Number | Name | Date | Kind |
---|---|---|---|
5034791 | Kameyama et al. | Jul 1991 | A |
5194923 | Vinal | Mar 1993 | A |
5348897 | Yen | Sep 1994 | A |
5648920 | Duvvury et al. | Jul 1997 | A |
6069485 | Long et al. | May 2000 | A |
6166558 | Jiang et al. | Dec 2000 | A |
6229164 | Momose et al. | May 2001 | B1 |
Entry |
---|
“Experimental Determination of Electrical, Metallurgical, and Physical Gatge Lengths of Submicron MOSFET's”, Xing Zhou and Yong Lim, Modeling and Simulation of Microsystems 2001, (www.cr.org), ISBN 0-9708275-0-4, pp. 44-47. |
“A New ‘Critical-Current at Linear-Threshold’ Methof for Direct Extraction of Deep-Submicron MOSFET Effective Channel Length”, IEEE Transactions on Electron Devices, vol. 46, No. 7, Jul., 1999, X. Zhou, K. Y. Lim and D. Lim, 3 pages. |