The present invention relates to microelectromechanical (MEMS) inertial sensors, and more particularly to the multiple degree-of-freedom (DOF) sensor comprising a plurality of single DOF angular velocity sensors and a plurality of single-DOF linear acceleration sensors accommodated on the same substrate.
A substrate with multiple DOF inertial sensors allows several simultaneous measurements of up to three independent angular velocities and up to three linear accelerations around and along three mutually orthogonal axes. The multi-DOF sensing assembly may comprise any combination of angular velocity sensor responsive to the angular velocity around axis parallel to the plane, an angular velocity sensor responsive to the angular velocity around axis normal to the plane, a linear acceleration sensor responsive to the axis parallel to the plane, and a linear acceleration sensor responsive to the axis normal to the plane.
The in-plane angular velocity sensor of a conventional multi-DOF sensing assembly is designed such that two proof masses are oscillated along the out-of-plane axis in anti-phase fashion.
There are several types of conventional angular velocity sensors. They are described in more detail below. For example, in Cardarelli (U.S. Pat. No. 6,725,719), all inertial instruments are placed on the common substrate which acts as an common gimbal. The gimbal is then driven into oscillations to provide common drive motion for all of the instruments, i.e. inertial sensors. Accordingly, there is a common drive system which does not allow for truly independent means for driving all of the instruments.
Further, in Cardarelli (U.S. Pat. No. 6,859,751), inertial sensors, or instruments, are mounted on the common substrate and are driven independently. The structures are, according to the teaching, formed from the inner and outer member. Inner member is flexibly coupled to the outer member and they are driven together relative to the case, or substrate.
Geen (U.S. Pat. No. 6,848,304), describes a 6 axis inertial sensor. However, it is claimed that three out of six axis are fabricated on the first substrate and the other three axis on the second substrate. Accordingly, this type of sensor is not implemented on a single substrate.
Chen (U.S. Pat. No. 7,168,317), describes a three axis angular velocity sensor. The proof masses for all three axis are always driven parallel to the plane and the sensing of the Coriolis force is different for each axis. This type of sensor also does not allow for a truly independent means for driving all of the assembly instruments.
The present invention relates to microelectromechanical (MEMS) inertial sensors, and more particularly to the multiple degree-of-freedom (DOF) sensor comprising plurality of single DOF angular velocity sensors and single-DOF linear acceleration sensors accommodated on the same substrate. Accordingly, what is needed is an angular velocity sensor that addresses the above-identified issues. The present invention addresses such a need.
A system and method describes an inertial sensor assembly, the assembly comprises a substrate parallel to the plane, at least one in-plane angular velocity sensor comprising a pair proof masses that are oscillated in anti-phase fashion along an axis normal to the plane. The first in-plane angular velocity sensor further includes a sensing frame responsive to the angular velocity of the substrate around the first axis parallel to the plane and perpendicular to the axis normal to the plane. The assembly also includes at least one out-of-plane angular velocity sensor comprising a pair of proof masses that are oscillated in anti-phase fashion in the plane parallel to the plane. The out-of-plane angular velocity sensor further comprises a sensing frame responsive to the angular velocity of the substrate around the axis normal to the plane.
The present invention relates to microelectromechanical (MEMS) inertial sensors, and more particularly to the multiple degree-of-freedom (DOF) sensor comprising plurality of single DOF angular velocity sensors and single-DOF linear acceleration sensors accommodated on the same substrate. The following description is presented to enable one of ordinary skill in the art to make and use the invention and is provided in the context of a patent application and its requirements. Various modifications to the preferred embodiment and the generic principles and features described herein will be readily apparent to those skilled in the art. Thus, the present invention is not intended to be limited to the embodiment shown but is to be accorded the widest scope consistent with the principles and features described herein.
Integrating multiple microelectromechanical (MEMS) inertial sensors on a common substrate, for instance, a wafer, yields multiple advantages over having multiple sensors built on several separate substrates subsequently arranged into the multi-DOF sensing assembly. First of all, as the individual sensors are lithographically defined, their input axes are almost perfectly aligned and there is no mounting mismatch between sensors' input axes. The alignment-induced cross-axis sensitivity between different DOFs is basically eliminated for all practical purposes. In addition, individual sensors can be designed so they are packed tightly without waste of available space on the substrate. The substrate may be a single wafer shared by MEMS structures, application specific integrated circuitry (ASIC) and digital interface circuitry. The substrate may comprise two separate wafers bonded together, the first one comprising MEMS structures and the second one comprising integrated circuitry (IC). A high level of integration of the electronic circuitry further contributes to the small size of the overall sensing assembly.
The environmental effects, such as temperature, acts similarly on all integrated MEMS sensors as well as on IC. Therefore, multi-axis sensing assembly can be temperature calibrated in one step. Furthermore, an application specific integrated circuitry (ASIC), the integral part of the sensor assembly, requires less space as many building blocks can be shared between the individual sensors. The size, and the price of the sensing assembly may be substantially reduced. Besides including the ASIC, the sensing assembly may comprise additional intelligence for performing higher level signal processing and application-specific tasks, e.g. motion processor. All individual sensors may share such an on-board processor which substantially minimizes the need for external processing. The low-cost motion-processing intelligence is needed to enable new markets, such as handset or gaming. All in all, the integration of multiple inertial sensors on the same substrate yields an extremely low-cost, easy-to-use, easy-to-implement product that is highly competitive on the market.
Individual sensors sharing a common substrate parallel to the plane may be integrated into a multiaxis sensing assembly in many different ways. Single-substrate multi-axis sensing assembly may comprise plurality of angular in-plane velocity sensors, plurality of out-of-plane angular velocity sensors, plurality of in-plane linear acceleration sensors and plurality of out-of-plane linear acceleration sensors. Depending on application some of the sensors may be omitted. In this disclosure only some typical configurations are described. However, this does not limit the disclosure to described embodiments. To describe the features of the present invention in more detail, refer to the following description in conjunction with the accompanying Figures.
US patent application US 2008/0115579, from May 22, 2008, “X-Y dual-mass tuning fork gyroscope with vertically integrated electronics and wafer-scale hermetic packaging,” discloses a single axis Y gyroscope 20 is shown in
The angular velocity sensors shown in
A triple axis accelerometer is shown in
In one embodiment, two in-plane angular velocity sensors shown in
In another embodiment of the present invention, three DOF angular velocity sensor shown in
In another embodiment and referring to
Further, in another embodiment shown in
A typical ASIC 700 for three DOF angular velocity sensor, may be given as shown in
Another portion of ASIC may comprise a digital motion processor 726. The function of the digital motion processor comprises processing and fusion of single-axis measurements and providing a suitable output that can be directly used at higher, i.e. application, level. Although the digital motion processor 726 adds more space to the sensing assembly, it takes over the processing load from the main application processor. As such, the inertial sensing assembly with digital motion processor enables opening of new markets such as handset or gaming markets. Without having a plurality of the sensors 704A-704C on the common substrate, there would be no point of processing measured data on that very substrate.
Although the present invention has been described in accordance with the embodiments shown, one of ordinary skill in the art will readily recognize that there could be variations to the embodiments and those variations would be within the spirit and scope of the present invention. Accordingly, many modifications may be made by one of ordinary skill in the art without departing from the spirit and scope of the appended claims.
The present application is related to X-Y AXIS DUAL-MASS TUNING FORK GYROSCOPE WITH VERTICALLY INTEGRATED ELECTRONICS AND WAFER-SCALE HERMETIC PACKAGING, 20080115579/0115579, dated May 22, 2008; and X-Y AXIS DUAL-MASS TUNING FORK GYROSCOPE WITH VERTICALLY INTEGRATED ELECTRONICS AND WAFER-SCALE HERMETIC PACKAGING, filed on May 17, 2005, U.S. Pat. No. 6,892,575 and LOW INERTIA FRAME FOR DETECTING CORIOLIS ACCELERATION, IVS 123, application Ser. No. 12/210,045, filed on Sep. 12, 2008.