Electrostatic valves for microfluidic devices

Information

  • Patent Grant
  • 7232109
  • Patent Number
    7,232,109
  • Date Filed
    Tuesday, October 23, 2001
    24 years ago
  • Date Issued
    Tuesday, June 19, 2007
    19 years ago
Abstract
Valve structures formed in elastomer material are electrostatically actuated by applying voltage to a flexible, electrically conductive wire pattern. An actuation force generated between the patterned wire structure and an electrode result in closure of a flow channel formed in elastomer material underlying the wire. In one embodiment of a valve structure in accordance with the present invention, the wire structure is patterned by lithography and etching of a copper/polyimide laminate, with an underlying gold plate positioned on the opposite side of the flow channel serving as an electrode. In an alternative embodiment, a first wire structure is patterned by physically cutting out a first pattern of strips from an Aluminum/Mylar(®) laminate sheet. A second patterned wire structure serving as the electrode is formed by the same method, and positioned on the opposite side of a control channel. Application of an actuation force between the first and second patterned strips closes the control channel and an associated flow channel underlying the control channel.
Description
BACKGROUND OF THE INVENTION

Pumps and valves for transporting and manipulating liquids in microfluidic devices are essential for developing lab on a chip technology. Various approaches to designing micro-fluidic pumps and valves have been attempted. However, each of these conventional approaches suffers from its own limitations.


The two most common methods of producing microelectromechanical (MEMS) structures such as pumps and valves are silicon-based bulk micro-machining (which is a subtractive fabrication method whereby single crystal silicon is lithographically patterned and then etched to form three-dimensional structures), and surface micro-machining (which is an additive method where layers of semiconductor-type materials such as polysilicon, silicon nitride, silicon dioxide, and various metals are sequentially added and patterned to make three-dimensional structures).


A limitation of the first approach of silicon-based micro-machining is that the stiffness of the semiconductor materials used may necessitate high actuation forces, which in turn result in large and complex designs. In fact, both bulk and surface micro-machining methods are limited by the stiffness of the materials used. In addition, adhesion between various layers of the fabricated device is also a problem. For example, in bulk micro-machining, wafer bonding techniques must be employed to create multilayer structures. On the other hand, when surface micro-machining, thermal stresses between the various layers of the device limits the total device thickness, often to approximately 20 μm. Using either of the above methods, clean room fabrication and careful quality control are required.


Pressure driven valves for devices made out of soft polymers (e.g. PDMS) are described in U.S. Nonprovisional Patent Application No. 09/605,520, incorporated herein by reference for all purposes herein.


From the above, it is seen that utilization of structures and methods for efficient and effective movement of fluids are highly desired.


SUMMARY OF THE INVENTION

Embodiments of the present invention relate to electrostatically actuated valve structures formed in elastomeric material. Specifically, a flow channel present in an elastomer block may be opened or closed by the application of a potential difference. In one embodiment of a valve structure in accordance with the present invention, a flexible conductive wire structure is patterned by lithography and etching of a copper/polyimide laminate. The patterned copper wire is positioned on top of elastomer material making up a ceiling of an underlying flow channel. A gold electrode forms the floor of the flow channel. Application of a potential difference between the wire and the underlying gold electrode drives the flexible wire and the elastomer ceiling of the flow channel down into the flow channel, obstructing the flow channel. Removal of the potential difference causes the wire/elastomer structure to relax back into its initial position out of the flow channel, opening the valve.


In an alternative valve structure in accordance with the present invention, flexible patterns of aluminum wire are formed from strips of aluminum/Mylar(®) laminate layers that are cut out from a larger sheet of laminate and then positioned on opposite sides of a control channel, the control channel overlying and connected to the flow channel. Application of a potential difference drives the wires together, closes the control channel, and also brings together the walls of the underlying flow channel to close the valve.


These and other embodiments of the present invention, as well as its advantages and features are described in more detail in conjunction with the text below and the attached Figures.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1A shows a simplified cross-sectional view of one embodiment of an electrostatically-actuated valve structure in accordance with the present invention.



FIG. 1B shows a simplified plan view of the electrostatically actuated valve structure of FIG. 1A.



FIG. 2A shows a microscope plan view of a valve structure in an nonactuated state having a channel with of 100 μm underlying an orthogonally-positioned copper wire having a width of 200 μm. FIG. 2B shows a microscope plan view of the valve structure of FIG. 2A in an actuated state.



FIG. 3 shows a cross-sectional view of an embodiment of a device containing multiple addressable valves in accordance with the present invention.



FIG. 4A shows a simplified cross-sectional view of a valve structure in accordance with a second alternative embodiment of the present invention, in a nonactuated state. FIG. 4B shows a simplified cross-sectional view of the valve structure of FIG. 4A in an actuated state. FIG. 4C shows a plan view of the valve structure of FIGS. 4A and 4B.





DESCRIPTION OF THE SPECIFIC EMBODIMENTS

The subject matter of the present application is related to U.S. nonprovisional patent application No. 09/605,520, filed Jun. 27, 2000. The content of this nonprovisional patent application is incorporated by reference herein.


As described above, it is desirable to find alternative valve structures and methods of their activation for use in various microfluidic applications, for example implementable high density microfluidic devices. Embodiments of the present invention therefore relate to methods and structures for closing channels in elastomeric materials by electrostatic action utilizing flexible conductive materials (e.g. copper/polyimide or aluminum/Mylar(®) laminates) that can readily be patterned for a variety of applications.


I. First Embodiment of a Valve Structure in Accordance with the Present Invention


A. Sources of Materials


RTV 615(™) polydimethylsulfoxide (PDMS) was obtained from General Electric. Pyralux(®) LF 9110 copper/polyimide laminate was obtained from DuPont. Photoresist 5740(™) and Developer CD 20 (™) were obtained from Shipley Microelectronics. Trimethylchlorosilane (TMCS) and FeCl3 were obtained from Sigma. Hexamethyldisilazine (HMDS) was obtained from ShinEtsuMicrosi of Phoenix, Ariz.


B. Fabrication of Mold


A silicon wafer was exposed to HMDS, and then Photoresist 5740 was spun upon a silicon wafer at 2000 rpm for 60 sec. The photoresist/wafer combination was then baked at 95° C. for 60 min. The coated wafer was exposed to UV light through a mask for 2.3 min. to create exposed photoresist regions having widths varying between 30-250 μm. Development of the photoresist with 20% CD20(™) resulted in removal of unexposed photoresist. The wafer and patterned exposed photoresist features formed thereon were hard baked at 130° C. for 30 min. on a hot plate, causing reflow of the photoresist and resulting in rounding of the raised photoresist features.


C. Fabrication of Flow Channel-containing Structure from the Mold


The silicon wafer bearing the raised, rounded photoresist features was next utilized as a mold to fabricate the elastomeric channel-containing structure. The raised photoresist features were treated with TMCS in the gas phase. RTV 615(™) PDMS was mixed at 30:1 (component A: component B) and then spun onto the mold at 2000 rpm for 45 sec., resulting in formation of a PDMS layer having a thickness of around 20 μm over the mold. This PDMS layer was then hardened by baking for 90 min. at 85° C.


D. Fabrication of Flexible Electrically-conductive Wires


A sheet of Pyralux(®) LF9110 laminate having a copper side and a polyimide side was treated with HMDS, and afterwards Photoresist 5740(™) was spun on to the copper side at 2000 rpm for 60 sec.


After baking at 95° C. for 60 min, the photoresist on the copper side of the Pyralux(®) laminate was exposed to light through a mask bearing the control wire pattern. After developing for 60 sec. with 20% CD20(™) to remove the unexposed photoresist, the copper of the laminate exposed during development was etched with FeCl3 solution having a concentration of 1.4 g/ml. Residual developed photoresist overlying the remaining copper wires was removed using acetone to leave the patterned copper control lines lying on top of the polyimide layer of the laminate.


E. Fabrication of Valve Structure from Channel-containing Structure and Flexible Electrically Conductive Wires


The electrically conducting copper control lines were cut out from the larger laminate sheet, turned over, and then placed flat, copper side down, over the 30:1 PDMS channel-containing structure, such that at crossover points the copper wires were positioned orthogonal to the underlying flow channels. Portions of the bare polyimide layer from which copper had previously been removed were flexible and conformed over the copper wires to directly contact the surface of the 30:1 PDMS, such that few if any voids between the polyimide and 30:1 PDMS were created.


Next, 3:1 (component A: component B) PDMS was poured on top of the polyimide layer of the laminate, and the entire combined device was baked for additional 90 min. to bind the 3:1 PDMS elastomer to the polyimide. The purpose of the additional (3:1) PDMS layer was to passivate the underlying flow channel/wire structure.


The entire device was then removed from the mold and transferred to a glass slide bearing a patterned gold layer having a thickness of 5000 Å.



FIG. 1A shows a simplified cross-sectional view of the resulting electrostatically-actuated valve structure. FIG. 1B shows a simplified plan view of the electrostatically actuated valve structure.


Valve structure 100 includes flow channel 102 having walls 104 and arched ceiling 106 formed from 30:1 PDMS elastomer material 108. Arched ceiling 106 reflects the rounded profile of the raised features on the mold created by reflowing the photoresist material, as described above under section I.B.


Floor 110 of flow channel 102 is formed from electrode 112 that is part of gold layer 114 patterned on glass slide 116. Copper wire 118 overlies ceiling portion 106 of elastomer layer 108 and polyimide layer 120 overlies copper wire 118.


During operation of valve structure 100, a voltage is applied to copper wire 118. This voltage creates an attraction between copper wire 118 and underlying gold electrode 112, such that copper wire 118 and arched ceiling portion 106 of 30:1PDMS elastomer 108 are driven downward into flow channel 102, closing valve structure 100. Upon cessation of application of voltage to copper wire 118, the attractive force between copper wire 118 and underlying gold electrode 112 is no longer present, and copper wire 118 and arched membrane portion 106 of 30:1 PDMS elastomer 108 relax upward out of flow channel 102, opening valve structure 100.


The response time for closing of the valve structure shown in FIGS. 1A-1B having a flow channel of width 100 μm was less than 100 ms. The time for relaxation and opening of the valve structure of FIGS. 1A-1B was around 3 seconds following the cessation of the applied voltage. The substantially longer time required for the valve to open following actuation may be due to actuation of valves having empty air-filled flow channels. No change in the performance of the valve structure of FIGS. 1A-1B was observed after 100 close/open cycles.



FIG. 2A shows a microscope plan view of a nonactuated valve structure having a width of flow channel 102 of width 100 μm underlying an orthogonally-positioned copper wire 118 having a width of 200 μm. FIG. 2B shows a microscope plan view of the valve structure of FIG. 2A that is actuated by applying a voltage of 1200V to copper wire 118. FIG. 2B clearly shows deformation (closing) at crossover portion 102a of flow channel 102 resulting from application of a potential difference of 1200V between copper wire 118 and underlying gold electrode 112.


The valve structures in accordance with embodiments of the present invention offer a number of advantages. One advantage is the possibility of utilizing optics to determine the state of the valve. Specifically, a laser beam can be aimed at the elastomer surface at the location of the wire/channel cross-over point. By measuring the deflection of the laser beam, flexion of the copper wire and the underlying elastomer channel forming the roof of the flow channel, and hence the degree of openness of the valve structure, can be determined.


In addition to utilizing optics to detect valve position, flexion of the copper wire and underlying elastomer material as described above could also be employed to create a micromachined switching mirror. Specifically, the wire/channel cross-over point could be formed as a reflective, micro-mirror surface that serves as a target for a light source such as a laser beam. Actuation of the valve would alter the orientation of the micro-mirror surface and change the angle of reflection of a beam aimed at the micro-mirror. Such a switching mirror would have potential applications in a variety of optical display and networking applications.


Another advantage of embodiments of valve structures in accordance with the present invention is their low price and ready integration with existing technology. Specifically, elastomer materials in which the flow channels are formed are readily available in bulk quantities. Moreover, the photoresist and photoresist development chemicals utilized to create the mold and to pattern the copper wire from the laminate sheet are widely used in conventional semiconductor processing.


Yet another important advantage of embodiments of the present invention is the ability to form operational multi-valve structures in which the electrically conducting control wires cross over one another. This is illustrated below in conjunction with FIG. 3, which shows a cross-sectional view of an embodiment of a device containing multiple addressable valves in accordance with the present invention.


Multiple valve device 300 includes flow channel 302 having walls (not shown in FIG. 3 cross-section) and ceiling 304 formed from 30:1 PDMS elastomer material 306. Floor 308 of flow channel 302 is formed from electrode 310 that is part of gold layer 312 patterned over glass slide 314. First copper wire 316 of the first laminate overlies flow channel 302 at first valve location 318, and first polyimide layer 320 overlies first copper wire 316.


Second copper wire 322 of the second laminate overlies first polyimide layer 320 and overlies 30:1 PDMS elastomer material 306 at second valve location 324. Second polyimide layer 326 overlies second copper wire 322 of the second laminate. 3:1 RTV PDMS 328 overlies second polyimide layer 326.


Because of the highly insulating properties of first polyimide layer 320, a voltage applied to second copper wire 322 will not affect the application of voltage to underlying first copper wire 316, and vice versa. In this manner, a multilayer structure of overlapping electrical wires may be fabricated utilizing successive layers of patterned laminate material, analogous to formation of multilayer interconnect metallization structures of integrated circuits.


II. Second Embodiment of a Valve Structure in Accordance with the Present Invention


While embodiments of valve structures described above in connection with FIGS. 1A-3 utilize flexible electrical control wires fabricated from copper/polyimide laminate layers overlying the flow channel, the present invention is not limited to this particular structure. Other structures and/or materials could be utilized to control the flow liquid and gaseous materials, and still remain within the scope of the present invention.


For example, in both embodiments described above in conjunction with FIGS. 1A-3, an electric field is applied across the flow channel during actuation of the valve structure. However, in an electric field ions present in the flow channel may migrate to a side of the flow channel proximate to one of the charged poles (wire or electrode). This possible migration of charged species could affect the magnitude of the electrostatic force applied to the valve.


In addition, substances in the flow channel that are susceptible to electrochemical reaction (e.g. electrolysis) may undergo electrolysis during actuation due to contact with the electrode and the potential within the flow channel.


Therefore, in accordance with an alternative embodiment of the present invention, the flow channel of a valve structure is closed by application of an electrostatic force across a control channel overlying the flow channel, rather than across the flow channel itself. Closing the upper control channel in turn forces the flow channel to close. Operation and fabrication of this alternative valve structure is illustrated in detail in conjunction with FIGS. 4A-4C below.


A. Sources of Materials


RTV 615(™) PDMS was obtained from General Electric. Aluminum/Mylar(®)laminate (10 μm, 12 Ohm/in2 was obtained from Steinerfilm, Inc. of Williamstown, Mass. Photoresist 5740(™) and Developer CD 20(™) were obtained from Shipley Microelectronics. Trimethylchlorosilane (TMCS) was obtained from Sigma. HMDS was obtained from ShinEtsuMicrosi of Phoenix, Ariz. Silver epoxy was obtained from Chemtronics of Kennesaw, Ga.


B. Fabrication of First Mold for Flow Channel-containing Portion


A silicium wafer was treated with HMDS in the gas phase for 1 min. Photoresist 5740 was spun on the wafer at 2000 rpm for 60 sec. and baked for 60 min. at 90° C. After exposing with UV through a mask containing the desired pattern for 2.3 min. the photoresist was developed using 20% Developer CD-30(™) to produce raised line structures of between 30 and 250 μm in width. In order to round these photoresist features, the mold was then heated for 30 min. at 130° C. on a hot plate.


C. Fabrication of Flow Channel-containing Portion


30:1 (component A: component B) RTV 615(™) was spun at 2000 rpm for 45 sec. on the first mold fabricated above after treatment with TMCS in the gas phase. The wafer was then baked for 60 minutes at 80° C.


2 mm wide strips of Mylar(®)/Aluminum laminate were cut out by hand from a larger laminate sheet and then placed, Aluminum side up, on top of the 30:1 elastomer, orthogonal to the underlying flow channel. A second thin layer of 30:1 (component A: component B) RTV 615(™) was spun at 4000 rpm for 30 sec. over the aluminum, and the wafer was baked again for 60 min. at 80° C.


D. Fabrication of Control Channel-containing Portion


3:1 (component A: component B) RTV 615(™) was spun at 2000 rpm for 45 sec. on a second mold bearing a pattern of raised lines of photoresist having a width of 100 μm. These raised lines are formed by lithography in the same manner as described above for formation of the first mold, and the raised lines occupy the space that will later serve as the control channels of the device.


The second wafer was then baked for 60 min. at 80° C. A second set of 2 mm wide strips of Mylar(®)/aluminum laminate were cut out by hand from a larger laminate sheet and placed, aluminum side down, over the control channels. A second 3:1 (component A: component B) RTV 615(™) material was then poured on top of the second wafer (ca. 5 mm) and the second wafer baked again for 60 min. at 80° C.


E. Assembly of Valve Structure


The valve structure in accordance with an alternative embodiment of the present invention was assembled by peeling the control channel-containing portion off of the second wafer, and placing the control channel-containing portion over the flow channel-containing portion. During this step, the control channels and flow channels were oriented orthogonal to one another.


The combined structure was then baked for 1 hour at 80° C. to bind the top 30:1 RTV 615(™) elastomer layer of the flow channel-containing portion to the first 3:1 RTV 615(™) elastomer material of the control channel-containing portion. The complete device was then peeled carefully from the first wafer and placed against a glass slide to enclose the flow channel. Contacts to the aluminum control strips were created utilizing silver epoxy.



FIG. 4A shows a simplified cross-sectional view of a valve structure in accordance with a second alternative embodiment of the present invention, in a non-actuated state. FIG. 4B shows a simplified cross-sectional view of the valve structure of FIG. 4A in an actuated state. FIG. 4C shows a plan view of the valve structure of FIGS. 4A and 4B.


Valve structure 400 includes control channel-containing portion 402 on top of flow channel-containing portion 404.


Flow channel-containing portion 404 includes flow channel 406 having walls 408 and arched ceiling 410 formed from first 30:1 RTV 615(™) material layer 412 that was poured over the first mold. Arched ceiling 410 reflects the rounded profile of the raised features on the first mold that were created by reflowing the photoresist material, as described above under section II.B. Floor 411 of flow channel 406 is formed from underlying glass plate 413.


First Mylar(®) strip 414 of first laminate 416 overlies RTV 615(™) layer 412, and first aluminum strip 418 overlies first Mylar(®) strip 414. Second RTV 615(™) material layer 420 overlies first aluminum strip 418.


Control channel-containing portion 402 includes control channel 422 having walls and ceiling formed from first 3:1 RTV 615(™) elastomer layer 424, and floor 426 made up of second 30:1 RTV 615(™) material layer 420 of flow channel-containing portion 404. Second aluminum strip 428 of second laminate 430 overlies 3:1 RTV 615(™) material layer 424, and second Mylar(®) strip 432 of second laminate 430 overlies second Aluminum strip 428. Second 3:1 RTV 615(™) material layer 434 overlies second Mylar(®) strip 432.


During actuation of valve 400, a potential difference is applied across first aluminum strip 418 and second aluminum strip 428. The electric field generated by this potential difference creates an attractive actuation force between aluminum strips 418 and 428. As a result, aluminum strips 418 and 428 are drawn toward one another due to flexibility of the elastomer and the freedom of movement imparted by the intervening control channel 422.


Upward movement of first aluminum strip 418 forces walls 408 of flow channel 406 to move together, closing flow channel 406.


Upon cessation of application of the potential difference across aluminum strips 418 and 428, the attractive force between strips 418 and 428 vanishes. Strips 418 and 428 relax back to their initial positions, such that control channel 422 and flow channel 406 open.


By applying 1600V over the control channel, the inventors have discovered that the flow channel is significantly compressed (closed). Times for closing and opening of this alternative valve structure are currently being further investigated.


Given the variety of embodiments of the present invention just described, the above description and illustrations should not be taken as limiting the scope of the present invention which is defined by the appended claims.

Claims
  • 1. A valve structure comprising: a first elastomeric layer defining a flow channel having walls and a deflectable ceiling;a first electrode positioned on top of the first elastomeric layer over the deflectable ceiling of the flow channel;a second elastomeric layer positioned over the first electrode;a third elastomeric layer positioned over the second elastomeric layer, the third elastomeric layer defining a control channel having walls and a ceiling, the second elastomeric layer forming a floor of the control channel; anda second electrode positioned on top of the third elastomeric layer over the control channel, such that application of a potential difference between the first electrode and the second electrode drives the first electrode and the second electrode together, causing the walls of the control channel and of the underlying flow channel to be driven together.
  • 2. The valve of claim 1 further comprising a reflective micromirror surface positioned over the ceiling of the flow channel, wherein a physical orientation of the reflective micromirror surface altered when the deflectable ceiling of the flow channel is driven into the flow channel.
CROSS-REFERENCE TO RELATED APPLICATION

This nonprovisional patent application claims priority from provisional patent application No. 60/246,469, filed Nov. 6, 2000. The text of this provisional patent application is hereby incorporated by reference.

STATEMENT AS TO RIGHTS TO INVENTIONS MADE UNDER FEDERALLY SPONSORED RESEARCH AND DEVELOPMENT

Work described herein has been supported, in part, by Air Force Research Organization grant DAAD 19-00-1-0392. The United States Government may therefore have certain rights in the invention.

US Referenced Citations (95)
Number Name Date Kind
3570515 Kinner Mar 1971 A
3747628 Holster et al. Jul 1973 A
3839176 McCoy et al. Oct 1974 A
4046159 Pegourie Sep 1977 A
4119368 Yamazaki Oct 1978 A
4153855 Feingold May 1979 A
4245673 Bouteille et al. Jan 1981 A
4373527 Fischell Feb 1983 A
4399219 Weaver Aug 1983 A
4434704 Surjaatmadja Mar 1984 A
4575681 Grosso et al. Mar 1986 A
4662710 ten Berge May 1987 A
4898582 Faste Feb 1990 A
4992312 Frisch Feb 1991 A
5085562 Van Lintel Feb 1992 A
5088515 Kamen Feb 1992 A
5096388 Weinberg Mar 1992 A
5126115 Fujita et al. Jun 1992 A
5164558 Huff et al. Nov 1992 A
5171132 Miyazaki et al. Dec 1992 A
5224843 Van Lintel Jul 1993 A
5259737 Kamisuki et al. Nov 1993 A
5265327 Faris et al. Nov 1993 A
5290240 Horres, Jr. Mar 1994 A
5307186 Izumi et al. Apr 1994 A
5323999 Bonne et al. Jun 1994 A
5336062 Richter Aug 1994 A
5346372 Naruse et al. Sep 1994 A
5375979 Trah Dec 1994 A
5376252 Ekstrom et al. Dec 1994 A
5400741 DeTitta et al. Mar 1995 A
5423287 Usami et al. Jun 1995 A
5452878 Gravesen et al. Sep 1995 A
5529465 Zengerle et al. Jun 1996 A
5574893 Southgate et al. Nov 1996 A
5593130 Hansson et al. Jan 1997 A
5642015 Whitehead et al. Jun 1997 A
5656155 Norcross et al. Aug 1997 A
5659171 Young et al. Aug 1997 A
5660370 Webster Aug 1997 A
5665070 McPhee Sep 1997 A
5681024 Lisec et al. Oct 1997 A
5705018 Hartley Jan 1998 A
5759014 Van Lintel Jun 1998 A
5775371 Pan et al. Jul 1998 A
5788468 Dewa et al. Aug 1998 A
5836750 Cabuz Nov 1998 A
5839722 Berlin et al. Nov 1998 A
5842787 Kopf-Sill et al. Dec 1998 A
5854684 Stabile et al. Dec 1998 A
5875817 Carter Mar 1999 A
5876187 Forster et al. Mar 1999 A
5932799 Moles Aug 1999 A
5942443 Parce et al. Aug 1999 A
5971355 Biegelsen et al. Oct 1999 A
5997961 Feng et al. Dec 1999 A
6007309 Hartley Dec 1999 A
6043080 Lipshutz et al. Mar 2000 A
6089534 Biegelsen et al. Jul 2000 A
6123769 Sanjoh Sep 2000 A
6155282 Zachary et al. Dec 2000 A
6174365 Sanjoh Jan 2001 B1
6246330 Nielsen Jun 2001 B1
6296673 Santarsiero et al. Oct 2001 B1
6329209 Wagner et al. Dec 2001 B1
6345502 Tai et al. Feb 2002 B1
6358387 Kopf-Sill et al. Mar 2002 B1
6375871 Bentsen et al. Apr 2002 B1
6376971 Pelrine et al. Apr 2002 B1
6409832 Weigl et al. Jun 2002 B2
6488832 Heller Dec 2002 B2
6488872 Beebe et al. Dec 2002 B1
6520936 Mann Feb 2003 B1
6541071 Bookbinder et al. Apr 2003 B1
6667124 Suenaga et al. Dec 2003 B2
6689473 Guire et al. Feb 2004 B2
6713327 Leedy Mar 2004 B2
6716378 Yang et al. Apr 2004 B2
6765279 Leedy Jul 2004 B2
6767706 Quake et al. Jul 2004 B2
6829753 Lee et al. Dec 2004 B2
6847153 Balizer Jan 2005 B1
6866785 Zare et al. Mar 2005 B2
6884346 Zare et al. Apr 2005 B2
20010027745 Weigl et al. Oct 2001 A1
20020005354 Spence et al. Jan 2002 A1
20020014673 Leedy Feb 2002 A1
20020037499 Quake et al. Mar 2002 A1
20020045297 Leedy Apr 2002 A1
20020058332 Quake et al. May 2002 A1
20020108096 Lee et al. Aug 2002 A1
20030080442 Unger May 2003 A1
20030134129 Lammertink et al. Jul 2003 A1
20040248167 Quake et al. Dec 2004 A1
20050065735 Lee et al. Mar 2005 A1
Foreign Referenced Citations (24)
Number Date Country
0 592 094 Apr 1994 EP
0 703 364 Mar 1996 EP
0 706 004 Apr 1996 EP
0 779 436 Jun 1997 EP
0 829 360 Mar 1998 EP
0 845 603 Jun 1998 EP
0 999 055 May 2000 EP
1 065 378 Jan 2001 EP
2 097 692 Nov 1982 GB
2 155 152 Sep 1985 GB
2 308 460 Jun 1997 GB
WO 9807069 Feb 1998 WO
WO 9900655 Jan 1999 WO
WO 9904361 Jan 1999 WO
WO 9917093 Apr 1999 WO
WO 9952633 Oct 1999 WO
WO 0000678 Jan 2000 WO
WO 0043748 Jul 2000 WO
WO 0060345 Oct 2000 WO
WO 0106529 Jan 2001 WO
WO 0106575 Jan 2001 WO
WO 0109595 Jan 2001 WO
WO 0109595 Feb 2001 WO
WO 0282047 Oct 2002 WO
Related Publications (1)
Number Date Country
20020109114 A1 Aug 2002 US
Provisional Applications (1)
Number Date Country
60246469 Nov 2000 US