1. Field of the Invention
The present invention relates to manufacturing methods for making polymeric positive temperature coefficient (PPTC) of resistance electrical circuit protection devices, and to the devices made by these methods. More particularly, the present invention relates to insert injection-compression molding of PPTC devices
2. Introduction to the Invention
Positive temperature coefficient (PTC) of resistance electrical devices are well known. Particularly useful devices contain PTC elements composed of a PTC conductive polymer, i.e. a composition comprising an organic polymer and, dispersed or otherwise distributed therein, a particulate conductive filler, e.g. carbon black, or a metal or a conductive metal compound. Such devices are referred to herein as polymer PTC, or PPTC resistors or resistive devices. Other PTC materials are also known, e.g. doped ceramics, but are not as generally useful as PTC conductive polymer, in particular because they often have higher non-operating, quiescent resistivities.
As used herein, the term “PTC” is used to mean a composition of matter which has an R14 value of at least 2.5 and/or an R100 value of at least 10, and it is preferred that the composition should have an R30 value of at least 6, where R14 is the ratio of the resistivities at the end and the beginning of a 14° C. range, R100 is the ratio of the resistivities at the end and the beginning of a 100° C. range, and R30 is the ratio of the resistivities at the end and the beginning of a 30° C. range. Generally the compositions used in devices of the present invention show increases in resistivity that are much greater than those minimum values.
The sharp increase in resistance of PPTC resistive devices is attributable to a phase change in the polymeric material. In its cool state, the material is mostly crystalline, and the conductive particles are forced into amorphous regions between the crystallites. If the percentage of conductive particles is sufficiently high, a level called the percolation level, the conductive particles touch, or nearly touch, forming a three-dimensional very low resistance conductive network. When the device becomes heated to the melting point of the polymer material, the crosslinked crystallites melt and become amorphous, disrupting the network of conductive paths. As the network is disrupted, the resistance of the device increases dramatically. Once current is removed from the device and the polymer recrystallizes, the very low resistance conductive network is reestablished, thereby providing an automatic reset of the PPTC resistive device.
Suitable conductive polymer compositions and elements, and methods for producing the same, are disclosed, for example, in U.S. Pat. Nos. 4,237,441 (van Konynenburg et al.), 4,545,926 (Fouts et al.), 4,724,417 (Au et al.), 4,774,024 (Deep et al.), 4,935,156 (van Konynenburg et al.), 5,049,850 (Evans et al.), 5,250,228 (Baigrie et al.), 5,378,407 (Chandler et al.), 5,451,919 (Chu et al.), 5,701,285 (Chandler et al.), 5,747,147 (Wartenberg et al.) and 6,130,597 (Toth et al.), the disclosures of which are incorporated herein by reference.
PPTC resistive devices can be used in a number of different ways, and are particularly useful in circuit protection applications, in which they function as remotely resettable devices to help protect electrical components from excessive currents and/or temperatures. Components which can be protected in this way include motors, batteries, battery chargers, loudspeakers, wiring harnesses in automobiles, telecommunications equipment and circuits, and other electrical and electronic components, circuits and devices. The use of PPTC resistive elements, components and devices in this way has grown rapidly over recent years, and continues to increase.
Traditional injection molding has been proposed in the prior art for the formation of PPTC electrical devices. However, test data collected for devices made by injection molding has demonstrated that such devices have lower performance ratings compared to PPTC resistive devices made by extrusion-lamination procedures using the same material. This reduction in performance has been thought to be caused by melt flow pattern and residual stresses in the polymer matrix resulting from high pressure injection of the polymer-conductive particle mixture through a narrow opening, or mold gate, and rapid flow-cool conditions inherent with injection molding processes. The internal stresses have introduced a higher variability in the resistance of the resultant devices and have reduced high-voltage cycling performance. Accordingly, while the prior art, such as commonly assigned U.S. Pat. No. 5,122,775 to Fang et al., for “Conduction Device for Resistive Elements”, suggests at column 3, lines 14-19 that “the invention is also useful in processes in which each device is manufactured separately, e.g. by injection molding, in order to simplify the steps of the process and/or complexity of the mold or other equipment”, commercial practice and success have been focused essentially upon the extrusion-lamination formation method.
With reference to
While the conventional manufacturing method outlined in
Injection molding of useful articles is known in the art. Plastic pellets are collected in a hopper and fed into a reciprocating screw. The screw heats the pellets to plastic phase and to homogenize the plastic pellet material before it is injected into a mold cavity formed by two mold parts through a nozzle by forward reciprocation of the screw. During injection molding, injection pressures are applied directly to the plasticized material and can reach 69 to 138 MPa (10,000 to 20,000 pounds per square inch), or more. After the molded article cools, one part of the mold is moved back and the article is ejected by ejector pins or a panel. Coolant may be circulated through temperature control channels of the mold to provide active cooling following injection molding, causing the plastic material to solidify rapidly and decrease overall cycle time. One drawback of injection molding is that the viscosity of the plastic material locks stress into the molded article, especially when cooling time is shortened, most often manifested as physical deformation or warpage of the articles following ejection from the mold. One prior solution has been to include ribs or other supporting features into a thin-walled molded plastic article to provide rigidity to counteract warpage.
Injection-compression molding is a two phase operation in which plastic phase material is injected into a partially open mold in a first phase. In a second phase the mold is closed, compressing the molten plastic material under very high pressure into the desired shape defined by the mold cavity. The workpiece cools and is ejected by pins or a plate. Injection-compression molding is often used in cases where thin walled plastic parts must be made without ribs or supporting features and where maintaining close dimensional tolerances is very important, such as in the manufacture of compact discs and optical lenses.
Insert molding is a manufacturing process that can be derived from either injection molding or injection-compression molding. Insert molding is used when an application requires that a composite plastic-metal article be created with a metallic element or insert embedded within the molded plastic body. A common example is a plastic article having a threaded metal shaft. The metal insert is first placed into the mold and the plastic material is then injected and molded under pressure to form the composite article.
A hitherto unsolved need has remained for an improved method for making PPTC resistive devices with fewer process steps and at lower cost than the conventional method. In addition a hitherto unsolved need has remained for PPTC resistive devices capable of providing reliable circuit protection to relatively high voltage circuits and for an improved method for making such devices.
A general object of the present invention is to provide a method for manufacturing PPTC resistive devices with terminal electrode panels or foils attached in a single manufacturing step, in a manner overcoming limitations and drawbacks of the prior art.
Another object of the present invention is to provide a manufacturing method for PPTC resistive devices that achieves low residual stress in each molded device.
Another object of the present invention is to provide a manufacturing method for PPTC resistive devices that provides continuous product flow enabling reel-to-reel capability.
Another object of the present invention is to provide a manufacturing method for PPTC resistive devices having thick metal electrodes that eliminates steps of foil lamination and electrode soldering required by the prior art extrusion-lamination methods exemplified in
Another object of the present invention is to provide an insert injection-compression molding process for manufacturing PPTC resistive devices that includes ways for controlling the temperature of the mold and the molded panel during the manufacturing process.
Another object of the present invention is to provide a method for modifying facing major surfaces of metal electrode panels to achieve good adhesion to PPTC material during insert injection-compression molding of PPTC resistive panels.
In accordance with principles and aspects of the present invention, a method for making PPTC resistive panels includes the steps of:
(a) inserting metal electrodes having oppositely facing major surfaces modified for good adhesion into opposite sides of an open mold cavity;
(b) injecting a controlled amount of PPTC material in plastic phase into the mold cavity in a partially closed position;
(c) completely closing the mold cavity and compressing the PPTC material to occupy a predetermined thickness between the two metal electrodes; and,
(d) opening the mold and ejecting the PPTC resistive panel having the electrodes integrally attached thereto. In this aspect of the invention, the metal electrodes may be metal plates having a thickness at least 0.127 mm (0.005 inch), or may be metal foils having a thickness not greater than 0.5 mm (0.020 inch), for example. The mold apparatus is most preferably heated in a range of between 80° C. and 125° C. during the insert injection-compression molding cycle.
In the example of molding PPTC-metal plate devices, the oppositely facing major surface of the metal electrode plates are processed by steps of:
(e) chemically etching the major surface to provide a roughened surface; and
(f) depositing metal, e.g. by electroplating, to grow dendrite-like nodules on the roughened surface.
As one related aspect, the method may include a step of irradiating (crosslinking) the PPTC resistive panel and includes a further step of dividing the PPTC resistive panel into individual PPTC electrical devices.
These and other objects, advantages, aspects and features of the present invention will be more fully understood and appreciated upon consideration of the detailed description of preferred embodiments presented in conjunction with the following drawings.
The invention is illustrated by the drawings in which
With reference to
Returning to the description of
Mold temperature control is important to successful manufacturing of the laminar panels 10 in accordance with the present invention. In one example a mold apparatus employed fluid heating in which the heating fluid was maintained at 120° C., while the mold surface temperatures never exceeded 75° C., plus or minus 5° C. In this example, the PPTC material layer 50 cools very rapidly before and during the compression step and dominated other process variables. Cooling time following the compression step was approximately 40 seconds. Also, it was noted that the use of this fluid heating of the mold resulted in excessively viscous plastic-phase PPTC material, making it very difficult to make thin layered PPTC devices.
When an electrically heated mold was employed it became possible to heat the molding surfaces higher than 75° C., and molding and compression at 127° C. was carried out. However, cooling time in ambient air following the compression step required about ten minutes, and it was found that the molded panel 10 had to be cooled to a temperature below 115° C. before being ejected from the mold 30 by operation of the ejector pin mechanism 37. Otherwise, the panel 10 can become deformed by the ejector pins of mechanism 37. Employing a mold apparatus having active heating and cooling elements reduces the cooling time of the panel 10.
After the PPTC panel 10 is removed from the mold apparatus 30 and cooled, it may be further processed by crosslinking (e.g. by means of an electron beam) either before or after being sheared, stamped, cut, sawn or otherwise divided into individual devices.
In addition to active cooling, or alternatively, as shown in
In order to achieve satisfactory bonding between the metal electrode panels 40, 42 and the PPTC layer 50, a suitable surface treatment is provided for the metal major surfaces confronting the PPTC layer 50. While a wide variety of surface treatments are known in the art such as abrasion and coining, a presently preferred chemical etch treatment is illustrated in
Turning to 5A, a first step is to create a roughened surface 41 on the metal electrode plate, e.g. plate 40, it being understood that the same treatment is applied to a surface of electrode plate 42. The plate 40, 42 is typically of brass or copper or alloys and preferably has a thickness of 0.51 mm (0.02 inch). While surface roughening can be carried out by abrasion with fine-grit sandpaper having grit size in a range of 240 to 600 particles per square inch, or by use of carbide dust applied to the surface at pressure via a nozzle (sand blasting), most preferably surface roughening is carried out with a chemical etch employing ferric chloride and hydrochloric acid (FeCl3+HCl). The resulting roughened surface has roughened plateaus 60 and recesses 62 as diagrammed in
Turning now to
Molded PPTC-Metal Plate Circuit Protection Device Example
PPTC-Metal Foils Devices Peel Test Example
As shown above, the present invention works very well in providing molded PPTC protection devices using brass plate electrodes. The invention also works well in making laminar molded PPTC devices having thin foils. One method for determining how well the PPTC material has become engaged with the surface treated electrical foils is by measuring peel strength. The peel strength test is used to indicate how well polymer flows during compression phase of the insert injection-compression molding cycle. If peel strength is poor, electrical arcing may occur between the terminals and the polymeric layer, causing sparks and possible device failure. In making test panels injection-compression molding apparatus defining a 152 mm×76 mm (6 inch by 3 inch) cavity was used. The mold apparatus included five ejector pins for ejecting the injection-compression molded PPTC panel after each molding operation. The mold was set up such that a polymeric material of high density polyethylene filled with carbon black could be injected into the cavity and compressed to a final thickness selectable within a range of 6.4 mm (0.25 inch) to 0.25 mm (0.010 inch), depending upon the metal insert foil/panel thicknesses and the amount of material initially injected into the mold. In this example, 0.1 mm (0.004 inch) nickel foils were inserted into the mold. The 0.1 mm (0.004 inch) nickel foil provides a more rigid terminal, and larger nodules for better adhesion than thinner foils, such as the 0.05 mm (0.002 inch) nickel foil typically used with conventional extrusion-lamination PPTC devices. Herein, the tests of molded PPTC foil devices relate to injection-compression molded (ICM) parts having 0.1 mm (0.004 inch) thickness nickel foils.
The insert foils had surfaces confronting the polymer material processed to form nodules of the type illustrated above in
Four sample PPTC-electrode foil laminar panels were molded, permitted to cool for 20 seconds following ejection and tested for peel strength.
When the mold is heated at 82° C., the values of peel strength are high for many of the middle strips and low at the edge strips. There is a difference of 18 N/cm between the highest and lowest values of peel strength. The 93° C. sample panel has much higher values for the edge strips than the 82° C. sample, and the greatest difference in peel strength is 10 N/cm. The 101° C. sample panel is more consistent across the panel, but has slightly higher values of peel at the edge strips than for the middle strips. This sample panel's peel strength varies by 5.5 N/cm. The last sample panel, made at 118° C. has the most consistent values of peel strength, varying no more than 4 N/cm in its peel strength values. Also, the sample made at 118° C. shows considerable uniformity and higher correlation for A side peel strengths with the B side peel strengths graphed in
Metal Foil PPTC Device Electrical Testing Example
It is very important for PPTC devices to have uniform resistivity when they are employed to protect electrical circuits. In this example, two laminar PPTC-foil panels using 0.1 mm (0.004 inch) nickel foil electrode inserts were made as set forth in the peel strength example above. One panel was molded at a temperature of 115° C., and the other panel was molded at a temperature of 125° C. Small chips were punched out of the panels after molding and before beam irradiation. The chips were 8 mm by 13.5 mm (0.32 inch by 0.53 inch) and had a polymer thickness of 2 mm (0.08 inch). Test chips were punched along the length (i.e. the longest) dimension of the panel from edge to edge, in the same manner as peel strength strips were punched. Twelve chips were punched at equal intervals along the panel. Test data showed that initial resistance in ohms varied from a high of 0.36 ohm at an edge chip to a low of 0.27 ohm at chip 9 in the 115° C. family. Much less variation in resistance was seen in the chip family from the panel made at 125° C. In those chips resistance ranged from 0.31 ohm to 0.27 ohm. Measurements established that the 125° C. panel showed a more uniform cross sectional thickness and resistances. The 115° C. panel showed ten percent thickness increases at the edges and thirty percent variations in resistances, edge to edge.
Next, resistance jump was measured for the chips punched across the molded laminar PPTC-foil panel. For this test the initial resistance measurements are compared to resistance measurements after beaming and heat treatments. The sample chips were irradiated to crosslink the polymer material and were subjected to heat during terminal soldering and annealing steps. The average resistance of the molded chips directly after punching from the molded laminar PPTC-foil panel was 0.3 ohm. After the crosslinking and heat treatment steps, the average resistance of the chips had increased to 1.5 ohm. Before crosslinking and heat treatment, the resistance of individual chips tended to vary as much as 20 percent, whereas after crosslinking and heat treatment chip resistance varied by no more than nine percent.
Next, the molded chips were tested for Resistance v. Temperature (RT) characteristics and were compared to extrusion chips made by conventional methods. RT tests are normally performed in lots of 20 devices. In this test the extruded chips were made of 38 percent carbon-black in HDPE by weight, whereas the molded laminar chips were 37 percent carbon-black in HDPE by weight. The initial resistance of the molded chips was lower than the extruded chips. The molded chips had an ATH of 4.39 decades while the extruded chips had an ATH of 4.47. When the initial resistances are normalized, the molding process produced similar ATH as manifested by the conventional extruded chips. There is some evidence that the insert injection-compression molding process results in molded PPTC-foil devices which use the carbon-black more efficiently than devices made by conventional extrusion-lamination methods, based on the lower initial resistance of the molded chips containing PPTC with a lesser concentration of carbon-black.
The next test compared resistance versus temperature of molded chips with resistance versus temperature of conventional extruded chips. For this test, the carbon-black loading of the molded laminar PPTC panel was reduced to 35.8 percent by weight, so that the initial resistance of molded devices was 2.46 ohms, while the conventional extruded chips had an initial resistance of 2.3 ohms. Normalized resistance-temperature data for the molded chips and the extruded chips shows that the molded chips obtain an ATH of 5.4 decades which is nearly one order of magnitude greater ATH obtained from the conventional extruded chips (ATH equals 4.4 decades). The ATH for the molded chips basically tracks the initial resistance of each chip based on position across the molded PPTC laminar panel.
High voltage rated PPTC devices are subjected to electrical stress cycle testing. The polymer composition and geometry of the device is designed to withstand large power surges. In cycle life tests, these devices are typically tested at one of the following: 250 volts at three amps for 100 cycles; 600 volts at 2.2 amps for 100 cycles; 600 volts at seven amps for ten cycles; or, 600 volts at 60 amps for three cycles. Each test holds the device at the stated power level for five seconds and then provides a 120 second cool off interval before the next power cycle. The chip devices molded in accordance with the present invention (35.8 percent carbon-black in HDPE) passed the 250 volt, three amp test at a 100 percent pass rate.
The resistance behavior during the 600 volt at 2.2 amp cycle life testing is tabulated in summary form in the table, below, which compares results for conventional 38 percent carbon-black extruded parts with 35.8 percent carbon-black molded parts. Before each power cycle, the testing machine measures the resistance of the devices undergoing testing. The resistance jumps significantly for the first two cycles, and then decays slowly during the additional 98 cycles that follow. The resistance is recorded for all 100 cycles, but the initial cycle, the second cycle, the tenth cycle and the 100th cycle resistances are most frequently used for comparison, as shown in the table below. The resistance at any particular cycle, Rf, divided by the initial resistance is known as the trip jump, TJ. During the testing reported in the table, below, usually only one molded chip device of 25 undergoing testing would fail.
The 600 volt at 7 amps over ten cycles test proved more challenging for the molded devices. A typical performance specification for high voltage PPTC devices is that each device withstand one cycle at 600 volts, 7 amps. In tests half of the molded devices survived all ten cycles of this test. These devices had a normal resistance jump after the first cycle, and then had a constant or slightly decreasing resistance throughout the remaining nine cycles. For the molded chips that survived this test, they seem to have almost identical trip jump behavior as is summarized in the table above for the 600 volt, 2.2 amp test.
The 600 volt at 60 amp two cycles test is by far the most aggressive and harsh of the standardized tests. Fifty of the molded 35.8% carbon-black chip devices were tested at the 600 volt, 60 amp settings. Only seven failed during the first cycle. The increase in chip resistance following the initial cycle averaged at about six ohms, with some devices less and some at as much as 12 ohms. Unlike previous testing, substantial polymer oxidation within each chip may have occurred in this first cycle. The trip jumps for the 60 amp test turned to be much more sporadic than those reported above in the table, suggesting that the first cycle of the lower amperage tests does not damage the polymer, while the 60 amp test oxidizes some of the polymer structure as early as the first cycle.
Having thus described preferred embodiments of the invention, it will now be appreciated that the objects of the invention have been fully achieved, and it will be understood by those skilled in the art that many changes in construction and widely differing embodiments and applications of the invention will suggest themselves without departing from the spirit and scope of the invention. Therefore, the disclosures and descriptions herein are purely illustrative and are not intended to be in any sense limiting.
This application is an application under 35 USC 111(a) and claims priority under 35 USC 119 from Provisional Application Ser. No. 60/644,346, filed Jan. 14, 2005 under 35 USC 111(b). The disclosure of that provisional application is incorporated herein by reference.
Number | Date | Country | |
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60644346 | Jan 2005 | US |