The present application claims a priority based on Japanese Patent Application No. 2009-232501 filed on Oct. 6, 2009, the contents of which are incorporated herein by reference.
1. Technical Field
The present invention relates to frequency measurement devices and, more particularly, to improvements of a frequency measurement device that is capable of measuring an absolute frequency, using a frequency measurement device that counts a signal to be measured for a predetermined time, and removes high frequency components from a stream of counted values thereby detecting a frequency change component.
2. Related Art
As frequency measurement methods, a direct count method that counts pulses passing within a predetermined gate time (see, for example, JP-A-2001-119291 (Patent Document 1)), a reciprocal method that accurately measures a pulse period and obtains a frequency from its time reciprocal (see, for example, JP-A-05-172861 (Patent Document 2)), and a method that obtains a delta sigma (ΔΣ) modulation signal to acquire a frequency (see, for example, U.S. Pat. No. 7,230,458 (Patent Document 3)) are known.
The inventors of the invention have proposed a “short-gate time count method” (see JP-A-2009-250807) as a novel frequency measurement method having characteristics that are nonexistent in the methods of related art. According to the short-gate time count method, counting (sampling) of pulses is continuously repeated with a short-gate time, and high frequency components are removed from a stream of the obtained counted values, whereby an output corresponding to the frequency of the signal to be measured is obtained. By this method, both of the time resolving power and the frequency resolving power can be considerably improved, compared to the methods of related art.
The frequency counter of the proposed method uses a short-gate counter section and a low-pass filter section that removes high frequency components. When a digital filter is used as a part of the composition of the low-pass filter, for example, the use of a moving average filter is proposed. The use of a moving average filter can substantially reduce the amount of computation, enabling highly accurate real-time measurement.
The short-gate counter section has a relatively simple hardware structure, and therefore is suitable for high-speed operation. However, the processing at the filter section needs addition and subtraction of multiple bits, such that the upper limit of sampling frequency in real time measurement is defined, mainly, by the processing power of the filter section. To obtain a moving average filter with desired characteristics, it is necessary to structure a shift register with multiple bits in multiple stages and to operate such a shift register at high speed, resulting in a greater circuit scale and greater power consumption.
In accordance with an advantage of some aspects of the invention, it is possible to provide a counter (a frequency measurement device) of a short-gate time count method, wherein the structure of its low-pass filter section is simplified to achieve lower power consumption.
In accordance with another advantage of some aspects of the invention, it is possible to reduce noise generation that would likely occur, resulting from simplification of the filter structure of the low-pass filter section.
A frequency measurement device in accordance with an embodiment of the invention is equipped with a counter section that counts a supplied pulse stream signal to be measured at a predetermined time interval and outputs a stream of count values corresponding to the frequency of the signal, and a low-pass filter section that performs a filtering process on the stream of count values, wherein the low-pass filter section is formed from moving average filters in multiple stages, and an output of at least one moving average filter among the moving average filters in multiple stages is downsampled.
It is preferred that sampling frequencies for obtaining data at the moving average filters in multiple stages decrease at each of the stages of the moving average filters from the first stage to the last stage of the moving average filters.
With the composition described above, the structure of the low-pass filter section in the frequency measurement device of a short-gate time count method can be simplified. By simplifying the circuit structure of the moving average filter and lowering the operation frequency of the circuit, the number of components and the power consumption can be reduced.
The short-gate time count method used in the frequency measurement device in accordance with the present embodiment exhibits in principle a noise shaping function, and has a small change in count values when changes in the frequency of the signal to be measured are within a range sufficiently lower than the sampling frequency of the counter section, such that influence such as aliasing noise is very low, even when the data stream is intermittently processed in downsampling (decimation) by the low-pass filter section (the moving average filter).
Preferably, in the downsampling between two consecutive ones of the moving average filters in forward and rear stages, at least one of the number of data delay taps in the moving average filter in the forward stage and the sampling frequency in the moving average filter in the rear stage may be adjusted such that a cumulative value of the stream of data intermittently transmitted from the moving average filter in the forward stage to the moving average filter in the rear stage in a specified period becomes to be a constant value.
When downsampling is performed by a multiple-stage moving average filter, aliasing noise is generated. To prevent such aliasing noise, high frequency components need to be reduced to a substantially low level by inserting a low-pass filter before the downsampling. However, according to the structure of the invention, generation of aliasing noise that may occur in downsampling between the moving average filters can be avoided without providing an additional low-pass filter, such that the structure of the low-pass filter section can be simplified.
The counter section and the moving average filter in the first stage in the low-pass filter may preferably be formed from a circuit that processes a binary signal (bit-stream). This is convenient because the counter section and the moving average filter in the first stage in the low-pass filter can be simplified into a circuit with equivalent functions thereof.
The predetermined time may preferably be less than one second (more precisely, less than one second but more than an operational limit of the circuit, for example, 0.01 μsecond), without any particular limitation thereto. For example, when gate sampling of about 0.1 m second is performed, for example, the time resolving power can be expected to improve by about one to two digits and the SN ratio by about two to three digits, compared to the direct count method of related art.
A frequency measurement method in accordance with an embodiment of the invention pertains to a frequency measurement method (a short-gate time count method) including continuously measuring a signal in a pulse stream supplied at a predetermined time interval, and processing a stream of count values of the signal to be measured by a low-pass filter to obtain an output signal corresponding to the frequency of the signal to be measure, wherein the low-pass filter section is formed from moving average filters in multiple stages; sampling frequencies for acquiring data at the moving average filters in multiple stages are set to decrease at each of the stages of the moving average filters from the first stage to the last stage of the moving average filters; and, in the downsampling between two consecutive ones of the moving average filters in forward and rear stages, at least one of the number of data delay taps in the moving average filter in the forward stage and the sampling frequency in the moving average filter in the rear stage is adjusted such that a cumulative value of the stream of data intermittently transmitted from the moving average filter in the forward stage to the moving average filter in the rear stage in a specified period becomes to be a constant value.
According to the structure of the invention, frequency measurement can be conducted, while generation of aliasing noise that may occur in the frequency measurement device using the short-gate time count method can be avoided, and the device structure can be simplified by means of downsampling.
The frequency measurement device described above is small in circuit scale and is readily mountable, and is therefore suitable to be used as a resonance frequency change type sensor. For example, such sensors include acceleration sensors and pressure sensors using quartz oscillators, QCM (Quartz Crystal Microbalance) devices and the like. For example, the frequency measurement device of the invention may be applied to a QCM odor sensor with crystal oscillators whose oscillation frequencies change by adhesion of odor substance to the crystal oscillators, whereby a multiple-channel odor sensor can be readily structured.
Preferred embodiments of the invention are described below with reference to the accompanying drawings. Corresponding sections in the figures are appended with the same reference numbers. It is noted that clock signal generation circuits for generating various clocks, a power supply circuit and the like are used in digital circuits described in the embodiments, but their detailed description will be omitted as they are known to those skilled in the art.
Short-Gate Time Count Method
First, a short-gate time count method is described.
As shown in
The low-pass filter section 20 that digitally processes the series of count values may be formed from, for example, a digital filter (or analogue filter), and may be formed from a moving average filter that performs its intended operation with a relatively small amount of computation.
For example,
As shown in
As shown in
In this manner, according to the short-gate time count method, a signal to be measured is continuously sampled with a short-gate time (for example, less than one second), whereby the stream of count values obtained behaves as a pulse stream signal, and the frequency (density) of the pulse stream varies according to changes in the frequency of the signal to be measured. Also, the magnitude of the oscillation frequency of the signal to be measured corresponds to the magnitude of the pulse stream. Information about the frequency of a pulse stream signal to be counted exists in low-band components of the frequency spectrum of the stream of count values that behaves as a pulse stream. Accordingly, the low-band components are extracted (harmonic components originating from quantization errors are removed) from the count values by a low-pass filter, whereby the information about the frequency of the pulse stream signal counted can be decoded.
In the frequency measurement device using the method of the present embodiment, when the low-pass filter 20 for removing high frequency components is structured with digital filters, filters in a high order (a high tap number) may preferably be used in order to acquire smooth outputs. Also, the low-pass filter section 20 may be structured in multiple stages.
The short-gate count section 10 can be realized with a relatively simple hardware structure, and therefore is suitable for high-speed operation. However, the data processing at the filter section 20 needs addition and subtraction of multiple bits. Therefore the upper limit of sampling frequency in real time measurement is defined, mainly, by the processing power of the filter section. Also, when digital filters in two or more stages are used, multiple-bit shift registers in multiple stages need to be operated at high speed, resulting in greater power consumption.
The first embodiment example of the invention attempts to achieve higher operation speed and lower power consumption by simplifying the circuit structure of the low-pass filter section 20 in the frequency measurement device of the short-gate time count method and by gradually reducing the operation frequency of the multiple-stage filters (at least in one stage).
In
The output of the count filter section 11 (the output of the subtractor 114) is supplied to the second stage moving average filter 22 with the tap number being 1000 operating at a sampling frequency of 1188 Hz (=fs/128), and the output of the second-stage moving average filter 22 is supplied to the third-stage moving average filter 23 with the tap number being 125 operating at a sampling frequency of 148 Hz (=fs/1024). The output of the third-stage moving average filter 23 is the measured value of the frequency.
The moving average filter 22 is formed from an accumulator (an integrator) 221 that sequentially adds (accumulates) outputs of the subtractor 114, a data latch 224 that acquires the output of the accumulator 221 in synchronism with a sampling clock at a sampling frequency of 1188 Hz (=fs/128), a 1000-stage shift register 222a that delays the output of the data latch 224 in synchronism with the sampling clock, and a subtractor 223 that subtracts the output of the shift register 222a which is a 1000-data-preceding cumulative value from the cumulative value outputted from the data latch 224 thereby outputting a value corresponding to the moving average. Like the moving average filter 22, the moving average filter 23 is also formed from an accumulator (an integrator) 231 that accumulates outputs of the subtractor 223 in the preceding stage, a data latch 234 that acquires the output of the accumulator 231 in synchronism with a sampling clock at a sampling frequency of 148 Hz (=fs/1024), a 125-stage shift register 232a that delays the output of the data latch 234 in synchronism with the sampling clock, and a subtractor 233 that subtracts the output of the shift register 232a which is a 125-data-preceding cumulative value from the cumulative value outputted from the data latch 234 thereby outputting a value corresponding to the moving average.
It is noted that, in accordance with the present embodiment, the low-pass filter section 20 is structured with moving average filters in three stages, and downsampling is conducted in two stages. However, the invention is not limited to such a structure. The moving average filter may be structured in a greater number of stages, and the downsampling may be conducted in greater frequency. Also, (at least) one downsampling operation is effective in reducing the number of taps. The same characteristics are similarly applicable to embodiment examples to be described below.
According to the structure of the comparison example, the number of taps of the three-stage low-pass filter is 152 kHz÷0.25÷2=304 k taps, wherein 48 k taps are assigned to the first-stage register 113, 128 k taps to the second-stage register 222a, and 128 k taps to the third-stage register 232, and each of the stages is operated with a sampling frequency of 152 kHz (fs). According to the embodiment of the invention, the frequency measurement device (
In general, when downsampling is performed by a multiple-stage moving average filter, aliasing noise is generated. To prevent such aliasing noise, high frequency components need to be reduced to a substantially low level by inserting a low-pass filter before the downsampling. For example, an example of such technology is described in Japanese Laid-open Patent Application 2000-307384. According to the short-gate time count method, the noise shaping function can be exhibited even when downsampling is conducted. Accordingly, the low-pass filter required before the downsampling does not need high performance, compared to the case where the noise shaping function does not work. Therefore, the structure of the low-pass filter can be simplified. Also, it is acceptable if the low-pass filter section including low-pass filters before and after downsampling as a whole has a sufficient performance.
According to the present example, the count filter section 11 is formed from a data latch 112a that acquires instantaneous values of a pulse stream signal to be measured (78 MHz) in synchronism with a sampling clock of 4760 Hz (fs), a 1-bit 4-stage delay shift register 113a that delays the output of the data latch 112a in synchronism with the sampling clock (fs), and an exclusive OR (EXOR) circuit 114a that adds the output of the data latch 112a and the output of the shift register 113a. The count filter section 11 functions as a 1-bit short-gate counter 10 that counts the pulse stream of the signal to be measured and the 1-bit 4-stage moving average filter in the first stage (see
The second-stage moving average filter 22 is formed from a 1-bit input and 11-bit output counter 225a that continuously performs counting, a data latch 224 that acquires the 11-bit data, a 32-stage delay shift register 222c that delays the 11-bit data, and an 11-bit output subtractor 223 that receives the output of the latch 224 as a positive input and the output of the register 222c as a negative input. The second-stage moving average filter 22 operates as a low-pass filter in synchronism with a sampling clock of ( 1/32) fs. The output of the second-stage moving average filter 22 (the output of the subtractor 223) is supplied to the third-stage moving average filter 23.
The moving average filter 23 is formed from a 17-bit output accumulator (an integrator) 231 that accumulates outputs of the subtractor 223 in the preceding stage, a 17-bit output data latch 234 that acquires the output of the accumulator 231 in synchronism with a sampling clock at a sampling frequency of 37 Hz (=fs/128), a 16-stage shift register 232c that delays the output of the data latch 234 in synchronism with the sampling clock, and a subtractor 233 that subtracts the output of the shift register 232c which is a 16-data-preceding cumulative value from the cumulative value outputted from the data latch 234 thereby outputting a value corresponding to the moving average.
According to this comparison example, the count filter section 11 is composed of a binary signal (bit stream) processing circuit, like the circuit shown in
According to the structure of the comparison example, to set the cut-off frequency of the three-stage low-pass filter at about 0.77 Hz (=4760 Hz÷(4+2048+1024)÷2), 4 taps are assigned to the first-stage register 113, 2048 taps to the second-stage register 222a, and 1024 taps to the third-stage register 232, and each of the stages is operated with a sampling frequency of 4760 Hz (fs).
According to the structure of the present embodiment, 4 taps are assigned to the first-stage register 113, 32 taps to the second-stage register 222a, and 16 taps to the third-stage register 232, and the stages are operated with sampling frequencies of 4760 Hz, 149 Hz (=fs/32) and 37 Hz (=fs/128), respectively.
Therefore, according to the embodiment of the invention, the frequency measurement device (
Comparison of Effects
Comparing
The downsampling described above can be performed multiple times between adjacent stages of the multiple-stage moving average filters. Also, the downsampling may be performed once between any one of the adjacent stages thereof.
Next, referring to
In accordance with the third embodiment example, in the frequency measurement device using the short-gate time count method described in the first and second embodiment examples (having a low-pass filter composed of moving average filters in multiple stages wherein sampling frequencies for acquiring data at the moving average filters at the respective stages are set to gradually lower from the first stage toward the last stage), in downsampling between two forward and rear moving average filters, the number of data delay stages in the moving average filter in the forward stage or the sampling frequency in the moving average filter in the rear stage is adjusted, such that a cumulative value of the stream of data intermittently transmitted from the moving average filter in the forward stage to the moving average filter in the rear stage in a specified period becomes to be a constant value.
In
In this case, the latched value of the second-stage moving average filter 22 at the clock 18 changes to “0,” but the latched value of the second-stage moving average filter section at the clock 22 changes to “1,” such that the number of cells having the value “1” of the output of the data latch 224 in a specified period does not change. In other words, the input of “1” at the clock 18 (
Accordingly, by adjusting the number of taps of the shift register 113a, noise shaping can be functioned. In other words, when the data latch 112a is influenced by jitter, a time shift (a phase difference) occurs in the output value of the adder 114a. However, as long as the consistency between the phase difference and the timing of the data latch 224 is maintained, no difference occurs in the cumulative value, and therefore noise shaping works. For example, the number of taps of the shift register 113a can be selected to be a multiple of the downsampling.
Accordingly, S/N can be improved by adjusting the interval of downsampling (sampling frequency), the phase difference between the time axis of the series of data stream and the time axis of downsampling timing (a shift in the sampling position) and the like. For example, the number of taps of the shift register 113a may be selected to be a multiple of downsampling, and the downsampling period may be selected to be one of divisors of the number of taps of the shift register 113a.
It goes without saying that both of the data shift amount (the filter's tap number) and the sampling frequency (period) of downsampling may be adjusted.
In the case of
An absolute value of the impact of the ±1 count error on the output can be roughly estimated as a maximum value of the impulse response from the tap number of the moving average filter and the operation clock, which is 4760 Hz÷(128×16)≅2.3 Hz. On the other hand, an absolute value (a theoretical value) of the error is (1/√(4760))÷((5+256×4+128×16)÷4760)≅0.02 Hz. Therefore, it is understood that, according to the third embodiment example, the SN ratio of the output signal can be considerably improved.
In the third embodiment example described above, the count filter section 11 is formed with a 1-bit signal processing (bit stream) circuit structure, for the convenience of description, but the invention is not limited to such a structure. The count filter section 11 may be structured with a multiple-bit signal processing system, like the structure shown in
In the above-described embodiment example (for tuning) is described with reference to an example in which downsampling is performed between the first-stage moving average filter and the second-stage moving average filter. However, the same method is similarly applicable to downsampling between the second-stage moving average filter and the third-stage moving average filter. Also, the same method is similarly applicable to downsampling between any adjacent ones of the moving average filters in multiple stages.
Accordingly, as described in the third embodiment example, by adjusting at least one of the data shift and the sampling frequency (period), the cumulative value in a specified period in the data stream becomes to be a constant value, whereby generation of noise due to quantization errors can be suppressed. For example, in the case of a sensor using quartz oscillators, characteristics of a generated signal to be measured, such as, the frequency of the signal to be measured, the range of changes in the frequency and the like, are known in advance, at least one of the number of data delay stages in a moving average filter in a forward stage and the sampling frequency of a moving average filter in a rear stage in moving average filters in multiple stages may be adjusted, whereby the S/N of the frequency measurement device can be improved.
Applied Apparatuses
The frequency measurement device in accordance with any one of the embodiments of the invention is applicable to a variety of resonance frequency change type sensors, whereby size-reduction, weight-reduction, higher resolving power and lower cost of the apparatuses can be achieved. Also, the invention is suitable for circuit integration and platform implementation of various sensors. Moreover, the invention is favorably used for transducer arrays of odor sensors, gas sensors, biosensors and the like, QCM devices, pressure sensors, acceleration sensors and the like.
As described above, in accordance with the first embodiment example of the invention, the low-pass filter using the short-gate time count method is structured with moving average filters in multiple stages, and downsampling is performed between the forward stage and the rear stage, or between any adjacent ones of the stages, such that the number of shift registers can be reduced, compared to the structure of related art composed of a short-gate counter and moving average filters.
In accordance with the second embodiment example, the short-gate time counter and the first-stage moving average filter are formed with a bit-stream processing circuit, such that the circuit structure is further simplified, and higher speed operation becomes possible.
Also, in accordance with the third embodiment of the invention, in the frequency measurement device that combines the short-gate time count method and the multiple-stage moving average filter that performs downsampling, the number of taps in the moving average filter and the sampling interval are adjusted, whereby the S/N is improved.
Also, according to the above-described embodiment examples (with the counter using the short-gate time count method), noise shaping works even after downsampling has been performed. Therefore, in contrast to other methods in which noise shaping does not work, a low-pass filter required before downsampling does not require high performance, such that the low-pass filter before downsampling can also be simplified (in other words, it is acceptable if the performance of the low-pass filter and components before and after downsampling as a whole is sufficient). Therefore, the structure of the low-pass filter can be simplified.
Also, sensors equipped with the frequency measurement device in accordance with any one of the embodiments of the invention are favorable, because the frequency measurement device is small in circuit scale and readily mountable, whereby size-reduction, higher accuracy, weight-reduction, power saving and lower cost of the apparatuses can be achieved.
Number | Date | Country | Kind |
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2009-232501 | Oct 2009 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
2627033 | Jensen et al. | Jan 1953 | A |
2840812 | Di Giacomo | Jun 1958 | A |
2944219 | Isokazu Tanaka et al. | Jul 1960 | A |
3026473 | De Mott | Mar 1962 | A |
3056085 | James et al. | Sep 1962 | A |
3144623 | Steiner | Aug 1964 | A |
3227952 | Proebster et al. | Jan 1966 | A |
3310660 | Cogar | Mar 1967 | A |
3372346 | Rogers et al. | Mar 1968 | A |
3407290 | Atrubin | Oct 1968 | A |
3440617 | Lesti | Apr 1969 | A |
3486007 | Jacobson | Dec 1969 | A |
3551826 | Sepe | Dec 1970 | A |
3553579 | Teixeira | Jan 1971 | A |
3557796 | Keller et al. | Jan 1971 | A |
3605017 | Chertok et al. | Sep 1971 | A |
3609308 | Lemon et al. | Sep 1971 | A |
3624494 | Turan | Nov 1971 | A |
3652838 | Dillon et al. | Mar 1972 | A |
3686565 | Kelem et al. | Aug 1972 | A |
3697870 | Brenner | Oct 1972 | A |
3704414 | Herbst | Nov 1972 | A |
3708686 | Butler, Jr. et al. | Jan 1973 | A |
3733471 | Gilberg | May 1973 | A |
3736510 | Wu | May 1973 | A |
3742353 | Parisi | Jun 1973 | A |
3743940 | Yamagata | Jul 1973 | A |
3745380 | Kitajima et al. | Jul 1973 | A |
3750014 | Gaw | Jul 1973 | A |
3755734 | Blanyer | Aug 1973 | A |
3761740 | Naïve | Sep 1973 | A |
3766818 | Prohofsky | Oct 1973 | A |
3775681 | Konrad | Nov 1973 | A |
3777121 | Jamieson | Dec 1973 | A |
3780346 | Gagnon | Dec 1973 | A |
3795771 | Gundersen et al. | Mar 1974 | A |
3803487 | Iten | Apr 1974 | A |
3812427 | Coulter | May 1974 | A |
3823374 | Dandliker et al. | Jul 1974 | A |
3838338 | Khoury | Sep 1974 | A |
3875518 | Odams | Apr 1975 | A |
3930199 | Valis | Dec 1975 | A |
3942123 | Georgi | Mar 1976 | A |
3943460 | Arai | Mar 1976 | A |
4041387 | Dalichow et al. | Aug 1977 | A |
4051434 | Sweet | Sep 1977 | A |
4053839 | Knoedl | Oct 1977 | A |
4063169 | Palmer | Dec 1977 | A |
4130799 | Cherry | Dec 1978 | A |
4137497 | Lowenschuss | Jan 1979 | A |
4139819 | Worley | Feb 1979 | A |
4139870 | Tachi | Feb 1979 | A |
4144490 | Stevens | Mar 1979 | A |
4150432 | Sorden | Apr 1979 | A |
4169213 | Dye et al. | Sep 1979 | A |
4310891 | Niki | Jan 1982 | A |
4339722 | Sydor et al. | Jul 1982 | A |
4345206 | Skalka | Aug 1982 | A |
4368354 | Furihata et al. | Jan 1983 | A |
4374358 | Hirose | Feb 1983 | A |
4389642 | Kahn | Jun 1983 | A |
4420809 | Pierce | Dec 1983 | A |
4494067 | Barszczewski | Jan 1985 | A |
4514592 | Miyaguchi | Apr 1985 | A |
4544892 | Kaufman et al. | Oct 1985 | A |
4546490 | Miller-Thomson et al. | Oct 1985 | A |
4583211 | Nishikawa et al. | Apr 1986 | A |
4588979 | Adams | May 1986 | A |
4603292 | Russell | Jul 1986 | A |
4609990 | Sember et al. | Sep 1986 | A |
4616173 | Cook et al. | Oct 1986 | A |
4651089 | Haigh | Mar 1987 | A |
4667689 | Kohashi | May 1987 | A |
4670712 | Lavergnat et al. | Jun 1987 | A |
4672556 | Shepler | Jun 1987 | A |
4695791 | Miller | Sep 1987 | A |
4695792 | Roy | Sep 1987 | A |
4707653 | Wagner | Nov 1987 | A |
4716363 | Dukes et al. | Dec 1987 | A |
4760536 | Curtis | Jul 1988 | A |
4769836 | Aihara | Sep 1988 | A |
4795963 | Ueno et al. | Jan 1989 | A |
4864588 | Simpson et al. | Sep 1989 | A |
4864634 | Nakagawa et al. | Sep 1989 | A |
4866260 | Lescourret | Sep 1989 | A |
4880005 | Pless et al. | Nov 1989 | A |
4942365 | Satterwhite | Jul 1990 | A |
4984254 | Thomas | Jan 1991 | A |
5027228 | Yokoyama | Jun 1991 | A |
5065095 | Suzuki | Nov 1991 | A |
5095279 | Quan et al. | Mar 1992 | A |
5122758 | Tomita | Jun 1992 | A |
5128607 | Clark et al. | Jul 1992 | A |
5157699 | Miyazaki et al. | Oct 1992 | A |
5168215 | Puzzo | Dec 1992 | A |
5206549 | Suzuki et al. | Apr 1993 | A |
5262714 | Friedman | Nov 1993 | A |
5302916 | Pritchett | Apr 1994 | A |
5304938 | Gregory et al. | Apr 1994 | A |
5313154 | Norris | May 1994 | A |
5317215 | Kranzler | May 1994 | A |
5323096 | Nakai | Jun 1994 | A |
5365181 | Mair | Nov 1994 | A |
5381085 | Fischer | Jan 1995 | A |
5442278 | Fan Chiang et al. | Aug 1995 | A |
5448606 | Snelgrove | Sep 1995 | A |
5471133 | Sezi | Nov 1995 | A |
5509040 | Shimada | Apr 1996 | A |
5539355 | Nakamura | Jul 1996 | A |
5555247 | Matsuoka et al. | Sep 1996 | A |
5650954 | Minuhin | Jul 1997 | A |
5652552 | Chung | Jul 1997 | A |
5710710 | Owen et al. | Jan 1998 | A |
5764045 | Hayashi | Jun 1998 | A |
5941974 | Babin | Aug 1999 | A |
6018560 | Kim | Jan 2000 | A |
6078200 | Miyano | Jun 2000 | A |
6127950 | Yamauchi | Oct 2000 | A |
6140869 | Troise | Oct 2000 | A |
6172579 | Dacus et al. | Jan 2001 | B1 |
6181829 | Clark et al. | Jan 2001 | B1 |
6259251 | Sugiura et al. | Jul 2001 | B1 |
6265869 | Takahashi | Jul 2001 | B1 |
6282803 | Dunne | Sep 2001 | B1 |
6359938 | Keevill et al. | Mar 2002 | B1 |
6360090 | Holcombe et al. | Mar 2002 | B1 |
6377616 | Brankovic et al. | Apr 2002 | B1 |
6411075 | Battiston et al. | Jun 2002 | B1 |
6463452 | Schulist | Oct 2002 | B1 |
6519194 | Tsujino et al. | Feb 2003 | B2 |
6549479 | Blodgett | Apr 2003 | B2 |
6566964 | Hirano | May 2003 | B1 |
6590400 | Hilliard et al. | Jul 2003 | B2 |
6665367 | Blair | Dec 2003 | B1 |
6674277 | Oishi et al. | Jan 2004 | B1 |
6675326 | Yoshizaki | Jan 2004 | B1 |
6680607 | Smith | Jan 2004 | B2 |
6759838 | Tao et al. | Jul 2004 | B2 |
6834093 | Chiu | Dec 2004 | B1 |
6888902 | Kondo | May 2005 | B1 |
6917191 | Oishi et al. | Jul 2005 | B2 |
7027940 | Iannuzzi | Apr 2006 | B2 |
7046964 | Sullivan et al. | May 2006 | B1 |
7068744 | Watanabe | Jun 2006 | B2 |
7124153 | Grushin | Oct 2006 | B2 |
7230458 | DaDalt | Jun 2007 | B2 |
7242223 | Alon | Jul 2007 | B1 |
7265559 | Hladky et al. | Sep 2007 | B1 |
7266756 | Saado et al. | Sep 2007 | B2 |
7271631 | Watanabe | Sep 2007 | B2 |
7276978 | Puma et al. | Oct 2007 | B2 |
7285961 | Shinmoto et al. | Oct 2007 | B2 |
7372875 | Hadzic et al. | May 2008 | B2 |
7394723 | Rubin | Jul 2008 | B2 |
7409031 | Lee et al. | Aug 2008 | B1 |
7429896 | Hattori | Sep 2008 | B2 |
7436265 | Park et al. | Oct 2008 | B2 |
7463096 | Chi et al. | Dec 2008 | B2 |
7466789 | Rieubon et al. | Dec 2008 | B2 |
7504976 | Pellon | Mar 2009 | B1 |
7560962 | Kamath | Jul 2009 | B2 |
7636747 | Watanabe | Dec 2009 | B2 |
7642767 | Willis | Jan 2010 | B2 |
7653170 | Mattes et al. | Jan 2010 | B2 |
7692419 | Peel | Apr 2010 | B1 |
7696741 | Gurr | Apr 2010 | B2 |
7729071 | Harada | Jun 2010 | B2 |
7737688 | Tomida et al. | Jun 2010 | B2 |
7750618 | Fang et al. | Jul 2010 | B1 |
7750685 | Bunch | Jul 2010 | B1 |
7804289 | Li | Sep 2010 | B2 |
7847597 | Chan et al. | Dec 2010 | B1 |
7907016 | Eikenbroek | Mar 2011 | B2 |
7932751 | Boomer | Apr 2011 | B2 |
8139685 | Simic et al. | Mar 2012 | B2 |
8140283 | Banmouyal et al. | Mar 2012 | B2 |
8242941 | Arknæs-Pedersen et al. | Aug 2012 | B2 |
8258831 | Banai et al. | Sep 2012 | B1 |
8461821 | Todorokihara | Jun 2013 | B2 |
8508213 | Todorokihara | Aug 2013 | B2 |
20010045868 | Takeyabu et al. | Nov 2001 | A1 |
20010048348 | Unterricker | Dec 2001 | A1 |
20020024343 | Moore | Feb 2002 | A1 |
20020097091 | Takagishi | Jul 2002 | A1 |
20020167874 | Hayashi | Nov 2002 | A1 |
20020180415 | Roth | Dec 2002 | A1 |
20030038624 | Hilliard et al. | Feb 2003 | A1 |
20030046064 | Moriya et al. | Mar 2003 | A1 |
20030062959 | Tsuda et al. | Apr 2003 | A1 |
20030165112 | Noda | Sep 2003 | A1 |
20030176932 | Wild | Sep 2003 | A1 |
20030184346 | Lamb | Oct 2003 | A1 |
20030215100 | Kimura et al. | Nov 2003 | A1 |
20040075425 | Horio et al. | Apr 2004 | A1 |
20040078737 | Miyamoto | Apr 2004 | A1 |
20040196052 | Okayasu | Oct 2004 | A1 |
20040199345 | Ananthanarayanan et al. | Oct 2004 | A1 |
20050025270 | Muhammad et al. | Feb 2005 | A1 |
20050110500 | Hoyte et al. | May 2005 | A1 |
20050147197 | Perrott | Jul 2005 | A1 |
20050237125 | Hino | Oct 2005 | A1 |
20050270043 | Iacob et al. | Dec 2005 | A1 |
20060084386 | Irie et al. | Apr 2006 | A1 |
20060120537 | Burnett et al. | Jun 2006 | A1 |
20060171496 | Nakamuta et al. | Aug 2006 | A1 |
20060246865 | Makarov | Nov 2006 | A1 |
20060267698 | Erdogan et al. | Nov 2006 | A1 |
20060285756 | Sugita | Dec 2006 | A1 |
20070094581 | Kajita | Apr 2007 | A1 |
20070103333 | Michalski et al. | May 2007 | A1 |
20070132442 | Jones | Jun 2007 | A1 |
20070159938 | Sugawara et al. | Jul 2007 | A1 |
20070216556 | Rieubon et al. | Sep 2007 | A1 |
20080019471 | Waldner | Jan 2008 | A1 |
20080068096 | Feng et al. | Mar 2008 | A1 |
20080104072 | Stampleman et al. | May 2008 | A1 |
20080120356 | Watanabe | May 2008 | A1 |
20080122498 | Furukawa | May 2008 | A1 |
20080136400 | Chi et al. | Jun 2008 | A1 |
20080136471 | Kamath | Jun 2008 | A1 |
20080165862 | Takahashi | Jul 2008 | A1 |
20080189064 | Yamaguchi et al. | Aug 2008 | A1 |
20080191762 | Seethamraju et al. | Aug 2008 | A1 |
20080204088 | Garlapati et al. | Aug 2008 | A1 |
20080229829 | Kondo | Sep 2008 | A1 |
20080247500 | Goto et al. | Oct 2008 | A1 |
20080256157 | Bostaman et al. | Oct 2008 | A1 |
20080291287 | Dvir | Nov 2008 | A1 |
20080320065 | Kan | Dec 2008 | A1 |
20090058452 | Tanaka et al. | Mar 2009 | A1 |
20090058468 | Hjelm et al. | Mar 2009 | A1 |
20090144018 | Chang et al. | Jun 2009 | A1 |
20090153256 | Jo et al. | Jun 2009 | A1 |
20090156150 | Deleon | Jun 2009 | A1 |
20090180527 | Asami | Jul 2009 | A1 |
20090192958 | Todorokihara | Jul 2009 | A1 |
20090237070 | Herselman | Sep 2009 | A1 |
20090240994 | Lee | Sep 2009 | A1 |
20090243736 | Miura et al. | Oct 2009 | A1 |
20090251129 | Todorokihara et al. | Oct 2009 | A1 |
20090261809 | Li | Oct 2009 | A1 |
20090295460 | Gulba et al. | Dec 2009 | A1 |
20090296878 | Tsai | Dec 2009 | A1 |
20100052653 | Lebrun | Mar 2010 | A1 |
20100054390 | Kim et al. | Mar 2010 | A1 |
20100091752 | Kemmochi et al. | Apr 2010 | A1 |
20100213924 | Osumi et al. | Aug 2010 | A1 |
20100289479 | Prance et al. | Nov 2010 | A1 |
20100295535 | Todorokihara | Nov 2010 | A1 |
20100295536 | Todorokihara | Nov 2010 | A1 |
20100295537 | Todorokihara | Nov 2010 | A1 |
20100315061 | Tomita et al. | Dec 2010 | A1 |
20110050352 | Kondo et al. | Mar 2011 | A1 |
20110068828 | Anderson et al. | Mar 2011 | A1 |
20110074514 | Marutani | Mar 2011 | A1 |
20110082656 | Todorokihara | Apr 2011 | A1 |
20110084687 | Todorokihara | Apr 2011 | A1 |
20110150168 | Tseng et al. | Jun 2011 | A1 |
20110182398 | Iwashita et al. | Jul 2011 | A1 |
20110235772 | Obkircher | Sep 2011 | A1 |
20120019301 | Murray | Jan 2012 | A1 |
20120053903 | Todorokihara | Mar 2012 | A1 |
20120161815 | Polivka | Jun 2012 | A1 |
Number | Date | Country |
---|---|---|
1862263 | Nov 2006 | CN |
0 484 629 | May 1992 | EP |
53-111768 | Sep 1978 | JP |
A-56-169923 | Dec 1981 | JP |
A-61-501528 | Jul 1986 | JP |
A-61-223662 | Oct 1986 | JP |
A-62-298726 | Dec 1987 | JP |
A-64-054271 | Mar 1989 | JP |
A-64-57189 | Mar 1989 | JP |
A-01-182758 | Jul 1989 | JP |
A-01-269297 | Oct 1989 | JP |
A-02-252306 | Oct 1990 | JP |
A-04-048271 | Feb 1992 | JP |
A-04-072815 | Mar 1992 | JP |
A-04-357468 | Dec 1992 | JP |
A-05-030772 | Apr 1993 | JP |
A 5-172861 | Jul 1993 | JP |
A-05-327515 | Dec 1993 | JP |
A-06-011525 | Jan 1994 | JP |
A-06-501554 | Feb 1994 | JP |
A-06-164372 | Jun 1994 | JP |
A-06-235743 | Aug 1994 | JP |
A-06-342021 | Dec 1994 | JP |
A-07-055554 | Mar 1995 | JP |
A-07-229910 | Aug 1995 | JP |
A-07-260526 | Oct 1995 | JP |
A-09-178785 | Jul 1997 | JP |
A-09-304259 | Nov 1997 | JP |
A-10-132874 | May 1998 | JP |
A-10-170566 | Jun 1998 | JP |
A-09-178785 | Jul 1998 | JP |
A-11-154921 | Jun 1999 | JP |
A-11-220369 | Aug 1999 | JP |
A-11-264846 | Sep 1999 | JP |
A-2000-307384 | Nov 2000 | JP |
A-2001-094395 | Apr 2001 | JP |
A 2001-119291 | Apr 2001 | JP |
A-2001-166008 | Jun 2001 | JP |
A-2001-177378 | Jun 2001 | JP |
A-2002-057583 | Feb 2002 | JP |
A-2003-065768 | Mar 2003 | JP |
A-2003-179490 | Jun 2003 | JP |
A-2003-194860 | Jul 2003 | JP |
A-2003-249905 | Sep 2003 | JP |
A-2003-307481 | Oct 2003 | JP |
A-2003-315356 | Nov 2003 | JP |
A-2005-020554 | Jan 2005 | JP |
A-2006-029874 | Feb 2006 | JP |
A-2006-165912 | Jun 2006 | JP |
A-2007-060447 | Mar 2007 | JP |
A-2008-131500 | Jun 2008 | JP |
A-2008-147837 | Jun 2008 | JP |
A-2009-229353 | Oct 2009 | JP |
A 2009-250807 | Oct 2009 | JP |
A-2009-250808 | Oct 2009 | JP |
A-2010-085286 | Apr 2010 | JP |
A-2010-127914 | Jun 2010 | JP |
A-2010-271210 | Dec 2010 | JP |
A-2010-271211 | Dec 2010 | JP |
WO 85-04487 | Oct 1985 | WO |
WO 9204634 | Mar 1992 | WO |
Entry |
---|
U.S. Appl. No. 12/783,900, filed May 20, 2010 in the name of Todorokihara. |
Katano, K., “Introduction to Proper Method for Using Measuring Instruments; How to Use Timing Devices,” Transistor Technology Seminar, 14th Installment, Feb. 1994, p. 331-338 (with English translation). |
Oct. 11, 2011 Office Action issued in U.S. Appl. No. 12/418,000. |
Office Action dated May 25, 2012 issued in U.S. Appl. No. 12/782,382. |
Office Action dated May 30, 3012 issued in U.S. Appl. No. 12/783,900. |
Office Action dated May 23, 2012 issued in U.S. Appl. No. 12/784,136. |
Office Action dated Jun. 5, 2012 issued in U.S. Appl. No. 12/418,000. |
Feb. 29, 2012 Office Action issued in U.S. Appl. No. 12/782,382. |
Mar. 7, 2012 Office Action issued in U.S. Appl. No. 12/418,000. |
Office Action issued Dec. 14, 2011 in U.S. Appl. No. 12/782,382. |
Office Action issued Dec. 29, 2011 in U.S. Appl. No. 12/783,900. |
Office Action issued Dec. 29, 2011 in U.S. Appl. No. 12/835,108. |
Office Action issued Jan. 6, 2012 in U.S. Appl. No. 12/784,136. |
Nov. 28, 2012 Office Action issued in U.S. Appl. No. 12/418,000. |
Nov. 30, 2012 Notice of Allowance issued in U.S. Appl. No. 12/782,382. |
Mar. 13, 2013 Notice of Allowance issued in U.S. Appl. No. 12/782,382. |
Apr. 8, 2013 Office Action issued in U.S. Appl. No. 12/835,108. |
Apr. 19, 2013 Notice of Allowance issued in U.S. Appl. No. 12/889,770. |
Jun. 12, 2013 Notice of Allowance issued in U.S. Appl. No. 12/783,900. |
Jul. 16, 2013 Notice of Allowance issued in U.S. Appl. No. 12/889,770. |
Jul. 11, 2013 Corrected Notice of Allowability issued in U.S. Appl. No. 12/782,382. |
May 9, 2013 Supplemental Notice of Allowability issue in U.S. Appl. No. 12/889,770. |
Sep. 10, 2013 Notice of Allowance issued in U.S. Appl. No. 12/835,108. |
Feb. 6, 2013 Notice of Allowance issued in U.S. Appl. No. 12/784,136. |
Jan. 14, 2013 Advisory Action issued in U.S. Appl. No. 12/783,900. |
Jan. 28, 2013 Office Action issued in U.S. Appl. No. 12/783,900. |
Jan. 31, 2013 Office Action issued in U.S. Appl. No. 12/889,770. |
Jul. 23, 2012 Office Action issued in U.S. Appl. No. 12/835,108. |
Jul. 31, 2012 Office Action issued in U.S. Appl. No. 12/418,000. |
Sep. 14, 2012 Office Action issued in U.S. Appl. No. 12/784,136. |
Sep. 19, 2012 Office Action dated issued in U.S. Appl. No. 12/782,382. |
Sep. 27, 2012 Office Action Issued in U.S. Appl. No. 12/783,900. |
Oct. 17, 2012 Office Action issued in U.S. Appl. No. 12/889,770. |
U.S. Appl. No. 12/835,108 in the name of Kondo filed Jul. 13, 2010. |
U.S. Appl. No. 12/889,770 in the name of Todorokihara, filed Sep. 24, 2010. |
U.S. Appl. No. 12/784,136 in the name of Todorokihara, filed May 20, 2010. |
U.S. Appl. No. 12/782,382 in the name of Todorokihara, filed May 18, 2010. |
U.S. Appl. No. 12/418,000 in the name of Todorokihara, filed Apr. 3, 2009. |
U.S. Appl. No. 13/211,726 in the name of Todorokihara, filed Aug. 17, 2011. |
Sep. 25, 2013 Office Action Issued in U.S. Appl. No. 13/211,726. |
Number | Date | Country | |
---|---|---|---|
20110082656 A1 | Apr 2011 | US |