The present invention relates to the technical field of semiconductor and, in particular, to an integrated structure of crystal resonator and control circuit and an integration method therefor.
A crystal resonator is a device operating on the basis of inverse piezoelectricity of a piezoelectric crystal. As key components in crystal oscillators and filters, crystal resonators have been widely used to create high-frequency electrical signals for performing precise timing, frequency referencing, filtering and other frequency control functions that are necessary for measurement and signal processing systems.
The continuous development of semiconductor technology and increasing popularity of integrated circuits has brought about a trend toward miniaturization of various semiconductor components. However, it is difficult to integrate existing crystal resonators with other semiconductor components, and also the sizes of the existing crystal resonators are relatively large.
For example, commonly used existing crystal resonators include surface-mount ones, in which a base is bonded with a metal solder (or an adhesive) to a cover to form a hermetic chamber in which a piezoelectric vibrator is housed. in addition, electrodes for the piezoelectric vibrator are electrically connected to an associated circuit via solder pads or wires. Further shrinkage of such crystal resonators is difficult, and their electrical connection to the associated circuit by soldering or gluing additionally hinders their miniaturization.
It is an object of the present invention to provide a method for integrating a crystal resonator with a control circuit, which overcomes the above described problems with conventional crystal resonators, i.e., a bulky size and difficult integration.
To solve the problem, the present invention provides a method for integrating a crystal resonator with a control circuit, comprising:
providing a device wafer in which the control circuit is formed, and etching the device wafer to form a lower cavity for the crystal resonator;
forming a piezoelectric vibrator comprising a top electrode, a piezoelectric crystal and a bottom electrode on a front side of the device wafer above the lower cavity;
forming a connecting structure on the device wafer, wherein the connecting structure electrically connects the top electrode and the bottom electrode of the piezoelectric vibrator to the control circuit; and
forming a cap layer on the front side of the device wafer, wherein the cap layer covers the piezoelectric vibrator, and the cap layer together with the piezoelectric vibrator and the device wafer delimits an upper cavity for the crystal resonator.
It is a further object of the present invention to provide an integrated structure of a crystal resonator and a control circuit, comprising:
a device wafer in which the control circuit and a lower cavity are formed, wherein the lower cavity is exposed at a front side of the device wafer;
a piezoelectric vibrator comprising a top electrode, a piezoelectric crystal and a bottom electrode, wherein the piezoelectric vibrator is formed on the front side of the device wafer above the lower cavity;
a connecting structure configured to electrically connect the top and bottom electrodes of the piezoelectric vibrator to the control circuit; and
a cap layer which is formed on the front side of the device wafer and covers the piezoelectric vibrator, wherein the cap layer together with the piezoelectric vibrator and the device wafer delimits an upper cavity for the crystal resonator.
In the method of the present invention, the crystal resonator and the control circuit are integrated on the same device wafer, which is accomplished by first forming the lower cavity in the device wafer containing the control circuit using a planar fabrication process, forming the piezoelectric vibrator on the device wafer and then enclosing the piezoelectric vibrator within the upper cavity through forming the cap layer using another planar fabrication process. As such, compared with traditional crystal resonators (e.g., surface-mount ones), in addition to being able to integrate with other semiconductor components with a higher degree of integration, the crystal resonator produced using the method of the present invention is more compact or miniaturized in size and hence less costly and less power-consuming.
In these figures,
100 denotes a device wafer; AA, a device area; 100A, an initial crystal; 100B, a dielectric layer; 110, a control circuit; 111, a first circuit; 111T, a first transistor; 111C, a first interconnecting structure; 112, a second circuit; 112T, a first transistor; 112C, a first interconnecting structure; 120, a lower cavity; 200, a piezoelectric vibrator; 210, a bottom electrode; 220, a piezoelectric crystal; 230, a top electrode; 300, an encapsulation layer; 300a, a through hole; 310, a conductive plug; 320, an interconnecting wire; 400, an upper cavity; 410, a sacrificial layer; 420, a cap layer; 420a, an opening; 421, a cap material layer; and 430, a closure plug.
The core idea of the present invention is to provide an integrated structure of a crystal resonator and a control circuit and an integration method therefor, in which planar fabrication processes are utilized to form the crystal resonator and integrate it onto a device wafer where the control circuit is formed. This, on the one hand, results in a size reduction of the crystal resonator and, on the other hand, allows an increased degree of integration of the crystal resonator with other semiconductor components.
Specific embodiments of the structure and method proposed in the present invention will be described below in greater detail with reference to the accompanying drawings. Features and advantages of the invention will be more apparent from the following description. Note that the accompanying drawings are provided in a very simplified form not necessarily drawn to exact scale, and their only intention is to facilitate convenience and clarity in explaining the disclosed embodiments.
In step S100, with reference to
The control circuit 110 may include a first circuit 111 and a second circuit 112, Which may be electrically connected to a top electrode and a bottom electrode of the subsequently formed piezoelectric vibrator, respectively.
With continued reference to
Similarly, the second circuit 112 may include a second transistor 112T and a second interconnecting structure 112C. The second transistor 112T may be buried within the device wafer 100, and the second interconnecting structure 112C may be connected to the second transistor 112T and extend to the front side of the device wafer 100. The second interconnecting structure 112C may include conductive plugs electrically connected respectively to a gate, source and drain of the second transistor 112T.
The formation of the control circuit 110 may include:
providing a substrate wafer 100A, and forming a first transistor . T and a second transistor 112T on the substrate wafer 100A and
then, forming a dielectric layer 100B on the substrate wafer 100A to cover the first transistor 1117 and the second transistor 112T, and forming a first interconnecting structure 111C and a second interconnecting structure 112C in the dielectric layer 100B, resulting in the formation of the device wafer 100.
In other words, the device wafer 100 includes the substrate wafer 100A and the dielectric layer 100B formed thereon, and the first transistor 111T and the second transistor 112T are both formed on the substrate wafer 100A. Additionally, the dielectric layer 100B covers the first transistor 111T and the second transistor 112T, and each of the first interconnecting structure 111C and the second interconnecting structure 112C are formed in the dielectric layer 100B and extends to the surface of the dielectric layer 100B.
The substrate wafer 100A may be either a silicon wafer or a silicon-on-insulator (SOI) wafer. In the latter case, the substrate wafer may, from the back side 100D to the front side 100U, include a base layer, a buried oxide layer and a top silicon layer.
In this embodiment, a plurality of crystal resonators may be formed on the device wafer 100. Accordingly, there may be a plurality of device areas AA defined on the device wafer 100, with the control circuits 110 being formed in the device areas AA.
In step S200, with reference to
In this embodiment, the lower cavity 120 is formed in the dielectric layer 100B of the device wafer in the device area AA. Accordingly, the formation of the lower cavity 120 may include etching the dielectric layer 100B until the substrate wafer 100A is reached, so as to form a lower cavity 120 in the dielectric layer 110B. The lower cavity 120 may have a depth as practically required, and the present invention is not limited in this regard. For example, the lower cavity 120 may extend only within the dielectric layer 100B or even into the substrate wafer 100A.
It is to be noted that the relative positions of the lower cavity 120 and the first and second circuits shown in the appended drawings are merely for illustration, and in practice, the arrangement of the first and second circuits may depend on the actual circuit layout requirements. The present invention is not limited in this regard.
As noted above, the substrate wafer 100A may be implemented as a SOI wafer. In this case, the formation of the lower cavity may include successively etching through the dielectric layer and the top silicon layer so that the lower cavity extends from the dielectric layer to the buried oxide layer.
In step S300, with reference to
The formation of the piezoelectric vibrator 200 may include the following steps.
Step 1: With reference to
The bottom electrode 210 may be formed of silver by successively performing a thin-film deposition process, a photolithography process and an etching process. Alternatively, the formation of the bottom electrode 210 may be accomplished by a vapor deposition process.
Step 2: With reference to
Step 3: With continued reference to
It is to be noted that, in this embodiment, the bottom electrode 210, the piezoelectric crystal 220 and the top electrode 230 are successively formed over the device wafer 100 using semiconductor processes. However, in other embodiments, it is also possible to form the top and bottom electrodes on opposing sides of the piezoelectric crystal and then bond the three as a whole onto the device wafer.
In step S400, with reference to
An electrical signal can be applied to the bottom and top electrodes 210, 230 of the piezoelectric vibrator 200 by the control circuit 110 to create an electric field therebetween, which causes the piezoelectric crystal 220 of the piezoelectric vibrator 200 to change its shape. When the electric field in the piezoelectric vibrator 200 is inverted, the piezoelectric crystal 220 will change its shape in the opposite direction. Therefore, when the control circuit 110 applies an AC signal to the piezoelectric vibrator 200, the piezoelectric crystal 220 will change shape alternately in opposite directions and thus alternately contract and expand due to the change in direction of the electric field. As a result, the piezoelectric crystal 220 will mechanically vibrate.
The connecting structure may include a first connecting member and a second connecting member. The first connecting member connects the first interconnecting structure and the bottom electrode 210 of the piezoelectric vibrator. The second connecting member connects the second interconnecting structure and the top electrode 230 of the piezoelectric vibrator.
In this embodiment, the bottom electrode 210 is formed on the surface of the device wafer 100 and extends beyond the piezoelectric crystal 220 thereunder over the first interconnecting structure 111C. Therefore, it can be considered that the extension of the bottom electrode 210 beyond the piezoelectric crystal constitutes the first connecting member.
Of course, in other embodiments, it is also possible that the first connecting member is formed on the device wafer 100 so as to be electrically connected to the first interconnecting structure prior to the formation of the bottom electrode and brought into electrical connection with the bottom electrode 210 subsequent to the formation of the bottom electrode. In this case, the first connecting member may, for example, include a rewiring layer, which is connected to the first interconnecting structure and is brought into electrical connection with the bottom electrode 210 after the bottom electrode is formed on the device wafer.
Subsequent to the formation of the top electrode 230, the second connecting member may be formed to enable electrical connection between the top electrode 230 and the second circuit 112. The formation of the second connecting member may include the steps detailed below.
At first, with reference to
Next, with continued reference to
Subsequently, with reference to
Afterward, with continued reference to
Of course, alternatively, the top electrode may be formed on the piezoelectric crystal so as to have an extension extending beyond the piezoelectric crystal. In this case, the conductive plug of the second connecting member may be formed under the extension of the top electrode so that it is connected to the second interconnecting structure at the bottom and connected to, and thus provides support for, the extension of the top electrode at the top.
Alternatively, the conductive plug of the second connecting member may be formed prior to the formation of the top electrode. Specifically, the formation of the top electrode and the conductive plug of the second connecting member may include the steps detailed below.
At first, a encapsulation layer is formed on the device wafer 100. Specifically, the encapsulation layer may cover the device wafer 100, with the piezoelectric crystal 220 being exposed from the encapsulation layer.
Next, a through hole is formed in the encapsulation layer and a conductive material is filled in the through hole, resulting in the formation of the conductive plug, which is electrically connected to the second interconnecting structure 112C.
Afterward, the top electrode is formed on the piezoelectric crystal 220 so that it covers at least part of the piezoelectric crystal 220 and extends beyond the piezoelectric crystal 220 over the conductive plug. As a result, the top electrode is electrically connected to the second interconnecting structure 112C via the conductive plug 310.
In step S500, with reference to
Specifically, the formation of the cap layer 420 that delimits the upper cavity 400 may include, for example, the steps detailed below.
In a first step, with reference to
In a second step, with continued reference to
The space occupied by the sacrificial layer 410 corresponds to the internal space of the subsequently formed upper cavity. Therefore, a depth of the upper cavity to be formed may be adjusted by changing a height of the sacrificial layer. It will be recognized that the depth of the upper cavity may be determined as practically required, and the present invention is not limited in this regard.
In a third step, with reference to
In a fourth step, with reference to
At this point, the piezoelectric vibrator 200 is confined in the upper cavity 400 so that the piezoelectric vibrator 200 can vibrate within the lower and upper cavities 120, 400.
Optionally, with reference to
An integrated structure of a crystal resonator and a control circuit corresponding to the above method will be described below with reference to
a device wafer 100 in which the control circuit and a lower cavity 120 are formed, the lower cavity 120 being exposed at a front side of the device wafer;
a piezoelectric vibrator 200 formed on the front side of the device wafer 100 above the lower cavity 120;
a connecting structure configured to electrically connect a top electrode 210 and a bottom electrode 230 of the piezoelectric vibrator 200 to the control circuit, wherein the control circuit is able to apply to an electrical signal to the piezoelectric vibrator 200 to cause the piezoelectric vibrator 200 to vibrate; and
a cap layer 420 formed on the front side of the device wafer 100 so as to cover the piezoelectric vibrator 200 and delimit an upper cavity 400 together with the piezoelectric vibrator 200 and the device wafer 100. That is, the cap layer 420 encloses the piezoelectric vibrator 200 within the upper cavity 400.
Therefore, the integration of the crystal resonator with the control circuit is accomplished by forming the lower cavity 120 in the device wafer 100 and forming the cap layer 420 using a semiconductor process, which encloses the piezoelectric vibrator 200 within the upper cavity 400 so that it is ensured that the piezoelectric vibrator 200 can oscillate in the upper and lower cavities 400, 120. This is favorable to on-chip modulation for correcting raw deviations of the crystal resonator such as temperature and frequency drifts. Further, the crystal resonator fabricated based on the semiconductor processes is more compact in size and is thus less power-consuming.
With continued reference to
The connecting structure may include a first connecting member connecting the first interconnecting structure 111C and the bottom electrode 210 of the piezoelectric vibrator, and a second connecting member connecting the second interconnecting structure 112C and the top electrode 230 of the piezoelectric vibrator.
In this embodiment, the bottom electrode 210 is formed on the surface of the device wafer 100 so as to be located at the periphery of the lower cavity 120 and have an extension extending laterally beyond the piezoelectric crystal 220 over the first interconnecting structure 111C in the first circuit 111. As such, the bottom electrode 210 is electrically connected to the first circuit 111. Therefore, it can be considered that the extension of the bottom electrode 210 beyond the piezoelectric crystal constitutes the first connecting member.
The top electrode 230 may be formed on the piezoelectric crystal 220 and electrically connected to the second interconnecting structure 112C of the second circuit 112 via the second connecting member. Specifically, the second connecting member for connecting the top electrode 230 and the second circuit 112 may include a conductive plug 310 and an interconnecting wire 320. The conductive plug 310 may be formed on the surface of the device wafer 100 so as to be electrically connected at the bottom to the second interconnecting structure 112C. The interconnecting wire 320 may cover the top electrode 230 at one end and cover the top of the conductive plug 310 at the other end. In this way, the interconnecting wire 320 can be connected to the conductive plug 310. It will be appreciated that, in this case, the conductive plug 310 may also function to support the interconnecting wire 320,
In other embodiments, the second connecting member may only include the conductive plug. In this case, the conductive plug may be electrically connected to the top electrode 230 at one end and to the second interconnecting structure 112C at the other end. For example, the top electrode may extend from the piezoelectric crystal to the conductive plug.
With continued reference to
With continued reference to
In summary, in the method for integrating the crystal resonator with the control circuit according to the present invention, the integration of the crystal resonator with the control circuit is accomplished by first forming the lower cavity in the device wafer containing the control circuit, forming the piezoelectric vibrator on the device wafer and then enclosing the piezoelectric vibrator within the upper cavity through forming the cap layer using a planar fabrication process. Apparently, compared with traditional crystal resonators (e.g., surface-mount ones), in addition to being able to integrate with other semiconductor components more easily with a higher degree of integration, the crystal resonator of the present invention that is fabricated using planar fabrication processes is more compact in size and hence less power-consuming.
The description presented above is merely that of a few preferred embodiments of the present invention without limiting the scope thereof in any sense. Any and all changes and modifications made by those of ordinary skill in the art based on the above teachings fall within the scope as defined in the appended claims.
Number | Date | Country | Kind |
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201811647884.4 | Dec 2018 | CN | national |
Filing Document | Filing Date | Country | Kind |
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PCT/CN2019/115658 | 11/5/2019 | WO | 00 |