BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1A is a plan view showing the construction of a foreign substance removing apparatus according to a first embodiment of the present invention;
FIG. 1B is a side view of the foreign substance removing apparatus;
FIG. 1C is a view showing a displacement distribution in a vibration mode of the foreign substance removing apparatus;
FIG. 1D is a view showing a displacement distribution in another vibration mode of the foreign substance removing apparatus;
FIG. 2 is a perspective view showing the foreign substance removing apparatus in a state mounted to a reader section of a copying machine;
FIG. 3A is a fragmentary section view, taken along an X-Z plane of the foreign substance removing apparatus shown in FIGS. 1A to 1D, showing part of an optical member near a piezoelectric element and a circular plate;
FIG. 3B is a strain distribution diagram for the optical member;
FIG. 4 is an exploded perspective view showing the construction of a foreign substance removing apparatus according to a second embodiment of the present invention;
FIG. 5A is a plan view of an optical filter, a piezoelectric element, and an elastic member that are shown in FIG. 4;
FIG. 5B is a side view of the optical filter, the piezoelectric element, and the elastic member;
FIG. 5C is a view showing a displacement distribution in a vibration mode in which the optical filter is caused to vibrate;
FIG. 5C is a view showing a displacement distribution in another vibration mode in which the optical filter is caused to vibrate;
FIG. 6 is an exploded perspective view showing the construction of a foreign substance removing apparatus according to a third embodiment of the present invention;
FIG. 7 is an exploded perspective view showing the construction of a foreign substance removing apparatus according to a fourth embodiment of the present invention;
FIG. 8 is a perspective view of a conventional image reading apparatus;
FIG. 9A is a view showing an ADF platen;
FIG. 9B is a view showing a bending vibration produced in the ADF platen in FIG. 9A by means of a piezoelectric element;
FIG. 9C is a view showing another bending vibration in the ADF platen;
FIG. 9D is a view showing a bending vibration displacement distribution in the ADF platen;
FIG. 10A is a fragmentary section view, taken along an X-Z plane of the conventional foreign substance removing apparatus in FIG. 8, showing part of the ADF platen near the piezoelectric element;
FIG. 10B is a view showing an X-directional strain in the ADF platen and the piezoelectric element;
FIG. 11 A is a fragmentary section view, taken along an X-Z plane of the conventional foreign substance removing apparatus in FIG. 8, showing part of the ADF platen at a location away from the piezoelectric element in the X direction; and
FIG. 11B is a view showing an X-directional strain in the ADF platen and the piezoelectric element.