Number | Name | Date | Kind |
---|---|---|---|
4059749 | Felchenfeld | Nov 1977 | |
4099668 | Feilchenfeld et al. | Jul 1978 | |
4606024 | Glass et al. | Aug 1986 | |
4785453 | Chandran et al. | Nov 1988 | |
4802231 | Davis | Jan 1989 | |
4853928 | Williams | Aug 1989 | |
4937826 | Gheewala et al. | Jun 1990 | |
4958347 | White et al. | Sep 1990 | |
5018144 | Corr et al. | May 1991 | |
5099436 | McCown et al. | Mar 1992 | |
5189674 | Shimizu | Feb 1993 | |
5220662 | Lipton | Jun 1993 | |
5410548 | Millman | Apr 1995 |
Entry |
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IBM Technical Disclosure Bulletin, vol. 31 No. 2, Jul. 1988-Flexible Fault Model for Test Generation-pp. 299-302. |