Number | Date | Country | Kind |
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3-302911 | Nov 1991 | JPX |
Number | Name | Date | Kind |
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4842408 | Yoshii et al. | Jun 1989 |
Number | Date | Country |
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62-263428 | Nov 1987 | JPX |
Entry |
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Univ. of Electrocommunications, "Subfringe Interferometry Fundamentals," Mitsuo Takeda, Oct. 1983 pp. 55-65. |
Homogeneity testing by phase sampling interferometry, Johannes Schwider et al, Sep. 15, 1985/vol. 24, No. 18 Applied Optics pp. 3059-3061. |