Many microdevices include substrates having features formed therein. Existing feature shapes, dimensions, and/or orientations can limit microdevice design.
The same components are used throughout the drawings to reference like features and components wherever feasible. Alphabetic suffixes are utilized to designate different embodiments.
a illustrate diagrammatic representations of a cross-sectional view of a portion of an exemplary print cartridge.
a-4b illustrate diagrammatic representations of top and bottom views respectively of the substrate illustrated in
a illustrates a diagrammatic representation of a perspective cut-away view of the exemplary substrate illustrated in
b illustrates a diagrammatic representation of a cross-sectional view of the exemplary substrate illustrated in
c illustrates a diagrammatic representation of a cross-sectional view of an alternative configuration of the view represented in
a-8b illustrate a diagrammatic representation of cross-sectional views of an exemplary substrate in accordance with one exemplary embodiment.
a-9b illustrate a diagrammatic representation of cross-sectional views of an exemplary substrate in accordance with one exemplary embodiment.
a-10b illustrate a diagrammatic representation of cross-sectional views of an exemplary substrate in accordance with one exemplary embodiment.
a-11c illustrate process steps for forming an exemplary substrate in accordance with one exemplary embodiment.
The embodiments described below pertain to methods and systems for forming features in a substrate and to microdevices incorporating such substrates. Feature(s) can have various configurations including blind features and through features. A blind feature passes through less than an entirety of the substrate's thickness. A feature which extends totally through the thickness becomes a through feature. A blind feature may be further processed into a through feature during subsequent processing steps.
Exemplary substrates having features formed therein can be utilized in various microdevices such as microchips and fluid-ejecting devices among others. Fluid-ejecting devices such as print heads are utilized in printing applications. Fluid-ejecting devices also are utilized in medical and laboratory applications among others. Exemplary substrates also can be utilized in various other applications. For example, display devices may comprise features formed into a glass substrate to create a visual display.
Several embodiments are provided below where the features comprise fluid-handling slots (“slots”). These techniques can be applicable equally to other types of features formed into a substrate.
Slotted substrates can be incorporated into fluid ejection devices such as ink jet print heads and/or print cartridges, among other uses. The various components described below may not be illustrated to scale. Rather, the included figures are intended as diagrammatic representations to illustrate to the reader various inventive principles that are described herein.
Print cartridge 202 is configured to have a self-contained fluid or ink supply within cartridge body 206. Other print cartridge configurations may alternatively or additionally be configured to receive fluid from an external supply. Other exemplary configurations will be recognized by those of skill in the art. Though the term ink is utilized below, it should be understood that fluid-ejecting devices can deliver a diverse range of fluids.
Reliability of print cartridge 202 is desirable for proper functioning of printer 100. Further, failure of print cartridges during manufacture increases production costs. Print cartridge failure can result from a failure of the print cartridge components. Such component failure can be caused by cracking. As such, various embodiments described below can provide print heads with a reduced propensity to crack.
Reliability of print cartridge 202 also can be affected by bubbles contained within the print cartridge, especially within the print head 204. Among other origins, bubbles can be formed in the ink as a byproduct of operation of a printing device. For example, bubbles can be formed as a byproduct of the ejection process in the printing device's print cartridge when ink is ejected from one or more firing chambers of the print head.
If bubbles accumulate within the print head the bubbles can occlude ink flow to some or all of the firing chambers and can cause the print head to malfunction. Some embodiments can evacuate bubbles from the print head to decrease the likelihood of such a malfunction as will become apparent below.
An additional desire in designing print cartridges, is the reduction of their cost. One way to reduce such cost, is to reduce the dimensions, and therefore the material and fabrication costs, of print head 204.
The view of
In this particular embodiment, substrate 300 comprises silicon which either can be doped or undoped. Other substrate materials can include, but are not limited to, gallium arsenide, gallium phosphide, indium phosphide, glass, quartz, ceramic or other material.
Substrate thickness t can have any suitable dimensions that are appropriate for an intended application. In some embodiments substrate thicknesses t can range from less than 100 microns to more than 2000 microns. One exemplary embodiment can utilize a substrate that is approximately 675 microns thick. Though a single substrate is discussed herein, other suitable embodiments may comprise a substrate that has multiple layers during fabrication and/or in the finished product. For example, one such embodiment may employ a substrate having a first component and a second sacrificial component which is discarded at some point during processing.
In this particular embodiment, one or more thin-film layers 314 are positioned over substrate's second surface 303. In at least some embodiments, where substrate 300 is incorporated into a fluid ejection device, a barrier layer 316 and an orifice plate or orifice layer 318 are positioned over the thin-film layers 314.
In one embodiment one or more thin-film layers 314 can comprise one or more conductive traces (not shown) and electrical components such as transistors (not shown), and resistors 320. Individual resistors can be controlled selectively via the electrical traces. Thin-film layers 314 also can at least partially define in some embodiments, a wall or surface of multiple fluid-feed passageways 322 through which fluid can pass. Thin-film layers 314 also can comprise among others, a field or thermal oxide layer. Barrier layer 316 can define, at least in part, multiple firing chambers 324. In some embodiments fluid-feed passageways 322 may be defined in barrier layer 316, alone or in combination with thin-film layers 314. Orifice layer 318 can define multiple firing nozzles 326. Individual firing nozzles can be aligned respectively with individual firing chambers 324.
Barrier layer 316 and orifice layer 318 can be formed in any suitable manner. In one particular implementation both barrier layer 316 and orifice layer 318 comprise thick-film material, such as a photo-imagable polymer material. The photo-imagable polymer material can be applied in any suitable manner. For example, the material can be “spun-on” as will be recognized by the skilled artisan.
After being spun-on, barrier layer 316 then can be patterned to form, at least in part, desired features such as passageways and firing chambers therein. In one embodiment patterned areas of the barrier layer can be filled with a sacrificial material in what is commonly referred to as a ‘lost wax’ process. In this embodiment orifice layer 318 can be comprised of the same material as the barrier layer and can be formed over barrier layer 316. In one such example orifice layer material can be ‘spun-on’ over the barrier layer. Orifice layer 318 then can be patterned as desired to form nozzles 326 over respective chambers 324. The sacrificial material then can be removed from the barrier layer's chambers 324 and passageways 322.
In another embodiment, barrier layer 316 comprises a thick-film, while the orifice layer 318 comprises an electroformed nickel or other suitable metal material. Alternatively the orifice layer can be a polymer, such as “Kapton” or “Oriflex”, with laser ablated nozzles. Other suitable embodiments may employ an orifice layer which performs the functions of both a barrier layer and an orifice layer.
A housing 330 of cartridge body 206 can be positioned over substrate's first surface 302. In some embodiments, housing 330 can comprise a polymer, ceramic and/or other suitable material(s). An adhesive, though not specifically shown, may be utilized to bond or otherwise join housing 330 to substrate 300.
In operation, a fluid, such as ink, can enter slots 305a-c from the cartridge body 206. Fluid then can flow through individual passageways 322 into an individual firing chamber 324. Fluid can be ejected from the firing chamber when an electrical current is passed through an individual resistor 320 or other ejection means. The electrical current can heat the resistor sufficiently to heat some of the fluid contained in the firing chamber to its boiling point so that it expands to eject a portion of the fluid from a respectively positioned nozzle 326. The ejected fluid then can be replaced by additional fluid from passageway 322.
As represented in
Angles α1, α2 can comprise any angle less than 90 degrees relative to second surface 303 with some embodiments having a value in the range of 10 degrees to 80 degrees. In some embodiments angles α1, α2 can range from about 60 degrees to about 80 degrees. In other embodiments angles α1, α2 can range from about 40 degrees to about 59 degrees. In still other embodiments angles α1, α2 can range from about 20 degrees to about 39 degrees. In this particular embodiment angles α1, α2 each comprise about 62 degrees, another particular embodiment has angles of about 45 degrees. Though in this embodiment angles α1, α2 comprise similar values, other embodiments may have dissimilar values. For example in an alternative embodiment angle α1 can have a value of 45 degrees while angle α2 has a value of 55 degrees. Having one or more angled slots can allow greater options in print cartridge design, as well in the design of other microdevices, as will be described in more detail below.
In this embodiment slots 305a, 305c are angled relative the second surface 303 when viewed transverse the long axis. Alternatively or additionally, other embodiments may be angled relative to second surface 303 when viewed along the long axis. Examples of such a configuration will be described in more detail below in relation to
a and 4b illustrate top views of substrate's first surface 302 and second surface 303 respectively. In this embodiment slots 305a-305c define a first footprint 402a at first surface 302 and a second different footprint 402b at second surface 303. First footprint 402a defines a first area while second footprint 402b defines a second area. In some embodiments the first area can be at least about 10 percent greater than the second area. In this particular embodiment first area is about 20 percent greater than second area. Further, in this embodiment the increased area is due predominately to a greater width wa of footprint 402a when compared to width wb of footprint 402b.
Some print cartridge designs achieve effective integration of substrate 300a with cartridge body housing 330a by maintaining the widest possible beam width of the substrate's narrowest beam relative to first surface 302a. Such a configuration can among other factors aid in molding cartridge body housing 330a. In this illustrated embodiment beam widths w1-w4 are generally equal.
Beams 502a-502d also define widths w5-w8 respectively at second surface 303a as measured transverse the slots' long axes. Some print cartridge designs configure substrate's second surface 303a so that external beams 502a, 502d are relatively wider than internal beams 502b, 502c to allow placement of various electrical components overlying second surface 303a on the external beams. As shown in
The embodiment shown in
c illustrate one example where ribs 602 extend generally across an axis of slots 305g-305i.
As illustrated in
b illustrates an embodiment where rib 602 tapers from a first width w1 proximate first surface 302b to a second width w2 proximate second surface 303b. This is but one exemplary configuration. For example other embodiments may maintain a generally uniform width between the first and second surfaces. In this instance rib 602 can approximate a frustrum. Such a configuration may supply generally uniform fluid flow to various chambers, described above, which can be supplied by slot 305g. Other embodiments may utilize other rib shapes. In the embodiment illustrated in
c illustrates an alternative configuration where rib height h is less than thickness t. In this particular instance rib 602a extends from first surface 302b but does not reach second surface 303b. Configurations which utilize a height h less than thickness t may contribute to a uniform fluid environment for various chambers supplied by slot 305g.
In this embodiment slot 305j is defined, at least in part, by a first sidewall 702a and a second sidewall 702b. Similarly, slot 305k is defined, at least in part, by a first sidewall 702c and a second sidewall 702d.
During operation of a print cartridge incorporating substrate 300c bubbles may occur. Some of the described embodiments can allow a bubble to evacuate more readily from the print head compared to a traditional print head design. In this particular embodiment, a bubble is indicated generally at 704. Buoyancy forces acting upon bubble 704 are directed along the z-axis. Fluid flow along bore b5 can be represented as a vector having both y-axis and z-axis components. Generally only the z-axis component of the fluid flow acts against the bubble's buoyancy forces and the bubble is more likely to migrate toward first surface 302c and ultimately from the slot. In some instances bubble 704 may migrate toward first sidewall 702c and then up the first sidewall toward first surface 302c.
Where multiple bubbles occur the bubbles may migrate toward and up first sidewall 702c. Following a common path may tend to force the bubbles together leading to agglomeration. If the bubbles agglomerate they may pass out of the slot more quickly than they otherwise would. Agglomeration may assist with bubble removal because the buoyant force acts to move the bubble upwards against the ink flow. This buoyant force may become increasingly dominant as the bubbles agglomerate and grow because it increases with the cube of the bubble diameter whereas the drag force induced by the downward ink flow increases only with the square of the bubble diameter.
As represented in
b represent another substrate 300d.
In this embodiment, when viewed along its long axis slot 305l generally approximates a portion of a parallelogram 804 as best can be appreciated from
a-9b and 10a-10b represent exemplary features and process steps for forming the features. In these two embodiments the term feature is employed. The feature may be a bind feature or a through feature comprising a slot.
a-9b represent cross-sectional views of substrate 300e.
Feature 905 is defined, at least in part, by one or more sidewalls. In this embodiment two sidewalls 902a, 902b are indicated. Also in this embodiment individual sidewalls 902a, 902b have a first sidewall portion 904a, 904b respectively that is generally transverse to first surface 302e. Further in this embodiment individual sidewalls 902a, 902b have a second different sidewall portion 906a, 906b that is not transverse the first surface.
Feature 905 can be formed with one or more substrate removal techniques. Examples of suitable substrate removal techniques are described below in relation to
a-10b show feature 905a formed in substrate 300f. Feature 905a defines a bore axis b8 which is not transverse first surface 302f and intersects a midpoint of the feature width w14, w15 at the first surface 302f and at a bottom surface 1000 respectively. In this embodiment feature 905a can comprise a first region 1001a and a second region 1001b. In some embodiments the two regions 1001a, 1001b can be formed in distinct steps or as a single process.
Feature 905a can be defined, at least in part, by one or more sidewalls. In this embodiment two sidewalls 1002a, 1002b are indicated. Also in this embodiment individual sidewalls 1002a, 1002b have a first sidewall portion 1004a, 1004b respectively that is not transverse to first surface 302f and lies at a first angle α4 relative to first surface 302f. Further in this embodiment individual sidewalls 1002a, 1002b have a second different sidewall portion 1006a, 1006b respectively that is not transverse the first surface and which lies at a second different angle α5 relative to first surface 302f. These exemplary sidewall configurations can allow greater microdevice design flexibility.
a-11c show process steps for forming an exemplary feature in a substrate.
a, illustrates a laser machine 1102 for removing substrate material sufficient to form feature 905b in a substrate. Feature 905b generally can approximate a circle, an ellipsoid, a rectangle, or any other desired shape whether regular or irregular. For purposes of explanation, an individual substrate 300g is illustrated here. Other embodiments may act upon a wafer or other material which subsequently can be separated or can be diced into individual substrates.
In this embodiment, laser machine 1102 comprises a laser source 1106 configured to generate laser beam 1108 for laser machining substrate 300g. Exemplary laser beams such as laser beam 1108 can provide sufficient energy to energize substrate material at which the laser beam is directed. Energizing can comprise melting, vaporizing, exfoliating, phase exploding, ablating, reacting, and/or a combination thereof, among others processes. Some exemplary laser machines may utilize a gas assist and/or liquid assist process to aid in substrate removal.
In this embodiment substrate 300g is positioned on a fixture or stage 1112 for processing. Suitable fixtures should be recognized by the skilled artisan. Some such fixtures may be configured to move the substrate along x, y, and/or z coordinates.
Various exemplary embodiments can utilize one or more mirrors 1114, galvanometers 1116 and/or lenses 1118 to direct laser beam 1108 at first surface 302g. In some embodiments, laser beam 1108 can be focused in order to increase its energy density to machine the substrate more effectively. In these exemplary embodiments the laser beam can be focused to achieve a desired beam geometry where the laser beam contacts the substrate 300g.
Laser machine 1102 further includes a controller 1120 coupled to laser source 1106, stage 1112, and galvanometer 1116. Controller 1120 can comprise a processor for executing computer readable instructions contained on one or more of hardware, software, and firmware. Controller 1120 can control laser source 1106, stage 1112 and/or galvanometer 1116 to form feature 905b. Other embodiments may control some or all of the processes manually or with a combination of controllers and manual operation.
As illustrated in
b illustrates a subsequent process step where stage 1112 has repositioned substrate 300g to form feature 905c. In this embodiment stage 1112 can orient substrate 300g at an angle β less than 90 degrees relative to laser beam 1108. Various embodiments can utilize angles ranging from about 10 degrees to about 80 degrees. In some embodiments angle β can range from about 60 degrees to about 80 degrees. In other embodiments angle β can range from about 40 degrees to about 59 degrees. In still other embodiments angle β can range from about 20 degrees to about 39 degrees. In this particular embodiment angle β comprises about 70 degrees. During laser machining, adjustments can be made to stage 1112, lens 1118 and/or galvanometer 1116 to maintain focus of the laser beam on the substrate. This process can be utilized to form blind features and/or through features. Though
c illustrates a further process step forming another feature 905d. Stage 1112 repositioned substrate 300g relative to laser beam 1108 to form feature 905d having a desired orientation. The skilled artisan should recognize other suitable configurations.
Although specific structural features and methodological steps are described, it is to be understood that the inventive concepts defined in the appended claims are not necessarily limited to the specific features or steps described. Rather, the specific features and steps are disclosed as forms of implementation of the inventive concepts.
This is a divisional of U.S. patent application Ser. No. 10/817,716 entitled “Features in Substrates and Method of Forming,” filed Mar. 31, 2004, now abandoned by Clark et al., and assigned to the present assignee.
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Number | Date | Country | |
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Parent | 10817716 | Mar 2004 | US |
Child | 11803179 | US |