Claims
- 1. A flexible potentiometer, comprising:
- a flexible insulating plastic substrate; and
- a conductive material applied to the substrate, the conductive material having a resistance which consistently and predictably varies as the substrate and conductive material are bent.
- 2. The flexible potentiometer of claim 1 in which the conductive material is an ink.
- 3. A flexible potentiometer, comprising:
- a flexible substrate; and
- a flexible conductive material applied adjacent to the substrate, the conductive material having a resistance which varies as the conductive material is bent.
- 4. The flexible potentiometer of claim 3 in which the substrate is plastic.
- 5. The flexible potentiometer of claim 3 in which the conductive material is an ink.
- 6. The flexible potentiometer of claim 3 in which the bending of the conductive material causes cracks in the conductive material.
- 7. The flexible potentiometer of claim 6 in which the number of cracks increases and the resistance increases as the bending increases.
- 8. The flexible potentiometer of claim 6 in which the space between the cracks widens and the resistance increases as the bending increases.
- 9. The flexible potentiometer of claim 3 in which the resistance increases as the bending increases.
- 10. The flexible potentiometer of claim 3 in which the conductive material deforms when bent.
- 11. The flexible potentiometer of claim 3 in which the conductive material is in direct contact with the substrate.
- 12. The flexible potentiometer of claim 3 in which the resistance consistently and predictably varies as the conductive material is bent.
- 13. A flexible potentiometer system, comprising:
- a flexible insulating substrate which is bendable between a first and a second position;
- a conductive material adhered adjacent to the substrate, the conductive material having a resistance which consistently and predictably varies as the conductive material is bent between the first to the second position; and
- an electrical measuring circuit connected to the conductive material that provides a value to a parameter that is indicative of the mount of bending.
- 14. The flexible potentiometer of claim 13 in which the parameter is resistance.
- 15. The flexible potentiometer of claim 13 in which the bending of the conductive material causes cracks in the conductive material.
- 16. The flexible potentiometer of claim 15 in which the number of cracks increases and the resistance increases as the bending increases.
- 17. The flexible potentiometer of claim 15 in which the cracks become wider and the resistance increases as the bending increases.
- 18. The flexible potentiometer of claim 13 in which the resistance increases as the bending increases.
- 19. The flexible potentiometer of claim 13 in which the conductive material is in direct contact with the substrate.
Parent Case Info
This application is a continuation, of application Ser. No. 08/293,674, filed Aug. 19, 1994, now abandoned, which is a continuation of application Ser. No. 08/184,787, filed Jan. 24, 1994, now abandoned, which is a continuation of application Ser. No. 07/963,855, filed Oct. 20, 1992, now abandoned, which is a continuation of application Ser. No. 07/552,575, filed Jul. 13, 1990, now U.S. Pat. No. 5,157,372.
US Referenced Citations (58)
Continuations (4)
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Number |
Date |
Country |
Parent |
293674 |
Aug 1994 |
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Parent |
184787 |
Jan 1994 |
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Parent |
963855 |
Oct 1992 |
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Parent |
552575 |
Jul 1990 |
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