Claims
- 1. An integrated circuit comprising
an FPGA core; an interface adapted to receive commands to configure said FPGA core; and a microcontroller coupled to said FPGA core, said microcontroller configuring said FPGA core responsive to said commands received from said interface.
- 2. The integrated circuit of claim 1 further comprising a processor unit for directing operations of said integrated circuit.
- 3. The integrated circuit of claim 2 wherein said interface is adapted to receive said configure commands from said processor.
- 4. The integrated circuit of claim 1 wherein said interface is further adapted to test said FPGA core, said microcontroller testing said FPGA core responsive to said test commands received from said interface.
- 5. The integrated circuit of claim 2 wherein said interface is further adapted to test said FPGA core, said microcontroller testing said FPGA core responsive to said test commands received by said interface and wherein said interface is adapted to receive said test commands from said processor.
- 6. The integrated circuit of claim 4 wherein said microcontroller tests said FPGA core in a predetermined sequence of tests for specific features of said FPGA core.
- 7. The integrated circuit of claim 6 wherein said FPGA core has a hierarchical architecture and said predetermined sequence of tests corresponds to said hierarchical architecture.
- 8. The integrated circuit of claim 4 further comprising a plurality of scan chains coupled to said FPGA core for introducing test vectors into said FPGA core and for receiving test results from said FPGA core responsive to said microcontroller.
- 9. The integrated circuit of claim 8 wherein said scan chains are arranged with respect to at least one predetermined portion of said FPGA core so that a first scan chain introduces a test vector into said portion and a second scan chain receives tests results of said test vector from said portion.
- 10. The integrated circuit of claim 8 wherein said microcontroller in predetermined sequence introduces said test vectors into said FPGA core and receives test results from said FPGA core through said scan chains.
- 11. The integrated circuit of claim 10 wherein said FPGA core has a hierarchical architecture and said predetermined sequence corresponds to said hierarchical architecture.
CROSS-REFERENCES TO RELATED APPLICATIONS
[0001] This patent application claims priority from U.S. Provisional Patent Application No. 60/329,818, filed Oct. 16, 2001, and which is incorporated herein for all purposes.
Provisional Applications (1)
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Number |
Date |
Country |
|
60329818 |
Oct 2001 |
US |