Number | Name | Date | Kind |
---|---|---|---|
3928795 | Lechner | Dec 1975 | |
4232262 | Emo et al. | Nov 1980 | |
4342957 | Russell | Aug 1982 | |
4342958 | Russell | Aug 1982 | |
4578637 | Allen et al. | Mar 1986 | |
5202639 | McKeon et al. | Apr 1993 | |
5369358 | Metzger et al. | Nov 1994 | |
5444390 | Bartlett et al. | Aug 1995 | |
5485095 | Bertsch et al. | Jan 1996 |
Number | Date | Country |
---|---|---|
5-281297 | Oct 1993 | JPX |
Entry |
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IBM Technical Disclosure Bulletin vol. 25 No. 12 May 1983; "Testing Tester Relays Within A Tester", R.D. Burke and PC. Reichert. |