BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a conceptual diagram showing the configuration of a SPECT apparatus as a radiological imaging apparatus according to the present invention;
FIG. 2 shows a trapping loss peak value distribution of a semiconductor detection element;
FIG. 3 shows a peak value distribution variation (transfer of mode) according to an amount of superimposing noise of the semiconductor detection element;
FIG. 4 shows nonlinearity of a mode position in an energy spectrum of the semiconductor detection element; and
FIG. 5 shows a relationship between a noise variation and an ROI.