Number | Date | Country | Kind |
---|---|---|---|
11-070937 | Mar 1999 | JP |
Number | Name | Date | Kind |
---|---|---|---|
5831992 | Wu | Nov 1998 | A |
5872793 | Attaway et al. | Feb 1999 | A |
Entry |
---|
Charles L. Hudson, Jr. and Gary D. Peterson, “Parallel Self-Test With Pseudo-Random Test Patterns”, IEEE 1987 International Test Conference, Paper 41.1., pp. 954-963. |