Number | Date | Country | Kind |
---|---|---|---|
107763 | Nov 1993 | ITX |
Number | Name | Date | Kind |
---|---|---|---|
4692618 | Klatt | Sep 1987 | |
4705945 | Worcester | Nov 1987 | |
4754704 | Lubbers | Jul 1988 | |
4807532 | Anderson et al. | Feb 1989 | |
5075553 | Noble et al. | Dec 1991 |
Number | Date | Country |
---|---|---|
143419 | Nov 1980 | JPX |
1124728 | May 1989 | JPX |
Entry |
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"The Infrared Handbook" rev. ed., Wolfe, W. & Zissis, G., eds, The Infrared Information and Analysis (IRIA) Center, Environmental Research Institute of Michigan (1985), Figure 7-5. |
Yasuda, A. et al "Direct Measurement of Localized Joule Heating in Silicon Devices By Means of Newly Developed High Resolution IR Microscopy" IEEE/IRPS Journal pp. 245-249 (1991). |
Shell, M. et al "Applications of Infrared Microscopy for Bond Pad Damage Detection" IEEE/IRPS Journal pp. 152-159 (1991). |