Imaging system with X-ray beam angulation compensation

Information

  • Patent Grant
  • 6422749
  • Patent Number
    6,422,749
  • Date Filed
    Thursday, July 13, 2000
    24 years ago
  • Date Issued
    Tuesday, July 23, 2002
    22 years ago
Abstract
In an X-ray imaging system, an arrangement is provided for readily aligning the system detector with the X-ray beam field, i.e., the projection of the X-ray beam into the plane of the detector. The arrangement is adapted for correcting or compensating for distortion which results from X-ray beam angulation, wherein the beam is projected toward the detector plane at an angle of less than 90°. Initially, the system X-ray tube is positioned to project the X-ray beam at a given beam direction angle φ. A beam width angle γ1 is then computed, from the given angle φ and from specified values of the source-to-image distance and the length of the projected beam field. Thereupon, an offset value is determined from γ1, φ and the source-to-image distance to locate the geometric center of the beam field, and the center of the detector is aligned therewith.
Description




BACKGROUND OF THE INVENTION




The invention disclosed and claimed herein generally pertains to a method and apparatus for correcting or compensating for distortion of the shape of the X-ray field in an X-ray imaging system. More particularly, the invention pertains to a method of the above type wherein distortion results from X-ray beam angulation, that is, projection of the X-ray beam toward the X-ray detector at an angle of less than 90 degrees. Even more particularly, the invention pertains to a method of the above type wherein the geometric center of the X-ray beam field, as projected into the plane of the detector and distorted by the angulation, is computed and selectively positioned with respect to the detector.




As is well known, in a typical X-ray imaging system a patient is positioned between an X-ray tube and an image receptor having a planar imaging surface, such as an X-ray film or a digital solid state detector. The tube projects a beam of X-radiation toward the detector surface and through body structure of the patient which is to be imaged. The area of projected X-radiation which is incident on the detector defines the active imaging area (AIA) . Generally, the X-ray beam field or field of view (FOV), which is defined herein to be the intersection of the projected beam and the detector plane, must be coincident with, or lie within, the boundaries of the detector surface in order to avoid loss of image data. The FOV may be adjusted by rotating or tilting the tube to vary the direction of the projected X-ray beam, and also by operating a collimator to vary the width and length dimensions of the X-ray beam. Further adjustments may be made by linear translation of the tube and/or the detector




If the tube is oriented so that the X-ray beam, or more particularly the beam axis or central ray thereof, is directed in perpendicular or orthogonal relationship to the detector plane, the beam field projected into the detector plane will be of rectangular configuration. However, an X-ray technician or operator, when setting up for an imaging procedure, may need to angulate the beam, that is, rotate or pivot the X-ray tube so that the beam is directed toward the detector at an angle of less than 90 degrees. This may be necessary, for example, to ensure that the beam passes through the specific body structure of the patient which is to be imaged. As the X-ray beam is increasingly angulated, however, the beam field projected into the detector becomes correspondingly distorted and trapezoidal, and the location of the center of the central ray of the beam becomes offset with respect to the geometric center of the projected X-ray field. As a consequence of these decentering and distorting effects, the task of the operator to achieve alignment becomes more difficult, time consuming and prone to error. More specifically, it may become necessary for the operator to re-collimate the X-ray beam to a smaller field size, or to realign the image detector with the beam field, in order to achieve optimal centering of the projected image onto the detector. It may also be necessary to reposition the patient. In the absence of optimal or appropriate centering, anatomical cutoff may occur during the imaging process, which would necessitate that the examination be repeated, thus contributing to increased procedure cycle time, higher examination costs, and higher net radiation doses to the patient. Moreover, if beam angulation causes the angle of beam incidence to exceed +/−10°, current regulations prevent use of an automated device to adjust the collimator. Accordingly, the system operator must manually collimate the beam to a desired field size.




SUMMARY OF THE INVENTION




The invention relates to an arrangement for enabling an operator of an X-ray system to quickly and efficiently align the X-ray detector with the imaging subject and the projected X-ray beam, in a manner which avoids anatomical cutoff and inaccurate positioning, notwithstanding any angulation of the beam or distortion effects resulting therefrom. Moreover, the invention reduces cycle time by enabling autocollimation for angles of beam incidence in excess of +/−10°, and by providing for automatic shifting of the detector.




One embodiment of the invention is directed to a method of alignment for an imaging system provided with an X-ray tube and a detector having a surface lying in a specified plane, wherein the tube is spaced apart from the detector by a source-to-image distance (SID) along a first axis, and wherein the tube is disposed to project an X-ray beam characterized by a beam direction angle φ and a beam width angle γ toward the detector. The method includes the step of specifying the length dimension of the beam field projected into the specified detector plane, the length dimension being measured along a second axis which is orthogonal to the first axis. The method further comprises the steps of computing a value of the beam width angle from the specified beam field length, the SID and the beam direction angle, and then locating the geometric center of the beam field from the computed beam width angle, the SID and the beam direction angle. Thereupon, a selected positional relationship is established between the center of the detector surface and the geometric center of the beam field.




In a preferred embodiment of the invention, the locating step comprises determining the point at which the central axis of the projected beam intersects the detector plane, and then locating the geometric center at a point which is spaced apart from the beam axis intersection point, along the second axis, by a computed offset value. The offset value is computed from the SID and beam direction angle, and also from the computed value of the beam width angle. Preferably also, the center of the detector surface is aligned with the geometric center of the beam field, after the offset value has been determined. In one useful embodiment, the specified length of the beam field is equal to the length of the detector surface extending along the second axis. In another useful embodiment, the specified length of the beam field is selectively less than the length of the detector surface along the second axis.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a perspective view showing components of an X-ray imaging system for use in connection with an embodiment of the invention.





FIG. 2

is a schematic diagram showing components of the system of

FIG. 1

in simplified form, together with an imaging subject, to illustrate principles of an embodiment of the invention.





FIG. 3

is a view taken along lines


3





3


of

FIG. 2

, illustrating distortion of the beam field which results from X-ray beam angulation.





FIG. 4

shows two other beam fields for comparison with the field of FIG.


3


.











DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT




Referring to

FIG. 1

, there is shown an X-ray imaging system


10


provided with an X-ray tube


12


which is journalled or pivotably mounted on a vertically oriented column


14


. System


10


further includes a table


16


which is disposed to support a patient or other imaging subject (not shown in

FIG. 1

) in a horizontal plane. Usefully, column


14


is suspended from a track


18


, and the tube and column may be translated along the track and along the length dimension of table


16


.

FIG. 1

further shows table


16


carried upon a table base


22


, which also supports a flat X-ray detector


20


directly beneath the table


18


. Detector


20


has a planar image receiving surface


20




a


, and usefully comprises X-ray film or a digital solid state detector.




It is to be understood that horizontal support of a patient is shown in

FIG. 1

for purposes of illustration, and is by no means intended to limit the scope of the invention. In other embodiments the patient could be placed in a vertical or other orientation, provided that the X-ray tube and detector were respectively located so that the patient was positioned between them.




After an imaging subject has been placed on table


16


, X-ray tube


12


is adjusted to project a beam of X-radiation through a region of the subject to image specified body structure. The tube position may be adjusted by pivoting the tube relative to column


14


, and also by translating the column and tube along the table. The dimensions of the projected X-ray beam may be adjusted by means of a collimator


24


, of conventional design, which is joined to tube


12


and is traversed by the projected beam. Detector


20


is likewise mounted for translational movement along the table


16


, and is disposed to receive the image of the specified body structure. However, as stated above, the detector must be properly aligned with the projected beam field or FOV, in order to ensure detection of all desired image data. Usefully, means may be provided for automatically aligning the detector and the beam field. Referring further to

FIG. 1

, there is shown an electronic device


26


for performing computations in accordance with an embodiment of the invention, as described hereinafter, and for controlling operation of the alignment means.

FIG. 1

also shows mutually orthogonal X-, Y-, and Z- coordinate axes for reference purposes, the Z-axis being vertically oriented, the X-axis being parallel to the longitudinal dimension of table


16


, and the Y-axis being transverse thereto. The center of the coordinate system is coincident with the focal spot of X-ray tube


12


, and the tube is mounted for rotation about the center of the coordinate system.




Referring to

FIG. 2

, there is shown tube


12


oriented to project an X-ray beam


30


toward detector


20


, through a patient


28


positioned on table


16


. More specifically, tube


12


is directed so that its central ray R


c


, comprising the beam axis, is at an angle φ with respect to the vertical Z-axis, wherein φ may be 45° and is hereinafter referred to as the beam direction angle. However, it is to be understood that the principles of the invention apply to any beam direction angle φ which is less than +/−90°. It is to be further understood that central ray R


c


of beam


30


is directed toward detector surface


20




a


at an angle of 90° if φ is 0°, and is directed toward the detector surface at an angle of less than 90° if φ is non-zero. Thus, beam


30


is angulated, as described above, when φ is non-zero.

FIG. 2

further shows projected beam


30


to be bounded in the X-Z plane by rays R


1


and R


2


extending along its respective edges.

FIG. 2

also shows beam


30


passing through collimator


24


. Collimator


24


establishes the angle γ of beam


30


in the X-Z plane, the collimator


24


being adjustable to selectably vary γ. Hereinafter, γ is referred to as the beam width angle. Since central ray R


c


of beam


30


is at an angle φ, it will be readily apparent that rays R


1


and R


2


are oriented to angles of φ+γ/2 and φ−γ/2, respectively, as shown by FIG.


2


.




Referring further to

FIG. 2

, there is shown X-ray beam


30


intersecting detector plane


32


, the plane of detector surface


20




a


of detector


20


. This intersection defines the beam field or FOV, that is, the projection of the beam into the detector plane. The length FOV


1


of the beam field, i.e., its dimension along the X-axis, is the distance between X


1


and X


2


, the points at which detector plane


32


is intersected by rays R


1


and R


2


, respectively, of X-ray beam


30


. In order to align the beam FOV with detector surface


20




a


, it is necessary to know the location of the beam FOV along the X-axis, with respect to a known reference point.




Referring further to

FIG. 2

, it is seen that X


c


, the point at which beam axis R


c


intersects the detector plane, and which may serve as a useful reference in aligning the detector and beam field, may be readily determined from φ and SID


z


. More particularly, X


c


equals SID


z


tanφ, where SID


z


is the source-to-image distance along the Z-axis, i.e., the distance between the tube


12


and the detector plane


32


, which is a known value. Moreover, as stated above, when X-ray beam


30


is angulated, by pivoting tube


12


to a non-zero angle of φ, the beam field projected into the detector plane


32


becomes distorted, and the geometric center thereof is shifted away from X


c


. This is illustrated by

FIG. 3

, wherein the beam field


34


of beam


30


, which is projected into detector plane


32


as described above, is shown to be of trapezoidal configuration. Also,

FIG. 3

shows beam axis intersection X


c


to be offset from the geometric center C


geom


of beam field


34


by an amount δ. As a result, as illustrated by both

FIGS. 2 and 3

, a portion of beam field


34


is not incident upon detector


20


, whereby the image data provided by such beam portion is not received. In order to properly align beam field


34


and detector surface


20




a


, so that data is not lost, it becomes necessary to determine the offset value δ.




While

FIG. 2

shows beam


30


angulated by pivoting tube


12


with respect to the Z-axis, the beam could alternatively be angulated by pivoting or rotating detector


20


. Generally, the invention is applicable for any relative movement between the tube and the detector which causes the beam direction angle φ to become less than +/−90°.




Referring to

FIG. 4

, there is shown, by way of comparison, the beam field


36


which results when φ is set to 0°,so that tube


12


projects an X-ray beam toward the detector plane at an angle of 90°. The beam field


36


is of symmetrical rectangular shape, and the geometric center coincides with the point X


c


.




Referring further to

FIG. 4

, there is shown the beam field


38


which results when φ is set to a value such as −45°.The beam field


38


is seen to be trapezoidal, in like manner with beam field


34


of

FIG. 3

, but is distorted in the opposite direction. Also, in beam field


38


the point X


c


is offset leftward from the geometric center, along the X-axis, rather than rightward as shown in connection with beam field


34


.




In determining the value of offset δ, it is useful to first consider the slopes M


1


, M


2


and M


c


, the slopes of rays R


1


, R


2


and R


c


, respectively, as shown by FIG.


2


. Each of these slopes can be defined in terms of the defined angles φ and δ, as follows:








M




center


=tan(φ)  Equation (1)










M




1


=tan(φ+γ/2)  Equation (2)










M




2


=tan(φ−γ/2)  Equation (3)






For the coordinate system described above for the X-Z plane shown in

FIG. 2

, the equation for a line shown therein has the generalized form x


i


=M


i


z


i


+b


i


, where (x


i


, z


i


) are coordinates of points along the line and M


i


is its slope. However, computational complexity can be reduced if imaging system


10


is designed so that the focal spot of tube


12


is coincident with the rotation center of the X-ray tube support device. In this case, the equations pass through the origin of the coordinate system, and the b


i


terms drop to 0, resulting in the expression x


i


=M


i


z


i


, which is useful for describing beam rays R


1


, R


2


and R


c


. Moreover, for z


i


=SID


z


, the known source-to-image distance, respective intersection points X


1


and X


2


of rays R


1


and R


2


are given as follows:








X




1




=M




1




SID




z




=SID




z


tan(φ+γ/2)  Equation (4)










X




2




=M




2




SID




z




=SID


tan(φ−γ/2)  Equation (5)






It is essential to recognize that the length FOV


1


of beam field


34


can be no less than the length dimension of detector surface


20




a


which extends along the X-axis. Thus, FOV


1


of beam field


34


is prespecified to either be equal to, or selectively less than, the length of detector surface


20




a


. Thus, FOV


1


is a known predetermined value. From

FIG. 2

, it is seen that FOV


1


is equal to (X


1


-X


2


). Accordingly, FOV


1


is related to SID


z


, φ and γ as follows:








FOV




1




=X




1




−X




2




=SID




z


[tan(φ+γ/2)−tan(φ−γ/2)]  Equation (6)






Using the known trigonometric relationships







tan






(

A
-
B

)


=



tan





A

-

tan





B



1
+

tan





A





tan





B













and








tan






(

A
+
B

)


=



tan





A

+

tan





B



1
-

tan





A





tan





B




,










Equation (6) can be rearranged as follows:










FOV
1

=


[


2






(

1
+


tan
2







(
φ
)



)






tan






(

γ
2

)



1
-


tan
2







(
φ
)







tan
2







(

γ
2

)




]

×

SID
z






Equation






(
7
)














When the terms of Equation (7) are re-arranged and the equation solved, the following quadratic results:








A


tan


2


(γ/2)+


B


tan(γ/2)+


C


=0   Equation (8)






where A=tan


2


(φ), B=2(1+tan


2


(φ))x(SID


z


/FOV


1


), and C=−1. Solution of the quadratic Equation (8) gives rise to two possible solutions










γ
1

=

2







tan

-
1


[



-

(


1
+


tan
2







(
φ
)





FOV
1

/

SID
z



)


+




(


1
+


tan
2







(
φ
)





FOV
1

/

SID
z



)

2

+


tan
2







(
φ
)







tan
2







(
φ
)



]






Equation






(
9
)





















γ
2

=

&AutoLeftMatch;

2







tan

-
1


[







-

(


1
+


tan
2







(
φ
)





FOV
1

/

SID
z



)


-




(


1
+


tan
2







(
φ
)





FOV
1

/

SID
z



)

2

+


tan
2







(
φ
)







tan
2







(
φ
)



]







Equation






(
10
)














For the geometric state of the X-ray beam provided by imaging system


10


, only the solution γ


1


provided by Equation (9) is valid. Thus, after γ


1


has been determined, collimator


24


is adjusted as required to establish the beam width angle of beam


30


at γ


1


. The length FOV


1


is thereby set to the value prespecified therefor. Moreover, from the values of FOV


1


, beam direction angle φ, SID


z


and γ


1


, the offset δ can be directly computed, in order to establish the required displacement of the detector for alignment to the center of the projected X-ray field. To compute δ , it is noted that the geometric center C


geom


of the projected beam field


34


is defined by the average {overscore (X)} of the coordinates X


1


and X


2


, that is, {overscore (X)}=(X


+(X




1


+X


2


)/2. From Equations (4) and (5) for γ=γ


1


, {overscore (X)} may be set forth as follows:










X
_

=



SID
z

2







(


tan






(

φ
+


γ
1

2


)


+

tan






(

φ
-


γ
1

2


)



)






Equation






(
11
)














As stated above, X


c


is equal to SID


z


tan(φ). Thus, the offset δ given by the expression:









δ
=



X
_

-

X
c


=


SID
z





[



(


tan






(

φ
+


γ
1

2


)


+

tan






(

φ
-


γ
1

2


)



)

2

-

tan






(
φ
)



]






Equation






(
12
)














Electronic control device


26


, shown in FIG.


1


and comprising a computer control or the like, is disposed to receive the specified values of φ, SID


z


and FOV


1


as inputs, and is configured to perform computations in accordance with the equations set forth above. Thus, upon receiving the specified inputs, device


26


is operated to implement Equations (7)-(9) to determine the beam width angle γ


1


corresponding to the inputs. If collimator


24


is automatically adjustable, in response to a signal, control device


26


may be further configured to couple a signal, representing γ


1


to adjust collimator


24


, and thereby provide autocollimation.




After determining γ


1


, control device


26


is operated in accordance with Equations (11) and (12) to compute offset δ. If imaging system


10


is provided with a servo mechanism


40


, as shown by

FIG. 1

, control device


26


may couple a signal representing offset δ to direct servo mechanism


40


to align the center of detector


20


with point C


geom


, as described above.

FIG. 1

further shows a mechanical linkage


42


, such as a rotatable ball screw and ball nut arrangement, for enabling mechanism


40


to selectively translate detector


20


along the X-axis. Thus, an embodiment of the invention may be provided in which both detector alignment and collimation are performed automatically.




In another embodiment of the invention, control device


26


would provide information to the system operator, for use in manual adjustment of the detector and/or the collimator.




The above description in regard to electronic control device


26


is directed to a mode of the invention wherein specified values of FOV


1


, φ, and SID


z


are given. Accordingly, the required computational task is determination of the beam width angle γ


1


, and then determination of the offset value δ, using the equations respectively given therefor. In a second mode of the invention, γ


1


is initially given, together with the values of φ and SID


z


. In this mode it would only be necessary to compute the offset δ, using Equations


11


and


12


. This situation could occur, for example, if FOV


1


was preselected and the value of γ


1


associated therewith was initially known for the given image parameters.




Obviously, many other modifications and variations of the present invention are possible in light of the above teachings. It is therefore to be understood that within the scope of the disclosed concept, the invention may be practiced otherwise than as has been specifically described.



Claims
  • 1. In an imaging system provided with an X-ray tube and a detector having a surface lying in a specified plane, wherein said tube is spaced apart from said detector surface by a source-to-image distance along a first axis, and wherein said tube is disposed to project an X-ray beam characterized by beam direction and beam width angles toward said detector, a method for selectively aligning said detector surface and the field of said beam which is projected into said specified plane, said method comprising the steps of:providing a value of said beam width angle; locating the geometric center of said beam field from said distance, said beam direction angle and said beam width angle value; and establishing a specified positional relationship between the center of said detector surface and said geometric center of said beam field along a second axis which is orthogonal to said first axis.
  • 2. The method of claim 1 wherein said locating step comprises:determining the point at which the central axis of said projected beam intersects said specified plane; and locating said geometric center at a point which is spaced apart from said beam axis intersection point, along said second axis, by an offset value comprising a function of said distance, said beam direction angle and said computed beam width angle.
  • 3. The method of claim 2 wherein:said beam width angle value is provided by specifying the dimension of said beam field along said second axis, and then computing said beam width angle value from said specified beam field dimension, said distance and said beam direction angle.
  • 4. The method of claim 3 wherein:said positional relationship is established by aligning the center of said detector surface and said geometric center of said beam field along a common axis.
  • 5. The method of claim 4 wherein:said specified dimension of said beam field is equal to the length of said detector surface extending along said second axis.
  • 6. The method of claim 3, wherein said imaging system is provided with an electronic control device disposd to receive input signals respectively representing said specified beam field dimension, said distance, and said beam direction angle, and wherein:said method includes the step of operating said control device to automatically compute said corresponding beam width angle and said offset value from said received input signals.
  • 7. The method of claim 6 wherein:said method includes the step of coupling an output signal from said control device to an associated mechanical device to operate said mechanical device to align said detector surface center with said beam field geometric center.
  • 8. The method of claim 7 wherein:said control device operates a collimator associated with said projected beam to adjust said beam width angle to said computed value thereof.
  • 9. In an imaging system provided with an X-ray tube and a detector having a surface lying in a specified plane, wherein said tube is spaced apart from said detector surface by a source-to-image distance (SID) along a first axis, a method for positioning said tube and said detector with respect to a patient supported therebetween, said method comprising the steps of:orienting said tube to project an X-ray beam through a selected region of said patient and toward said specified plane, the central axis of said projected beam being placed at an angle φ with respect to said first axis; specifying the length, along a second axis orthogonal to said first axis, of a beam field defined by the intersection of said beam and said specified plane; computing a beam width angle γ1 which provides said specified beam field length for said angle φ and for said SID; employing the respective values of γ1, φ, and SID to determine the location of the geometric center of said beam field; and establishing a specified positional relationship between the center of said detector surface and said geometric center of said beam field.
  • 10. The method of claim 9 wherein:the location of said geometric center is determined by computing an offset value as a function of γ1, φ, and SID, and by locating the point at which said central beam axis intersects said specified plane, said geometric center being spaced apart from said beam axis intersection point, along said second axis, by said offset value.
  • 11. The method of claim 10 wherein:said positional relationship is established by aligning the center of said detector surface and said geometric center of said beam field along a common axis.
  • 12. The method of claim 11 wherein:said specified length of said beam field is equal to the length of said detector surface extending along said second axis.
  • 13. The method of claim 11 wherein:said specified length of said beam field is selectively less than the length of said detector surface extending along said second axis.
  • 14. An X-ray imaging system comprising:a detector having a surface lying in a specified plane; an X-ray tube spaced apart from said detector surface by a source-to-image distance (SID) along a first axis, said tube being rotatable to an angle φ, with respect to said first axis, to project an X-ray beam through a selected region of an imaging subject and toward said specified plane; a collimator traversed by said projected beam which is disposed to selectively adjust the width angle thereof, and to thereby adjust the length, along a second axis orthogonal to said first axis, of a beam field defined by the intersection of said beam and said specified plane; an electronic control device disposd to receive input signals respectively representing a specified value of said beam field length, said SID, and said angle φ, and to generate an output signal therefrom representing the location of the geometric center of said beam field; and an alignment device responsive to said output signal to establish a specified positional relationship between the center of said detector surface and said geometric center of said beam field.
  • 15. The system of claim 14 wherein:said control device is adapted to compute a beam width angle γ1 which provides said specified beam field length for said SID and said angle φ.
  • 16. The system of claim 15 wherein:said control device is adapted to determine the location of said geometric center by computing an offset value as a function of γ1, φ, and SID, and by locating the point at which the central axis of said beam intersects said specified plane, said geometric center being spaced apart from said beam axis intersection point, along said second axis, by said offset value.
  • 17. The system of claim 16 wherein:said positional relationship is established by aligning the center of said detector surface and said geometric center of said beam field along a common axis.
  • 18. The system of claim 17 wherein:said specified length of said beam field is equal to the length of said detector surface extending along said second axis.
  • 19. The system of claim 17 wherein:said specified length of said beam field is selectively less than the length of said detector surface extending along said second axis.
  • 20. The system of claim 17 wherein:said control device couples a second output signal representing said angle γ1 to said collimator, said collimator being operable in response to said second output signal to adjust said beam to provide said specified beam field length.
US Referenced Citations (4)
Number Name Date Kind
4008400 Brunnett et al. Feb 1977 A
4024403 Bernstein et al. May 1977 A
6056437 Toth May 2000 A
6148058 Dobbs Nov 2000 A
Foreign Referenced Citations (1)
Number Date Country
90 02 129 Apr 1990 DE
Non-Patent Literature Citations (1)
Entry
European Search Report, EP 01 30 6074, dated Oct. 26, 2001.