Measuring contact resistance of connections

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CPC
G01R27/205

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

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G01R27/205Measuring contact resistance of connections

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation jig and evaluation method
- Patent number 12,095,191
- Issue date Sep 17, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hisato Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring insulation resistance in inverters with multip...
- Patent number 12,044,735
- Issue date Jul 23, 2024
- SMA Solar Technology AG
- Steffen Aust
- G01 - MEASURING TESTING
Information Patent Grant
Ground connection detection in an electronic equipment
- Patent number 12,019,108
- Issue date Jun 25, 2024
- Cisco Technology, Inc.
- Madhuri Chandrashekharaiah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method and device for contact resistor
- Patent number 11,719,730
- Issue date Aug 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Haiyang Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Contact resistor test method and device
- Patent number 11,703,531
- Issue date Jul 18, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shih-Chieh Lin
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuitry
- Patent number 11,686,752
- Issue date Jun 27, 2023
- HP INDIGO B.V.
- Gideon Amir
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Evaluation jig and evaluation method
- Patent number 11,588,265
- Issue date Feb 21, 2023
- Toyota Jidosha Kabushiki Kaisha
- Hisato Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool for a perforating gun segment
- Patent number 11,578,566
- Issue date Feb 14, 2023
- DynaEnergetics Europe GmbH
- Christian Eitschberger
- E21 - EARTH DRILLING MINING
Information Patent Grant
High accurate contact resistance measurement method using one or mo...
- Patent number 11,555,844
- Issue date Jan 17, 2023
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring of the contact region in a plug device
- Patent number 11,486,941
- Issue date Nov 1, 2022
- AMAD Mennekes Holding GmbH & Co. KG
- Markus Lubeley
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method
- Patent number 11,402,406
- Issue date Aug 2, 2022
- Toyota Jidosha Kabushiki Kaisha
- Hisato Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe cards, system for manufacturing semiconductor device, and met...
- Patent number 11,327,095
- Issue date May 10, 2022
- Samsung Electronics Co., Ltd.
- Sungho Joo
- G01 - MEASURING TESTING
Information Patent Grant
Display device
- Patent number 11,313,891
- Issue date Apr 26, 2022
- SAMSUNG DISPLAY CO., LTD.
- Chung Seok Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for monitoring a ground resistance of an electric installation
- Patent number 11,275,102
- Issue date Mar 15, 2022
- Bender GmbH & Co. KG
- Eckhard Broeckmann
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for obtaining internal side, external side insula...
- Patent number 11,249,123
- Issue date Feb 15, 2022
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Zhimin Dan
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for obtaining a contact resistance of a planar device
- Patent number 11,215,652
- Issue date Jan 4, 2022
- Institute of Microelectronics, Chinese Academy of Sciences
- Guangwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool for a perforating gun segment
- Patent number 11,053,778
- Issue date Jul 6, 2021
- DynaEnergetics Europe GmbH
- Christian Eitschberger
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 11,029,365
- Issue date Jun 8, 2021
- Rohm Co., Ltd.
- Satoshi Maejima
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuitry
- Patent number 11,016,131
- Issue date May 25, 2021
- HP INDIGO B.V.
- Gideon Amir
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for obtaining internal side, external side insula...
- Patent number 10,996,251
- Issue date May 4, 2021
- Contemporary Amperex Technology Co., Limited
- Zhimin Dan
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Wire connection quality monitoring systems
- Patent number 10,989,765
- Issue date Apr 27, 2021
- Hamilton Sundstrand Corporation
- Francis A. Carcia
- G01 - MEASURING TESTING
Information Patent Grant
Cleaning methods for probe cards
- Patent number 10,921,358
- Issue date Feb 16, 2021
- Winbond Electronics Corp.
- Chih-Chiang Lai
- B08 - CLEANING
Information Patent Grant
Method for characterizing ohmic contact electrode performance of se...
- Patent number 10,755,990
- Issue date Aug 25, 2020
- Xidian University
- Xuefeng Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact detection circuit of four-terminal measurement device
- Patent number 10,718,635
- Issue date Jul 21, 2020
- CHROMA ATE INC.
- Tsz-Lang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Display device and method of inspecting the same
- Patent number 10,706,787
- Issue date Jul 7, 2020
- Samsung Display Co., Ltd.
- Chang Ho Hyun
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Electronic switch
- Patent number 10,677,846
- Issue date Jun 9, 2020
- HYDRA-ELECTRIC COMPANY
- Robert Andrew Guziak
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool for a perforating gun segment
- Patent number 10,597,979
- Issue date Mar 24, 2020
- DynaEnergetics Europe GmbH
- Christian Eitschberger
- G01 - MEASURING TESTING
Information Patent Grant
Testing method for sheet resistance and contact resistance of conne...
- Patent number 10,495,678
- Issue date Dec 3, 2019
- Shanghai Institute of Ceramics, Chinese Academy of Sciences
- Bufa Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor device, inspection device of...
- Patent number 10,418,292
- Issue date Sep 17, 2019
- Renesas Electronics Corporation
- Yu Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical connection validation scheme
- Patent number 10,408,869
- Issue date Sep 10, 2019
- Satyajit Patwardhan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT RESISTANCE TEST STRUCTURE FOR STACKED FETS
- Publication number 20240426895
- Publication date Dec 26, 2024
- International Business Machines Corporation
- Huimei Zhou
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION JIG AND EVALUATION METHOD
- Publication number 20240396244
- Publication date Nov 28, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hisato KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, SYSTEM AND METHOD OF MONITORING JOINTS AND SWITCH CONDIT...
- Publication number 20240369647
- Publication date Nov 7, 2024
- Eaton Intelligent Power Limited
- Viral Shah
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ARRANGEMENT HAVING AN INSULATION MONITOR, AND IT SYSTEM
- Publication number 20240353465
- Publication date Oct 24, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Robert Lange
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS
- Publication number 20240030123
- Publication date Jan 25, 2024
- SAMSUNG DISPLAY CO., LTD.
- KYUNG-MOK LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION JIG AND EVALUATION METHOD
- Publication number 20230155311
- Publication date May 18, 2023
- Toyota Jidosha Kabushiki Kaisha
- Hisato KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUND CONNECTION DETECTION IN AN ELECTRONIC EQUIPMENT
- Publication number 20230065681
- Publication date Mar 2, 2023
- Cisco Technology, Inc.
- Madhuri CHANDRASHEKHARAIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING RESISTANCE VALUE OF CONTACT PLUG AND TESTING S...
- Publication number 20230016770
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qiang Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT RESISTOR TEST METHOD AND DEVICE
- Publication number 20220373584
- Publication date Nov 24, 2022
- Changxin Memory Technologies, Inc.
- Shih-Chieh LIN
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD
- Publication number 20220334143
- Publication date Oct 20, 2022
- Toyota Jidosha Kabushiki Kaisha
- Hisato KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING OF THE CONTACT REGION IN A PLUG DEVICE
- Publication number 20210278481
- Publication date Sep 9, 2021
- AMAD Mennekes Holding GmbH & Co. KG
- Markus Lubeley
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CIRCUITRY
- Publication number 20210263087
- Publication date Aug 26, 2021
- HP INDIGO B.V.
- Gideon Amir
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING A GROUND RESISTANCE OF AN ELECTRIC INSTALLATION
- Publication number 20210255225
- Publication date Aug 19, 2021
- BENDER GMBH & CO. KG
- Eckhard Broeckmann
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING INSULATION RESISTANCE IN INVERTERS WITH MULTIP...
- Publication number 20210231735
- Publication date Jul 29, 2021
- SMA Solar Technology AG
- Steffen Aust
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD
- Publication number 20210215739
- Publication date Jul 15, 2021
- Toyota Jidosha Kabushiki Kaisha
- Hisato KAWAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION JIG AND EVALUATION METHOD
- Publication number 20210218173
- Publication date Jul 15, 2021
- Toyota Jidosha Kabushiki Kaisha
- Hisato KAWAHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING A CONTACT RESISTANCE OF A PLANAR DEVICE
- Publication number 20210165027
- Publication date Jun 3, 2021
- Institute of Microelectronics, Chinese Academy of Sciences
- Guangwei XU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION TOOL FOR A PERFORATING GUN SEGMENT
- Publication number 20210148194
- Publication date May 20, 2021
- DynaEnergetics Europe GmbH
- Christian Eitschberger
- E21 - EARTH DRILLING MINING
Information Patent Application
METHOD AND DEVICE FOR OBTAINING INTERNAL SIDE, EXTERNAL SIDE INSULA...
- Publication number 20210116486
- Publication date Apr 22, 2021
- Contemporary Amperex Technology Co., Limited
- Zhimin DAN
- B60 - VEHICLES IN GENERAL
Information Patent Application
PROBE CARDS, SYSTEM FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND MET...
- Publication number 20210055328
- Publication date Feb 25, 2021
- Samsung Electronics Co., Ltd.
- Sungho JOO
- G01 - MEASURING TESTING
Information Patent Application
WIRE CONNECTION QUALITY MONITORING SYSTEMS
- Publication number 20200400733
- Publication date Dec 24, 2020
- HAMILTON SUNDSTRAND CORPORATION
- Francis A. Carcia
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
INSPECTION TOOL FOR A PERFORATING GUN SEGMENT
- Publication number 20200173259
- Publication date Jun 4, 2020
- DynaEnergetics Europe GmbH
- Christian Eitschberger
- E21 - EARTH DRILLING MINING
Information Patent Application
INSPECTION TOOL FOR A PERFORATING GUN SEGMENT
- Publication number 20200088011
- Publication date Mar 19, 2020
- DYNAenergetics GmbH & Co. KG
- Christian Eitschberger
- E21 - EARTH DRILLING MINING
Information Patent Application
CLEANING METHODS FOR PROBE CARDS
- Publication number 20200041552
- Publication date Feb 6, 2020
- WINBOND ELECTRONICS CORP.
- Chih-Chiang LAI
- B08 - CLEANING
Information Patent Application
DISPLAY DEVICE AND METHOD OF INSPECTING THE SAME
- Publication number 20200020281
- Publication date Jan 16, 2020
- SAMSUNG DISPLAY CO., LTD.
- Chang Ho HYUN
- G01 - MEASURING TESTING
Information Patent Application
HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...
- Publication number 20200003824
- Publication date Jan 2, 2020
- INFINEON TECHNOLOGIES AG
- RALF ARNOLD
- G01 - MEASURING TESTING
Information Patent Application
Method And Device For Obtaining Internal Side, External Side Insula...
- Publication number 20190234997
- Publication date Aug 1, 2019
- Contemporary Amperex Technology Co., Limited
- Zhimin DAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING OHMIC CONTACT ELECTRODE PERFORMANCE OF SE...
- Publication number 20190237369
- Publication date Aug 1, 2019
- Xidian University
- XUEFENG ZHENG
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE
- Publication number 20190064239
- Publication date Feb 28, 2019
- SAMSUNG DISPLAY CO., LTD.
- Chung Seok Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
MONITORING CIRCUITRY
- Publication number 20190033356
- Publication date Jan 31, 2019
- HP INDIGO B.V.
- Gideon Amir
- G06 - COMPUTING CALCULATING COUNTING

Measuring contact resistance of connections

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Evaluation jig and evaluation method

Method for measuring insulation resistance in inverters with multip...

Ground connection detection in an electronic equipment

Test method and device for contact resistor

Contact resistor test method and device

Monitoring circuitry

Evaluation jig and evaluation method

Inspection tool for a perforating gun segment

High accurate contact resistance measurement method using one or mo...

Monitoring of the contact region in a plug device

Evaluation method

Probe cards, system for manufacturing semiconductor device, and met...

Display device

Method for monitoring a ground resistance of an electric installation

Method and device for obtaining internal side, external side insula...

Method for obtaining a contact resistance of a planar device

Inspection tool for a perforating gun segment

Semiconductor device

Monitoring circuitry

Method and device for obtaining internal side, external side insula...

Wire connection quality monitoring systems

Cleaning methods for probe cards

Method for characterizing ohmic contact electrode performance of se...

Contact detection circuit of four-terminal measurement device

Display device and method of inspecting the same

Electronic switch

Inspection tool for a perforating gun segment

Testing method for sheet resistance and contact resistance of conne...

Manufacturing method of semiconductor device, inspection device of...

Electrical connection validation scheme

Patents Applicationslast 30 patents

CONTACT RESISTANCE TEST STRUCTURE FOR STACKED FETS

EVALUATION JIG AND EVALUATION METHOD

APPARATUS, SYSTEM AND METHOD OF MONITORING JOINTS AND SWITCH CONDIT...

ARRANGEMENT HAVING AN INSULATION MONITOR, AND IT SYSTEM

ELECTRONIC APPARATUS

EVALUATION JIG AND EVALUATION METHOD

GROUND CONNECTION DETECTION IN AN ELECTRONIC EQUIPMENT

METHOD FOR MEASURING RESISTANCE VALUE OF CONTACT PLUG AND TESTING S...

CONTACT RESISTOR TEST METHOD AND DEVICE

EVALUATION METHOD

MONITORING OF THE CONTACT REGION IN A PLUG DEVICE

MONITORING CIRCUITRY

METHOD FOR MONITORING A GROUND RESISTANCE OF AN ELECTRIC INSTALLATION

METHOD FOR MEASURING INSULATION RESISTANCE IN INVERTERS WITH MULTIP...

EVALUATION METHOD

EVALUATION JIG AND EVALUATION METHOD

METHOD FOR OBTAINING A CONTACT RESISTANCE OF A PLANAR DEVICE

INSPECTION TOOL FOR A PERFORATING GUN SEGMENT

METHOD AND DEVICE FOR OBTAINING INTERNAL SIDE, EXTERNAL SIDE INSULA...

PROBE CARDS, SYSTEM FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND MET...

WIRE CONNECTION QUALITY MONITORING SYSTEMS

INSPECTION TOOL FOR A PERFORATING GUN SEGMENT

INSPECTION TOOL FOR A PERFORATING GUN SEGMENT

CLEANING METHODS FOR PROBE CARDS

DISPLAY DEVICE AND METHOD OF INSPECTING THE SAME

HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...

Method And Device For Obtaining Internal Side, External Side Insula...

METHOD FOR CHARACTERIZING OHMIC CONTACT ELECTRODE PERFORMANCE OF SE...

DISPLAY DEVICE

MONITORING CIRCUITRY