Claims
- 1. A method of analyzing an analyte present in a liquid using a mass spectrometer incorporating an ion trap, the method comprising:
- providing a capillary with an outlet adjacent an inlet aperture for the mass spectrometer;
- electrospraying the liquid from the capillary outlet by generating an electric field at the outlet to produce a beam of charged spray particles; and
- injecting the beam of charged particles into the mass spectrometer through the inlet aperture, wherein the pressure within the capillary is such that flow of the liquid through the capillary outlet occurs only in the presence of said electric field, and wherein flow of charged particles into the mass spectrometer is controlled by varying the said electric field.
- 2. A method as claimed in claim 1, wherein the flow of charged particles into the ion trap is controlled cyclically so as to switch on the flow of charged particles in filling periods of the ion trap, and to switch off the flow during time periods for ion investigation and analysis.
- 3. A method as claimed in claim 1, wherein spraying is carried out with the capillary outlet in ambient gas at standard pressure.
- 4. A method as claimed in claim 1, wherein the capillary forms a nozzle with an outlet diameter smaller than 5 micrometers.
- 5. A method as claimed in claim 4, wherein the nozzle outlet diameter is from 2 to 4 micrometers.
- 6. A method as claimed claim 1, wherein the spectrometer is an ion trap mass spectrometer.
- 7. A method as claimed in claim 6, wherein the ion trap mass spectrometer is an ion cyclotron resonance mass spectrometer, or an rf quadrupole mass spectrometer.
- 8. A method as claimed in claim 1, wherein substantially the whole of the beam of spray particles is transferred to the mass spectrometer through the aperture.
- 9. A method as claimed in claim 1, wherein the flow rate of the liquid is lower than 1000 nanoliters per minute.
- 10. A method as claimed in claim 9, wherein the flow rate of the liquid is lower than 25 nanoliters per minute.
- 11. A method as claimed in claim 1, wherein the capillary is pressurised to a static pressure which is insufficient to maintain flow through the capillary in the absence of the said electric field.
- 12. A method as claimed in claim 11, wherein the static pressure is maintained by a closed gas volume at the end of the capillary.
- 13. A method as claimed in claim 1, wherein the potential difference used to generate the said electron field is less than 1 kilovolt.
- 14. A method as claimed in claim 1, wherein the capillary outlet and the aperture are less than 3 millimeters apart.
- 15. A method as claimed in claim 1, wherein the aperture of the mass spectrometer is 500 micrometers or less in diameter.
- 16. A method as claimed in claim 1, wherein an additional gas is supplied to the space between capillary outlet and the aperture.
- 17. A method as claimed in claim 16, wherein the additional gas flows in a direction counter to the beam of spray particles.
- 18. A method as claimed in claim 16, wherein the additional gas is supplied at super-ambient temperature.
- 19. A method as claimed in claim 16, wherein the pressure in the capillary is ambient pressure.
Priority Claims (2)
Number |
Date |
Country |
Kind |
44 08 032.8 |
Mar 1994 |
DEX |
|
44 44 229.7 |
Nov 1994 |
DEX |
|
RELATED APPLICATIONS
This application is a continuation-in-part of U.S. patent application Ser. No. 401,405 entitled "Method of Ionizing Atoms or Molecules by Electrospraying," which has named inventors Matthias Mann and Matthias Wilm and was filed on Mar. 9, 1995 and which issued as U.S. Pat. No. 5,504,329. This application may be identified by Bookstein & Kudirka, P. C. Attorney Docket No. B0004/7014.
US Referenced Citations (6)
Number |
Name |
Date |
Kind |
4531056 |
Labowsky et al. |
Jul 1985 |
|
4861988 |
Henion et al. |
Aug 1989 |
|
4885076 |
Smith et al. |
Dec 1989 |
|
5115131 |
Jorgenson et al. |
May 1992 |
|
5306910 |
Jarrell et al. |
Apr 1994 |
|
5504329 |
Mann et al. |
Apr 1996 |
|
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
401405 |
Mar 1995 |
|