Routing signals to or from the device under test [DUT]

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G01R31/31926

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31926Routing signals to or from the device under test [DUT]

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Patents Grantslast 30 patents

Information Patent Grant
Method for semiconductor device interface circuitry functionality a...
- Patent number 12,360,162
- Issue date Jul 15, 2025
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Transmitter for ultra-high speed and storage device including the same
- Patent number 12,332,307
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Ikjin Jo
- G01 - MEASURING TESTING
Information Patent Grant
Software and firmware support for device interface board configured...
- Patent number 12,320,851
- Issue date Jun 3, 2025
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High throughput sort
- Patent number 12,320,845
- Issue date Jun 3, 2025
- Infineon Technologies AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Grant
Processor debugging over an interconnect fabric
- Patent number 12,320,843
- Issue date Jun 3, 2025
- International Business Machines Corporation
- Michael James Becht
- G01 - MEASURING TESTING
Information Patent Grant
Self-testing circuits for devices having multiple input channels wi...
- Patent number 12,306,242
- Issue date May 20, 2025
- STMicroelectronics S.r.l.
- Nicola Errico
- G01 - MEASURING TESTING
Information Patent Grant
Memory repair system and method
- Patent number 12,300,337
- Issue date May 13, 2025
- QUALCOMM Incorporated
- Hong Dai
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods of testing devices using CXL for increased para...
- Patent number 12,216,163
- Issue date Feb 4, 2025
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Grant
Telephone connector to audio connector mapping and leveling device
- Patent number 12,140,633
- Issue date Nov 12, 2024
- Tony Dux
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Wafer-level multi-device tester and system including the same preli...
- Patent number 12,105,146
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for semiconductor device interface circuitry functionality a...
- Patent number 12,025,663
- Issue date Jul 2, 2024
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Hold time improved low area flip-flop architecture
- Patent number 11,946,973
- Issue date Apr 2, 2024
- Texas Instruments Incorporated
- Arnab Khawas
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for die-to-die physical interfaces
- Patent number 11,940,491
- Issue date Mar 26, 2024
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Grant
System and method for schedule-based I/O multiplexing for integrate...
- Patent number 11,927,630
- Issue date Mar 12, 2024
- MARVELL ASIA PTE. LTD.
- Sounil Biswas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device interface board supporting devices with multiple different s...
- Patent number 11,860,229
- Issue date Jan 2, 2024
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Stimulated circuits and fault testing methods
- Patent number 11,852,685
- Issue date Dec 26, 2023
- Hamilton Sundstrand Corporation
- Christopher Blazer
- G01 - MEASURING TESTING
Information Patent Grant
Battery SOH determination circuit
- Patent number 11,835,584
- Issue date Dec 5, 2023
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement method
- Patent number 11,789,079
- Issue date Oct 17, 2023
- Rohde & Schwarz GmbH & Co. KG
- Michael Feilen
- G01 - MEASURING TESTING
Information Patent Grant
Detection system and detection method
- Patent number 11,782,093
- Issue date Oct 10, 2023
- AmTRAN TECHNOLOGY Co., Ltd
- Yen-Ting Tung
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method of testing single DUT through multiple cores in p...
- Patent number 11,686,768
- Issue date Jun 27, 2023
- Test Research, Inc.
- Ching-Chih Lin
- G01 - MEASURING TESTING
Information Patent Grant
Control data registers for scan testing
- Patent number 11,680,984
- Issue date Jun 20, 2023
- Texas Instruments Incorporated
- Wilson Pradeep
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for die-to-die physical interfaces
- Patent number 11,662,380
- Issue date May 30, 2023
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus and storage medium for testing chip, and chip the...
- Patent number 11,639,964
- Issue date May 2, 2023
- Beijing Baidu Netcom Science and Technology Co., Ltd
- Ziyu Guo
- G01 - MEASURING TESTING
Information Patent Grant
Signal path monitor
- Patent number 11,561,257
- Issue date Jan 24, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Grant
Extended JTAG controller and method for functional reset using the...
- Patent number 11,493,553
- Issue date Nov 8, 2022
- COMMSOLID GMBH
- Uwe Porst
- G01 - MEASURING TESTING
Information Patent Grant
Error detection on integrated circuit input/output pins
- Patent number 11,467,211
- Issue date Oct 11, 2022
- SIGNIFY HOLDING B.V.
- Yuhong Fang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,415,628
- Issue date Aug 16, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment using an on-chip-system test controller
- Patent number 11,385,285
- Issue date Jul 12, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device, method and system of error detection and correction in mult...
- Patent number 11,385,288
- Issue date Jul 12, 2022
- STMicroelectronics S.A.
- Ricardo Gomez Gomez
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Chip Self-Repair for Interconnect Short Faults
- Publication number 20250216456
- Publication date Jul 3, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal R. Patel
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR DEBUGGING OVER AN INTERCONNECT FABRIC
- Publication number 20250076375
- Publication date Mar 6, 2025
- International Business Machines Corporation
- Michael James BECHT
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF
- Publication number 20250044353
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
- Publication number 20240361386
- Publication date Oct 31, 2024
- CELERINT, LLC.
- Howard H. ROBERTS
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT SORT
- Publication number 20240302431
- Publication date Sep 12, 2024
- INFINEON TECHNOLOGIES AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Application
HOLD TIME IMPROVED LOW AREA FLIP-FLOP ARCHITECTURE
- Publication number 20240210472
- Publication date Jun 27, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Arnab Khawas
- G01 - MEASURING TESTING
Information Patent Application
TRANSMITTER FOR ULTRA-HIGH SPEED AND STORAGE DEVICE INCLUDING THE SAME
- Publication number 20240168091
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Ikjin JO
- G01 - MEASURING TESTING
Information Patent Application
SELF-TESTING CIRCUITS FOR DEVICES HAVING MULTIPLE INPUT CHANNELS WI...
- Publication number 20240159819
- Publication date May 16, 2024
- STMicroelectronics S.r.l.
- Nicola Errico
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240142522
- Publication date May 2, 2024
- Innolux Corporation
- Chih-Yung Hsieh
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARA...
- Publication number 20240094293
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
FAILURE INSERTION UNIT
- Publication number 20240094294
- Publication date Mar 21, 2024
- dSPACE GmbH
- Bjoern MUELLER
- G01 - MEASURING TESTING
Information Patent Application
MEMORY REPAIR SYSTEM AND METHOD
- Publication number 20240087662
- Publication date Mar 14, 2024
- QUALCOMM Incorporated
- HONG DAI
- G11 - INFORMATION STORAGE
Information Patent Application
WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
- Publication number 20240085478
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
Built-in Self-Test for Die-to-Die Physical Interfaces
- Publication number 20230384377
- Publication date Nov 30, 2023
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Application
STIMULATED CIRCUITS AND FAULT TESTING METHODS
- Publication number 20230221369
- Publication date Jul 13, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Christopher Blazer
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE
- Publication number 20220334180
- Publication date Oct 20, 2022
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20220308111
- Publication date Sep 29, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Michael Feilen
- G01 - MEASURING TESTING
Information Patent Application
TELEPHONE CONNECTOR TO AUDIO CONNECTOR MAPPING AND LEVELING DEVICE
- Publication number 20220252666
- Publication date Aug 11, 2022
- Cyara Solutions Pty Ltd
- Tony Dux
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SIGNAL PATH MONITOR
- Publication number 20220196739
- Publication date Jun 23, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Application
PIN DRIVER AND TEST EQUIPMENT CALIBRATION
- Publication number 20220099738
- Publication date Mar 31, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Application
BATTERY SOH DETERMINATION CIRCUIT
- Publication number 20220057452
- Publication date Feb 24, 2022
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEXER-ENABLED CABLES AND TEST FIXTURES
- Publication number 20220034967
- Publication date Feb 3, 2022
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND DETECTION METHOD
- Publication number 20210373076
- Publication date Dec 2, 2021
- AmTRAN TECHNOLOGY CO., LTD
- Yen-Ting TUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Switch-Mode Based Interposer Enabling Self-Testing Of An MCM Withou...
- Publication number 20210333326
- Publication date Oct 28, 2021
- Peter Shun Shen Wang
- G01 - MEASURING TESTING
Information Patent Application
EXTENDED JTAG CONTROLLER AND METHOD FOR FUNCTIONAL RESET USING THE...
- Publication number 20210325461
- Publication date Oct 21, 2021
- COMMSOLID GMBH
- Uwe PORST
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INTERFACE BOARD SUPPORTING DEVICES WITH MULITPLE DIFFERENT S...
- Publication number 20210278462
- Publication date Sep 9, 2021
- Advantest Corporation
- Mei-Mei SU
- G01 - MEASURING TESTING
Information Patent Application
ERROR DETECTION ON INTEGRATED CIRCUIT INPUT/OUTPUT PINS
- Publication number 20210223313
- Publication date Jul 22, 2021
- Signigy Holding B.V.
- Yuhong FANG
- G01 - MEASURING TESTING
Information Patent Application
Vector Eyes
- Publication number 20210223314
- Publication date Jul 22, 2021
- Richard C. Carmichael
- G11 - INFORMATION STORAGE
Information Patent Application
Method, Apparatus and Storage Medium for Testing Chip, and Chip The...
- Publication number 20210215756
- Publication date Jul 15, 2021
- Beijing Baidu Netcom Science and Technology CO., Ltd.
- Ziyu Guo
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND PIN DRIVER CONTROLLER
- Publication number 20210184579
- Publication date Jun 17, 2021
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING

Routing signals to or from the device under test [DUT]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for semiconductor device interface circuitry functionality a...

Transmitter for ultra-high speed and storage device including the same

Software and firmware support for device interface board configured...

High throughput sort

Processor debugging over an interconnect fabric

Self-testing circuits for devices having multiple input channels wi...

Memory repair system and method

Systems and methods of testing devices using CXL for increased para...

Telephone connector to audio connector mapping and leveling device

Wafer-level multi-device tester and system including the same preli...

Method for semiconductor device interface circuitry functionality a...

Hold time improved low area flip-flop architecture

Built-in self-test for die-to-die physical interfaces

System and method for schedule-based I/O multiplexing for integrate...

Automated test equipment for testing one or more devices under test...

Device interface board supporting devices with multiple different s...

Stimulated circuits and fault testing methods

Battery SOH determination circuit

Measurement system and measurement method

Detection system and detection method

System and method of testing single DUT through multiple cores in p...

Control data registers for scan testing

Built-in self-test for die-to-die physical interfaces

Method, apparatus and storage medium for testing chip, and chip the...

Signal path monitor

Extended JTAG controller and method for functional reset using the...

Error detection on integrated circuit input/output pins

Automated test equipment for testing one or more devices under test...

Automated test equipment using an on-chip-system test controller

Device, method and system of error detection and correction in mult...

Patents Applicationslast 30 patents

Chip Self-Repair for Interconnect Short Faults

PROCESSOR DEBUGGING OVER AN INTERCONNECT FABRIC

SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF

METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...

HIGH THROUGHPUT SORT

HOLD TIME IMPROVED LOW AREA FLIP-FLOP ARCHITECTURE

TRANSMITTER FOR ULTRA-HIGH SPEED AND STORAGE DEVICE INCLUDING THE SAME

SELF-TESTING CIRCUITS FOR DEVICES HAVING MULTIPLE INPUT CHANNELS WI...

ELECTRONIC DEVICE

SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARA...

FAILURE INSERTION UNIT

MEMORY REPAIR SYSTEM AND METHOD

WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME

Built-in Self-Test for Die-to-Die Physical Interfaces

STIMULATED CIRCUITS AND FAULT TESTING METHODS

REAL-EQUIVALENT-TIME FLASH ARRAY DIGITIZER OSCILLOSCOPE ARCHITECTURE

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

TELEPHONE CONNECTOR TO AUDIO CONNECTOR MAPPING AND LEVELING DEVICE

SIGNAL PATH MONITOR

PIN DRIVER AND TEST EQUIPMENT CALIBRATION

BATTERY SOH DETERMINATION CIRCUIT

MULTIPLEXER-ENABLED CABLES AND TEST FIXTURES

DETECTION SYSTEM AND DETECTION METHOD

Switch-Mode Based Interposer Enabling Self-Testing Of An MCM Withou...

EXTENDED JTAG CONTROLLER AND METHOD FOR FUNCTIONAL RESET USING THE...

DEVICE INTERFACE BOARD SUPPORTING DEVICES WITH MULITPLE DIFFERENT S...

ERROR DETECTION ON INTEGRATED CIRCUIT INPUT/OUTPUT PINS

Vector Eyes

Method, Apparatus and Storage Medium for Testing Chip, and Chip The...

COMPOUND PIN DRIVER CONTROLLER