Integrated circuit package and method of making the same

Information

  • Patent Grant
  • 8963301
  • Patent Number
    8,963,301
  • Date Filed
    Friday, December 27, 2013
    11 years ago
  • Date Issued
    Tuesday, February 24, 2015
    9 years ago
Abstract
Packages for an integrated circuit die and methods and lead frames for making such packages are disclosed. The package includes a die, a die pad, peripheral metal contacts, bond wares, and an encapsulant. The die pad and contacts are located at a lower surface of the package. The die pad and the contacts have side surfaces which include reentrant portions and asperities to engage the encapsulant.
Description
FIELD OF THE INVENTION

The present invention is to directed toward an improved plastic package for an integrated circuit die, and a method of making such a package.


BACKGROUND OF THE INVENTION

Integrated circuit die are conventionally enclosed in plastic packages that provide protection from hostile environments and enable electrical interconnection between the integrated circuit die and printed circuit boards. The elements of such a package include a metal leadframe, an integrated circuit die, bonding material to attach the integrated circuit die to the leadframe, bond wires which electrically connect pads on the integrated circuit die to individual leads of the leadframe, and a hard plastic encapsulant material which covers the other components and forms the exterior of the package.


The leadframe is the central supporting structure of such a package. A portion of the leadframe is internal to the package, i.e., completely surrounded by the plastic encapsulant. Portions of the leads of the leadframe extend eternally from the package and are used to connect the package externally.


Further background information concerning conventional plastic integrated circuit packages and leadframes is contained in chapter 8 of the book Microelectronics Packaging Handbook (1989), which was edited by R. Tummala and E. Rymaszewski, and is published by Van Nostrand Reinhold, 115 Fifth Avenue, New York, N.Y.


A problem with conventional plastic packages is that their internal leadframes limit reduction of the size of the packages. Practitioners have attempted to reduce the size of packages by eliminating internal leadframes, as is shown in U.S. Pat. No. 4,530,152 to Roche et al and U.S. Pat. No. 5,172,214 to Castro, but these packages have numerous disadvantages. The contacts of the package shown by Roche in the '152 patent have orthogonal side surfaces. Accordingly, the packages are believed to be unreliable because the contacts could easily be pulled from the encapsulant material. The package shown by Castro in the '214 patent has leads which extend into the body of the package from a lower external surface of the package to the top of the die. These leads are large, and have complex bends. Including such leads in a package would increase manufacturing costs and limit reductions in the lateral size of the package. By contrast, the contacts of the packages within the present invention are simpler, do not have such bends, and allow for packages of smaller lateral size.


SUMMARY OF THE INVENTION

The present invention is to directed toward improved plastic packages for housing an integrated circuit die, and to leadframes and methods for making such packages. The packages of the present invention are easier and less expensive to make than conventional plastic packages, and are more reliable and efficiently-sized than conventional packages.


In one embodiment of an assembly method for a package within the present invention, Step 1 provides a metal leadframe. The leadframe includes a rectangular frame, e.g., a square frame. A substantially planar die pad is within and connected to the frame. A plurality of finger-like rectangular tabs extend from the frame toward the die pad without contacting the die pad. The number and location of the tabs around the frame may vary. The die pad and the tabs have peripheral side surfaces which include a reentrant portion(s) and asperities. The reentrant position(s) and asperities enhance the connection of the die pad and tabs to the plastic encapsulating material.


Step 2 places and attaches an integrated circuit to a first surface of the die pad.


Step 3 electrically connects a bond wire or an equivalent conductor between each bonding pad of the die and a first surface of one of the tabs.


Step 4 places the leadframe on a flat surface with the die facing upwards, and applies a viscous encapsulant material onto the upward facing first surface of the leadframe. The encapsulant material is then hardened. The encapsulant material covers the die, the bond wires, a first surface of the tabs, the first surface of the die pad, the side surfaces of the die pad and tabs, and all or part of the frames around the die pad. A lower second surface of the leadframe, including a lower second surface of the die pad and tabs, is not covered with encapsulant.


Step 5 plates the exposed surfaces of the leadframe, including the exposed second surfaces of the die pad and tabs with a metal, such as copper, gold, lead-tin solder, tin, nickel, palladium, or any solderable metal.


Step 6 cuts the encapsulated portions of the leadframe with a saw. In particular, step 6 either obliterates the disposable portions of the leadframe, or severs the disposable portions of the leadframe from other components of the leadframe, such as the die pad and tabs, which are to be included in the package. Step 6 also trims the encapsulant material and thereby forms the peripheral sides of the package.


A feature the packages built by the above described method is that the die pad and contacts (i.e., the severed tabs of the leadframe) of the package are located at the lower first surface of the package. The first surfaces and side surfaces of the die pad and tabs are internal to the package, i.e., covered with encapsulant material, but the second surfaces of the die pad and tabs are not covered by encapsulant material. The die pad and tabs are isolated from each other by encapsulant material.


In a completed package, only the encapsulant material holds the die pad and contacts to the package. The connection of the encapsulant material to the die pad and contacts is enhanced by the reentrant portion(s) and asperities of the side surfaces of the die pad and contacts. The reentrant portions and asperities of the side surfaces of the die pad and contacts function as encapsulant fasteners or lead locks.


Numerous variations of the leadframe, package, and assembly method described above also are described in this application. In one alternative assembly method, a leadframe is provided which allows a plurality of packages to be constructed simultaneously.


A leadframe for constructing a plurality of packages simultaneously includes, for example, a matrix of interconnected rectangular frames. A die pad is within and connected to each of the interconnected frames. A set of tabs extend from each frame toward the sides of the enclosed die pad without contacting the die pad. A subsequent encapsulation step includes applying an encapsulant material onto the surface of the leadframe to which the dies are attached. This step covers the dies and the side surfaces of the die pads and tabs within a single block of encapsulant material. The encapsulant material is then hardened. A cutting step separates individual packages from each other and from the disposable portions of the leadframe. The cutting step also severs the connection between each of the interconnected frames and the die pad and tabs within each frame.





BRIEF DESCRIPTION OF DRAWINGS


FIG. 1 is a flow chart of a method of making a package.



FIG. 2 is a top view of leadframe used for making a package.



FIG. 3 is an enlarged cross-sectional side view of a circled portion of FIG. 2. FIG. 3 shows an embodiment of a side surface of a die pad and tab.



FIG. 4 is a first alternative embodiment of a side surface of a die pad and tab.



FIG. 5 is a second alternative embodiment of a side surface of a die pad and tab.



FIG. 6 is a third alternative embodiment of a side surface of a die pad and tab.



FIG. 7 is a top view of the leadframe of FIG. 1 after encapsulation. The dashed lines are cutting paths for a subsequent sawing step.



FIG. 8 is a cross-sectional side view of a completed package.



FIG. 9 is a cross-sectional side view of the package of FIG. 8 further including solder interconnection bumps on the package contacts.



FIG. 10 is a flow chart of a method for making a plurality of packages simultaneously.



FIG. 11 is a top view of a leadframe used for making a plurality of packages simultaneously.





DETAILED DESCRIPTION


FIG. 1 shows an exemplary method of assembling a package in accordance with the present invention. FIG. 8 shows a completed package.


Step 1 of FIG. 1 provides a metal leadframe. FIG. 2 is a top view of a first embodiment of a metal leadframe 20 in accordance with the present invention. For ease of view, shading is used in FIG. 2 to distinguish the metal portions of leadframe 20 from empty spaces between the various elements of leadframe 20.


Leadframe 20 of FIG. 2 is planar or substantially planar and is made of a conventional leadframe metal, such as copper or copper alloys, plated copper or plated copper alloys, Alloy 42 (42% nickel, 58% iron), or copper plated steel, depending on the application. The opposing upper and lower surfaces of leadframe 20 may be plated with different metals. For example, the tabs 30 and/or other portions of leadframe 20 which ultimately are enclosed within the package may be plated with silver, gold, nickel palladium, or copper. Such plating, for example, may enhance attachment of bond wires to tabs 30.



FIG. 2 includes dash lines A--A, B--B, C--C, and D--D. These are lines which indicate where leadframe 20 is cut in Step 6 of FIG. 1. Step 6 is described below. FIG. 2 also includes a circle and dashed line 3-3, which indicate the view of FIG. 3.


Leadframe 20 of FIG. 2 includes a peripheral rectangular frame 21. Frame 21 consists of four rectilinear members. The two intersecting pairs of parallel members of frame 21 are denoted as members 22 and 22A and 23 and 23A. Artisans should understand that the terms “rectangular” or “rectangle” as used herein include a square, which is a rectangle with four equivalent sides.


A rectangular die pad 24 is within and connected to frame 21. Die pad 24 has a planar or substantially planar upper first surface 25 and, although it is not shown in FIG. 2, an opposite planar or substantially planar lower second surface 26. Die pad 24 also has peripheral aide surfaces 27 between upper first surface 26 and lower second surface 26.


A connector 28 connects two parallel side surfaces 27 of die pad 24 to members 22 and 22A of frame 21 of FIG. 2. Each connector 28 includes a mushroom-shaped anchor 29, although other shapes may be used for anchor 29.


Three finger-like rectangular tabs 30 are connected to and extend from members 23 and 23A toward an adjacent side surface 27 of die pad 24 without contacting side surfaces 27. As a result of this configuration, the completed package will have a single row of three contacts on two parallel sides of the package. Tabs 30 ultimately are severed from members 23 and 23A along cut lines C--C and D--D of FIG. 2, and become the contacts of the package.


The number, location, and shape of tabs 30 may vary. For example, instead of having tabs 30 only on members 23 and 23A of frame 21 of leadframe 20, as in FIG. 2, sets of tabs 30 may be placed on all four members of frame 21. This alternative embodiment would result in the formation of a quad package.


Each tab 30 of FIG. 2 has a planar or substantially planar upper first surface 31 and, although it is not shown in FIG. 2, an opposite planar or substantially planar lower second surface 32. Each tab 30 also has three peripheral side surfaces 33 between upper first surface 31 and lower second surface 32.



FIGS. 3-6 show an enlarged cross-sectional side view of the circled portion of FIG. 2 along line 3-3. In particular, FIGS. 3-6 show, in accordance with the present invention, a side surface 27 of a die pad 24 and a side surface 33 of a tab 30 of leadframe 20 of FIG. 2.


Side surface 27 of die pad 24 and side surface 33 of tab 30 of FIG. 3 have reentrant portions. In particular; the upper and lower portions of side surfaces 27 and 33 are reentrant such that there is a central peak 34 which extends outward from side surfaces 27 and 33 of die pad 24 and tab 30, respectively. Encapsulant material flows into the reentrant portions of side surfaces 27 and 33. Central peak 34 extends into the encapsulant material.


The reentrant portions of side surfaces 27 of die pad 24 and side surfaces 33 of tabs 30 of FIG. 3 have the function, in a completed package, of enhancing the connection between the encapsulating material, on the one hand, and die pad 24 and the contacts of the package (i.e., severed tabs 30), on the other hand.


In addition to having reentrant portions, side surface 27 of die pad 24 and side surface 33 of tab 30 of FIG. 3 have a roughly-textured surface which includes numerous asperities. Encapsulant material flows into the areas of the asperities. The asperities also enhance the connection between the encapsulant material and die pad 24 and the contacts of the package (i.e., the severed tabs 30).



FIG. 4 shows a first alternative profile for side surfaces 27 of die pad 24 and side surfaces 33 of tabs 30 of leadframe 20 of FIG. 2. In the embodiment of FIG. 4, side surfaces 27 and 33 each have a central depression 35 and a roughly-textured surface which includes numerous asperities. Encapsulant material flows into central depression 35 and in the areas of the asperities. The reentrant portion and asperities of side surfaces 27 and 33 of FIG. 4 have the function, in a completed package, of enhancing the connection between the encapsulant material and die pad 24 and the contacts of the package (i.e., the severed tabs 30).



FIG. 5 shows a second alternative profile for side surfaces 27 of die pad 24 and side surfaces 33 of tabs 30 of leadframe 20 of FIG. 2. In the embodiment of FIG. 5, side surfaces 27 and 33 include a rounded lip 36 adjacent to upper surface 25 and 31 of die pad 24 and tab 30, respectively. Lip 30 has a roughly-textured surface which includes numerous asperities. Side surfaces 27 and 33 also have a reentrant orthogonal portion 37 beneath lip 36, adjacent to lower second surface 29 and 32 of die pad 24 and tab 30, respectively. Encapsulant material flows beneath lip 36 and into the area of the asperities. Like the embodiments of FIGS. 3 and 4, the reentrant portions and asperities of side surface 27 of die pad 24 and side surface 33 of tab 30 of FIG. 5 have the function, in a completed package, of enhancing the connection between the encapsulant material and die pad 24 and the contacts of the package (i.e., tabs 30 after they are severed from members 23 and 23A).



FIG. 6 shows a third alternative for side surfaces 27 of die pad 24 and side surfaces 33 of tabs 30 of leadframe 20 of FIG. 1. In this embodiment, side surfaces 27 and 33 each include a rectangular lip 38 adjacent to upper surface 25 and 31 of die pad 24 and tab 30, respectively. Side surfaces 27 and 33 also have a reentrant orthogonal portion 39 beneath lip 38 adjacent to lower second surface 29 and 32 of die pad 24 and tab 30, respectively. Encapsulant material flows beneath lip 38. Like the embodiments of FIGS. 3-5, the reentrant portions of side surface 27 of die pad 24 and side surface 33 of tab 30 of FIG. 6 have the function, in a completed package, of enhancing the connection between the encapsulant material and die pad 24 and the contacts of the package (i.e., severed tabs 30).


As discussed above, Step 1 of FIG. 1 provides a metal leadframe having features like those shown in FIG. 2 and either FIG. 3, 4, 5, or 6, or equivalents thereof. Leadframe 20 of FIG. 2 is formed from rolled strip metal stock by wet chemical etching or mechanical stamping using progressive dies.


As is well known, chemical etching (also known as chemical milling) is a process that uses photolithography and metal-dissolving chemicals to etch a pattern into a metal strip. The photoresist is exposed to ultraviolet light through a photo mask having a desired pattern, and is subsequently developed and cured. Chemicals are sprayed or otherwise applied to the masked strip, and exposed portions of the strip are etched away, leaving the desired pattern.


As is also well known, progressive stamping uses sets of progressive dies to mechanically remove metal from a metal strip. Each of a plurality of stamping stations uses one of the dies to punch a distinct small area of metal from the strip as the strip moves through the stations.


A leadframe 20 having side surfaces like FIG. 3 can be formed by chemically etching the rolled strip metal stock from both sides using a conventional liquid etchant. The etch process is stopped early so that there is an underetching of all of the side surfaces of the components of leadframe 20, including side surfaces 27 of die pad 24 and side surfaces 33 of tabs 30, compared to the time it would take to form vertical side surfaces. The size and shape of central peak 34 of FIG. 2 is controlled by the amount of underetching.


A leadframe 20 having side surfaces like FIG. 4 can be formed by chemically etching the rolled strip metal stock from one side using a conventional liquid etchant. The etch process is continued beyond the time required to form orthogonal side surfaces for the components of leadframe 20. The size and shape of central depression 35 of FIG. 3 is controlled by the amount of overetching.


A leadframe 20 having side surfaces like FIG. 5 can be formed in a two step process. The first step of such a process involves forming a leadframe 20 by chemical etching or progressive stamping so that the side surfaces of the components of leadframe 20, including die pad 24 and tabs 30, have an orthogonal profile. The second step involves coining the upper first surface of the leadframe 20, that is, applying a high pressure impact to the upper first surface of the leadframe 20. This step deforms the side surfaces of leadframe 40 adjacent to the impacted surface so that the rounded, asperity-marked protruding lip 36 of FIG. 5 is formed.


A leadframe 20 having side surfaces like FIG. 6 can be formed by progressive stamping. The side surfaces of the components of leadframe 20, including side surfaces 27 of die pad 24 and the side surfaces 33 of tabs 30, can be provided with a rectangular lip 38 and a reentrant orthogonal portion 39 by including intermediate stamping steps which do not fully cut through the rolled strip metal stock before finally cutting through the rolled-strip sheet. The intermediate stamping steps and the final cutting steps combine to form the rectangular, protruding lips 38 of side surfaces 27 and 33 of FIG. 5.


Step 2 of FIG. 1 places an integrated circuit die onto upper first surface 25 of die pad 24. The placement and attachment of the die onto die pad 24 may be performed using a conventional die attach machine and conventional die attach adhesives. During Step 2 and the subsequent assembly steps, leadframe 20 of FIG. 2 is grounded to protect against electrostatic discharge (“ESD”).


Step 3 of FIG. 1 electrically connects a conductive metal bond wire between individual bonding pads on the integrated circuit die and the upper first surface 31 of individual tabs 30 on leadframe 20 of FIG. 2. Tabs 30 ultimately become contacts in the completed package, after tabs 30 are severed from members 23 and 23A of frame 21. Conventional bond wire attachment equipment may be used for Step 3. Leadframe 20 of FIG. 2 is grounded during this wiring step to prevent damage to the integrated circuit dies due to electrostatic discharge. At the completion of Step 3, each bonding pad of each die is electrically connected to a tab 30 of leadframe 20 of FIG. 1, which is grounded. Tabs 30 of leadframe 20 are all shorted together, which facilitates ESD protection.


In Step 4 of FIG. 1, the lower second surface of leadframe 20 of FIG. 2 is placed on a flat surface, and a viscous adhesive encapsulating material is applied onto the upward facing upper first surface of leadframe 20. The encapsulating material is applied so that the encapsulating material covers: the integrated circuit die; the bond wires; any exposed peripheral portions of upper first surface 25 of die pad 24 around the die; side surfaces 27 of die pad 24; upper first surface 31 of tabs 30; side surfaces 33 of tabs 33; and part or all of the width of members 22, 22A, 23, and 23A of frame 21. The encapsulant material also fills the empty spaces between the components within frame 21 of leadframe 20. The encapsulant material does not, however, cover lower second surface 26 of die pad 24 or lower second surfaces 32 of tabs 30 of FIG. 2. In an alternative embodiment, die pad 24 may be up set during the encapsulation step so that a thin layer of encapsulant material forms under lower second surface 26 of die pad 24. If such a step were used, die pad 24 would be completely internal to the package. Finally, the encapsulant material is hardened.


There are several methods by which Step 4 of FIG. 1 may be accomplished, depending on the application. For example, as a first step, leadframe 20 of FIG. 2 is placed on a horizontal surface. As a second step, a contiguous bead of a conventional hardenable viscous adhesive material, such as HYSOL 4451 epoxy from the Dexter-Hysol Company of City of Industry, Calif. is applied onto the upper first surface of side members 22, 22A, 23, and 23A of frame 21 of leadframe 20 of FIG. 2, forming a closed rectangular dam. As a third step, the dam is solidified, such as by heating at 150° C. for one hour. As a fourth step, a conventional hardenable viscous adhesive material suitable for encapsulating packages, such as HYSOL 4450 encapsulant, is applied within the dam so that the incomplete package within the dam is covered with encapsulant material. As a final step, the encapsulant material is hardened, such as by heating at 150° C. for one hour, forming a single solid block of encapsulant material above and on leadframe 20, including on its side surfaces.


Alternatively, Step 4 of FIG. 1 may be accomplished using conventional plastic molding techniques. In such a method, leadframe 20 of FIG. 2 is placed in a mold, and a single block of solid molded encapsulant material is formed above and on leadframe 20, including on its side surfaces. The encapsulant material may be a conventional plastic molding compound applied using conventional techniques. Example molding compounds include NITTO MP-8000AN molding compound from the Nitto Company of Japan, and EME 7351 UT molding compound from the Sumitomo Company of Japan. Conventional gates may be formed in leadframe 20 to assist in the molding process.


In Step 5 of FIG. 1, the portions of leadframe 20 of FIG. 2 which are not covered with the encapsulant material, including lower second surface 26 of die pad 24 and lower second surfaces 32 of tabs 30, are plated using a conventional plating metal compatible with printed circuit boards. For example, exposed second surfaces 26 and 33 of die pad 24 and tabs 30, respectively, may be plated with gold, nickel-palladium, inconel, lead tin solder, or tantalum, depending on the application. The plating step is facilitated by the electrical interconnection of the components of leadframe 20.



FIG. 7 is a top view of leadframe 20 of FIG. 2 after the completion of Steps 1-5 of FIG. 1. A rectangular block of hardened encapsulant material 40 covers the upper first surface of leadframe 20. Although not shown, encapsulant material 40 also covers side surfaces 27 and 33 of die pad 24 and tabs 30, respectively, of leadframe 20. The block of encapsulant material 40 in FIG. 7 covers a portion of the width of members 22, 22A, 23, and 23A of frame 21 of leadframe 20. The peripheral portions of members 22, 22A, 23, and 23A of frame 21 remain exposed. Alternatively, encapsulant material 40 could be deposited over the entire upper first surface of leadframe 20. As a second alternative, encapsulant material 40 could be deposited within frame 21 so that tabs 30 are covered, but members 22, 22A, 23, and 23A are not covered.


Step 6 of FIG. 1 cuts leadframe 20 of FIG. 7 in situ. Referring to FIGS. 2 and 7, Step 6 severs the connection between tabs 30 and members 23 and 23A of frame 21 of leadframe 20. Step 2 also severs connectors 28 between die pad 24 and members 22 and 22A of frame 21 of leadframe 20. Step 6 also cuts encapsulant material 40, forming vertical external aide surfaces of the package. Finally, Step 6 completes the formation of the package by cutting a completed package away from the disposable portions of leadframe 20.


Step 6 may be performed using a saw or other shearing apparatus. To perform Step 6 using a saw, the encapsulated leadframe 20 of FIG. 7 is inverted and placed on sticky film. Using the exposed portions of leadframe 20 as a guide (see FIG. 2), a conventional wafer saw is used to saw a completed package from the encapsulated leadframe 20. Criss-crossing rectilinear cuts are made along dashed lines A--A, B--B, C--C, and D--D of FIGS. 2 and 7 so that the disposable portions of leadframe 20, including side members 22, 22A, 23, and 23A of frame 21, connectors 28 and anchors 29, are cut away from the package, isolated within encapsulant material 40, or obliterated by the saw. The cutting path of the saw and/or the width of the saw blade should be selected so that the connections between tabs 30 and members 23 and 23A are severed and side members 22, 22A, 23, and 23A are cut away or obliterated, but all or most of each tab 30 remains intact.



FIG. 8 is a cross-sectional side view of an exemplary package 50 made from leadframe 20 of FIG. 2 according to Steps 1-6 of FIG. 1. Package 50 has a planar or substantially planar external upper first surface 51, and an opposite planar or substantially planar external lower second surface 52. Orthogonal external package sides 57 are at the periphery of package 50 between upper first surface 51 and lower second surface 52. Sides 57 were formed during Step 6, when encapsulant material 40 and tabs 30 were cut.


Lower second surface 52 of package 50 of FIG. 8 consists of die pad 24, a plurality of peripheral contacts 53, and hardened encapsulant material 40. Die pad 24 and each contact 53 are like islands at the lower external second surface 52 of package 50. They are physically separated from each other by encapsulant material 40.


Die pad 24 and contacts 53 of FIG. 8 are vestiges of leadframe 20 of FIG. 2. Referring to FIGS. 2 and 8, contacts 53 of package 50 of FIG. 8 were formed when the connections between tabs 30 and members 23 and 23A were severed by the saw during Step 6.


Die pad 24 of FIG. 8 is rectangular and is located at lower second surface 52 of package 50. Die pad 24 includes a planar or substantially planar upper first surface 25, an opposite planar or substantially planar second surface 26, and peripheral side surfaces 27. Second surface 26 of die pad 24 is in the same plane as lower second surface 52 of package 50 in FIG. 8, although in alternative embodiments, die pad 24 may be set up into encapsulant material 40.


Although not fully shown in FIG. 8, rectangular die pad 24 has four side surfaces 27 (only two are shown). Each aide surface 27 of die pad 24 has a reentrant portion(s), as exemplified by FIGS. 3-6. In addition, side surface 27 may have asperities, as exemplified by FIGS. 3-5.


In FIG. 8, integrated circuit die 56 is on and attached to upper first surface 25 of die pad 24. Peripheral portions of upper first surface 25 are covered by encapsulant material 40. Side surfaces 27 of die pad 24 also are covered by encapsulant material 40. Lower second surface 26 of die pad 24 is not covered encapsulant material 40, but rather is exposed at lower external surface 52 of package 50. In an alternative embodiment (not shown), die pad 24 may be entirely internal to encapsulant material 40 of package 50.


Two contacts 53 are shown in package 50 of FIG. 8, but since package 50 was constructed from leadframe 20 of FIG. 2, it should be understood that package 50 has a set of three contacts 53 on two sides 57 of package 50. In alternative embodiments, package 50 could be formed with a different number or arrangement of contacts, depending on the application.


Each contact 53 of FIG. 8 has a substantially rectangular perimeter and is located at the lower second surface 52 of package 50. Each contact 53 includes a planar or substantially planar upper first surface 31, an opposite planar or substantially planar second surface 32, three internal side surfaces 33 (only one is shown in FIG. 8) having reentrant portions, and one external orthogonal aide surface 55. Second surface 32 of contact 53 is in the same plane as lower second surface 52 of package 50.


First surface 31 and side surfaces 33 of contacts 53 are covered with an encapsulant material. Second surface 32 and external side surface 55 of contacts 53 are not covered with encapsulant material.


Orthogonal external side surfaces 55 of contacts 53 of FIG. 8 were formed during Step 6 of FIG. 1 when the saw cut the connections between tabs 30 and members 23 and 23A of leadframe 20 of FIG. 2. Accordingly, the external side surface 55 of each contact 53 has a vertical profile which is the same plane as the corresponding vertical aide 57 of package so.


Although not shown in FIG. 8, the three internal side surfaces 33 (only one is shown) of each contact 53 have reentrant portions, as exemplified by FIGS. 3-6. In addition side surfaces 33 may have asperities, as exemplified by FIGS. 3-5. Both the reentrant portion(s) and asperities of contacts 53 enhance the connection between contacts 53 and encapsulant material 40 of package 50 of FIG. 8.


The perimeter of contacts 53 need not be substantially rectangular in shape. For example, if tabs 30 of leadframe 20 of FIG. 2 had a circular perimeter, then contacts 53 would have a largely circular perimeter with a rectilinear portion formed during the cutting of tab 30 from leadframe 20 in Step 6.


A bond wire 58 is connected between each bonding pad 56a of die 56 and the upper first surface 31 of each contact 53. Bond wire 58 electrically connects individual bonding pads 56a of die 56 to individual contacts 53.


Second surface 32 of contacts 53 of FIG. 8 may be directly connected to an external printed circuit board, as in an LCC package. Alternatively, a solder interconnection bump may be formed on contacts 53 for physically and electrically connecting package 50 to a printed circuit board. FIG. 9 shows a solder interconnection bump 60 formed on lower second surface 32 and external side surface 55 of each contact 53 of package 50 of FIG. 8.


In an alternative embodiment, second surface 26 of die pad 24 also may be connected, such as by solder paste, to the printed circuit board to facilitate package cooling. The cooling occurs by thermal conduction.



FIG. 10 is a flow chart for an alternative assembly method, in accordance with the present invention, for constructing a package like that of FIG. 8. In the method of FIG. 10, a plurality of packages are constructed simultaneously. The basic steps of the FIG. 10 process are the same as the FIG. 1 process.


Step 1 of FIG. 10 provides a thin metal leadframe which includes a plurality of interconnected rectangular frames in a matrix. A die pad is provided within each frame.



FIG. 11 shows an exemplary metal leadframe 70, in accordance with the present invention, suitable for Step 1 of FIG. 10. Shading is used in FIG. 11 to distinguish metal portions of leadframe 70 from empty space between the components of leadframe 70.


Leadframe 70 of FIG. 11 is planar or substantially planar and is formed of metal. The metals and methods used for constructing leadframe 70 are the same as those described above for leadframe 20 of FIG. 2.


Leadframe 70 of FIG. 11 includes a disposable rectangular outer frame 71. Outer frame 71 consists of four intersecting members, denoted as members 72-75. Member 72 is parallel to member 74, and member 73 is parallel to member 75.


Within outer frame 71 of FIG. 11 are four interconnected rectangular frames in a two by two matrix. These frames are formed by the intersection of three disposable strips 76 and three disposable strips 77. Each of the four interconnected frames of FIG. 11 has the same basic features as frame 21 of FIG. 2. Accordingly, the same reference numbers will be used, where applicable, and associated discussion will be abbreviated.


A rectangular die pad 24 is within and connected to each of the four frames formed by strips 76 and 77 of FIG. 11. As in FIG. 2, each die pad 24 of FIG. 11 has four side surfaces 27. Each side surface 27 has a reentrant portion(s), such as in the examples of FIGS. 3-6. Side surfaces 27 also may include asperities, such as those shown in FIGS. 3-5.


Three parallel strips 76 are within and connected to frame 71 of FIG. 11. A first strip 76 is adjacent to, parallel to, and connected to member 72 of frame 71. A second strip 76 is adjacent to, parallel to, and connected to member 74 of frame 71. A third strip 76 is located in the center of frame 71 between juxtaposed pairs of die pads 24. Each strip 76 of FIG. 11 is connected to each of the die pads 24 which are adjacent to that particular strip 76. A disposable mushroom-shaped anchor 29 connects each strip 76 to each adjacent die pad 24. Two disposable connectors 78 connect member 72 to its adjacent strip 76, and two connectors 78 connect member 74 to its adjacent strip 76. The number and locations of connectors 76 may vary.


Three parallel strips 77 also are within and connected to frame 71 of FIG. 11. One strip 77 is adjacent to, parallel to, and connected to side members 73 and 75 of frame 71. A disposable connector 78 connects members 73 and 75 to their respective adjacent strip 77. A third strip 77 is located in the center of frame 71 between juxtaposed pairs of die pads 24.


The intersecting ends of the peripheral strips 76 and 77 of FIG. 11 are connected to the inner corners of outer frame 71. A gate 79 extends at approximately a 45 degree angle from each of the four inner corners of frame 71 and connects to the interconnected ends of peripheral strips 76 and 77. Gate 79 is useful for the introduction of molding compound into a mold, where molding is the chosen method of encapsulation.


Central strip 76 of FIG. 11 intersects central strip 77 at the center of leadframe 70. The ends of central strips 76 and 77 intersect the peripheral strips 77 and 76, respectively.


In FIG. 11, a plurality of straight, evenly-spaced, finger-like, rectangular tabs 30 extend in sets of five from each strip 77 toward the sides of each of the die pads 24 adjacent that particular strip 77. Tabs 30 do not contact die pads 24. The central strip 77 that is between juxtaposed pairs of die pads 24 has mirror-image sets of five tabs 30 which extend in opposite directions toward each of the juxtaposed die pads 24. Each tab 30 will ultimately form a contact 53 of package 50 of FIG. 8.


Each tab 30 of FIG. 11 has three side surfaces 33 which have a reentrant portion(s), such as shown in FIGS. 3-6. Side surfaces 33 of tabs 53 also may include asperities, such as those shown in FIGS. 3-5. The reentrant portions and asperities of side surfaces 33 of tabs 30 enhance the connection between encapsulant material 40 and contacts 53 (i.e., severed tabs 30) of a completed package 10 of FIG. 8.


Step 2 of FIG. 10 places and attaches an integrated circuit die 56 on upper first surface 25 of each die pad 24 of leadframe 70 of FIG. 11, as described above for Step 2 of FIG. 1.


Referring to FIGS. 8 and 11, Step 3 of FIG. 10 electrically connects a conductive metal bond wire 58 between each bonding pad 56a on each integrated circuit die 56 attached to leadframe 70 and a tab 30. Bond wire 58 is connected to the first surface 31 of each tab 30. The methods for Step 3 of FIG. 11 are the same as described above for Step 3 of FIG. 1.


Step 4 of FIG. 10 covers each incomplete package of leadframe 70 of FIG. 11, including all of the dies 56, with a conventional viscous, adhesive encapsulant material. The methods and materials used for Step 4 of FIG. 10 are the same as for Step 4 of FIG. 1, except that the encapsulant material is applied onto all of the incomplete packages 50 of leadframe 70 of FIG. 11. The encapsulant material covers the upper first surface of leadframe 70, as well as side surfaces 27 and 33 of die pads 24 and tabs 33, respectively. The encapsulant material is then hardened into a single block which covers all of the incomplete packages of leadframe 70 of FIG. 11, as well as all or part of the width of members 72-75 of frame 71 of leadframe 70. Again, the lower second surface of leadframe 70, including lower surfaces 26 and 32 of die pads 24 and tabs 30, respectively, is not covered by encapsulant material, but instead remains exposed.


Step 5 of FIG. 10 plates the exposed lower surface of leadframe 70 of FIG. 11, including lower second surfaces 26 and 32 of die pads 24 and tabs 30, respectively, with a conventional plating metal. This step is accomplished as described above for Step 5 of FIG. 1.


Step 6 of FIG. 10 cuts leadframe 70 of FIG. 11 after the encapsulation step. Encapsulated leadframe 70 is cut in situ, similar to leadframe 20 of FIG. 7. The disposable portions of leadframe 70 are either severed from the packages, obliterated, or isolated by encapsulant material from the other components of package 50 of FIG. 8. The requirements of and methods used for Step 6 of FIG. 10 are basically the same as described above for Step 6 of FIG. 1, except that more cuts have to be made because leadframe 70 of FIG. 11 is bigger and has more components than leadframe 20 of FIG. 2.


Step 6 of FIG. 10 severs the connection between tabs 30 and strips 77 of leadframe 70. This cut forms the isolated, individual contacts 53 shown in package 50 of FIG. 8. Step 6 also severs the connection between anchors 29 and strips 76. This cut physically isolates die pads 24 within the encapsulant material. Step 6 also cuts through the single block of encapsulant material formed during Step 4 to form four packages 50 from leadframe 70 of FIG. 11.


Step 6 may be performed using a saw or other cutting apparatus. Where a saw is used for Step 6, the saw is moved along strips 76 and 77 (See FIG. 11). The saw blade used should be wider than strips 76 and 77 of FIG. 11, but narrower than the combined width of central strip 77 and the back-to-back tabs 30. As a result, moving the saw blade along strips 76 and 77 will obliterate strips 76 and 77, but will not obliterate tabs 30. As discussed above, the surface area of tabs 30 must be maintained because the severed tabs 30 become contacts 53 in package 50 of FIG. 8.


An exemplary method of accomplishing Step 6 of FIG. 10 includes a first step of inverting the encapsulated leadframe 70 and placing it on sticky paper. Using the exposed portions of leadframe 70 of FIG. 11 as a pattern, three parallel cuts are made, each of which goes through side members 73 and 75 and along and through the length of a strip 76 of leadframe 70. These three cuts form two of the four external side surfaces 57 of package 50 of FIG. 8; obliterate strips 76; and sever the connections between die pads 24 and strips 76.


Next, the encapsulated leadframe 70 is rotated 90 degrees, and three parallel cuts are made perpendicular to the original three cuts. Each of these latter three cuts goes through side members 72 and 74 and along and through the length of a strip 77. These latter three cuts also form the remaining two external side surfaces 57 of package 50 of FIG. 8. Since the width of the saw blade is selected to be wider than strips 76 and 77, but narrower than the combination of central strip 77 and tabs 30, the latter three cuts obliterate strips 77 but do not obliterate the tabs 30 which are attached to strips 77.


The six cuts described above complete the formation of the four packages 50 from leadframe 70 of FIG. 11 by separating the completed packages from one another and from the disposable portions of leadframe 70.


Artisans will appreciate that numerous variations of the packages, leadframes, and assembly methods described above are possible. As one example, changes can be made to leadframe 70 of FIG. 11 in order to change the size, shape and numbers of the packages 50 (FIG. 7) formed from leadframe 70. For example, instead of simultaneously forming four packages using a leadframe like leadframe 70 of FIG. 11, the size of the leadframe may be adjusted so that two, eight, sixteen, forty-eight or some other number of packages are formed simultaneously. As another example, one may multiply the number of packages formed simultaneously by forming several leadframes 70 adjacent to each other on a single strip of rolled stock, and processing all of the leadframes 70 on the strip simultaneously. As another example, the peripheral shapes of die pads 24 and tabs 30 may be changed from rectangular to some other shape.


In addition, the profiles of side surfaces 27 and 33 of die pads 24 and tabs 30, respectively, can be altered from the embodiments of FIGS. 3-6, provided that the function of enhancing the connection between encapsulant material 40 and the die pads 24 and contacts 53 of packages 50 of FIG. 8 is maintained.


Leadframe 70 of FIG. 11 may be modified in other ways as well. For example, the peripheral strips 76 and 77 that are adjacent to members 72-75, may be omitted. In such a case, the anchors 29 of FIG. 11 would be attached to members 72 and 74, and tabs 30 would be attached to members 73 and 75 of frame 71 of leadframe 70.


As a final example, instead of forming a single block of encapsulant material over all of the dies and incomplete packages of leadframe 70 of FIG. 11, a mold having individualized cavities for forming a block of encapsulant material above each the four interconnected frames and die pads 24 of leadframe 70 may be used. In such a case, less encapsulant material would be cut in Step 6 of FIG. 10.


The above description of embodiments of this invention is intended to be illustrative and not limiting. Other embodiments of this invention will be obvious to those skilled in the art in view of the above disclosure.

Claims
  • 1. A semiconductor device comprising: a metal die pad comprising a top planar surface, a bottom planar surface opposite the top planar surface, and at least four sides between the top and bottom planar surfaces;a semiconductor die coupled to the top planar surface of the metal die pad;a plurality of metal members, each comprising: a top surface;a bottom surface;a curved side surface; anda straight side surface opposite the curved side surface; andan encapsulating material covering at least: said semiconductor die;the top planar surface and the at least four sides of said metal die pad; andthe top surface and the curved side surface of each of said plurality of metal members.
  • 2. The semiconductor device of claim 1, wherein each of said plurality of metal members comprises an anchor.
  • 3. The semiconductor device of claim 1, wherein the curved side surface of each of said plurality of metal members is semicircular-shaped.
  • 4. The semiconductor device of claim 1, wherein the curved side surface of each of said plurality of metal members is convex.
  • 5. The semiconductor device of claim 1, wherein for each of said plurality of metal members, the curved side surface faces away from said metal die pad, and the straight side surface faces said metal die pad.
  • 6. The semiconductor device of claim 1, wherein said metal die pad is positioned between a first metal member of said plurality of metal members and a second metal member of said plurality of metal members, and the first and second metal members are symmetric about said metal die pad.
  • 7. The semiconductor device of claim 1, wherein each of said plurality of metal members is connected to said metal die pad by a respective connector.
  • 8. The semiconductor device of claim 1, wherein each of said plurality of metal members comprises a lip extending from the curved side surface.
  • 9. A semiconductor device comprising: a metal die pad comprising a top planar surface, a bottom planar surface opposite the top planar surface, and at least four sides between the top and bottom planar surfaces;a semiconductor die coupled to the top planar surface of the metal die pad;a plurality of metal members, each comprising: a top surface;a bottom surface;a curved side surface; anda straight side surface; andan encapsulating material covering at least: said semiconductor die;the top planar surface and the at least four sides of said metal die pad; andthe top surface and the curved side surface of each of said plurality of metal members,wherein the straight side surface of each of said plurality of metal members is exposed by the encapsulating material.
  • 10. The semiconductor device of claim 9, wherein each of said plurality of metal members comprises an anchor.
  • 11. The semiconductor device of claim 9, wherein the straight side surface of each of said plurality of metal members is severed at a side surface of said encapsulating material.
  • 12. The semiconductor device of claim 9, wherein the curved side surface of each of said plurality of metal members is semicircular-shaped.
  • 13. The semiconductor device of claim 9, wherein the curved side surface of each of said plurality of metal members is convex.
  • 14. The semiconductor device of claim 9, wherein each of said plurality of metal members is connected to said metal die pad by a respective connector.
  • 15. The semiconductor device of claim 9, wherein each of said plurality of metal members comprises a lip extending from the curved side surface.
  • 16. A semiconductor device comprising: a metal die pad comprising a top planar surface, a bottom planar surface opposite the top planar surface, and at least four sides between the top and bottom planar surfaces;a semiconductor die coupled to the top planar surface of the metal die pad;a plurality of metal members, each comprising: a top surface;a bottom surface;a first side surface that is curved;a second side surface that is straight;a third side surface extending between a first end of the second side surface and the first side surface; anda fourth side surface extending between a second end of the second side surface and the first side surface; andan encapsulating material covering at least: said semiconductor die;the top planar surface and the at least four sides of said metal die pad; andthe top surface, the first side surface, the third side surface, and the fourth side surface of each of said plurality of metal members,wherein the second side surface of each of said plurality of metal members is exposed by the encapsulating material.
  • 17. The semiconductor device of claim 16, wherein each of said plurality of metal members comprises an anchor.
  • 18. The semiconductor device of claim 16, wherein the second side surface of each of said plurality of metal members is severed at a side surface of said encapsulating material.
  • 19. The semiconductor device of claim 16, wherein the first side surface of each of said plurality of metal members is semicircular-shaped.
  • 20. The semiconductor device of claim 16, wherein the first side surface of each of said plurality of metal members is convex.
  • 21. The semiconductor device of claim 16, wherein each of said plurality of metal members is connected to said metal die pad by a respective connector.
  • 22. The semiconductor device of claim 16, wherein for each of said plurality of metal members, the third and fourth side surfaces are straight and parallel to each other.
  • 23. The semiconductor device of claim 16, wherein each of said plurality of metal members comprises a lip extending from the first side surface.
CROSS-REFERENCE TO RELATED APPLICATIONS/INCORPORATION BY REFERENCE

The present application is a continuation of U.S. application Ser. No. 13/662,702, titled INTEGRATED CIRCUIT PACKAGE AND METHOD OF MAKING THE SAME, filed Oct. 29, 2012, and issued as U.S. Pat. No. 8,853,836 on Oct. 7, 2014; which is a continuation of U.S. application Ser. No. 13/009,690, titled INTEGRATED CIRCUIT PACKAGE AND METHOD OF MAKING THE SAME, filed Jan. 19, 2011, and issued as U.S. Pat. No. 8,318,287 on Nov. 27, 2012; which is a continuation of U.S. application Ser. No. 12/474,126 entitled INTEGRATED CIRCUIT PACKAGE AND METHOD OF MAKING THE SAME filed May 28, 2009 now abandoned, which is a continuation of U.S. application Ser. No. 11/970,712 entitled INTEGRATED CIRCUIT PACKAGE AND METHOD OF MAKING THE SAME filed Jan. 8, 2008 and issued as U.S. Pat. No. 7,560,804 on Jul. 14, 2009, which is a continuation of U.S. application Ser. No. 11/503,752 entitled METHOD OF MAKING AN INTEGRATED CIRCUIT PACKAGE filed Aug. 14, 2006 and issued as U.S. Pat. No. 7,332,375 on Feb. 19, 2008, which is a continuation of U.S. application Ser. No. 11/299,859 entitled METHOD OF MAKING AN INTEGRATED CIRCUIT PACKAGE filed Dec. 12, 2005 and issued as U.S. Pat. No. 7,112,474 on Sep. 26, 2006, which is a continuation of U.S. application Ser. No. 10/847,742 entitled METHOD OF MAKING AN INTEGRATED CIRCUIT PACKAGE filed May 18, 2004 and issued as U.S. Pat. No. 7,005,326 on Feb. 28, 2006, which is a continuation of U.S. application Ser. No. 10/688,710 entitled METHOD OF MAKING AN INTEGRATED CIRCUIT PACKAGE filed Oct. 17, 2003 and issued as U.S. Pat. No. 6,893,900 on May 17, 2005, which is a continuation of U.S. application Ser. No. 10/007,337 entitled METHOD OF MAKING AN INTEGRATED CIRCUIT PACKAGE filed Oct. 22, 2001 and issued as U.S. Pat. No. 6,684,496 on Feb. 3, 2004, which is a continuation of U.S. application Ser. No. 09/393,016 entitled PLASTIC INTEGRATED CIRCUIT PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE filed Sep. 10, 1999 and now abandoned, which is a divisional of U.S. application Ser. No. 09/103,760 entitled PLASTIC INTEGRATED CIRCUIT CHIP PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE filed Jun. 24, 1998 and issued as U.S. Pat. No. 6,143,981 on Nov. 7, 2000. The present application is also related to U.S. application Ser. No. 11/021,340, titled PLASTIC INTEGRATED CIRCUIT PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE, filed Dec. 22, 2004, now U.S. Pat. No. 7,030,474; U.S. application Ser. No. 10/626,150, titled PLASTIC INTEGRATED CIRCUIT PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE, filed Jul. 24, 2003, now U.S. Pat. No. 7,071,541; U.S. application Ser. No. 10/171,702, titled PLASTIC INTEGRATED CIRCUIT PACKAGE AND LEADFRAME FOR MAKING THE PACKAGE, filed Jun. 14, 2002, now U.S. Pat. No. 6,630,728; U.S. application Ser. No. 10/119,826, titled PLASTIC INTEGRATED CIRCUIT PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE, filed Apr. 11, 2002, now abandoned U.S. patent application Ser. No. 09/615,107, titled PLASTIC INTEGRATED CIRCUIT PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE, filed Jul. 13, 2000, now U.S. Pat. No. 6,433,277; and U.S. application Ser. No. 09/103,760, titled PLASTIC INTEGRATED CIRCUIT CHIP PACKAGE AND METHOD AND LEADFRAME FOR MAKING THE PACKAGE, filed Jun. 24, 1998, and issued as U.S. Pat. No. 6,143,981 on Nov. 7, 2000.

US Referenced Citations (451)
Number Name Date Kind
2596992 Gookin May 1952 A
3435815 Forcier Apr 1969 A
3734660 Davies et al. May 1973 A
3838984 Crane et al. Oct 1974 A
4054238 Lloyd et al. Oct 1977 A
4189342 Kock Feb 1980 A
4221925 Finley et al. Sep 1980 A
4258381 Inaba Mar 1981 A
4289922 Delvin Sep 1981 A
4301464 Otsuki et al. Nov 1981 A
4332537 Slepcevic Jun 1982 A
4417266 Grabbe Nov 1983 A
4451224 Harding May 1984 A
4530152 Roche et al. Jul 1985 A
4541003 Otsuka et al. Sep 1985 A
4646710 Schmid et al. Mar 1987 A
4707724 Suzuki et al. Nov 1987 A
4727633 Herrick Mar 1988 A
4737839 Burt Apr 1988 A
4756080 Thorp, Jr. et al. Jul 1988 A
4812896 Rothgery et al. Mar 1989 A
4862245 Pashby et al. Aug 1989 A
4862246 Masuda et al. Aug 1989 A
4907067 Derryberry Mar 1990 A
4920074 Shimizu et al. Apr 1990 A
4935803 Kalfus et al. Jun 1990 A
4942454 Mori et al. Jul 1990 A
4987475 Schlesinger et al. Jan 1991 A
5018003 Yasunaga May 1991 A
5029386 Chao et al. Jul 1991 A
5041902 McShane Aug 1991 A
5057900 Yamazaki Oct 1991 A
5059379 Tsutsumi et al. Oct 1991 A
5065223 Matsuki et al. Nov 1991 A
5070039 Johnson et al. Dec 1991 A
5087961 Long et al. Feb 1992 A
5091341 Asada et al. Feb 1992 A
5096852 Hobson et al. Mar 1992 A
5118298 Murphy Jun 1992 A
5122860 Kikuchi et al. Jun 1992 A
5134773 LeMaire et al. Aug 1992 A
5136366 Worp et al. Aug 1992 A
5147905 Dubois et al. Sep 1992 A
5151039 Murphy Sep 1992 A
5157475 Yamaguchi Oct 1992 A
5157480 McShane et al. Oct 1992 A
5168368 Gow, 3rd et al. Dec 1992 A
5172213 Zimmerman Dec 1992 A
5172214 Casto Dec 1992 A
5175060 Enomoto et al. Dec 1992 A
5200362 Lin et al. Apr 1993 A
5200809 Kwon Apr 1993 A
5214845 King et al. Jun 1993 A
5216278 Lin et al. Jun 1993 A
5218231 Kudo Jun 1993 A
5221642 Burns Jun 1993 A
5250841 Sloan et al. Oct 1993 A
5252853 Michii Oct 1993 A
5258094 Furui et al. Nov 1993 A
5266834 Nishi et al. Nov 1993 A
5273938 Lin et al. Dec 1993 A
5277972 Sakumoto et al. Jan 1994 A
5278446 Nagaraj et al. Jan 1994 A
5279029 Burns Jan 1994 A
5281849 Singh Deo et al. Jan 1994 A
5285352 Pastore et al. Feb 1994 A
5294897 Notani et al. Mar 1994 A
5327008 Djennas et al. Jul 1994 A
5332864 Liang et al. Jul 1994 A
5335771 Murphy Aug 1994 A
5336931 Juskey et al. Aug 1994 A
5343076 Katayama et al. Aug 1994 A
5354422 Kato Oct 1994 A
5358905 Chiu Oct 1994 A
5365106 Watanabe Nov 1994 A
5367191 Ebihara Nov 1994 A
5381042 Lerner et al. Jan 1995 A
5391439 Tomita et al. Feb 1995 A
5406124 Morita et al. Apr 1995 A
5410180 Fujii et al. Apr 1995 A
5414299 Wang et al. May 1995 A
5417905 LeMaire et al. May 1995 A
5424576 Djennas et al. Jun 1995 A
5428248 Cha Jun 1995 A
5435057 Bindra et al. Jul 1995 A
5444301 Song et al. Aug 1995 A
5452511 Chang Sep 1995 A
5454905 Fogelson Oct 1995 A
5465105 Shatas et al. Nov 1995 A
5467032 Lee Nov 1995 A
5474958 Djennas et al. Dec 1995 A
5484274 Neu Jan 1996 A
5493151 Asada et al. Feb 1996 A
5508556 Lin Apr 1996 A
5517056 Bigler et al. May 1996 A
5521429 Aono et al. May 1996 A
5528076 Pavio Jun 1996 A
5534467 Rostoker Jul 1996 A
5539251 Iverson et al. Jul 1996 A
5543657 Diffenderfer et al. Aug 1996 A
5544412 Romero et al. Aug 1996 A
5545923 Barber Aug 1996 A
5548890 Tada et al. Aug 1996 A
5580466 Tada et al. Dec 1996 A
5581122 Chao et al. Dec 1996 A
5592019 Ueda et al. Jan 1997 A
5592025 Clark et al. Jan 1997 A
5594274 Suetaki Jan 1997 A
5595934 Kim Jan 1997 A
5604376 Hamburgen et al. Feb 1997 A
5608265 Kitano et al. Mar 1997 A
5608267 Mahulikar et al. Mar 1997 A
5625222 Yoneda et al. Apr 1997 A
5633528 Abbott et al. May 1997 A
5637922 Fillion et al. Jun 1997 A
5639990 Nishihara et al. Jun 1997 A
5640047 Nakashima Jun 1997 A
5641997 Ohta et al. Jun 1997 A
5643433 Fukase et al. Jul 1997 A
5644169 Chun Jul 1997 A
5646831 Manteghi Jul 1997 A
5650663 Parthasarathi Jul 1997 A
5661088 Tessier et al. Aug 1997 A
5661338 Yoo et al. Aug 1997 A
5663106 Karavakis et al. Sep 1997 A
5665996 Williams et al. Sep 1997 A
5673479 Hawthorne Oct 1997 A
5683806 Sakumoto et al. Nov 1997 A
5683943 Yamada Nov 1997 A
5689135 Ball Nov 1997 A
5696666 Miles et al. Dec 1997 A
5701034 Marrs Dec 1997 A
5703407 Hori Dec 1997 A
5710064 Song et al. Jan 1998 A
5723899 Shin Mar 1998 A
5724233 Honda et al. Mar 1998 A
5726493 Yamashita Mar 1998 A
5736432 Mackessy Apr 1998 A
5745984 Cole, Jr. et al. May 1998 A
5753532 Sim May 1998 A
5753977 Kusaka et al. May 1998 A
5766972 Takahashi et al. Jun 1998 A
5767566 Suda Jun 1998 A
5770888 Song et al. Jun 1998 A
5776798 Quan et al. Jul 1998 A
5783861 Son Jul 1998 A
5786639 Takahashi Jul 1998 A
5799204 Pesto, Jr. Aug 1998 A
5801440 Chu et al. Sep 1998 A
5812785 Lappen et al. Sep 1998 A
5814877 Diffenderfer et al. Sep 1998 A
5814881 Alagaratnam et al. Sep 1998 A
5814883 Sawai et al. Sep 1998 A
5814884 Davis et al. Sep 1998 A
5817540 Wark Oct 1998 A
5818105 Kouda Oct 1998 A
5821457 Mosley et al. Oct 1998 A
5821615 Lee Oct 1998 A
5825321 Park Oct 1998 A
5834830 Cho Nov 1998 A
5835988 Ishii Nov 1998 A
5844306 Fujita et al. Dec 1998 A
5854511 Shin et al. Dec 1998 A
5854512 Manteghi Dec 1998 A
5856911 Riley Jan 1999 A
5857861 Silliman Jan 1999 A
5859471 Kuraishi et al. Jan 1999 A
5859475 Freyman et al. Jan 1999 A
5866939 Shin et al. Feb 1999 A
5866942 Suzuki et al. Feb 1999 A
5871782 Choi Feb 1999 A
5874784 Aoki et al. Feb 1999 A
5877043 Alcoe et al. Mar 1999 A
5886397 Ewer Mar 1999 A
5886398 Low et al. Mar 1999 A
5894108 Mostafazadeh et al. Apr 1999 A
5897339 Song et al. Apr 1999 A
5900676 Kweon et al. May 1999 A
5903049 Mori May 1999 A
5903050 Thurairajaratnam et al. May 1999 A
5909053 Fukase et al. Jun 1999 A
5909063 Silliman et al. Jun 1999 A
5915998 Stidham et al. Jun 1999 A
5917242 Ball Jun 1999 A
5939779 Kim Aug 1999 A
5942794 Okumura et al. Aug 1999 A
5951305 Haba Sep 1999 A
5953057 Thompson et al. Sep 1999 A
5959356 Oh Sep 1999 A
5969426 Baba et al. Oct 1999 A
5973388 Chew et al. Oct 1999 A
5973935 Schoenfeld et al. Oct 1999 A
5976912 Fukutomi et al. Nov 1999 A
5977613 Takata et al. Nov 1999 A
5977615 Yamaguchi et al. Nov 1999 A
5977630 Woodworth et al. Nov 1999 A
5981314 Glenn et al. Nov 1999 A
5986333 Nakamura Nov 1999 A
5986885 Wyland Nov 1999 A
6001671 Fjelstad Dec 1999 A
6013947 Lim Jan 2000 A
6018189 Mizuno Jan 2000 A
6020625 Qin et al. Feb 2000 A
6025640 Yagi et al. Feb 2000 A
6031279 Lenz Feb 2000 A
RE36613 Ball Mar 2000 E
6034423 Mostafazadeh et al. Mar 2000 A
6040626 Cheah et al. Mar 2000 A
6043430 Chun Mar 2000 A
6060768 Hayashida et al. May 2000 A
6060769 Wark May 2000 A
6072228 Hinkle et al. Jun 2000 A
6075284 Choi et al. Jun 2000 A
6081029 Yamaguchi Jun 2000 A
RE36773 Nomi et al. Jul 2000 E
6084310 Mizuno et al. Jul 2000 A
6087715 Sawada et al. Jul 2000 A
6087722 Lee et al. Jul 2000 A
6100594 Fukui et al. Aug 2000 A
6107679 Noguchi Aug 2000 A
6113473 Costantini et al. Sep 2000 A
6113474 Shih Sep 2000 A
6114752 Huang et al. Sep 2000 A
6118174 Kim Sep 2000 A
6118184 Ishio et al. Sep 2000 A
RE36907 Templeton, Jr. et al. Oct 2000 E
6130115 Okumura et al. Oct 2000 A
6130473 Mostafazadeh et al. Oct 2000 A
6133623 Otsuki et al. Oct 2000 A
6140154 Hinkle et al. Oct 2000 A
6143981 Glenn Nov 2000 A
6150709 Shin et al. Nov 2000 A
6150997 Asprey Nov 2000 A
6154067 Cheung Nov 2000 A
6166430 Yamaguchi Dec 2000 A
6169329 Farnworth et al. Jan 2001 B1
6177718 Kozono Jan 2001 B1
6181002 Juso et al. Jan 2001 B1
6184465 Corisis Feb 2001 B1
6184573 Pu Feb 2001 B1
6184919 Asprey et al. Feb 2001 B1
6194777 Abbott et al. Feb 2001 B1
6197615 Song et al. Mar 2001 B1
6198171 Huang et al. Mar 2001 B1
6201186 Daniels et al. Mar 2001 B1
6201292 Yagi et al. Mar 2001 B1
6204554 Ewer et al. Mar 2001 B1
6208020 Minamio et al. Mar 2001 B1
6208021 Ohuchi et al. Mar 2001 B1
6208023 Nakayama et al. Mar 2001 B1
6211462 Carter, Jr. et al. Apr 2001 B1
6218731 Huang et al. Apr 2001 B1
6222258 Asano et al. Apr 2001 B1
6222259 Park et al. Apr 2001 B1
6225146 Yamaguchi et al. May 2001 B1
6229200 McClellan et al. May 2001 B1
6229205 Jeong et al. May 2001 B1
6231379 Shen May 2001 B1
6238952 Lin et al. May 2001 B1
6239367 Hsuan et al. May 2001 B1
6239384 Smith et al. May 2001 B1
6242281 McClellan et al. Jun 2001 B1
6256200 Lam et al. Jul 2001 B1
6258629 Niones et al. Jul 2001 B1
6261864 Jung et al. Jul 2001 B1
6281566 Magni Aug 2001 B1
6281568 Glenn Aug 2001 B1
6282094 Lo et al. Aug 2001 B1
6282095 Houghton et al. Aug 2001 B1
6285075 Combs et al. Sep 2001 B1
6291271 Lee et al. Sep 2001 B1
6291273 Miyaki et al. Sep 2001 B1
6294100 Fan et al. Sep 2001 B1
6294830 Fjelstad Sep 2001 B1
6295977 Ripper et al. Oct 2001 B1
6297548 Moden et al. Oct 2001 B1
6303984 Corisis Oct 2001 B1
6303997 Lee Oct 2001 B1
6306685 Liu et al. Oct 2001 B1
6307272 Takahashi et al. Oct 2001 B1
6309909 Ohgiyama Oct 2001 B1
6316822 Venkateshwaran et al. Nov 2001 B1
6316838 Ozawa et al. Nov 2001 B1
6323550 Martin et al. Nov 2001 B1
6326243 Suzuya et al. Dec 2001 B1
6326244 Brooks et al. Dec 2001 B1
6326678 Karnezos et al. Dec 2001 B1
6335564 Pour Jan 2002 B1
6337510 Chun-Jen et al. Jan 2002 B1
6339252 Niones et al. Jan 2002 B1
6339255 Shin Jan 2002 B1
6342730 Jung et al. Jan 2002 B1
6348726 Bayan et al. Feb 2002 B1
6355502 Kang et al. Mar 2002 B1
6359221 Yamada et al. Mar 2002 B1
6362525 Rahim Mar 2002 B1
6369447 Mori Apr 2002 B2
6369454 Chung Apr 2002 B1
6373127 Baudouin et al. Apr 2002 B1
6377464 Hashemi et al. Apr 2002 B1
6380048 Boon et al. Apr 2002 B1
6384472 Huang May 2002 B1
6388336 Venkateshwaran et al. May 2002 B1
6395578 Shin et al. May 2002 B1
6396611 Distefano et al. May 2002 B1
6399415 Bayan et al. Jun 2002 B1
6400004 Fan et al. Jun 2002 B1
6410979 Abe Jun 2002 B2
6411330 Purcell et al. Jun 2002 B1
6414385 Huang et al. Jul 2002 B1
6420779 Sharma et al. Jul 2002 B1
6421013 Chung Jul 2002 B1
6423643 Furuhata et al. Jul 2002 B1
6429508 Gang Aug 2002 B1
6433277 Glenn Aug 2002 B1
6437429 Su et al. Aug 2002 B1
6444499 Swiss et al. Sep 2002 B1
6448633 Yee et al. Sep 2002 B1
6452279 Shimoda Sep 2002 B2
6455356 Glenn et al. Sep 2002 B1
6459148 Chun-Jen et al. Oct 2002 B1
6464121 Reijinders Oct 2002 B2
6465883 Oloffson Oct 2002 B2
6472735 Isaak et al. Oct 2002 B2
6475646 Park et al. Nov 2002 B2
6476469 Hung et al. Nov 2002 B2
6476474 Hung Nov 2002 B1
6482680 Khor et al. Nov 2002 B1
6483178 Chuang Nov 2002 B1
6492718 Ohmori Dec 2002 B2
6495909 Jung et al. Dec 2002 B2
6498099 McClellan et al. Dec 2002 B1
6498392 Azuma Dec 2002 B2
6507096 Gang Jan 2003 B2
6507120 Lo et al. Jan 2003 B2
6518089 Coyle Feb 2003 B2
6525942 Huang et al. Feb 2003 B2
6528893 Jung et al. Mar 2003 B2
6530085 Perlman Mar 2003 B1
6534849 Gang Mar 2003 B1
6545332 Huang Apr 2003 B2
6545345 Glenn et al. Apr 2003 B1
6545707 Newcomb et al. Apr 2003 B1
6552421 Kishimoto et al. Apr 2003 B2
6559525 Huang May 2003 B2
6566168 Gang May 2003 B2
6580161 Kobayakawa Jun 2003 B2
6583503 Akram et al. Jun 2003 B2
6585905 Fan et al. Jul 2003 B1
6603196 Lee et al. Aug 2003 B2
6624005 DiCaprio et al. Sep 2003 B1
6627977 Foster Sep 2003 B1
6630728 Glenn Oct 2003 B2
6646339 Ku et al. Nov 2003 B1
6667546 Huang et al. Dec 2003 B2
6677663 Ku et al. Jan 2004 B1
6684496 Glenn Feb 2004 B2
6686649 Mathews et al. Feb 2004 B1
6687907 Bortolini Feb 2004 B1
6696752 Su et al. Feb 2004 B2
6696757 Yunus et al. Feb 2004 B2
6700189 Shibata Mar 2004 B2
6711639 Singer et al. Mar 2004 B1
6713375 Shenoy Mar 2004 B2
6757178 Okabe et al. Jun 2004 B2
6786764 Sivertsen Sep 2004 B2
6800936 Kosemura et al. Oct 2004 B2
6812552 Islam et al. Nov 2004 B2
6818973 Foster Nov 2004 B1
6858919 Seo et al. Feb 2005 B2
6867492 Auburger et al. Mar 2005 B2
6876068 Lee et al. Apr 2005 B1
6878571 Isaak et al. Apr 2005 B2
6893900 Glenn May 2005 B1
6897552 Nakao May 2005 B2
6907615 Alexander et al. Jun 2005 B1
6927478 Paek Aug 2005 B2
6940440 Iacob Sep 2005 B1
6967125 Fee et al. Nov 2005 B2
6977431 Oh et al. Dec 2005 B1
6995459 Lee et al. Feb 2006 B2
7002805 Lee et al. Feb 2006 B2
7005326 Glenn Feb 2006 B1
7005327 Kung et al. Feb 2006 B2
7015571 Chang et al. Mar 2006 B2
7030474 Glenn Apr 2006 B1
7045396 Crowley et al. May 2006 B2
7053469 Koh et al. May 2006 B2
7071541 Glenn Jul 2006 B1
7075816 Fee et al. Jul 2006 B2
7102209 Bayan et al. Sep 2006 B1
7109572 Fee et al. Sep 2006 B2
7112474 Glenn Sep 2006 B1
7185426 Hiner et al. Mar 2007 B1
7193298 Hong et al. Mar 2007 B2
7200856 Perlman Apr 2007 B2
7211471 Foster May 2007 B1
7242081 Lee Jul 2007 B1
7245007 Foster Jul 2007 B1
7253503 Fusaro et al. Aug 2007 B1
7324167 Miller Jan 2008 B2
7332375 Glenn Feb 2008 B1
7560804 Glenn Jul 2009 B1
8248538 Sivertsen Aug 2012 B2
8318287 Glenn Nov 2012 B1
20010008305 McClellan et al. Jul 2001 A1
20010014538 Kwan et al. Aug 2001 A1
20020011654 Kimura Jan 2002 A1
20020024122 Jung et al. Feb 2002 A1
20020027297 Ikenaga et al. Mar 2002 A1
20020038873 Hiyoshi Apr 2002 A1
20020065970 Tanaka et al. May 2002 A1
20020072147 Sayanagi et al. Jun 2002 A1
20020111009 Huang et al. Aug 2002 A1
20020140061 Lee Oct 2002 A1
20020140068 Lee et al. Oct 2002 A1
20020140081 Chou et al. Oct 2002 A1
20020144396 Glenn Oct 2002 A1
20020158318 Chen Oct 2002 A1
20020163015 Lee et al. Nov 2002 A1
20020167060 Buijsman et al. Nov 2002 A1
20030006055 Chien-Hung et al. Jan 2003 A1
20030030131 Lee et al. Feb 2003 A1
20030059644 Datta et al. Mar 2003 A1
20030064548 Isaak Apr 2003 A1
20030073265 Hu et al. Apr 2003 A1
20030102537 McLellan et al. Jun 2003 A1
20030164554 Fee et al. Sep 2003 A1
20030168719 Cheng et al. Sep 2003 A1
20030184680 Takahashi Oct 2003 A1
20030198032 Collander et al. Oct 2003 A1
20040027788 Chiu et al. Feb 2004 A1
20040056277 Karnezos Mar 2004 A1
20040061212 Karnezos Apr 2004 A1
20040061213 Karnezos Apr 2004 A1
20040063242 Karnezos Apr 2004 A1
20040063246 Karnezos Apr 2004 A1
20040065963 Karnezos Apr 2004 A1
20040080025 Kasahara et al. Apr 2004 A1
20040089926 Hsu et al. May 2004 A1
20040164387 Ikenaga et al. Aug 2004 A1
20040253803 Tomono et al. Dec 2004 A1
20050086552 Matsubara Apr 2005 A1
20050117059 Smits et al. Jun 2005 A1
20050138245 Chen Jun 2005 A1
20060087020 Hirano et al. Apr 2006 A1
20060157843 Hwang Jul 2006 A1
20060216868 Yang et al. Sep 2006 A1
20060231939 Kawabata et al. Oct 2006 A1
20070023202 Shibata Feb 2007 A1
20080230887 Sun et al. Sep 2008 A1
Foreign Referenced Citations (93)
Number Date Country
19734794 Aug 1997 DE
59050939 Mar 1984 EP
0393997 Oct 1990 EP
0459493 Dec 1991 EP
5421117 May 1993 EP
0720225 Mar 1996 EP
0720234 Mar 1996 EP
0794572 Oct 1997 EP
0844665 May 1998 EP
0936671 Aug 1999 EP
0989608 Mar 2000 EP
1032037 Aug 2000 EP
55163868 Dec 1980 JP
5745959 Mar 1982 JP
58160096 Aug 1983 JP
59208756 Nov 1984 JP
59227143 Dec 1984 JP
60010756 Jan 1985 JP
60116239 Aug 1985 JP
60195957 Oct 1985 JP
60231349 Nov 1985 JP
6139555 Feb 1986 JP
61248541 Nov 1986 JP
629639 Jan 1987 JP
6333854 Feb 1988 JP
63067762 Mar 1988 JP
63188964 Aug 1988 JP
63205935 Aug 1988 JP
63233555 Sep 1988 JP
63249345 Oct 1988 JP
63289951 Nov 1988 JP
63316470 Dec 1988 JP
64054749 Mar 1989 JP
1106456 Apr 1989 JP
1175250 Jul 1989 JP
1205544 Aug 1989 JP
1251747 Oct 1989 JP
2129948 May 1990 JP
369248 Jul 1991 JP
3177060 Aug 1991 JP
3289162 Dec 1991 JP
4098864 Mar 1992 JP
5129473 May 1993 JP
5166992 Jul 1993 JP
5283460 Oct 1993 JP
6052050 Feb 1994 JP
6061401 Mar 1994 JP
692076 Apr 1994 JP
6140563 May 1994 JP
6252333 Sep 1994 JP
6260532 Sep 1994 JP
7297344 Nov 1995 JP
7312405 Nov 1995 JP
8064634 Mar 1996 JP
8083877 Mar 1996 JP
8125066 May 1996 JP
964284 Jun 1996 JP
8222682 Aug 1996 JP
8306853 Nov 1996 JP
98205 Jan 1997 JP
98206 Jan 1997 JP
98207 Jan 1997 JP
992775 Apr 1997 JP
9092775 Apr 1997 JP
9260568 Oct 1997 JP
9293822 Nov 1997 JP
10022447 Jan 1998 JP
10163401 Jun 1998 JP
10189830 Jul 1998 JP
10199934 Jul 1998 JP
10256240 Sep 1998 JP
11307675 Nov 1999 JP
2000150765 May 2000 JP
556398 Oct 2000 JP
2001060648 Mar 2001 JP
2002519848 Jul 2002 JP
2002043497 Aug 2002 JP
2003243595 Aug 2003 JP
2004158753 Jun 2004 JP
941979 Jan 1994 KR
19940010938 May 1994 KR
19950018924 Jun 1995 KR
19950041844 Nov 1995 KR
19950044554 Nov 1995 KR
19950052621 Dec 1995 KR
1996074111 Dec 1996 KR
19970072358 Nov 1997 KR
100220154 Jun 1999 KR
20000072714 Dec 2000 KR
20000086238 Dec 2000 KR
20020049944 Jun 2002 KR
9956316 Nov 1999 WO
9967821 Dec 1999 WO
Non-Patent Literature Citations (80)
Entry
Carsem's Preliminary Claim Construction for: Plastic Integrated Circuit Package and Method and Leadframe for Making the Package D U.S. Patent No. 6,433,277 Issued Aug. 13, 2002.
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. Matsushita JP 01-106456 (Apr. 24, 1989).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. DaiNippon JP 63-188964 (Aug. 4, 1988).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. DaiNippon JP 63-188964 (Aug. 4, 1988).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. DaiNippon JP 63-33854 (Feb. 13, 1988).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. Fujitsu JP 3-69248 (Jul. 9, 1991).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. Fujistu JP-369248 (Jul. 9, 1991).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,433,277 v. National U.S. Patent No. 6,130,473 (Apr. 2, 1998).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,630,728 v. National U.S. Patent No. 6,130,473 (Apr. 2, 1998).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. U.S. Patent No. 6,130,473 (Apr. 2, 1998).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. DaiNippon JP 2-129948 (May 18, 1990).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. DaiNippon JP 63-33854 (Feb. 13, 1988).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. Matsushita JP 01-106456 (Apr. 24, 1989).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. Fujitsu JP 3-69248 (Jul. 9, 1991).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. Matsushita JP 01-106456 (Apr. 24, 1989).
Respondent Carsem, Inc.'s Supplemental Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. DaiNippon JP 63-33854 (Feb. 13, 1988).
Vishay, “4 Milliohms in the So-8: Vishay Siliconix Sets New Record for Power MOSFET On-Resistance,” Press Release from webpage, 3 pages, www.vishay.com/news/releases, Nov. 7, 2002.
Patrick Mannion, “MOSFETs Break out of the Shackles of Wire Bonding,” Informational Packet, 5 pages, Electronic Design, Mar. 22, 1999 vol. 47, No. 6, www.elecdesign.com/1999/mar2299/ti/0322ti1.shtml.
United States International Trade Commission document related to Investigation No. 337-TA-501 and entitled “Notice Regarding Issuance of Initial Determination.” Oct. 30, 2009 (1 page).
United States International Trade Commission document related to Investigation No. 337-TA-501 and entitled “Supplemental Initial Determination on Violation of Section 337.” Oct. 30, 2009 (3 pages).
United States International Trade Commission document related to Investigation No. 337-TA-501 and entitled “Supplemental Initial Determination on Violation of Section 337.” Oct. 30, 2009 (public version—26 pages).
United States International Trade Commission document related to Investigation No. 337-TA-501 and entitled “Notice of Commission Determination to Reverse a Supplemental Initial Determination and Remand Investigation to the Administrative Law Judge; Extension of Target Date for Completion of the Investigation.” Feb. 18, 2010. This document includes an attached Order dated Jan. 18, 2010. (5 pages).
United States International Trade Commission document related to Investigation No. 337-TA-501 and entitled “Notice Regarding Issuance of Initial Determination.” Mar. 22, 2010 (1 page).
United States International Trade Commission document related to Investigation No. 337-TA-501 and entitled “Supplemental Initial Determination on Violation of Section 337.” Mar. 22, 2010 (2 pages).
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Devices and Products Containing the Same Inv. No. 337-TA-501 Comments of the Office of Unfair Import Investigations on the Remand Initial Determination (33 pages), Dec. 15, 2005.
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Initial Determination on Violation of Section 337 and Recommended Determination on Remedy and Bond (406 pages), Dec. 10, 2004.
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Stipulation Concerning Carsem MLP Schematics (182 pages), Aug. 2004.
United States International Trade Commisiion in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Reply of Respondents Carsem, Inc., Carsem (M) SON and Carsem Semiconductor SON BHD to Initial Submissions of Amkor Technology and Office of Unfair Import Investigations . . . (128 pages), Mar. 4, 2005.
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Initial Determination on Violation of Section 337 and Recommended Determination on Remedy Bond (127 pages), Nov. 22, 2005.
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Complaint Amkor Technology Inc's Comments on Judge Bullock's Initial Determination on Remand (220 pages), Dec. 16, 2005.
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Respondent Carsem, Inc., Carsem (M) SDN BHO and Carsem semiconductor SDN . . . (175 pages), Dec. 16, 2005.
United States International Trade Commission in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Respondent Carsem, Inc. Carsern (M) SDN BHD and and Carsem Semiconductor SDN Comments regarding the initial Determination of Remand (143 pages), Dec. 16, 2005.
United States International Trade Commission in the Matter of: Certain Encapsulated integrated Circuit Devices and Products Containg the Same Inv. No. 337-TA-501 Supplemental Initial Determination on Violation of Section 337 (28 pages) Oct. 30, 2009.
United States International Trade Commision in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Supplemental Initial Determination on Violation of Section 337 (44 pages) Mar. 22, 2010.
United States International Trade Commision in the Matter of: Certain Encapsulated Integrated Circuit Devices and Products Containing the Same Inv. No. 337-TA-501 Complainant Amkor Technology's Inc.'s Comments on Judge Bullock's Initial Determination on Remand, Dec. 16, 2005.
United States International Trade Commission. In the Matter of Certain Encapsulated Integrated Circuit Devices and Products Containing Same. Investigation No. 337-TA-501. Expert Report of Gerald K. Fehr, Ph.D. Regarding Invalidity of Amkor U.S. Patent Nos. 6,433,277; 6,630,728; and 6,455,356. 155 pages, May 4, 2004.
United States International Trade Commission. In the Matter of Certain Encapsulated Integrated Circuit Devices and Products Containing Same. Investigation No. 337-TA-501. Supplemental Expert Report of Gerald K. Fehr, Ph.D. Concerning Obviousness of U.S. Patent Nos. 6,433,277; 6,630,728; and 6,455,356. 23 pages, Jun. 8, 2004.
Respondent Carsem, Inc.'s Supplemental Invalidity Charts, U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. DaiNippon JP 2-129948 (May 18, 1990).
National Semiconductor Corporation, “Leadless Leadframe Package,” Informational Pamphlet from webpage, 21 pages, Oct. 2002, www.national.com.
United States International Trade Commission. “Commission Opinion,” 20 pages. In the matter of Certain Encapsulated Integrated Circuit Devices and Products Containing Same, Aug. 26, 2010.
United States Court of Appeals for the Federal Circuit. Amkor Technology, Inc. v. International Trade Commission and Carsem (M) SDN BHD, Carsem Semiconductor SDN BHD (also known as Recams Sdn Bhd), and Carsem, Inc. “Non-Confidential Reply Brief of Appellant,” 47 pages. May 23, 2011.
United States Court of Appeals for the Federal Circuit. Amkor Technology, Inc. v. International Trade Commission and Carsem (M) SDN BHD, Carsem Semiconductor SDN BHD (also known as Recams Sdn Bhd), and Carsem, Inc. “Nonconfidential Brief for Internors' Carsem (M) SDN BHD, Carsem Semiconductor SDN BHD (NKJA Recams SDN BHD), and Carsem, Inc.” 80 pages. Apr. 18, 2011.
United States Court of Appeals for the Federal Circuit. Amkor Technology, Inc. v. International Trade Commission and Carsem (M) SDN BHD, Carsem Semiconductor SDN BHD (also known as Recams Sdn Bhd), and Carsem, Inc. “Nonconfidential Brief of Appellee.” 74 pages, Apr. 18, 2011.
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. Matsushita JP-01-106456 (Apr. 24, 1989).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. Oki JP 06-092076 (May 4, 1994).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. JP 63-289951 (Nov. 28, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. DaiNippon JP 63-33854 (Feb. 13, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. DaiNippon JP 63-188964 (Aug. 4, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. U.S. Patent No. 5,122,860 (Jun. 16, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. U.S. Patent No. 5,134,773 (Aug. 4, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. ESEC U.S. Patent No. 5,417,905 (Aug. 4, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. Matsushita U.S. Patent No. 5,942,794 (Fig. 11) (Oct. 21, 1997).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. National U.S. Patent No. 6,130,473 (Apr. 2, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,433,277 (Jun. 24, 1998) v. ASAT U.S. Patent No. 6,229,200 and 6,242,281 (Jun. 10, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. Matsushita JP 01-106456 (Apr. 24, 1989).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. DaiNippon JP 2-129948 (May 18, 1990).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. Fujitsu JP 3-69248 (Jul. 9, 1991).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. Oki JP 06-092076 (May 4, 1994).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. JP 63-289951 (Nov. 28, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. DaiNippon JP 6333854 (Feb. 13, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. DaiNippon JP 63-188964 (Aug. 4, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. U.S. Patent No. 5,122,860 (Jun. 16, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. U.S. Patent No. 5,134,773 (Aug. 4, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. ESEC U.S. Patent No. 5,417,905 (Aug. 4, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. Matsushita U.S. Patent No. 5,942,794 (Prior Art Fig. 11) (Jul. 21, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. National U.S. Patent No. 6,130,473 (Apr. 2, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,630,728 (Jun. 14, 1998) v. ASAT U.S. Patent No. 6,229,200 and 6,242,281 (Jun. 10, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. Matsushita JP-01-106456 (Apr. 24, 1989).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. Fujitsu JP 3-69248 (Jul. 9, 1991).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. Oki JP 06-092076 (May 4, 1994).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. JP 63-289951 (Nov. 28, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. DaiNippon JP 63-33854 (Feb. 13, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. DaiNippon JP 63-188964 (Aug. 4, 1988).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. U.S. Patent No. 5,122,860 (Jun. 16, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. U.S. Patent No. 5,134,773 (Aug. 4, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. ESEC U.S. Patent No. 5,417,905 (Aug. 4, 1992).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. Matsushita U.S. Patent No. 5,942,794 (Prior Art Fig. 11 )(Jul. 21, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. U.S. Patent No. 6,130,473 (Apr. 2, 1998).
Respondent Carsem, Inc.'s Preliminary Invalidity Charts U.S. Patent No. 6,455,356 (Oct. 21, 1998) v. ASAT U.S. Patent No. 6,229,200 and 6,242,281 (Jun. 10, 1998).
First Supplemental Appendix A Respondent Carsem, Inc.'s Preliminary Invalidity Claim Charts.
Divisions (1)
Number Date Country
Parent 09103760 Jun 1998 US
Child 09393016 US
Continuations (10)
Number Date Country
Parent 13662702 Oct 2012 US
Child 14142457 US
Parent 13009690 Jan 2011 US
Child 13662702 US
Parent 12474126 May 2009 US
Child 13009690 US
Parent 11970712 Jan 2008 US
Child 12474126 US
Parent 11503752 Aug 2006 US
Child 11970712 US
Parent 11299859 Dec 2005 US
Child 11503752 US
Parent 10847742 May 2004 US
Child 11299859 US
Parent 10688710 Oct 2003 US
Child 10847742 US
Parent 10007337 Oct 2001 US
Child 10688710 US
Parent 09393016 Sep 1999 US
Child 10007337 US