BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic diagram showing a configuration of a testing system according to an embodiment of the present invention;
FIG. 2 is a plan view of a circuit board according to an embodiment of the present invention;
FIG. 3 is a block diagram showing an exemplary configuration of a circuit part according to an embodiment of the present invention;
FIG. 4 is a flowchart showing an operation of a processing circuit (processing part) according to an embodiment of the present invention;
FIG. 5 is a schematic diagram for describing the directivity of element patterns (antenna patterns) according to an embodiment of the present invention;
FIG. 6 is a block diagram showing an exemplary configuration of a testing apparatus according to an embodiment of the present invention;
FIG. 7 is a flowchart for describing an operation of a processing apparatus according to an embodiment of the present invention; and
FIG. 8 is a schematic diagram for describing a severing (cutting) step in a process of manufacturing an electronic apparatus according to an embodiment of the present invention.