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using planar vibrating masses driven in a translation vibration along an axis
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G01C19/5719
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/5719
using planar vibrating masses driven in a translation vibration along an axis
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Patents Grants
last 30 patents
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Patent Grant
Three-axis rotation rate sensor including a substrate and a double...
Patent number
11,846,509
Issue date
Dec 19, 2023
Robert Bosch GmbH
Jochen Reinmuth
G01 - MEASURING TESTING
Information
Patent Grant
Vibration rectification error correction circuit, physical quantity...
Patent number
11,808,572
Issue date
Nov 7, 2023
Seiko Epson Corporation
Masayoshi Todorokihara
G01 - MEASURING TESTING
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,774,244
Issue date
Oct 3, 2023
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
Patent number
11,719,540
Issue date
Aug 8, 2023
STMicroelectronics, Inc.
Yamu Hu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Inertial sensor, electronic apparatus, and vehicle
Patent number
11,714,101
Issue date
Aug 1, 2023
Seiko Epson Corporation
Teruo Takizawa
G01 - MEASURING TESTING
Information
Patent Grant
Fused quartz dual shell resonator and method of fabrication
Patent number
11,703,330
Issue date
Jul 18, 2023
The Regents of the University of California
Andrei M. Shkel
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Multi-mass MEMS motion sensor
Patent number
11,674,803
Issue date
Jun 13, 2023
Motion Engine, Inc.
Robert Mark Boysel
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,650,078
Issue date
May 16, 2023
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and system for sensor configuration
Patent number
11,566,899
Issue date
Jan 31, 2023
Karthik Katingari
G01 - MEASURING TESTING
Information
Patent Grant
Comb-driven substrate decoupled annulus pitch/roll BAW gyroscope wi...
Patent number
11,566,898
Issue date
Jan 31, 2023
Georgia Tech Research Corporation
Haoran Wen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial navigation system
Patent number
11,561,098
Issue date
Jan 24, 2023
ATLANTIC INERTIAL SYSTEMS, LIMITED
Geoffrey Thomas Henderson
G01 - MEASURING TESTING
Information
Patent Grant
Angular rate sensor
Patent number
11,512,958
Issue date
Nov 29, 2022
Sumitomo Precision Products Co., Ltd.
Ryohei Uchino
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration gyroscope
Patent number
11,397,084
Issue date
Jul 26, 2022
Denso Corporation
Motohiro Fujiyoshi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Systems and methods for bias suppression in a non-degenerate MEMS s...
Patent number
11,390,517
Issue date
Jul 19, 2022
Honeywell International Inc.
Daniel Endean
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Demodulation phase calibration using external input
Patent number
11,365,983
Issue date
Jun 21, 2022
Invensense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor device and method of manufacturing thereof
Patent number
11,358,858
Issue date
Jun 14, 2022
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Amir Rahafrooz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,340,070
Issue date
May 24, 2022
Seiko Epson Corporation
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
Patent number
11,255,670
Issue date
Feb 22, 2022
STMicroelectronics, Inc.
Yamu Hu
G01 - MEASURING TESTING
Information
Patent Grant
Rotation-rate sensor, method for manufacturing a rotation-rate sensor
Patent number
11,248,909
Issue date
Feb 15, 2022
Robert Bosch GmbH
Robert Ramsperger
G01 - MEASURING TESTING
Information
Patent Grant
Noise performance for vibrating structure gyroscopes
Patent number
11,221,218
Issue date
Jan 11, 2022
Atlantic Inertial Systems Limited
Christopher Paul Fell
G01 - MEASURING TESTING
Information
Patent Grant
Resonator configured to be integrated into an inertial angular sensor
Patent number
11,215,456
Issue date
Jan 4, 2022
SAFRAN
Philippe Onfroy
G01 - MEASURING TESTING
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,193,771
Issue date
Dec 7, 2021
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor, electronic device, and vehicle
Patent number
11,181,547
Issue date
Nov 23, 2021
Seiko Epson Corporation
Makoto Furuhata
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope start-up process and circuit
Patent number
11,162,790
Issue date
Nov 2, 2021
STMicroelectronics, Inc.
Deyou Fang
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring a behavior of a MEMS device
Patent number
11,137,253
Issue date
Oct 5, 2021
TDK Corporation
Andreas Barbul
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, composite sensor, inertial measurement un...
Patent number
11,105,629
Issue date
Aug 31, 2021
Seiko Epson Corporation
Tatsuro Torimoto
G01 - MEASURING TESTING
Information
Patent Grant
Vibration device and method for controlling the same
Patent number
11,092,440
Issue date
Aug 17, 2021
Kabushikikaisha Toshiba
Ryunosuke Gando
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Microelectromechanical gyroscope with rejection of disturbances and...
Patent number
11,085,769
Issue date
Aug 10, 2021
STMicroelectronics S.r.l.
Carlo Valzasina
G01 - MEASURING TESTING
Information
Patent Grant
Proof mass offset compensation
Patent number
11,009,350
Issue date
May 18, 2021
Invensense, Inc.
Matthew Thompson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrating micro-mechanical sensor of angular velocity
Patent number
10,996,056
Issue date
May 4, 2021
Murata Manufacturing Co., Ltd.
Yoshitaka Kato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MULTI-MASS MEMS MOTION SENSOR
Publication number
20240230332
Publication date
Jul 11, 2024
Motion Engine, Inc.
Robert Mark Boysel
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FUSED QUARTZ DUAL SHELL RESONATOR AND METHOD OF FABRICATION
Publication number
20240125599
Publication date
Apr 18, 2024
The Regents of the University of California
Andrei M. SHKEL
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEMODULATION PHASE CALIBRATION USING EXTERNAL INPUT
Publication number
20220326045
Publication date
Oct 13, 2022
InvenSense, Inc.
Doruk Senkal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236058
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS ROTATION RATE SENSOR INCLUDING A SUBSTRATE AND A DOUBLE...
Publication number
20220228864
Publication date
Jul 21, 2022
ROBERT BOSCH GmbH
Jochen Reinmuth
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
Publication number
20220128360
Publication date
Apr 28, 2022
STMicroelectronics, Inc.
Yamu HU
G01 - MEASURING TESTING
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20220057210
Publication date
Feb 24, 2022
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL MEASUREMENT UNITS AS VIBROACOUSTIC DATA RECEIVERS
Publication number
20220011113
Publication date
Jan 13, 2022
Carnegie Mellon University
Christopher Harrison
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT BOARD SYSTEM, PHOTOGRAPHING DEVICE, GIMBAL ASSEMBLY, AND MO...
Publication number
20210251078
Publication date
Aug 12, 2021
SZ DJI Technology Co., Ltd.
Jun DU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
NOISE PERFORMANCE FOR VIBRATING STRUCTURE GYROSCOPES
Publication number
20210048296
Publication date
Feb 18, 2021
ATLANTIC INERTIAL SYSTEMS LIMITED
Christopher Paul Fell
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20210033398
Publication date
Feb 4, 2021
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT
Publication number
20200408523
Publication date
Dec 31, 2020
STMicroelectronics, Inc.
Deyou FANG
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
Publication number
20200408524
Publication date
Dec 31, 2020
STMicroelectronics, Inc.
Yamu HU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ROTATION-RATE SENSOR, METHOD FOR MANUFACTURING A ROTATION-RATE SENSOR
Publication number
20200386550
Publication date
Dec 10, 2020
ROBERT BOSCH GmbH
Robert Ramsperger
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR BIAS SUPPRESSION IN A NON-DEGENERATE MEMS S...
Publication number
20200346920
Publication date
Nov 5, 2020
HONEYWELL INTERNATIONAL INC.
Daniel Endean
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD AND SYSTEM FOR SENSOR CONFIGURATION
Publication number
20200348134
Publication date
Nov 5, 2020
InvenSense, Inc.
Karthik Katingari
G01 - MEASURING TESTING
Information
Patent Application
FUSED QUARTZ DUAL SHELL RESONATOR AND METHOD OF FABRICATION
Publication number
20200309527
Publication date
Oct 1, 2020
The Regents of the University of California
Andrei M. SHKEL
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Angular Rate Sensor
Publication number
20200300628
Publication date
Sep 24, 2020
Sumitomo Precision Products Co., Ltd.
Ryohei UCHINO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIAL SENSOR, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20200278377
Publication date
Sep 3, 2020
SEIKO EPSON CORPORATION
Teruo TAKIZAWA
G01 - MEASURING TESTING
Information
Patent Application
RESONATOR CONFIGURED TO BE INTEGRATED INTO AN INERTIAL ANGULAR SENSOR
Publication number
20200149890
Publication date
May 14, 2020
SAFRAN
Philippe Serge Claude ONFROY
G01 - MEASURING TESTING
Information
Patent Application
Method for Measuring a Behavior of a MEMS Device
Publication number
20200124419
Publication date
Apr 23, 2020
TDK Electronics AG
Andreas Barbul
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIAL NAVIGATION SYSTEM
Publication number
20200064136
Publication date
Feb 27, 2020
Atlantic Inertial Systems Limited
Geoffrey Thomas HENDERSON
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTROMECHANICAL GYROSCOPE WITH REJECTION OF DISTURBANCES AND...
Publication number
20200025567
Publication date
Jan 23, 2020
STMicroelectronics S.r.l.
Carlo Valzasina
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION RECTIFICATION ERROR CORRECTION CIRCUIT, PHYSICAL QUANTITY...
Publication number
20190331491
Publication date
Oct 31, 2019
SEIKO EPSON CORPORATION
Masayoshi TODOROKIHARA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM OF DUAL-MODE ACTUATION AND SENSING FOR REAL-TIME...
Publication number
20190271718
Publication date
Sep 5, 2019
Georgia Tech Research Corporation
Arashk Norouz Pour Shirazi
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION DEVICE AND METHOD FOR CONTROLLING THE SAME
Publication number
20190204081
Publication date
Jul 4, 2019
Kabushiki Kaisha Toshiba
Ryunosuke Gando
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FM INERTIAL SENSOR AND METHOD FOR OPERATING THE FM INERTIAL SENSOR
Publication number
20190064205
Publication date
Feb 28, 2019
STMicroelectronics S.r.l.
Alessandro TOCCHIO
G01 - MEASURING TESTING
Information
Patent Application
COMB-DRIVEN SUBSTRATE DECOUPLED ANNULUS PITCH/ROLL BAW GYROSCOPE WI...
Publication number
20180321037
Publication date
Nov 8, 2018
Georgia Tech Research Corporation
Haoran Wen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INFERRING AMBIENT ATMOSPHERIC TEMPERATURE
Publication number
20180273374
Publication date
Sep 27, 2018
InvenSense, Inc.
William Kerry Keal
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
HEMISPHERICAL RESONANCE MICROMECHANICAL GYROSCOPE AND PROCESSING ME...
Publication number
20180164098
Publication date
Jun 14, 2018
SUZHOU WENZHIXIN MICRO SYSTEM TECHNOLOGY CO., LTD
Shuwen Guo
G01 - MEASURING TESTING