23
is set to zero which is equal to that of the photocathode
20
. A voltage of 188.2 V, which is higher than the voltage applied to the second stage dynode
24
b,
is applied to the ion confining electrode
22
. In the present embodiment, by setting the potential of the ion confining electrode
22
equal to that of the second stage dynode
24
b,
it is possible to apply the necessary potential without increasing the number of the pins
17
.
FIG. 4
also shows an example of a calculated trajectory of the positive ions generated in the electron multiplying section
24
for when the potentials of the electrodes are set as described above. In regards to the mechanism for generating positive ions that initiate ion feedback, it is speculated that gas molecules adsorbed by the secondary electron emission surface of the first stage dynode
24
a
are emitted when photoelectrons impinge on the first stage dynode
24
a.
Then, these gas molecules collide with photoelectrons or secondary electrons, thereby generating positive ions.
In the electrode configuration described above, positive ions generated near the first stage dynode
24
a,
indicated by a region A in
FIG. 4
, are potentially restrained by the ion confining electrode
22
and ultimately absorbed by the ion trap electrode
23
and the electron multiplying section
24
itself. As a result, the positive ions do not reach the photocathode.
In terms of electron flow, it can be thought that a greater number of positive ions are generated near the dynodes from the second stage on.
FIG. 4
also shows a calculated trajectory of positive ions generated near the second dynode
24
b
, indicated by a region B in FIG.
4
. However, these positive ions are absorbed by the dynode at the previous stage, in this case the first stage dynode
24
a
and the second stage dynode
24
b
itself. Accordingly, it is speculated that positive ions generated near the dynodes from the second stage on do not contribute to ion, feedback in the conventional photomultiplier tube and consequently do not contribute to the deterioration of the photocathode caused by the ion feedback. Accordingly, it is possible to sufficiently suppress ion feedback by setting the potential of the ion confining electrode
22
higher than that of the first stage dynode
24
a.
FIG. 5
shows the change in characteristics over time of the relative output of the photomultiplier tube according to the present embodiment having the configuration described above in comparison with that of a conventional photomultiplier tube including a GaAs semiconductor photocathode but no ion confining electrode nor ion trap electrode. As shown in the graph, the output of the conventional apparatus declines to 55% after 100 hours of operation. However, the output from the improved model of the present invention is at 98% after 100 hours, and shows almost no decline in output caused by deterioration of the photocathode. Hence, the apparatus of the present invention demonstrates extremely stable properties over a long period of use.
The present invention is not limited to the abovedescribed embodiment, and can be applied to a variety of different types of electron tube. It should be noted that the electron tube of the present invention is constructed with a photocathode in a space defined by a faceplate, a side tube, and a stem. Hence, in addition to the photomultiplier tube, this type of electron tube includes an image tube and the like. The image tube is an electron tube that converts an optical image on a photocathode to a photoelectron image through the photoelectric conversion. The photoelectron image is accelerated and converged through an electron lens system, multiplied by an electron multiplying section, and emitted onto a fluorescent surface to reproduce an optical image.
In the embodiment described above, the metal channel dynodes each formed with a plurality of electron multiplying apertures in a slit shape are used. However, metal channel dynodes formed with a plurality of electron multiplying apertures can be used. In this case, as shown in
FIG. 6
, the aperture configuration of the focusing electrode, the ion confining electrode, and the ion trap electrode forms a matrix pattern corresponding to the dynodes. The same effects can be achieved in dynodes other than metal channel dynodes, such as dynodes that do not have a plurality of electron multiplying apertures in each dynode stage and those formed with a secondary electron emission surface on a prescribed region of a ceramic surface, for example.
The focusing electrode is used in the embodiment described above. However, the same effects can be achieved in a photomultiplier tube or image tube using a microchannel plate and not a focusing electrode. As shown in
FIG. 7
, a microchannel plate
25
is formed in a plate structure with a bundle of micro glass pipes
250
. The inner surfaces of the micro glass pipes
250
serve as the secondary electron emission surface. An electron impinging surface
25
a
on one side of the microchannel plate
25
opposes the photocathode, while an electron outgoing surface
25
b
on the other side is disposed in opposition to an anode electrode. The microchannel plate
25
is a dynode that multiplies impinging electrons along the micro glass pipes
250
by the repeated collision of electrons on the inner walls and the emission of secondary electrons. The present invention can be applied to this configuration by the electron impinging surface
25
a,
having a positive potential in relation to the photocathode, of the microchannel plate
25
serving as the electron impinging section of the electron multiplying section.
Industrial Applicability
The photomultiplier tube, as one of the electron tubes according to the present invention, has a wide range of applications as a light analytical, apparatus for analyzing various matter using absorption, reflection, and polarization of specific wavelengths, in medical instruments, analytical instruments, industrial measuring instruments, and the like. The photomultiplier tube can also be used in x-rays; in instruments used to observe fixed stars, the sun, and auroras; and in apparatus used to measure environmental phenomena inside and outside the atmosphere.
Claims
- 1. An electron tube comprising:a photocathode that emits electrons in response to incident light through photoelectric conversion; an electron multiplying section that multiplies the electrons emitted from the photocathode, the electron multiplying section including an electron impinging section positioned nearest the photocathode, wherein the electrons emitted from the photocathode impinge on the electron multiplying section; an ion confining electrode provided between the photocathode and the electron multiplying section for confining positive ions generated in the electron multiplying section; and an ion trap electrode provided between the ion confining electrode and the electron impinging section for capturing the positive ions confined by the ion confining electrode, wherein the potential of the ion confining electrode is set higher than the potential of the electron impinging section, and the potential of the ion trap electrode is set equal to or greater than the potential of the photocathode and set lower than the potential of the electron impinging section.
- 2. The electron tube as recited in claim 1, wherein the electron multiplying section includes a plurality of stages of dynodes, including a first stage dynode for capturing and orderly multiplying electrons emitted from the photocathode, the first stage dynode functioning as the electron impinging section.
- 3. The electron tube as recited in claim 1, wherein the electron multiplying section includes a microchannel plate having a plate structure formed of a plurality of bundled glass pipes, the microchannel plate having one surface opposing the photocathode, the one surface functioning as the electron impinging section.
- 4. The electron tube as recited in claim 1, further comprising an anode electrode that extracts the electrons multiplied by the electron multiplying section.
- 5. The electron tube as recited in claim 1, wherein the photocathode is formed from a semiconductor photoelectric conversion material.
- 6. The electron tube as recited in claim 5, wherein the semiconductor photoelectric conversion material is formed from gallium arsenic.
- 7. The electron tube as recited in claim 1, further comprising a focusing electrode disposed between the photocathode and the ion confining electrode for converging the electrons.
- 8. The electron tube as recited in claim 1, wherein each of the ion confining electrode and the ion trap electrode is formed with a row of a plurality of slits to allow photoelectrons to pass therethrough.
- 9. The electron tube as recited in claim 1, wherein each of the ion confining electrode and the ion trap electrode is formed with a plurality of channels forming a matrix pattern to allow photoelectrons to pass therethrough.
Priority Claims (1)
Number |
Date |
Country |
Kind |
10-167019 |
Jun 1998 |
JP |
|
PCT Information
Filing Document |
Filing Date |
Country |
Kind |
PCT/JP99/03176 |
|
WO |
00 |
Publishing Document |
Publishing Date |
Country |
Kind |
WO99/66534 |
12/23/1999 |
WO |
A |
US Referenced Citations (6)
Foreign Referenced Citations (8)
Number |
Date |
Country |
48-76470 |
Oct 1973 |
JP |
63-299032 |
Dec 1988 |
JP |
2-291658 |
Dec 1990 |
JP |
7-94139 |
Apr 1995 |
JP |
09-288992 |
Nov 1997 |
JP |
9-288992 |
Nov 1997 |
JP |
10-144251 |
May 1998 |
JP |
993361 |
Jan 1983 |
SU |