Claims
- 1. A device for detecting a defect in a photoconductive body, comprising:
- applying means for applying an electrical charge to said photoconductive body;
- moving means for moving said photoconductive body;
- position detecting means for detecting a position of a surface of said photoconductive body;
- surface potential detecting means for detecting a surface potential of said photoconductive body;
- arithmetic operation means for performing differentiation processing of said surface potential of said photoconductive body detected by said surface potential detecting means; and
- diagnosis means responsive to said arithmetic operation means, for evaluating a defect in said photoconductive body, based on a result of said differentiation processing.
- 2. A defect detecting device according to claim 1, wherein a position of a defect in said photoconductive body is detected based on a position of occurrence of a pulse generated by said arithmetic operation means.
- 3. A defect detecting device according to claim 1, wherein said diagnosis means evaluates a defect in said photoconductive body, based on a number of pulses and peak values of the pulses generated by said arithmetic operation means.
- 4. A defect detecting device according to claim 1, further comprising monitor means for monitoring a number of pulses and peak values of the pulses generated by said arithmetic operation means.
- 5. A defect detecting device according to claim 1, wherein a defect to be detected includes a pinhole.
- 6. An electrostatic recording apparatus including a photoconductive body defect detecting device according to claim 1.
- 7. A defect detecting device according to claim 2, wherein a defect to be detected includes a pinhole.
- 8. A defect detecting device according to claim 3, wherein a number of defects in said photoconductive body are detected based on a number of pulses and peak values of the pulses generated by said arithmetic operation means.
- 9. A defect detecting device according to claim 8, wherein a defect to be detected includes a pinhole.
- 10. A method according to claim 1, further comprising the step of utilizing said photoconductive body in an electrostatic recording process.
- 11. A method for detecting a defect in a photoconductive body, comprising the steps of:
- moving said photoconductive body;
- applying an electrical charge to said photoconductive body;
- detecting a position of a surface of said photoconductive body;
- detecting a surface potential of said photoconductive body;
- performing differentiation processing of the detected surface potential of said photoconductive body; and
- evaluating a defect in said photoconductive body, based on a result of the differentiation processing.
- 12. A method according to claim 11, further comprising the step of detecting a position of a defect in said photoconductive body based on a position of occurrence of a pulse generated by arithmetic operation means performing the differentiation processing.
- 13. A method according to claim 11, wherein the step of evaluating a defect in said photoconductive body effects evaluation, based on a number of pulses and peak values of the pulses generated by arithmetic operation means performing the differentiation processing.
- 14. A method according to claim 11, further comprising the step of monitoring a number of pulses and peak values of the pulses generated by arithmetic operation means performing the differentiation processing.
- 15. A method according to claim 11, wherein a defect to be detected includes a pinhole.
- 16. A method according to claim 12, wherein a defect to be detected is a pinhole.
- 17. A method according to claim 13, wherein the step of detecting a number of defects in said photoconductive body based on a number of pulses generated by the arithmetic operation means for performing the differentiation processing.
- 18. A method according to claim 17, wherein a defect to be detected is a pinhole.
Priority Claims (2)
Number |
Date |
Country |
Kind |
63-65636 |
Mar 1988 |
JPX |
|
63-306844 |
Dec 1988 |
JPX |
|
Parent Case Info
This application is a Continuation of application Ser. No. 07/827,939, filed Jan. 29, 1992, now U.S. Pat. No. 5,404,201 which is a continuation of application Ser. No. 07/325,386, filed Mar. 20, 1989, now U.S. Pat. No. 5,138,380, issued Aug. 11, 1992.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
5101159 |
Bossard et al. |
Mar 1992 |
|
5119030 |
Bossard et al. |
Jun 1992 |
|
Continuations (2)
|
Number |
Date |
Country |
Parent |
827939 |
Jan 1992 |
|
Parent |
325386 |
Mar 1989 |
|