J. M. Nieuwenhuizen and H. B. Haanstra, "Microfractography of thin films", Philips Technical Review, vol., No. 3/4, pp. 87-91, 1966. |
H. A. Macleod, "Thin-Film Optical Filters", Macmillan Publishing Co, pp. 357-411, 1987.H. |
Kumaya, Yamamoto, Fujimura, and Umemoto, "A Display Substrate, A Method for Manufacturing Said Substrate, and a Liquid Crystal Display Element Using Said Substrate," Japan Patent Application No. 3-114023, filed Sep. 20, 1989. |
Horowitz, "Structure-Induced Optical Anisotropy in Thin Films," Ph.D. Dissertation, University of Arizona, 1983. |
Kahn, "The Molecular Physics of Liquid-Crystal Devices," Physics Today, pp. 66-74, May 1982. |
Macleod, Structure-related Optical Properties of Thin Films, J. Vac. Sci. Technol. A, vol. 4, No. 3, pp. 418-422, 1986. |
Stoner, "The Demagnetizing Factor For Ellipsoids," Phil. Mag., vol. 36, pp. 803-821, 1945. |
Wu and Hodgkinson, "Materials for Birefringent Coatings," Optics and Photonics News, vol. 5, No. 5, insert, 1994. |
Hamaguchi, "Phase Compensation Plate," Patent Abstracts of Japan, vol. 14, No. 301, 1990, p. 1069. |
Hodgkinson et al., "Measurement of the Principal Refractive Indices of Thin Films Deposited at Oblique Incidence," J. Opt. Soc. Am. A, vol. 2, No. 10, 1985, pp. 1693-1697. |
Motohiro et al., "Thin Film Retardation Plate By Oblique Deposition," Applied Optics, vol. 28, No. 13, 1989, pp. 2466-2482. |