Electrostatic voltmeter with current source load

Abstract

An electrostatic voltmeter (ESV) and a method thereof provides an electrical signal proportional to an electrostatic potential. The ESV includes a high voltage input section that receives a high voltage signal representative of an electrostatic potential. The high voltage signal input section then generates a current signal representative of the electrostatic potential. The current signal is applied to a control and sensing circuit. A high voltage current source is connected between the high voltage input section and a high voltage potential. The high voltage current source acts as an active load for the control and sensing circuit. A voltage level determining section is connected to a node between the high voltage input section and the high voltage current source for providing an electrical signal proportional to the electrostatic potential. The EVS disclosed herein is particularly useful in measuring electrostatic potential of a photoreceptor to control imaging in an electrophotographic imaging system.

Description

FIELD OF THE INVENTION

[0002] The invention relates generally to the measurement of electrostatic potentials, but more specifically to an electrostatic voltmeter having a current source load working in a high voltage environment.

BACKGROUND OF THE INVENTION

[0003] In the past, probes and sensing circuits have not been as accurate as they could have been. Prior systems employed passive load devices to measure electrostatic potential and were disadvantageous because of insufficient current to charge stray capacitances when a switching transistor was turned off. Another disadvantage is that a rather complex mirror system was required to measure the electrostatic potential.

[0004] A device constructed according to one embodiment of the present invention is capable of measuring electrostatic potentials with insignificant current flow. Generally, such a device includes a probe working in conjunction with a circuit that receives signals from the probe and produces an output signal. The output signal, indicative of an electrostatic potential, may be used to drive an indicator or to control a process as a function of the measured electrostatic potential. Thus, the present invention may be used in the printing arts and, more particularly, in an electrophotographic reproduction system to control a xerographic process. Electrostatic voltmeters, or ESVs as they are called, are particularly well suited for measuring the surface charge potential of a photoreceptor which, in turn, allows automated adjustment of machine characteristics to achieve a high quality reprographic output.

SUMMARY OF THE INVENTION

[0005] It is a general object of the present invention to provide an ESV and method thereof that generates an electrical signal representing an electrostatic potential of an object.

[0006] To achieve this and other objects, the present invention provides an ESV having a probe and a sensing circuit that provides an electrical signal proportional to a measured electrostatic potential. The circuit comprises a high voltage input section that is subjected to an electrostatic potential to be measured. The high voltage input section generates a first signal representative of the electrostatic potential. The circuit further includes a high voltage current source connected between the high voltage input section and a high voltage potential. A voltage level determining section is connected to a node between the high voltage input section and the high voltage current source to provide an electrical signal that is proportional to the electrostatic potential.

[0007] According to another aspect of the present invention, an apparatus that provides an electrical signal proportional to an electrostatic potential comprises a high voltage current source load, which is active rather than passive. A drain circuit of the high voltage current source load connects to sensor circuitry. A source circuit of the high voltage current source load connects to a high voltage potential. A gate circuit of the high voltage current source load connects to a suitable biasing circuit to set the drain current in a high voltage MOSFET. A voltage level-determining device connects to a node between the sensor circuitry and the source circuit for providing an electrical signal that is proportional to the electrostatic potential being measured.

[0008] According to yet another aspect of the present invention, an apparatus for providing an electrical signal proportional to an electrostatic potential comprises an active load connected to a sensor circuit. The active load includes a drain circuit connected to the sensor circuitry, a source circuit connected to a high voltage potential, and a gate circuit connected to a high voltage power supply regulator. A voltage level-determining device is connected to a node between the sensor circuit and the source circuit for providing an electrical signal that is proportional to an electrostatic potential.

[0009] In addition, the invention includes a method of measuring the electrostatic potential of an object. The method includes the steps of placing a probe at or in the vicinity of an object having an electrostatic potential on the surface thereof, and generating a first signal that is representative of the electrostatic potential. The method includes applying the first signal to an input of a sensor circuit for controlling the current flow within. The method further includes connecting an active load between the sensor circuit and a high voltage potential. Finally, the method uses a voltage level-determining device that is connected to a node between the sensor circuit and the active load to provide an electrical signal that is proportional to the electrostatic potential.

[0010] Other objects, features, and advantages of the present invention will become apparent when considered in conjunction with the accompanied drawings. The invention, though, is pointed out with particularity by the appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

[0011] FIG. 1 illustrates an ESV in accordance with a preferred embodiment of the present invention.

[0012] FIG. 2 is an electrical schematic of the ESV in accordance with an embodiment of the present invention.

[0013] FIG. 3 illustrates a portion of the schematic of FIG. 2 in more detail.

DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

[0014] FIG. 1 illustrates an electrostatic voltmeter (ESV) 10 according to an embodiment of the present invention. The ESV 10 generates a low voltage electrical signal V in response to a signal from a sensing electrode 14, which lies in proximity to a charged surface 12 under measurement. Surface 12, for example, is a photoreceptor in a xerographic reproduction machine and has an electrostatic charge. During operation of the machine, it is desired to measure the potential of surface 12 in order to control the imaging process.

[0015] Sensing electrode 14, when occluded in a continuous manner such as by a vibrating chopper or tuning fork, supplies an input signal to input node 18 as a varying voltage or current signal that may be used to determine the electrostatic potential on surface 12. A high-voltage input stage 20 receives the input signal from input node 18 to produce a current signal. Subsequently, the current signal is passed to a control and signal processing circuit 24 where it is converted to the low voltage electrical signal V. The low voltage electrical signal is proportional to the electrostatic potential on surface 12.

[0016] FIG. 2 shows the ESV 10 of FIG. 1 in greater detail. A gate of an NMOS field effect transistor 30 receives a signal indicative of the potential in sensing probe 14 which, due to its proximity to surface 12 of an electrostatically charged object, is capacitively coupled to the surface 12. Transistors 30 and 32 form a cascode high-voltage depletion-mode NMOS driver that operates in the range of about 1700 volts. A protection device 35, e.g. zener diode, is connected between the gate of transistor 30 and a junction 38. The protection device 35 can withstand an electrostatic discharge voltage of approximately 2 KV and serves to protect the transistor 30 from overvoltage damage.

[0017] To occlude or modulate the signal of sensing electrode 14, a modulator (not shown) or similar mechanism either vibrates or occludes the sensor electrode 14. Numerous methods are known to achieve the modulation of capacitive couplings. For example, the single-beam modulator described in U.S. Pat. No. 5,212,451 by Werner, the contents of which are incorporated herein by reference, provides suitable modulation of the signal produced by sensing electrode 14.

[0018] Because transistor 30 is slightly in depletion mode when the gate-to-source voltage Vgs is approximately equal to zero volts, transistor 30 is active because of the small amount of current passing through it. Thus, the modulation of the signal at the gate of transistor 30 also modulates the current through the source-to-drain path of transistor 30. More specifically, transistor 30 has a nominal drain-to-source DC current Id1 of approximately ten microamps that flows through node 39. Variations in voltage in the input node 18, which is connected the gate of transistor 30, impress an AC component in the current Id1 that flows through node 39.

[0019] More specifically, Q=CV, wherein C is the capacitance between electrode 14 and surface 12, V is the voltage between electrode 14 and surface 12, and Q is the charge between detector electrode 14 and surface 12. A current i, flowing through a 20 megaohm resistor 34 to produce a gate-to-source voltage Vgs on transistor 30, can be expressed as:

i =(dQ/dt)=V(dC/dt)+C(dV/dt).

[0020] The dC/dt term is a function of the modulation of the occluded capacitive coupling described above.

[0021] An AC signal processing circuitry 72 processes the AC component of the current signal Id1 that flows through node 39, by amplifying, demodulating, and integrating the AC component of the signal. The AC component reflects the modulation of the signal received by sensing electrode 14 and the voltage difference between electrode 14 and surface 12. The AC signal processing circuitry 72 effects the supply of a processed DC current signal to the emitter of a pnp transistor 94 via a level shifting circuit (described hereafter). Transistor 94 supplies its collector current Ic to junction 38 to provide DC current feedback to node 38 where it is added to the currents from the high voltage input stage (described hereafter) and high voltage current source (described hereafter) thereby generating a voltage across resistor 70 (described hereafter) and causing the source voltage of transistor 30 to track the voltage on surface 12.

[0022] To extract the AC component from the combined DC and AC signals at node 39 and to supply the input of circuitry 72 with the AC signal, ESV 10 subtracts a DC current signal Id2 flowing through a node 29 from the current signal Id1 flowing through node 39. A subcircuit, including NMOS field effect transistor 31, determines the DC current signal Id1 flowing through node 29. The cascode circuit made from low voltage depletion transistor 30 and high voltage transistor 32 along with the cascode circuit made from low voltage depletion transistor 31 and high voltage transistor 33 form a closely matched integrated differential input stage that operates in the 1700 volt range. Protection devices 35 and 37 are zener diodes are also integrated into the input stage and will withstand an electrostatic discharge voltage of approximately 2 KV. Resistor 36 is a 20-megaohm resistor and is connected between the gate circuit of transistor 31 and junction 38. It is used to balance out any DC gate voltage due to any gate current in transistor 30 passing through resistor 35 with an equivalent DC gate voltage on transistor 31 across R36. Transistor 31 has a nominal drain-to-source current Id2 of approximately ten microamps.

[0023] Transistors 50, 52, 54, and 56 constitute a first current mirror system that generates a current tracking the current that flows through node 39 and onto the input of AC signal processing circuitry 72. Transistors 58, 60, 62, and 64 constitute a second current mirror that generates a current through transistor 65, which tracks the current that flows through node 29. Thus, transistors 65 and 57 effectively subtract the current flow through node 29 from the current flow through node 39. The resulting signal is an AC signal with the DC component removed.

[0024] AC signal processing circuitry 72 generates an output signal to a control pnp transistor 94 via a level shift circuit. The level shift circuit comprises resistors (80, 84, 91, and 92) and MOSFET transistors (51, 53, 55, 59, 82, 86, and 88).

[0025] The level shifting circuit translates the output of AC signal processing circuitry 72, which is in the range of 0-5 volts, to a current signal in the range of 20-150 microamps. The output of the level shifting circuit is applied to the emitter of pnp transistor 94. The base of transistor 94 is held at a constant voltage so that by controlling the current supplied to the emitter of transistor 94 a current is supplied to junction 38.

[0026] In accordance with an embodiment of the invention, an active current source load 40 is also connected to junction 38. The active current source load 40 comprises a MOSFET 41 having its “drain” terminal connected to the high voltage input stage, the “source” terminal connected to a negative high voltage source (−HV) via a resistor 43, and the “gate” terminal connected to a high voltage power supply regulator via a resistor 46. The active current source load 40 further includes a zener diode 45 connected between the gate of MOSFET 41 and the high voltage source HV and a resistor 46 connected between the gate of MOSFET 41 and ground potential. The negative high voltage source is preferably at −1200 volts.

[0027] A voltage level determining section is connected to junction 38 between the high voltage sensor circuit section, including MOSFET 30, the active current source load 40, and the collector of high voltage transistor 94. The voltage level determining section comprises an operational amplifier 66 that is connected to the junction 38 via a resistor 70. Resistor 70 is also the resistor load which the sum of the currents at junction 38 goes through in order to generate the feedback voltage at junction 38. With the use of a feedback resistor 68, the operational amplifier 66 generates a low DC voltage indicative of the electrostatic surface potential.

[0028] The low DC voltage may then be used as input for a display device (not shown) to indicate the voltage level on surface 12, or used to control an electrostatic process as a function of the measured electrostatic potential. The output of the operational amplifier 66 also supplies a minimum and maximum determining device 100. The minimum and maximum determining device 100 tracks and hold either the minimum or maximum values as supplied thereto by the operational amplifier 66.

[0029] When the ESV 10 is viewed as a whole device, certain components can be considered as being part of a control circuit. The control section includes the first pair of MOSFETs 50/52, second pair of MOSFETs 58/60, third pair of MOSFETs 54/56, fourth pair of MOSFETs 62/64, fifth pair of MOSFETs 51/53, sixth pair of MOSFETs 55/59, seventh pair of MOSFETs 57/65, MOSFETs 82/86/88, circuitry 72, and pnp transistor 94. The high voltage current source 40 acts as a load for transistor 94 by causing a current Ic to flow through transistor 94 and into MOSFET 41.

[0030] FIG. 3 shows an exemplary AC signal processing circuitry 72 in more detail. The AC signal processing circuitry 72 includes a buffer circuit having an operational amplifier 73 and a feedback resistor 74, a variable gain and low pass filter circuit 75, and an integrator including resistor 76, operation amplifier 77, and capacitor 78. The AC signal processing circuitry 72 may include a dynamically limited amplifier similar to that disclosed in the U.S. Pat. No. 5,204,636 for a “Dynamic Limiting Circuit for an Amplifier,” by Werner et al., the contents of which are incorporated by reference.

[0031] The illustrated embodiment provides a device capable of measuring electrostatic potentials with insignificant current flow into the ESV. The illustrated embodiment includes an application specific integrated circuit (ASIC) ESV that uses a high voltage current source as a load for a high voltage input stage. The high voltage current source further serves as a load for a control pnp transistor to resemble a transconductance amplifier output stage. One advantage of the invention is that the current available from the current source load is constant and independent of the voltage across it.

[0032] Another advantage is that the load is active to facilitate charging of stray capacitances in the system, and more current can be programmed into an “output stage”. When the output is driven positive, the integrator stage of FIG. 3 supplies a voltage output to the voltage-to-current conversion stage including resistor 80 and the current mirror system consisting of transistors 82, 88,51, 53, 55, and 59, which supplies the current needed to the emitter of high voltage PNP transistor 94 so that the collector of control transistor 94 supplies the required current to effect a current supply to resistor load 70 to cause junction 38 to go positive. When the output is driven negative, the integrator stage supplies a voltage which decreases the current from PNP transistor 94 and the high voltage current source pulls the output voltage negative. Since the current from the high voltage current source is independent of the voltage across it over the range of 0 to −1 KV, enough current is available over the full output range to charge stray capacitances. Since the current from transistor 94 has been cut back, the available current to charge the stray capacitances actually increases as the source terminal approaches the negative HV power supply.

[0033] Yet another advantage of the invention is that there is sufficient current available, even near the HV negative rail, to use two simple resistors and a single operational amplifier configuration to directly measure the high voltage output.

[0034] Additional advantages and modifications will readily occur to those skilled in the art. The invention in its broader aspects is therefore not limited to the specific details, circuit components or the values thereof, representative apparatus, or illustrative embodiments shown and described. Accordingly, departures may be made from such details without departing from the spirit and the scope of the invention. The invention is defined in the appended claims.

Claims

1. An apparatus for measuring an electrostatic potential comprising: a high voltage input section that receives a first signal representative of an electrostatic potential, said input section generating a first signal representative of said electrostatic potential; a high voltage current source connected between said signal input section and a high voltage source; and a voltage level determining circuit connected to a junction between said high voltage signal input section and said high voltage current source for providing an electrical signal proportional to the electrostatic potential.

2. The apparatus as claimed in claim 1 further including a control circuit connected between said junction and a medium voltage source.

3. The apparatus as claimed in claim 1 wherein said input section is connected between a medium voltage source and said high voltage source.

4. The apparatus as claimed in claim 1 wherein said high voltage current source includes a high voltage MOSFET connected between said junction and said high voltage source, wherein said high voltage MOSFET acts as a load for said control circuit.

5. The apparatus as claimed in claim 1 wherein said high voltage current source includes a high voltage MOSFET having a drain terminal connected to said junction, a source terminal connected to said high voltage source, and a gate terminal connected to a suitable biasing circuit to control the drain current of said MOSFET.

6. The apparatus as claimed in claim 5 wherein the biasing circuit of said high voltage current source further includes a first resistor connected between said source and said high voltage source, a second resistor connected between a power source suitable for activating a zener diode in a zener mode and said gate, and a zener diode connected between said gate and said high voltage source.

7. The apparatus claimed in claim 6 wherein said power source suitable for activating the zener diode is ground potential.

8. A method of measuring the electrostatic potential of an object comprising the steps of: placing a probe in the vicinity of an object having an electrostatic potential on the surface thereof; generating a first signal that is representative of said electrostatic potential; applying said first signal to an input of a sensor circuit; connecting a high voltage current source to said sensor circuit and using said high voltage current source as a load for said sensor circuit; and determining a voltage level at a node between said sensor circuit and said high voltage current source for providing an electrical signal that is proportional to the electrostatic potential.

9. An apparatus for measuring an electrostatic potential comprising: a high voltage input section for receiving a first signal representative of an electrostatic potential, said input section generating a first signal representative of said electrostatic potential; a high voltage current source load connected to said high voltage input section, said high voltage current source load including an active device having a first connection connected to said high voltage input section, a second connection connected to a high voltage source, and a third connection connected to a suitable biasing network; and a voltage level determining signal section connected to a junction between said high voltage input section and said first connection for providing a sensed electrical signal that is proportional to an electrostatic potential.

10. The apparatus as claimed in claim 9 wherein said high voltage current source load further includes a first resistor connected between said second connection and said high voltage source, a second resistor connected between said power source suitable for activating said zener diode in the zener mode and said third connection, and an zener diode connected between said third connection and said high voltage source.

11. The apparatus as claimed in claim 9 further including a control section connected between said junction and a medium voltage source.

12. The apparatus as claimed in claim 9 wherein said high voltage input section is connected between a medium voltage source and a high voltage source.

13. The apparatus as claimed in claim 11 wherein said active device is a high voltage MOSFET connected between said junction and a high voltage source, wherein said high voltage MOSFET acts as a load for said control section.

14. The apparatus as claimed in claim 9 wherein said high voltage current source load includes a high voltage MOSFET having a source connected to said junction, a drain connected to a high voltage source, and a gate circuit connected to a high voltage power supply regulator.

15. An apparatus for providing an electrical signal proportional to an electrostatic potential, comprising: a high voltage input section for receiving a first signal representative of an electrostatic potential, said high voltage input section generating a first signal representative of said electrostatic potential; an active load connected to said high voltage input section, said active load including a first connection connected to said high voltage input section, a second connection connected to a high voltage source, and a third connection connected to a high voltage power supply regulator; and a voltage level determining section connected to a junction between said high voltage input section and said first connection for providing an electrical signal that is proportional to the electrostatic potential.

16. A method of measuring an electrostatic potential of an object using an active load comprising: generating a first signal that is representative of said electrostatic potential; using an active device, acting as a load, for receiving said first signal; and determining a voltage level at a node connected to said active device for providing a second signal that is proportional to the electrostatic potential.