Claims
- 1. An imaging method comprising:
- providing an imaging member comprising a stable substrate having a particulate discontinuous layer of agglomerable imaging material on one surface of said substrate, wherein the particles have an average size of not greater than about two microns, and
- imagewise exposing said member to an image pattern of electromagnetic radiation of sufficient energy to cause the agglomerable imaging material in the imagewise exposed areas to agglomerate and fuse whereby the total cross-sectional area of the exposed, fused imaging material is less than the total cross-sectional area of the unexposed, non-fused imaging material, thereby substantially reducing the visibility of said exposed material and providing an imagewise contrast with the unexposed material.
- 2. The method of claim 1 wherein said discontinuous layer of imaging material comprises particles of imaging material having average particle size not greater than about 1 micron.
- 3. The method of claim 2 wherein said discontinuous layer of imaging material comprises particles of said imaging material having average particle size not greater than about 0.5 microns.
- 4. The method of claim 2 wherein said particles of imaging material have particle-to-particle spacings not greater than about 1/2 micron.
- 5. The method of claim 1 wherein said imaging material comprises a material selected from the group consisting of: selenium, tellurium, arsenic, zinc, sulfur, gallium, cobalt tricarbonyl, and mixtures thereof.
- 6. The method of claim 1 wherein said imaging material comprises amorphous selenium.
- 7. The method of claim 1 wherein the step of imagewise exposing said member comprises exposing imagewise portions of said member to electromagnetic radiation of energy in the range between about 0.001 and about 0.3 joules/cm.sup.2.
- 8. The method of claim 7 wherein said electromagnetic radiation is of wavelength in the range between about 2,000 A and about 26,000 A.
- 9. The method of claim 7 wherein the imagewise exposure is carried out for a time period in the range between about 10 microseconds and about 10.sup.5 microseconds.
- 10. The method of claim 7 wherein the source of said electromagnetic radiation is a Xenon gas discharge lamp.
- 11. The method of claim 7 wherein the source of said electromagnetic radiation is a laser.
CROSS-REFERENCE TO RELATED APPLICATIONS
This is a division of application Ser. No. 84,018 filed Oct. 26, 1970, now U.S. Pat. No. 4,084,966, granted Apr. 18, 1978, which is a continuation-in-part of copending U.S. Patent Application Ser. No. 755,163, filed Aug. 26, 1968 now abandoned.
US Referenced Citations (14)
Divisions (1)
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84018 |
Oct 1970 |
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Continuation in Parts (1)
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755163 |
Aug 1968 |
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