Claims
- 1. An arrangement for producing a directional and cooled gas jet in an ion source with a gas inlet or a UV/fluorescence detection cell with a gas inlet, comprising: a capillary extending into the interior of said ion source which is evacuated to generate a vacuum so that one end of said capillary is disposed in said vacuum, said one end being provided with a nozzle for discharging a gas sample into said ion source while being subjected to adiabatic cooling, the width of said nozzle opening being at most 40% of the inner diameter of said capillary, and means for heating said capillary so as to prevent condensation of compounds from said sample in said nozzle.
- 2. An arrangement according to claim 1, wherein said capillary consists of one of ceramics, glass and quartz glass.
- 3. An arrangement according to claim 1, wherein the outer surface of said capillary is at least partially coated with a conductive material.
- 4. An arrangement according to claim 1, wherein said capillary consists of metal which is deactivated at the inside by an inert coating.
- 5. An arrangement according to claim 1, wherein said inert coating is a silicon-based coating.
- 6. An arrangement according to claim 1, wherein the open width of said nozzle opening is less than 15% of the inner capillary diameter.
- 7. An arrangement according to claim 1, wherein said capillary has an inner diameter of 500±350 μm and said nozzle has a diameter of 520% of the diameter of said capillary.
- 8. An arrangement according to claim 1, wherein said capillary is installed in said ion source of a mass spectrometer such that the ionization occurs in the range of 0-30 mm in front of said capillary.
- 9. An arrangement according to claim 1, wherein the nozzle of said capillary is disposed 0-30 mm ahead of the withdrawal opening that is the ionization location of the ion source or the excitation volume of the fluorescence cell.
- 10. The use of an inlet apparatus for the introduction of an eluent of a gas chromatograph or of a gas flow from an on-line sampling probe into an analysis apparatus with a gas inlet such as a fluorescence cell or an ion source with a gas inlet of a mass spectrometer.
Priority Claims (1)
Number |
Date |
Country |
Kind |
199 13 451.0 |
Mar 1999 |
DE |
|
Parent Case Info
[0001] This is a Continuation-In-Part application of international application PCT/EP00/01478 filed Feb. 23, 2000 and claiming the priority of German application 199 13 451.0 filed Mar. 25, 1999.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
PCT/EP00/01478 |
Feb 2000 |
US |
Child |
09962945 |
Sep 2001 |
US |