Claims
- 1. A method for producing an electrophotographic photoconductor having an electroconductive substrate, comprising the steps of:
- providing an aluminum substrate;
- forming an anodic oxidation film on at least one surface of the aluminum substrate;
- adding an additive selected from the group consisting of a phosphate surfactant, a naphthalene sulfonate formaldehyde condensate, and a bisphenol A sulfonate formaldehyde condensate to a sealing agent to prepare a sealing agent mixture; and
- treating the substrate with the sealing agent mixture to provide the electroconductive substrate; and
- laminating a photosensitive film on the electroconductive substrate.
- 2. The method as claimed in claim 1, wherein said sealing agent is nickel acetate.
- 3. The method as claimed in claim 1, wherein said sealing agent is pure water.
- 4. An electrophotographic photoconductor, comprising:
- an electroconductive substrate; and
- a photosensitive film laminated on said electroconductive substrate,
- wherein said electroconductive substrate comprises an aluminum substrate which has an anodic oxidation film on at least one surface thereof and which has been treated with a sealing agent mixture comprising an additive selected from the group consisting of a phosphate ester surfactant, a naphthalene sulfonate formaldehyde condensate, and a bisphenol A sulfonate formaldehyde condensate and a sealing agent.
- 5. The electrophotographic photoconductor as claimed in claim 4, wherein said sealing agent is nickel acetate.
- 6. The electrophotographic photoconductor as claimed in claim 4, wherein said sealing agent is pure water.
- 7. The electrophotographic photoconductor as claimed in claim 4, wherein said electroconductive substrate has an admittance value of 70 .mu.S or less.
Priority Claims (1)
Number |
Date |
Country |
Kind |
9-189448 |
Jul 1997 |
JPX |
|
Parent Case Info
This application is based on Patent Application No. 189,448/1997 filed on Jul. 15, 1997 in Japan, the content of which is incorporated hereinto by reference.
US Referenced Citations (3)
Foreign Referenced Citations (2)
Number |
Date |
Country |
63-116165 |
May 1988 |
JPX |
2-242264 |
Sep 1990 |
JPX |
Non-Patent Literature Citations (1)
Entry |
Japanese Industrial Standard (JIS H8683), "Test Methods for Sealing Quality of Anodic Oxide Coating on Aluminium and Aluminium Alloys", 1994. |