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4947357 | Stewart | Aug 1990 | A |
5281864 | Hahn et al. | Jan 1994 | A |
5291495 | Udell, Jr. | Mar 1994 | A |
5325368 | James et al. | Jun 1994 | A |
5329533 | Lin | Jul 1994 | A |
5416409 | Hunter | May 1995 | A |
5434804 | Bock et al. | Jul 1995 | A |
5477545 | Huang | Dec 1995 | A |
5608736 | Bradford et al. | Mar 1997 | A |
5623503 | Rutkowski | Apr 1997 | A |
5627841 | Nakamura | May 1997 | A |
5636228 | Moughanni et al. | Jun 1997 | A |
5668490 | Mitra et al. | Sep 1997 | A |
5717701 | Angelotti et al. | Feb 1998 | A |
5726999 | Bradford et al. | Mar 1998 | A |
5784382 | Byers et al. | Jul 1998 | A |
5892503 | Kim | Apr 1999 | A |
5978902 | Mann | Nov 1999 | A |
6068194 | Mazur | May 2000 | A |
6363501 | Tobias et al. | Mar 2002 | B1 |
Entry |
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IEEE standard test access port and boundary—scan architecture Test Technology Technical Committee of the IEEE Computer Society, USA; IEEE Std 1149.1-1990, May 21, 1990;Abstract. |