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by converting frequency into a train of pulses, which are then counted
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Measuring instruments
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MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
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Arrangements for measuring frequencies Arrangements for analysing frequency spectra
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G01R23/10
by converting frequency into a train of pulses, which are then counted
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last 30 patents
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Patent Grant
Oscillation detector and operating method thereof
Patent number
12,117,472
Issue date
Oct 15, 2024
Samsung Electronics Co., Ltd.
Jaeseung Lee
G01 - MEASURING TESTING
Information
Patent Grant
Anomaly detection apparatus, method and computer-readable medium
Patent number
12,044,714
Issue date
Jul 23, 2024
NEC Corporation
Murtuza Petladwala
G01 - MEASURING TESTING
Information
Patent Grant
Phase frequency detector-based high-precision feedback frequency me...
Patent number
11,965,919
Issue date
Apr 23, 2024
Zhejiang University
Xinglin Sun
G01 - MEASURING TESTING
Information
Patent Grant
Analysis threshold determination device and analysis threshold dete...
Patent number
11,927,521
Issue date
Mar 12, 2024
JVCKENWOOD CORPORATION
Atsushi Saito
G01 - MEASURING TESTING
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Patent Grant
Pulse train signal cycle estimation device, pulse train signal cycl...
Patent number
11,846,662
Issue date
Dec 19, 2023
Nippon Telegraph and Telephone Corporation
Hiroki Nagayama
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive control of bias settings in a digital microphone
Patent number
11,811,904
Issue date
Nov 7, 2023
Invensense, Inc.
Miroslav Svajda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for monitoring pulsed high-frequency power and substrate...
Patent number
11,545,340
Issue date
Jan 3, 2023
Semes Co., Ltd.
Jong Hwan An
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Frequency counter circuit for detecting timing violations
Patent number
11,493,950
Issue date
Nov 8, 2022
Movellus Circuits, Inc.
Jeffrey Fredenburg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Frequency synthesizer output cycle counter including ring encoder
Patent number
11,486,916
Issue date
Nov 1, 2022
Texas Instmments Incorporated
Tom Altus
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency measurement circuit and frequency measurement apparatus
Patent number
11,467,198
Issue date
Oct 11, 2022
Seiko Epson Corporation
Tomoaki Takahashi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency measurement apparatus, microcontroller, and electronic ap...
Patent number
11,333,693
Issue date
May 17, 2022
Seiko Epson Corporation
Keisuke Hashimoto
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Frequency synthesizer output cycle counter including ring encoder
Patent number
11,162,986
Issue date
Nov 2, 2021
Texas Instruments Incorporated
Tom Altus
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency multiplying device
Patent number
11,105,837
Issue date
Aug 31, 2021
Boris Antic
G01 - MEASURING TESTING
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Patent Grant
Electronic magnetometer and method for measuring magnetic field
Patent number
10,901,048
Issue date
Jan 26, 2021
INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES (IGGCAS)
Lin Zhao
G01 - MEASURING TESTING
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Patent Grant
Physical quantity measurement apparatus, electronic apparatus, and...
Patent number
10,884,041
Issue date
Jan 5, 2021
Seiko Epson Corporation
Katsuhiko Maki
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and device for measuring the frequency of a signal
Patent number
10,823,771
Issue date
Nov 3, 2020
STMicroelectronics S.A.
Marc Houdebine
G01 - MEASURING TESTING
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Patent Grant
Measuring process of the average frequency of an alternating signal...
Patent number
10,712,198
Issue date
Jul 14, 2020
STMicroelectronics (Grenoble 2) SAS
Pascal Mellot
G01 - MEASURING TESTING
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Patent Grant
Methods and devices for real-time monitoring of tunable filters
Patent number
10,615,892
Issue date
Apr 7, 2020
Purdue Research Foundation
Mohammad Abu Khater
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High speed sampling of sensors
Patent number
10,541,650
Issue date
Jan 21, 2020
Stingray Geophysical Hong Kong Limited
Julian Fells
G01 - MEASURING TESTING
Information
Patent Grant
On-chip frequency monitoring
Patent number
10,514,401
Issue date
Dec 24, 2019
QUALCOMM Incorporated
Bipin Duggal
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for determining characteristics of an input si...
Patent number
10,488,449
Issue date
Nov 26, 2019
SCHNEIDER ELECTRIC IT CORPORATION
Brian Patrick Mearns
G01 - MEASURING TESTING
Information
Patent Grant
Frequency synthesizer output cycle counter including ring encoder
Patent number
10,481,187
Issue date
Nov 19, 2019
Texas Instruments Incorporated
Tom Altus
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Digital frequency measuring apparatus
Patent number
10,451,661
Issue date
Oct 22, 2019
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Jong Woo Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring the frequency of a signal
Patent number
10,261,117
Issue date
Apr 16, 2019
STMicroelectronics S.A.
Marc Houdebine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Signal inspection apparatus, signal inspection system, signal inspe...
Patent number
10,184,966
Issue date
Jan 22, 2019
FANUC CORPORATION
Shouhei Miyashita
G01 - MEASURING TESTING
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Patent Grant
Pulse frequency measurement device and method and control system
Patent number
10,114,053
Issue date
Oct 30, 2018
ABB Schweiz AG
Lilei Zhai
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Length measuring apparatus, and method of manufacturing article
Patent number
10,030,966
Issue date
Jul 24, 2018
Canon Kabushiki Kaisha
Yukie Kuroki
G01 - MEASURING TESTING
Information
Patent Grant
Low power small area oscillator-based ADC
Patent number
9,903,892
Issue date
Feb 27, 2018
QUALCOMM Incorporated
Chuang Zhang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and circuit for reading an array of oscillators
Patent number
9,667,897
Issue date
May 30, 2017
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Vigier Margaux
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Health monitor for turbine flow meter
Patent number
9,651,590
Issue date
May 16, 2017
Rosemount Inc.
Greg Edward Gindele
F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Patents Applications
last 30 patents
Information
Patent Application
PULSE COUNTER
Publication number
20240426882
Publication date
Dec 26, 2024
Dolphin Design
Konan Constant ESSEY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SENSOR MODULE
Publication number
20240110960
Publication date
Apr 4, 2024
SEIKO EPSON CORPORATION
Kenta Sato
G01 - MEASURING TESTING
Information
Patent Application
PHASE FREQUENCY DETECTOR-BASED HIGH-PRECISION FEEDBACK FREQUENCY ME...
Publication number
20230092014
Publication date
Mar 23, 2023
Zhejiang University
Xinglin Sun
G01 - MEASURING TESTING
Information
Patent Application
OSCILLATION DETECTOR AND OPERATING METHOD THEREOF
Publication number
20230034874
Publication date
Feb 2, 2023
Samsung Electronics Co., Ltd.
JAESEUNG LEE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING FLOW REGIME ALTERATIONS FROM RESERVOIR INFLOW...
Publication number
20220398514
Publication date
Dec 15, 2022
SUN YAT-SEN UNIVERSITY
Tongtiegang ZHAO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAVEFORM MEASURING METHOD
Publication number
20220187351
Publication date
Jun 16, 2022
NANJING MACROTEST SEMICONDUCTOE TECHNOLOGY CO., LTD.
GUOLIANG MAO
G01 - MEASURING TESTING
Information
Patent Application
PULSE TRAIN SIGNAL CYCLE ESTIMATION DEVICE, PULSE TRAIN SIGNAL CYCL...
Publication number
20220128607
Publication date
Apr 28, 2022
Nippon Telegraph and Telephone Corporation
Hiroki NAGAYAMA
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY SYNTHESIZER OUTPUT CYCLE COUNTER INCLUDING RING ENCODER
Publication number
20220050131
Publication date
Feb 17, 2022
TEXAS INSTRUMENTS INCORPORATED
Tom Altus
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FREQUENCY MEASUREMENT APPARATUS, MICROCONTROLLER, AND ELECTRONIC AP...
Publication number
20210405099
Publication date
Dec 30, 2021
SEIKO EPSON CORPORATION
Keisuke Hashimoto
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY COUNTER CIRCUIT FOR DETECTING TIMING VIOLATIONS
Publication number
20210255661
Publication date
Aug 19, 2021
Movellus Circuits Incorporated
Jeffrey Fredenburg
G01 - MEASURING TESTING
Information
Patent Application
ANOMALY DETECTION APPARATUS, METHOD AND COMPUTER-READABLE MEDIUM
Publication number
20210247427
Publication date
Aug 12, 2021
NEC Corporation
Murtuza PETLADWALA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS THRESHOLD DETERMINATION DEVICE AND ANALYSIS THRESHOLD DETE...
Publication number
20210080373
Publication date
Mar 18, 2021
JVCKENWOOD CORPORATION
Atsushi SAITO
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MEASUREMENT CIRCUIT AND FREQUENCY MEASUREMENT APPARATUS
Publication number
20210063451
Publication date
Mar 4, 2021
SEIKO EPSON CORPORATION
Tomoaki TAKAHASHI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
APPARATUS FOR MONITORING PULSED HIGH-FREQUENCY POWER AND SUBSTRATE...
Publication number
20210050184
Publication date
Feb 18, 2021
SEMES CO., LTD.
Jong Hwan AN
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR REAL-TIME MONITORING OF TUNABLE FILTERS
Publication number
20200076516
Publication date
Mar 5, 2020
Purdue Research Foundation
Mohammad Abu Khater
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FREQUENCY MULTIPLYING DEVICE
Publication number
20200049747
Publication date
Feb 13, 2020
Smart Grid Solutions GmbH
Boris Antic
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY SYNTHESIZER OUTPUT CYCLE COUNTER INCLUDING RING ENCODER
Publication number
20200041551
Publication date
Feb 6, 2020
TEXAS INSTRUMENTS INCORPORATED
Tom Altus
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and Device for Measuring the Frequency of a Signal
Publication number
20190178922
Publication date
Jun 13, 2019
STMicroelectronics S.A.
Marc Houdebine
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC MAGNETOMETER AND METHOD FOR MEASURING MAGNETIC FIELD
Publication number
20180188337
Publication date
Jul 5, 2018
INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES (IGGCAS)
LIN ZHAO
G01 - MEASURING TESTING
Information
Patent Application
CLOCK FREQUENCY DETECTION METHOD AND APPARATUS
Publication number
20180137276
Publication date
May 17, 2018
Huawei Technologies Co., Ltd
Qi Su
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY MEASUREMENT APPARATUS, ELECTRONIC APPARATUS, AND...
Publication number
20180088160
Publication date
Mar 29, 2018
SEIKO EPSON CORPORATION
Katsuhiko MAKI
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED SAMPLING OF SENSORS
Publication number
20180013387
Publication date
Jan 11, 2018
Stingray Geophysical Inc.
Julian Fells
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL INSPECTION APPARATUS, SIGNAL INSPECTION SYSTEM, SIGNAL INSPE...
Publication number
20170242060
Publication date
Aug 24, 2017
FANUC CORPORATION
Shouhei MIYASHITA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING THE FREQUENCY OF A SIGNAL
Publication number
20170146578
Publication date
May 25, 2017
STMicroelectronics S.A.
Marc HOUDEBINE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MONITORING PULSED HIGH-FREQUENCY POWER AND SUBSTRATE...
Publication number
20170103871
Publication date
Apr 13, 2017
SEMES CO., LTD.
Jong Hwan AN
G01 - MEASURING TESTING
Information
Patent Application
LOW POWER SMALL AREA OSCILLATOR-BASED ADC
Publication number
20160069939
Publication date
Mar 10, 2016
QUALCOMM Incorporated
Chuang Zhang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINING CHARACTERISTICS OF AN INPUT SI...
Publication number
20150331027
Publication date
Nov 19, 2015
SCHNEIDER ELECTRIC IT CORPORATION
Brian Patrick Mearns
G01 - MEASURING TESTING
Information
Patent Application
PULSE FREQUENCY MEASUREMENT DEVICE AND METHOD AND CONTROL SYSTEM
Publication number
20150051858
Publication date
Feb 19, 2015
ABB Technology Ltd.
Lilei Zhai
G01 - MEASURING TESTING
Information
Patent Application
METHOD, CIRCUIT AND INTEGRATED CIRCUIT FOR DETECTING RESONANCE FREQ...
Publication number
20140354261
Publication date
Dec 4, 2014
Lei Huang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR DETECTING FREQUENCY
Publication number
20140232371
Publication date
Aug 21, 2014
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Wan Cheol YANG
G01 - MEASURING TESTING