Claims
- 1. A plasma reactor, comprising:
- a plasma chamber;
- gas inlet means for introducing an ionizable gas into said plasma chamber;
- support means for positioning a workpiece in said plasma chamber;
- a dielectric plate positioned in opposed relationship to said support means and covering an opening in said plasma chamber;
- an electrostatic shield positioned within said plasma chamber and in contact with said dielectric plate for providing both a physical support to said dielectric plate and for serving as an electrostatic shield;
- an inductor juxtapositioned to said dielectric plate and outside said plasma chamber, said inductor comprising multiple winding portions which evidence plural segments of increasing radii from a center of said inductor, segments of lesser radii respectively arranged to reside further away from said dielectric plate than segments of greater radii;
- means for applying a radio frequency (RF) signal to said inductor so as to cause in inductive coupling of RF energy into said plasma chamber through said dielectric plate and a creation of a plasma therein from said ionizable gas.
- 2. A plasma reactor, comprising:
- a plasma chamber;
- gas inlet means for introducing an ionizable gas into said plasma chamber;
- support means for positioning a workpiece in said plasma chamber;
- a dielectric plate positioned in opposed relationship to said support means and covering an opening in said plasma chamber;
- an electrostatic shield positioned within said plasma chamber and between said support means and said dielectric plate;
- an inductor juxtapositioned to said dielectric plate, said inductor comprising multiple winding portions which evidence plural segments of increasing radii from a center of said inductor, segments of lesser radii respectively arranged to reside further away from said dielectric plate than segments of greater radii;
- means for applying a radio frequency (RF) signal to said inductor so as to cause in inductive coupling of RF energy into said plasma chamber through said dielectric plate and a creation of a plasma therein from said ionizable gas; and
- wherein said gas inlet means comprises channel means positioned within said electrostatic shield and having outlet orifices opening into said plasma chamber, said channel means for receiving said ionizable gas and for passing said gas into said plasma chamber through said orifices; and
- wherein said channel means comprises plural channels, each channel coupled to a different gas inlet and having outlet orifices opening into said plasma chamber for feeding different gases into said plasma chamber through said orifices.
- 3. A plasma reactor, comprising:
- a plasma chamber;
- gas inlet means for introducing an ionizable gas into said plasma chamber;
- support means for positioning a workpiece in said plasma chamber;
- a dielectric plate positioned in opposed relationship to said support means and covering an opening in said plasma chamber;
- an electrostatic shield positioned within said plasma chamber and between said support means and said dielectric plate, said electrostatic shield in contact with said dielectric plate and operating as a physical support therefor;
- an inductor, configured as a spiral conductor, juxtapositioned to said dielectric plate, said inductor comprising multiple winding portions which evidence plural segments of increasing radii from a center of said inductor, segments of lesser radii respectively arranged to reside further away from said dielectric plate than segments of greater radii;
- means for applying a radio frequency (RF) signal to said inductor so as to cause in inductive coupling of RF energy into said plasma chamber through said dielectric plate and a creation of a plasma therein from said ionizable gas.
- 4. The plasma reactor as recited in claim 1, wherein said gas inlet means comprises:
- channel means positioned within said electrostatic shield and having outlet orifices opening into said plasma chamber, said channel means for receiving said ionizable gas and for passing said gas into said plasma chamber through said orifices.
- 5. The plasma reactor as recited in claim 3, wherein said channel means comprises plural channels, each channel coupled to a different gas inlet and having outlet orifices opening into said plasma chamber for feeding different gases into said plasma chamber through said orifices.
- 6. The plasma reactor as recited in claim 1, wherein said channel means is configured as a circumferential wheel, a hub and plural spokes connecting said wheel and said hub, said wheel, hub and plural spokes including said channel means and said outlet orifices.
- 7. The plasma reactor as recited in claim 1, wherein said inductor is configured as a spiral conductor.
- 8. The plasma reactor as recited in claim 1, wherein said inductor is configured from a strap of conductive metal, said strap having a width that is greater than its thickness, said strap positioned so that its thickness aspect is parallel to a major surface of said dielectric plate.
- 9. The plasma reactor as recited in claim 1, wherein said dielectric plate evidences a thickness that is less than about 0.75 inches.
Parent Case Info
This application claims priority from Provisional Application 60/053,951, filed Jul. 28, 1997 in the U.S. Patent & Trademark Office.
US Referenced Citations (10)
Foreign Referenced Citations (2)
Number |
Date |
Country |
0379828A2 |
Dec 1989 |
EPX |
2231197A |
Mar 1990 |
GBX |
Non-Patent Literature Citations (2)
Entry |
Plasma Sources Sci. Technol. 1 (1992), pp. 109-116, J. Hopwood, "Review of Inductively Coupled Plasmas for Plasma Processing". |
Plasma Sources Sci. Technol. 5 (1996), pp. 166-172, J. Keller, "Inductive Plasmas for Plasma Processing". |