1. Field of the Invention
The present invention relates generally to curable adhesives. In particular, the invention relates to joining work pieces used in semiconductor fabrication equipment.
2. Description of the Prior Art
Batch substrate processing is used in fabricating semiconductor integrated circuits and similar micro structural arrays. In batch processing, many silicon wafers or other types of substrates are placed together on a wafer support fixture in a processing chamber and processed. Most batch processing includes extended exposure to high temperature, for example, in depositing planar layers of oxide or nitride or annealing previously deposited layers or dopants implanted into existing layers. A vertically arranged wafer tower is an example of the support fixture that supports many wafers one above the other in the processing chamber.
Vertical support towers are made of a variety of materials including: quartz, silicon carbide, and silicon. For example, a silicon tower 10, illustrated orthographically in
Vertical support towers, such as the silicon tower 10, require that certain components be joined together. For example, fabricating the silicon tower 10 involves joining the machined legs 12 to the bases 14. As schematically illustrated in
One way of joining components (e.g., those of the vertical support tower 10) includes the use of spin-on glass (SOG). For example, one way to adhere the ends 26 of the legs 12 to walls of the holes 24 of each base 14, involves using SOG, that has been thinned with an alcohol or the like, as a curable adhesive. The SOG is applied to one or both of the members in the area to be joined. The members are assembled and then annealed at 600° C. or above to vitrify the SOG in the seam between the members.
SOG is widely used in the semiconductor industry for forming thin inter-layer dielectric layers so that it is commercially available at relatively low expense and of fairly high purity. SOG is a generic term for chemicals widely used in semiconductor fabrication to form silicate glass layers on integrated circuits. Commercial suppliers include Allied Signal, Filmtronics of Butler, Pa., and Dow Corning. SOG precursors include one or more chemicals containing both silicon and oxygen as well as hydrogen and possibly other constituents. An example of such a precursor is tetraethylorthosilicate (TEOS) or its modifications or an organo-silane such as siloxane or silsesquioxane. When used in an adhesive, it is preferred that the SOG not contain boron or phosphorous, as is sometimes done for integrated circuits. The silicon and oxygen containing chemical is dissolved in an evaporable liquid carrier, such as an alcohol, methyl isobutyl ketone, or a volatile methyl siloxane blend. The SOG precursor acts as a silica bridging agent in that the precursor chemically reacts, particularly at elevated temperature, to form a silica network having the approximate composition of SiO2.
Another way of joining components (e.g., those of the vertical support tower 10) includes the use of SOG and silicon powder mixture. For example, another way to adhere the ends 26 of the legs 12 to walls of the holes 24 of each base 14, involves using SOG and silicon powder mixture as a curable adhesive. The SOG is applied to one or both of the members in the area to the joined. The members are assembled and then annealed at 400° C. or above to vitrify the SOG in the seam between the members. The silicon powder in the mixture improves the purity of the bond between structural members than if SOG were used alone.
Unfortunately there are deficiencies to the above described conventional methods of joining two work pieces together. For example, when using SOG for bonding purposes, the bonded structure and in particular the bonding material may still be excessively contaminated, especially by heavy metal. The very high temperatures experienced in the use or cleaning of the silicon towers, sometimes above 1300° C., may worsen the contamination. One possible source of the heavy metals is the relatively large amount of SOG used to fill the joint between the members to be joined. Siloxane SOG is typically cured at around 400° C. when used in semiconductor fabrication, and the resultant glass is not usually exposed to high-temperature chlorine. However, it is possible that the very high temperature used in curing a SOG adhesive draws out the few but possibly still significant number of heavy metal impurities in the SOG.
Furthermore, the joints joined by SOG adhesive are not as strong as desired. Support towers are subject to substantial thermal stresses during cycling to and from high temperatures, and may be accidentally mechanically shocked over extended usage. It is desirable that the joints not determine the lifetime of the support tower.
Additionally, mixing a silicon powder into the SOG improves the purity of the bond. However joints formed by this silicon powder SOG mixture are still not as strong as may be desirable.
Furthermore, yet another deficiency of the above described conventional joining methods is that they are not selectively conductive or non-conductive.
In contrast to the above described conventional methods of joining two work pieces together, an improved method for bonding two work pieces together includes using a mixed silicon compound (precursors) having a polycarbosilane backbone with bonding powder. When heated, silicon compounds having polycarbosilane backbone decompose into fragments. These fragments may be gaseous atoms or radicals of silicon and/or carbon. Recombination of gaseous silicon and carbon followed by condensation gives SiC in solid state. The excess carbon allows carbon-impregnation processes on the work pieces and powders imbedded within SiC bridging matrix, resulting in joining either conductive joining or non-conductive joining of workpieces with a covalent bonding force. Conductivity of the joining depends on the mixing powders. For example, conducting powders such as metal, and doped Si provide for a conducting joining.
For example, one embodiment is directed to a mixture having a silicon compound having a polycarbosilane backbone, and a powder having a plurality of individual powder grains, wherein each of the plurality of powder grains has a diameter substantially between 0.05 micrometers and 50 micrometers.
a is a diagram showing an improved way of bonding a coating to a workpiece.
b is a diagram showing an improved way of bonding a coating to a workpiece.
c is a diagram showing an improved way of bonding a coating to a workpiece.
d is a diagram showing an improved way of bonding a coating to a workpiece.
The preferred embodiment(s) of the present invention is illustrated in
Examples of the silicon compounds 32 include polysilamethylenosilane (PSMS), Trisilaalkanes, Dimethyltrisilaheptanes, Dimethyldichlorosilane, cyclic [—CH2SiCl2—]3, and mixtures of these precursors. The formula for Trisilaalkanes is shown in
The powder mixture 34 may be made of a number of different materials depending on the work piece that the mixture 30 is to be applied to and the level of conductivity that is desired. For example, in some arrangements, the powder mixture 34 is made of metals capable of forming carbide compounds (e.g., refractory metals including Ti, Ta, Mo, W, etc.). Additionally, in other arrangements, the powder mixture 34 is made of semiconductors (e.g., Si, doped-Si, SiGe, doped-SiGe, GaAs, SiC, etc.). In other arrangements, the powder mixture 34 is made of carbides (e.g, SiC, SiGeC, GeC, TiC, TaC, etc.). In yet other arrangements, the powder mixture 34 is made of carbon or graphite.
Individual grains of the powder mixture 34 are sized with diameters between 0.05 μm˜50 μm. Additionally, the powder mixture 34 takes up less than 70% of the volume of the mixture 30.
In use, for example, the mixture 30 is used to bond two work pieces together. Work pieces may be made of various materials including ceramic, refractory metals, semiconductors (e.g., Si, SiGe, SiC, doped Si, doped-SiGe, etc.), and graphite.
To form the bond between the first work piece 38 and the second work piece 40, the pre-curing assembly 36 is subjected to heating and cooling cycles as seen in
During heating, the mixture 30 undergoes pyrolysis (or sintering). The silicon compounds 32 having the polycarbosilane backbone decompose into fragments. These fragments may be gaseous atoms or radicals of silicon and/or carbon. Recombination of gaseous silicon and carbon followed by condensation produces SiC in solid state. Excess carbon allows carbon-impregnation processes to occur on the work pieces 38, 40 and powders 34 imbedded within the newly formed SiC bridging matrix. Thus strong covalent bonds are formed between the first work piece 38 and the second work piece 40.
The SiC bridging matrix 48 (i.e., Nano-sized “Carbon-rich (0<C≦15 at. %) SiC”) is pyrolyzed from the silicon compounds 32 having the polycarbosilane backbone by high temperature pyrolysis (or sintering) process at 1,100° C.˜1,300° C. for several hours in inert atmosphere (e.g., Ar, N2).
After the thermal pyrolysis process, the first carbide layer 50 forms between the first surface 42 of the first work piece 38 and the SiC bridging matrix 48 by a diffusion process between first work piece 38 and gaseous atoms or radicals of silicon and/or carbon, and/or carbon-impregnation process caused by a precursor decomposition.
Similarly, after the thermal pyrolysis process, the second carbide layer 52 forms between the second surface 44 of the second work piece 40 and the SiC bridging matrix 48 by a diffusion process between second work piece 40 and gaseous atoms or radicals of silicon and/or carbon, and/or carbon-impregnation process caused by a precursor decomposition.
After the thermal pyrolysis process, a powder carbide layer 58 (e.g., SiC, SiGeC, Ti(Si)C, Ta(Si)C, Mo(Si)C, W(Si)C, etc.) forms on bigger powder particles 34 (i.e., powder particles 34 with diameters greater than 1 μm) to create the carbide-surface-layer particles 56. The powder carbide layer 58 is formed by the carbon-impregnation and/or diffusion process. Smaller powder particles 34 (i.e., powder particles 34 with diameters less than 1 μm) are fully transformed into the carbonized particles 54. The carbonized particles 54 are also formed by the carbon-impregnation and/or diffusion process.
The strong bond between the first work piece 38 and the second work piece 40 is due to covalent bonding 58. In particular, the covalent bonding 58 among the carbide layers 50, 52, the carbonized particles 54, and the carbide-surface-layer particles 56.
Step 102 is to clean the surface 42 of the first work piece 38. This cleaning may be done physically and/or chemically to remove surface 42 impurities and promote a strong bonding.
Step 104 is to apply the mixture 30 to the surface 42 of the first work piece 38, the mixture 30 including a silicon compound 32 having a polycarbosilane backbone, and a powder 34 having a plurality of individual powder grains.
Step 106 is to join the surface 44 of the second work piece 40 to the mixture 30 coating the surface 42 of the first work piece 38.
Step 108 is to heat the first work piece 38, the second work piece 40, and the mixture 30 to a temperature sufficient to decompose the silicon compound 32 into gaseous atoms and radicals of silicon and carbon, wherein, after decomposition of the silicon compound, the gaseous atoms and radicals of silicon and carbon combine and condense to form (i) a carbon-rich silicon-carbide matrix 48, (ii) carbonized layers 50, 52, 58 on the first surface 42 of the first work piece 38, the second surface 44 of the second work piece 40, and outer surfaces of the plurality of powder grains 34; and (iii) covalent bonds 60 linking together the carbonized layers 50, 52, 58 of the first surface 42 of the first work piece 38, the second surface 44 of the second work piece 40, and the outer surfaces of the plurality of powder grains 38.
There are other uses for the mixture 30 other than joining together work pieces 38, 40. In some embodiments, the mixture 30 is used as a protective coating for objects subject to harsh conditions such as those found in semiconductor manufacturing processes. For example, in semiconductor manufacturing processes, polysilicon films are required for making conductors such as word-lines, bit-lines, and resistors. Low-pressure chemical vapor deposition (LPCVD) equipment is used to create these polysilicon films. Additionally, LPCVD equipment uses a quartz bell jar as an outer tube to control atmosphere. During operation of the LPCVD equipment, polysilicon is deposited on an inner surface of the quartz bell jar. As the thickness of the polysilicon film increases, the strain of the accumulated film ultimately exceeds its yield strength (due of the differences in thermal expansion coefficients between the polysilicon and the quartz), and the film peels off and generates particulates.
By applying the mixture 30 the surface of a workpiece 38 (e.g., interior surface of the quartz bell jar) sintering at high temperature in the same way as described above with respect to bonding workpieces 38, 40, the film peel-off problem is reduced. The coatings are “nano-structured SiC-based coatings” which covered the workpiece, and the bonding strength of the coatings is very high because the radicals of silicon and carbon from the precursor react with the mixed powders and the surface of the work piece during heat treatment. This chemical reaction produces covalent bonding between powders, bridging matrix, and the surface of the workpieces. So, the coating will allow work pieces such as the quartz bell jar to be cleaned less often because it accommodates the film stress.
To increase the adhesion of the coating 30, certain surface treatments provide recesses with tangential angles smaller than 90 degrees to allow anchoring of the coating into the work piece 38.
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When the mixture 30 is used as a coating, conductive properties may be preselected similar to as was done when using the mixture for bonding. For example, a non-conductive work piece may be changed into a conductive work piece by selecting powders 34 that are metallic. This produces, for example, a conductive coating on insulating ceramics to resolve “charging” in plasma systems or an ion implanter.
Another application is a passivation of the work piece. The base material is SiC which is a chemically inert material, does not dissolved in HF and KOH. So, deposited silicon film on the coating can be removed by dipping in KOH solution, and can be recycled the work piece.
Although the preferred embodiments of the present invention have been described herein, the above description is merely illustrative. Further modification of the invention herein disclosed will occur to those skilled in the respective arts and all such modifications are deemed to be within the scope of the invention as defined by the appended claims.
This Patent Application is a divisional application of U.S. patent application Ser. No. 12/890,037, which claims the benefit of U.S. Provisional Patent Application No. 61/277,362 filed on Aug. 25, 2009, entitled, “JOINING TWO MEMBERS BY A THERMAL PYROLYSIS OF CARBON-RICH SILICON COMPOUNDS HAVING POLYCARBOSILANE BACKBONE WITH POWDER MIXTURE”, the contents and teachings of which are hereby incorporated by reference in their entirety.
Number | Date | Country | |
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Parent | 12890037 | Sep 2010 | US |
Child | 13548885 | US |