Number | Name | Date | Kind |
---|---|---|---|
3764995 | Helf, Jr. et al. | Oct 1973 | |
4044244 | Foreman et al. | Aug 1977 | |
4055801 | Pike et al. | Oct 1977 | |
4168527 | Winkler | Sep 1979 |
Entry |
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"J325 Digital I. C. Test System" F580 Teradyne, Inc. Boston, Mass. |
"J133 D Analogical Circuit Test Instrument" _F 171D Teradyne, Inc. Boston, Mass. 1976. |
Ring "A Distributed Intelligence Automatic Test System for Patriot" IEEE Transactions on Aerospace & Electronic Systems, vol. AES-13, No. 3, May 1977 pp. 264-272. |
Mscope 820 Microprocessor System Console Operator's Handbook Intel. Corp. 1978. |
Mscope 820 Microprocessor System Console 8085 Probe Operator's Handbook 1978, Intel. Corp. |