by preliminary fault modelling

Industry

CPC
G01R31/318342

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318342by preliminary fault modelling

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Stress-testing electrical components using telemetry modeling
- Patent number 12,038,479
- Issue date Jul 16, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,837,308
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal toggling detection and correction circuit
- Patent number 11,686,769
- Issue date Jun 27, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Grant
Input data compression for machine learning-based chain diagnosis
- Patent number 11,681,843
- Issue date Jun 20, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Noise-compensated jitter measurement instrument and methods
- Patent number 11,624,781
- Issue date Apr 11, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for testing circuit elements at one or more m...
- Patent number 11,599,098
- Issue date Mar 7, 2023
- Ares Technologies, Inc.
- Christian T Wentz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unified approach for improved testing of low power designs with clo...
- Patent number 11,592,481
- Issue date Feb 28, 2023
- Ambarella International LP
- Praveen Kumar Jaini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
Utilizing single cycle ATPG test patterns to detect multicycle cell...
- Patent number 11,579,194
- Issue date Feb 14, 2023
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive cell-aware test model for circuit diagnosis
- Patent number 11,573,873
- Issue date Feb 7, 2023
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power electronic circuit fault diagnosis method based on extremely...
- Patent number 11,549,985
- Issue date Jan 10, 2023
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-stage machine learning-based chain diagnosis
- Patent number 11,361,248
- Issue date Jun 14, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for false-positive reduction in power electroni...
- Patent number 11,293,981
- Issue date Apr 5, 2022
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Donald McMenemy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,295,831
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive analytics of device performance
- Patent number 11,277,327
- Issue date Mar 15, 2022
- International Business Machines Corporation
- Tomasz Hanusiak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system as well as method of providing statistical infor...
- Patent number 11,256,781
- Issue date Feb 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Luke Cirillo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performance calculation system, performance calculation method, and...
- Patent number 11,095,251
- Issue date Aug 17, 2021
- Global Unichip Corporation
- Ting-Hao Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for multiple device diagnostics and failure grouping
- Patent number 10,996,270
- Issue date May 4, 2021
- Cadence Design Systems, Inc.
- Sameer Chillarige
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement gap communication
- Patent number 10,993,153
- Issue date Apr 27, 2021
- Telefonaktiebolaget LM Ericsson (publ)
- Oumer Teyeb
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing an embedded controller
- Patent number 10,890,621
- Issue date Jan 12, 2021
- Raytheon Company
- Terence J. McKiernan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cell-aware diagnostic pattern generation for logic diagnosis
- Patent number 10,795,751
- Issue date Oct 6, 2020
- Mentor Graphics Corporation
- Huaxing Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing storage device power circuitry
- Patent number 10,699,798
- Issue date Jun 30, 2020
- Microsoft Technology Licensing, LLC
- Laura Marie Caulfield
- G11 - INFORMATION STORAGE
Information Patent Grant
Mapping physical shift failures to scan cells for detecting physica...
- Patent number 10,605,863
- Issue date Mar 31, 2020
- Synopsys, Inc.
- Subhadip Kundu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated waveform analysis methods using a parallel automated deve...
- Patent number 10,598,722
- Issue date Mar 24, 2020
- Advanced Testing Technologies, Inc.
- Robert Spinner
- G01 - MEASURING TESTING
Information Patent Grant
Functional diagnostics based on dynamic selection of alternate cloc...
- Patent number 10,585,142
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Flip flop of a digital electronic chip
- Patent number 10,585,143
- Issue date Mar 10, 2020
- STMicroelectronics International N.V.
- Pascal Urard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive analytics of device performance
- Patent number 10,560,366
- Issue date Feb 11, 2020
- International Business Machines Corporation
- Tomasz Hanusiak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit structures to resolve random testability
- Patent number 10,545,190
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Raghu G. GopalaKrishnaSetty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test-pattern generation for memory-shadow-logic testing
- Patent number 10,535,416
- Issue date Jan 14, 2020
- STMicroelectronics International N.V.
- Nishu Kohli
- G01 - MEASURING TESTING
Information Patent Grant
Circuit structures to resolve random testability
- Patent number 10,527,674
- Issue date Jan 7, 2020
- International Business Machines Corporation
- Raghu G. GopalaKrishnaSetty
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic Test Pattern Generation-Based Circuit Verification Method...
- Publication number 20240125850
- Publication date Apr 18, 2024
- Huawei Technologies Co., Ltd
- Huiling Zhen
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING-BASED MLCC STACKED ALIGNMENT INSPECTION SYSTEM AND ME...
- Publication number 20240103076
- Publication date Mar 28, 2024
- Korea University of Technology and Education Industry-University Cooperation...
- Heung-Seon OH
- G01 - MEASURING TESTING
Information Patent Application
STRESS-TESTING ELECTRICAL COMPONENTS USING TELEMETRY MODELING
- Publication number 20240085477
- Publication date Mar 14, 2024
- Cisco Technology, Inc.
- James Edwin Turman
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
- Publication number 20240087668
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT
- Publication number 20230213580
- Publication date Jul 6, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Application
BACKSIDE POWER RAIL FOR PHYSICAL FAILURE ANALYSIS (PFA)
- Publication number 20230009640
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Chao CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS
- Publication number 20220299566
- Publication date Sep 22, 2022
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
- Publication number 20220230699
- Publication date Jul 21, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Vector Eyes
- Publication number 20210223314
- Publication date Jul 22, 2021
- Richard C. Carmichael
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR FALSE-POSITIVE REDUCTION IN POWER ELECTRONI...
- Publication number 20210215760
- Publication date Jul 15, 2021
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Donald McMenemy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER ELECTRONIC CIRCUIT FAULT DIAGNOSIS METHOD BASED ON EXTREMELY...
- Publication number 20200386811
- Publication date Dec 10, 2020
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AS WELL AS METHOD OF PROVIDING STATISTICAL INFOR...
- Publication number 20200265110
- Publication date Aug 20, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Application
Measurement Gap Communication
- Publication number 20200128454
- Publication date Apr 23, 2020
- Oumer Teyeb
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PREDICTIVE ANALYTICS OF DEVICE PERFORMANCE
- Publication number 20200044952
- Publication date Feb 6, 2020
- International Business Machines Corporation
- Tomasz Hanusiak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALTERNATIVE TECHNIQUES FOR DESIGN OF EXPERIMENTS
- Publication number 20190383874
- Publication date Dec 19, 2019
- Holger M. Jaenisch
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE ANALYTICS OF DEVICE PERFORMANCE
- Publication number 20190166034
- Publication date May 30, 2019
- International Business Machines Corporation
- Tomasz Hanusiak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY
- Publication number 20190056450
- Publication date Feb 21, 2019
- International Business Machines Corporation
- Raghu G. GopalaKrishnaSetty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY
- Publication number 20190056449
- Publication date Feb 21, 2019
- International Business Machines Corporation
- Raghu G. GopalaKrishnaSetty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLIP FLOP OF A DIGITAL ELECTRONIC CHIP
- Publication number 20190018062
- Publication date Jan 17, 2019
- STMicroelectronics S.A.
- Pascal URARD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING AN EMBEDDED CONTROLLER
- Publication number 20180348301
- Publication date Dec 6, 2018
- Raytheon Company
- Terence J. McKiernan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC TEST-PATTERN GENERATION FOR MEMORY-SHADOW-LOGIC TESTING
- Publication number 20180025787
- Publication date Jan 25, 2018
- STMicroelectronics International N.V.
- Nishu Kohli
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL SELECTION APPARATUS AND SYSTEM, AND CIRCUIT EMULATOR AND MET...
- Publication number 20140229906
- Publication date Aug 14, 2014
- NEC Corporation
- Kohei Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT LEAKAGE POWER REDUCTION USING ENHANCED GATED-Q S...
- Publication number 20130241593
- Publication date Sep 19, 2013
- QUALCOMM Incorporated
- Rajamani Sethuram
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SIMULATING CIRCUIT OPERATION
- Publication number 20130018643
- Publication date Jan 17, 2013
- Prashant Sharma
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TEST VECTOR GENERATION
- Publication number 20130014066
- Publication date Jan 10, 2013
- WhizChip Design Technologies Pvt. Ltd.
- RAVISHANKAR RAJARAO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST-PATTERN GENERATION FOR MEMORY-SHADOW-LOGIC TESTING
- Publication number 20130007548
- Publication date Jan 3, 2013
- STMICROELECTRONICS PVT. LTD.
- Nishu KOHLI
- G01 - MEASURING TESTING
Information Patent Application
Root Cause Distribution Determination Based On Layout Aware Scan Di...
- Publication number 20120297264
- Publication date Nov 22, 2012
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING TEST PATTERNS FOR USE IN AT-SPE...
- Publication number 20120191401
- Publication date Jul 26, 2012
- International Business Machines Corporation
- CHANDRAMOULI VISWESWARIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IDENTIFYING POWER DEFECTS USING TEST PATTERN...
- Publication number 20120089879
- Publication date Apr 12, 2012
- Cadence Design Systems Inc.
- Thomas Webster Bartenstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated Circuit Leakage Power Reduction using Enhanced Gated-Q S...
- Publication number 20120068734
- Publication date Mar 22, 2012
- QUALCOMM Incorporated
- Rajamani Sethuram
- G06 - COMPUTING CALCULATING COUNTING

by preliminary fault modelling

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Stress-testing electrical components using telemetry modeling

Systems and methods to detect cell-internal defects

Signal toggling detection and correction circuit

Input data compression for machine learning-based chain diagnosis

Noise-compensated jitter measurement instrument and methods

Apparatus and methods for testing circuit elements at one or more m...

Unified approach for improved testing of low power designs with clo...

Trajectory-optimized test pattern generation for built-in self-test

Utilizing single cycle ATPG test patterns to detect multicycle cell...

Adaptive cell-aware test model for circuit diagnosis

Power electronic circuit fault diagnosis method based on extremely...

Multi-stage machine learning-based chain diagnosis

Systems and methods for false-positive reduction in power electroni...

Systems and methods to detect cell-internal defects

Predictive analytics of device performance

Measurement system as well as method of providing statistical infor...

Performance calculation system, performance calculation method, and...

System and method for multiple device diagnostics and failure grouping

Measurement gap communication

Systems and methods for testing an embedded controller

Cell-aware diagnostic pattern generation for logic diagnosis

Testing storage device power circuitry

Mapping physical shift failures to scan cells for detecting physica...

Automated waveform analysis methods using a parallel automated deve...

Functional diagnostics based on dynamic selection of alternate cloc...

Flip flop of a digital electronic chip

Predictive analytics of device performance

Circuit structures to resolve random testability

Automatic test-pattern generation for memory-shadow-logic testing

Circuit structures to resolve random testability

Patents Applicationslast 30 patents

Automatic Test Pattern Generation-Based Circuit Verification Method...

DEEP LEARNING-BASED MLCC STACKED ALIGNMENT INSPECTION SYSTEM AND ME...

STRESS-TESTING ELECTRICAL COMPONENTS USING TELEMETRY MODELING

SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS

SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT

BACKSIDE POWER RAIL FOR PHYSICAL FAILURE ANALYSIS (PFA)

NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS

SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS

Vector Eyes

SYSTEMS AND METHODS FOR FALSE-POSITIVE REDUCTION IN POWER ELECTRONI...

POWER ELECTRONIC CIRCUIT FAULT DIAGNOSIS METHOD BASED ON EXTREMELY...

MEASUREMENT SYSTEM AS WELL AS METHOD OF PROVIDING STATISTICAL INFOR...

Measurement Gap Communication

PREDICTIVE ANALYTICS OF DEVICE PERFORMANCE

ALTERNATIVE TECHNIQUES FOR DESIGN OF EXPERIMENTS

PREDICTIVE ANALYTICS OF DEVICE PERFORMANCE

CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

CIRCUIT STRUCTURES TO RESOLVE RANDOM TESTABILITY

FLIP FLOP OF A DIGITAL ELECTRONIC CHIP

SYSTEMS AND METHODS FOR TESTING AN EMBEDDED CONTROLLER

AUTOMATIC TEST-PATTERN GENERATION FOR MEMORY-SHADOW-LOGIC TESTING

SIGNAL SELECTION APPARATUS AND SYSTEM, AND CIRCUIT EMULATOR AND MET...

INTEGRATED CIRCUIT LEAKAGE POWER REDUCTION USING ENHANCED GATED-Q S...

METHODS AND SYSTEMS FOR SIMULATING CIRCUIT OPERATION

METHOD AND SYSTEM FOR TEST VECTOR GENERATION

AUTOMATIC TEST-PATTERN GENERATION FOR MEMORY-SHADOW-LOGIC TESTING

Root Cause Distribution Determination Based On Layout Aware Scan Di...

METHOD AND APPARATUS FOR GENERATING TEST PATTERNS FOR USE IN AT-SPE...

METHOD AND SYSTEM FOR IDENTIFYING POWER DEFECTS USING TEST PATTERN...

Integrated Circuit Leakage Power Reduction using Enhanced Gated-Q S...