Claims
- 1. An electrophotographic sensitive plate, comprising:
- a conductive base;
- a semiconductive layer selected from the group consisting of Se, As.sub.2 S.sub.3 and As.sub.2 Se.sub.3 having a thickness of less than 1 micron overlaying said base;
- a photoconductive layer of a mixture of selenium and tellurium disposed on said semiconductive layer and containing between 10 to 60 percent tellurium by weight and having a thickness no greater than 1 micron; and
- an organic semiconductive layer selected from the group consisting of polyvinylcarbazole polyamide resin, polyvinyl-naphthalene and polyvinyl-malachite green disposed on said photoconductive layer and having a thickness of 5 to 30 microns.
- 2. An electrophotographic sensitive plate according to claim 1, wherein said conductive base is selected from the group consisting of aluminum, antimony and tin.
- 3. An electrophotographic sensitive plate according to claim 1, wherein said mixture of selenium and tellurium contains about 30 percent of tellurium by weight.
- 4. An electrophotographic sensitive plate comprising:
- a conductive base of aluminum;
- a selenium layer less than 1 micron thick disposed on said base forming a rectifying barrier for preventing the penetration of electric charges from said base;
- a selenium-tellurium layer containing between 20 to 40 percent tellurium by weight and having a thickness no greater than 1 micron disposed on said selenium layer for generating charge carriers upon absorption of light; and
- a polyvinyl-carbazole layer 5 to 30 microns thick disposed on said selenium-tellurium layer for retaining electric charges on its surface and for conducting photocarriers.
- 5. An electrophotographic sensitive plate, comprising:
- a conductive base;
- a semiconductive layer selected from the group consisting of Se, As.sub.2 S.sub.3 and As.sub.2 Se.sub.3 having a thickness in the range of 0.5 microns to 1.0 microns overlaying said base;
- a photoconductive layer of a mixture of selenium and tellurium disposed on said semiconductive layer and containing between 10 to 60 percent tellurium by weight and having a thickness in the range of 0.8 microns to 1.0 microns; and
- an organic semiconductive layer selected from the group consisting of polyvinylcarbazole polyamide resin, polyvinyl-naphthalene and polyvinyl-malachite green disposed on said photoconductive layer and having a thickness in the range of 5 to 30 microns.
- 6. An electrophotographic sensitive plate as in claim 5, wherein the thickness of said first semiconductive layer is substantially 0.5 microns, the thickness of said photoconductive layer is substantially 1.0 microns, the thickness of said organic semiconductive layer is substantially 8 microns, and the percentage by weight of tellurium is substantially 20 percent.
- 7. An electrophotographic sensitive plate as in claim 5, wherein the thickness of said first semiconductive layer is substantially 1 micron, the thickness of said photoconductive layer is substantially 0.8 microns, the thickness of said organic semiconductive layer is substantially 7 microns, and the percentage by weight of tellurium in said photoconductive layer is substantially 30 percent.
- 8. An electrophotographic sensitive plate as in claim 5, wherein the thickness of said first semiconductive layer is substantially 0.6 microns, the thickness of said photoconductive layer is substantially 0.8 microns, the thickness of said organic semiconductive layer is substantially 10 microns, and the percentage by weight of tellurium in said photoconductive layer is substantially 45.5 percent.
- 9. An electrophotographic sensitive plate, comprising:
- a conductive base;
- a semiconductor layer selected from the group consisting of Se, As.sub.2 S.sub.3 and As.sub.2 Se.sub.3 having a thickness of less than 1 micron overlaying said base;
- a photoconductive layer of a mixture of selenium with an element selected from the group consisting of Te, As, and Sb and containing between 10 to 60 percent of said element by weight and having a thickness no greater than 1 micron; and
- an organic semiconductive layer of a polyvinylcarbazole disposed on said photoconductive layer and having a thickness of 5 to 30 microns.
- 10. An electrophotographic sensitive plate as in claim 9, wherein said semiconductive layer has a thickness of 0.5 to 1 micron; and said photoconductive layer has a thickness of 0.8 to 1 micron.
Parent Case Info
This is a continuation of application Ser. No. 151,713 filed June 10, 1971, now abandoned.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
2803541 |
Paris |
Aug 1957 |
|
3355289 |
Hall et al. |
Nov 1967 |
|
3725058 |
Hayashi et al. |
Apr 1973 |
|
Continuations (1)
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Number |
Date |
Country |
Parent |
151713 |
Jun 1971 |
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