Claims
- 1. An apparatus for measuring pressure fluctuations, comprising:
- a pressure-sensing membrane which undergoes deflections in relation to pressure fluctuations to be measured;
- a membrane deflection sensor;
- a backplate within said apparatus and adjacent said membrane; and
- a voltage source for creating a predetermined voltage potential between said backplate and said membrane.
- 2. The apparatus of claim 1, wherein said deflection sensor comprises an optical fiber probe, a surface of said membrane facing said optical fiber probe is reflective, and said backplate includes an opening which permits at least one of said optical fiber probe and light from said optical fiber probe to pass through said backplate.
- 3. The apparatus of claim 2, wherein said optical fiber probe is at least partly encased in a conductive sheath, said sheath is electrically connected to said backplate and said voltage source.
- 4. The apparatus of claim 2, further comprising a housing electrically connected to said membrane and said voltage source.
- 5. The apparatus of claim 2, wherein said membrane is under tensile stress while at rest.
- 6. The apparatus of claim 2, further comprising a housing electrically connected to said membrane and said voltage source, wherein said optical fiber probe is at least partly covered in a conductive sheath, said sheath is electrically connected to said backplate and said voltage source, and wherein said backplate and sheath are insulated from said housing.
- 7. The apparatus of claim 6, wherein said sheath is electrically connected to said backplate by an annular coil spring located in said opening.
- 8. A method for calibrating in situ an apparatus for measuring pressure fluctuations wherein first deflections of a pressure sensing membrane responsive to said pressure fluctuations are measured, comprising electrostatically actuating said membrane with a predetermined voltage using an electrode within said apparatus to cause second deflections of said membrane, and comparing said second deflections to predetermined standards.
- 9. A method according to claim 8, wherein said electrode is a backplate adjacent to said membrane within said apparatus.
- 10. A method according to claim 8, wherein said first deflections are measured with an optical fiber probe.
Parent Case Info
This is a divisional of copending application Ser. No. 07/586,369 filed on Sep. 21, 1990, now U.S. Pat. No. 5,146,083.
ORIGIN OF THE INVENTION
The invention described herein was made by employees of the United States Government and an contractor employee during the performance of work under a NASA Grant. In accordance with 35 U.S.C. 202, the contractor elected not to retain title.
US Referenced Citations (2)
Number |
Name |
Date |
Kind |
4902964 |
Szabela et al. |
Feb 1990 |
|
5046028 |
Bryan et al. |
Sep 1991 |
|
Divisions (1)
|
Number |
Date |
Country |
Parent |
586369 |
Sep 1990 |
|