Patent Application
20140158254
The present invention relates to a flux to be mixed with solder powders and it particularly relates to a flux having an effect of preventing a migration from occurring after soldering.
Electrodes have been formed in accordance with terminals of leads or the like of electronic components on a substrate such as a printed circuit board on which the electronic components are mounted. Fixation and electric connection of the electronic components and the substrate has been made largely by soldering. In such a substrate, an ion (or electrochemical) migration may occur on a soldered portion of the terminals of the electronic components and the electrodes of the substrate due to any causes such as water droplets adhered to the electrodes through which direct voltage is applied.
The ion migration (hereinafter, referred to as “migration”) is such a phenomenon that metal ions dissolved from an anode transfer electrons in a cathode, between the electrodes through which direct voltage is applied, and reduced metal grows from the cathode and both electrodes is short-circuited by the reduced metal extending to the anode. When such a migration occurs, the short circuit occurs between both electrodes so that any function as the substrate is lost.
Apropos, in general, the flux used for the soldering has such an efficacy that it chemically removes metallic oxides exiting on a surface of a solder and a surface of the metal to be soldered at a temperature in which the solder melts and can move metallic element through a boundary of them. By using the flux, it is possible to form an intermetallic compound between the surface of the solder and the surface of the metal to be soldered so that any strong bonding can be obtained.
Solder paste is a composite material obtained by mixing solder powders and a flux. The solder paste is applied to the soldering portions such as the electrodes, terminals and the like of the substrate such as the printed circuit board or the like by means of a printing method or a discharging method. Components are mounted on the soldering portions to which the solder paste is applied and the soldering is performed so that the substrate is heated in a heating furnace called a reflow furnace to melt the solder.
The flux contains any ingredients that cannot be dissolved or evaporated by heating on the soldering and they remains around the soldered portions as flux residue after the soldering. As one of the causes by which the above-mentioned migration occurs, the adhering of water droplets between the electrodes is taken. Since rosin (pine resin) contained in the flux as a main ingredient has any water break nature, when the flux residue containing the rosin as its main ingredient is formed on the soldered portion, any migration does not occur directly because of the water break effect of the rosin even if any water droplets are adhered onto the flux residue.
However, when cracks occur in the flux residue, moisture permeates from the cracked portions of the flux residue into the flux residue so that this moisture causes the migration to occur.
Accordingly, until now, a measure against the migration generated by the water droplets or the like has been taken by configuring a structure of the substrate as the one preventing any water droplets from being adhered to the surface to be soldered. Or, it has been also taken by performing a moisture-proofing coating on the surface to be soldered.
On the other hand, a technology for suppressing an occurrence of migration by the flux residue and adding fatty acid ester to the flux has been proposed (For example, see Patent Document 1).
Patent Document 1: Japanese Patent Application Publication No. Hei11-077376
When adding fatty acid ester of glycerin to the flux, it is possible to make any ductile to the flux residue. It is possible to suppress an occurrence of cracks in the flux residue when the soldered portion is exposed to any inferior circumstances after the soldering.
It, however, is impossible to suppress an occurrence of migration based on any cause other than the moisture permeation by cracks in the residue only if any ductile is made to the flux residue. Namely, as other causes for allowing the migration to occur, a decrease in insulation resistance of the flux residue by moisture absorption to the residue and/or an adhesion of absorbed moisture to the electrodes, under high temperature/high humidity circumstances, are taken.
Even when the moisture permeation by cracks in the flux residue can be prevented by making any ductile to the flux residue, it is impossible to suppress the occurrence of migration based on the decrease in insulation resistance of the flux residue by the moisture absorption and/or the adhesion of absorbed moisture to the electrodes by the moisture absorption, under the high temperature/high humidity circumstances. Accordingly, even when forming the flux residue on the soldered portion with the flux residue covering the soldered portion, it is impossible to suppress the occurrence of migration surely.
Further, as the measure for suppressing the occurrence of migration, configuring a structure of the substrate as the one preventing any water droplets from being adhered and performing the moisture-proofing coating cause any costs to increase in an assembly of the substrate.
The present invention solves the above discussed problems and has an object to provide a flux that does not only allow the flux residue to cover the soldered portion but also suppresses the occurrence of migration surely, in the soldered portion on which the flux residue is formed.
Inventors have focused on adsorptive capacity of phosphonate ester to a metal and have found out such a fact that the phosphonate ester is adsorbed to a surface of the metal such as solder during the soldering, by adding the phosphonate ester to the flux that forms the solder paste by mixing it with the solder powders, to form a hydrophobic film.
The invention relates to a flux that forms solder paste by mixing the flux with solder powders wherein the flux contains phosphonate ester with an amount thereof such that a hydrophobic film is formed, the phosphonate ester being adsorbed to a surface of a soldered portion on which flux residue is formed during soldering.
An addition amount of the phosphonate ester is preferably not less than 1% through less than 30%. It is to be noted that % represents mass % unless otherwise specified. It is also preferable that the phosphonate ester is diethyl benzylphosphonate, diethyl allylphosphonate, diethyl (p-methylbenzyl)phosphonate or (2-ethylhexyl)-2-ethylhexyl phosphonate.
In the flux according to this invention, by adding the phosphonate ester having the adsorptive capacity to a metal, when the solder paste is produced by mixing the flux of this invention with the solder powders and the soldering is performed by using this solder paste to form the flux residue, the phosphonate ester is adsorbed to a surface of the metal in the soldered portion on which the flux residue is formed so as to form a hydrophobic film.
Thus, the hydrophobic film of phosphonate ester adsorbed to the soldered portion suppresses the adhesion of water droplets or the like to the soldered portion on which the flux residue is formed. Even when cracks occur in the flux residue when the soldered portion is exposed to any inferior circumstances, it is possible to suppress the adsorption of the water droplets or the like to the soldered portion and to suppress the occurrence of migration because of the adhesion of the water droplets or the like.
Further, even when the insulation resistance of the flux residue is decreased by moisture absorption to the flux residue under high temperature/high humidity circumstances or when absorbed moisture is adhered to the electrodes because of the moisture absorption to the flux residue, the hydrophobic film of phosphonate ester adsorbed to the soldered portion can suppress the occurrence of migration. Accordingly, a substrate on which the soldering is performed using the solder paste mixing the flux according to the invention and an electronic device mounting this substrate thereon can realize high reliability.
Additionally, since the phosphonate ester added to the flux obtains an effect of preventing the migration from occurring, the structure of preventing any water droplets from being adhered, which has been previously required to the substrate, and the moisture-proofing coating are made unnecessary, which can reduce the costs that is necessary in the assembly thereof.
The flux according to this embodiment is mixed with solder powders to form solder paste. The flux according to this embodiment contains phosphonate ester which is adsorbed to a surface of a metal such as solder during the soldering. It is preferable that the phosphonate ester is diethyl benzylphosphonate, diethyl allylphosphonate, diethyl (p-methylbenzyl) phosphonate or (2-ethylhexyl)-2-ethylhexyl phosphonate.
The flux contains any ingredients that cannot be dissolved or evaporated by heating on the soldering and the flux residue is formed on the soldered portion to cover it after the soldering. Further, in the solder paste according to this embodiment in which a predetermined amount of the phosphonate ester is added to the flux, the phosphonate ester does not evaporate at a heating temperature on the soldering and adsorbs a surface of the metal such as the solder and the electrodes to be bonded by the solder to form the hydrophobic film on a surface of the soldered portion.
This film obstructs a contact of water droplets with the metal to suppress the occurrence of migration. When the soldered portion is exposed to any inferior circumstances such as large temperature change circumstances, repeated temperature change circumstances, made impact circumstances and the like while there is the flux residue on the soldered portion, any moisture is prevented from being directly contacted with any metal portion of the soldered portion because the hydrophobic film covers the surface of the soldered portion even if any cracks occur in the flux residue to penetrate the moisture thereto.
Even when the insulation resistance of the flux residue is decreased by moisture absorption to the flux residue under high temperature/high humidity circumstances or when absorbed moisture is adhered to the electrodes because of the moisture absorption to the flux residue, the moisture is prevented from being directly contacted with the metal portion of the soldered portion because the hydrophobic film covers the surface of the soldered portion. This suppresses the occurrence of migration.
Here, due to an addition amount of the phosphonate ester, the flux residue property varies. When the addition amount of the phosphonate ester is increased, the flux residue is made liquefaction. Accordingly, taking into consideration the flux residue property after the soldering, the addition amount of the phosphonate ester is preferably not less than 1% through less than 30% by mass %.
The executed examples and the comparison examples were compared to each other concerning the effects of preventing the migration from occurring due to the addition of the phosphonate ester or not when the fluxes which had compositions shown in following tables were prepared and the solder pastes were prepared using the fluxes of the executed examples and the comparison examples. Further, they were compared to each other on a relationship between the addition amount of the phosphonate ester and the flux residue property.
The fluxes of the executed examples and the comparison examples having compositions shown in the flowing Table 1 were prepared and the solder pastes were prepared so that the solder powders (composition; Sn-3Ag-0.5Cu; particle size: 25 through 36 μm) became 89% by mass %. It is to be noted that composition rate in the Table 1 is represented by mass %.
In the table 1, diethyl benzylphosphonate, diethyl allylphosphonate, diethyl (p-methylbenzyl)phosphonate or (2-ethylhexyl)-2-ethylhexyl phosphonate is an example of the phosphonate ester. They were selectively added in each of the executed examples. In addition, diethyl benzylphosphonate was added to the comparison example 1 as an example of the phosphonate ester in order to make a comparison on the relationship between the addition amount of the phosphonate ester and the flux residue property. No diethyl benzylphosphonate was added to the comparison example 2.
Rosin as an ingredient constituting each of the fluxes of the executed examples and the comparison examples mainly has a function of removing an oxide from the surface of the metal. Diethylene glycol monohexyl ether has a function of dissolving rosin and other additive. As remaining ingredients of each of the fluxes, hardened castor oil was added as viscosity modifier and diethylamine hydrobromide was added as an activator.
The solder pastes of the executed examples and the comparison examples shown in the Table 1 were printed to the electrodes formed at a pitch of 0.5 mm on the substrates, components each having leads with the same pitch as that of the electrodes were mounted on each of the substrates and they were soldered in a reflow furnace. In order to perform an accelerated degradation test, ion exchanged water then dripped to the soldered electrodes and voltage of 8V was applied through the leads. Migration occurrence time was measured while observing it with stereoscopic microscope.
The following Table 2 shows the migration occurrence time.
As shown in the executed example 5 of the above-mentioned Table 2, when the phosphonate ester of 1% by mass % was added, the migration occurrence time thereof was extended as compared with a case of the comparison example 2 where no phosphonate ester was added. It is understood that the addition of phosphonate ester allows an effect of preventing the migration from occurring to be exhibited. As shown in the executed examples 1 through 4, when the addition amount of the phosphonate ester was about 10%, the migration occurrence time thereof was sufficiently extended. It is understood that the effect of preventing the migration from occurring is further improved.
Accordingly, it is understood that the addition amount of the phosphonate ester can be not less than 1% by mass % and that in order to improve the effect of preventing the migration from occurring, the addition amount of the phosphonate ester is preferably about 10%.
On the other hand, when the addition amount of the phosphonate ester is 30% by mass % shown in the comparison example 1, the hydrophobic film is formed on the soldered portion on which the flux residue is formed but the flux residue property is made liquefaction. Even when the flux residue is made liquefaction, the effect of preventing the migration from occurring is still maintained. However, when any dusts are adhered to the soldered portion on which the liquidized flux residue is formed after the soldering, a decrease in insulation resistance between the electrodes occurs so that a risk such that an electric reliability of a circuit is lost is generated.
Thus, it is understood that when taking into consideration the effect of preventing the migration from occurring, the addition amount of the phosphonate ester may exceed about 30% by mass % but when taking into consideration the flux residue property, the addition amount of the phosphonate ester is preferably less than 30%.
In view of the above-mentioned results, it is understood that the addition of the phosphonate ester to the flux allows the effect of preventing the migration from occurring to be exerted and in order to form the hydrophobic film of phosphonate ester on the soldered portion on which the flux residue is formed, the phosphonate ester of not less than 1% through less than 30% is preferably added. It is to be noted that when adding the phosphonate ester to the flux, it is found that wettability can be improved even if addition of a halogenide as an activator is reduced.
The flux according to the invention is applicable to an electronic device or the like mounted on a vehicle and an electronic device used under a circumstance where it may be influenced by water or dust.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2011-126282 | Jun 2011 | JP | national |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/JP2012/064374 | 6/4/2012 | WO | 00 | 1/23/2014 |
