Debugging aspects

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CPC
G01R31/31705

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31705Debugging aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Debug trace fabric for integrated circuit
- Patent number 12,093,161
- Issue date Sep 17, 2024
- Apple Inc.
- Charles J. Fleckenstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for electrically coupling a unit under test wi...
- Patent number 12,092,686
- Issue date Sep 17, 2024
- Western Digital Technologies, Inc.
- Aleksandr Dean Schwerdt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for remote access hardware testing
- Patent number 12,044,728
- Issue date Jul 23, 2024
- DISH Network L.L.C.
- Mansoor Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Interface system for interconnected die and MPU and communication m...
- Patent number 11,971,446
- Issue date Apr 30, 2024
- Jinghe Wei
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a simulation of the execution of a quantum cir...
- Patent number 11,954,009
- Issue date Apr 9, 2024
- Bull S.A.S.
- Jean Noël Quintin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-die debug stop clock trigger
- Patent number 11,946,969
- Issue date Apr 2, 2024
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Grant
Techniques to enable integrated circuit debug across low power states
- Patent number 11,933,843
- Issue date Mar 19, 2024
- Intel Corporation
- Keith A. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Voltage monitoring circuit for interface
- Patent number 11,899,061
- Issue date Feb 13, 2024
- Apple Inc.
- Fabien S. Faure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debug and trace circuit in lockstep architectures, associated metho...
- Patent number 11,892,505
- Issue date Feb 6, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Avneep Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Grant
Joint test action group transmission system capable of transmitting...
- Patent number 11,892,508
- Issue date Feb 6, 2024
- Realtek Semiconductor Corp.
- Chen-Tung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Reduced signaling interface method and apparatus
- Patent number 11,867,756
- Issue date Jan 9, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit with reduced signaling interface
- Patent number 11,768,238
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for intellectual property-secured, remote debug...
- Patent number 11,754,623
- Issue date Sep 12, 2023
- Intel Corporation
- Tsvika Kurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for identifying flaws and bugs in integrated ci...
- Patent number 11,733,295
- Issue date Aug 22, 2023
- International Business Machines Corporation
- Arun Joseph
- G01 - MEASURING TESTING
Information Patent Grant
Embedded logic analyzer and integrated circuit including the same
- Patent number 11,719,747
- Issue date Aug 8, 2023
- Samsung Electronics Co., Ltd.
- Joon-Won Ko
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Interfaces for wireless debugging
- Patent number 11,709,202
- Issue date Jul 25, 2023
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Grant
Device, system and method to support communication of test, debug o...
- Patent number 11,698,412
- Issue date Jul 11, 2023
- Intel Corporation
- Rolf H. Kuehnis
- G01 - MEASURING TESTING
Information Patent Grant
Debug system providing debug protection
- Patent number 11,609,268
- Issue date Mar 21, 2023
- Realtek Semiconductor Corp.
- Jieyu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Debug tool for test instruments coupled to a device under test
- Patent number 11,598,804
- Issue date Mar 7, 2023
- Intel Corporation
- Jesse Armagost
- G01 - MEASURING TESTING
Information Patent Grant
Method for real-time firmware configuration and debugging apparatus
- Patent number 11,585,850
- Issue date Feb 21, 2023
- Realtek Semiconductor Corp.
- Yue-Feng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Scan apparatus capable of fault diagnosis and scan chain fault diag...
- Patent number 11,567,132
- Issue date Jan 31, 2023
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
JTAG bus communication method and apparatus
- Patent number 11,549,982
- Issue date Jan 10, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device such as a connected object provided with means for checking...
- Patent number 11,537,709
- Issue date Dec 27, 2022
- IDEMIA IDENTITY & SECURITY FRANCE
- Fabien Blanco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reduced signaling interface circuit
- Patent number 11,519,959
- Issue date Dec 6, 2022
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Extended JTAG controller and method for functional debugging using...
- Patent number 11,519,961
- Issue date Dec 6, 2022
- COMMSOLID GMBH
- Uwe Porst
- G01 - MEASURING TESTING
Information Patent Grant
Authenticated debug for computing systems
- Patent number 11,468,199
- Issue date Oct 11, 2022
- Apple Inc.
- Mukesh Kataria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for debugging integrated circuit systems using...
- Patent number 11,442,106
- Issue date Sep 13, 2022
- Western Digital Technologies, Inc.
- Amir Segev
- G01 - MEASURING TESTING
Information Patent Grant
Secure debug architecture
- Patent number 11,443,071
- Issue date Sep 13, 2022
- SiFive, Inc.
- Yann Loisel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-die debug stop clock trigger
- Patent number 11,422,184
- Issue date Aug 23, 2022
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test system
- Patent number 11,320,484
- Issue date May 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT
- Publication number 20240402246
- Publication date Dec 5, 2024
- International Business Machines Corporation
- BENJAMIN NEIL TROMBLEY
- G01 - MEASURING TESTING
Information Patent Application
STORAGE SYSTEM AND AN OPERATING METHOD THEREOF
- Publication number 20240353486
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Ganggyu LEE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING
- Publication number 20240345158
- Publication date Oct 17, 2024
- Dish Network L.L.C.
- Mansoor Ahmed
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR A UNIFIED TEST AND DEBUG ARCHITECTURE
- Publication number 20240329129
- Publication date Oct 3, 2024
- Intel Corporation
- Sridhar Muthrasanallur
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFIELD TEST AND DEBUG
- Publication number 20240329130
- Publication date Oct 3, 2024
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES
- Publication number 20240241173
- Publication date Jul 18, 2024
- Teradyne, Inc.
- Richard W. FANNING
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR DEBUG, SURVIVABILITY, AND INFIELD TESTING OF A SYSTE...
- Publication number 20240219462
- Publication date Jul 4, 2024
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, DEBUG SYSTEM, AND DEBUG METHOD
- Publication number 20240168089
- Publication date May 23, 2024
- RENESAS ELECTRONICS CORPORATION
- Masahide MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
MEMORY, MEMORY SYSTEM AND METHOD OF CONTROLLING STORAGE DEVICE
- Publication number 20240094286
- Publication date Mar 21, 2024
- KIOXIA Corporation
- Atsushi YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING
- Publication number 20240044972
- Publication date Feb 8, 2024
- Dish Network L.L.C.
- Mansoor Ahmed
- G01 - MEASURING TESTING
Information Patent Application
PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...
- Publication number 20240003973
- Publication date Jan 4, 2024
- Intel Corporation
- Ratheesh Thekke Veetil
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20230314507
- Publication date Oct 5, 2023
- FUJIFILM Business Innovation Corp.
- Tsutomu NAGAOKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ELECTRICALLY COUPLING A UNIT UNDER TEST WI...
- Publication number 20230184829
- Publication date Jun 15, 2023
- Western Digital Technologies, Inc.
- Aleksandr Dean Schwerdt
- G01 - MEASURING TESTING
Information Patent Application
ERROR DIAGNOSIS CIRCUIT AND METHOD FOR OPERATING A DEVICE
- Publication number 20230116822
- Publication date Apr 13, 2023
- INFINEON TECHNOLOGIES AG
- Veit KLEEBERGER
- G01 - MEASURING TESTING
Information Patent Application
TEST AND DEBUG SUPPORT WITH HBI CHIPLET ARCHITECTURE
- Publication number 20230095914
- Publication date Mar 30, 2023
- Intel Corporation
- Gerald PASDAST
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR IDENTIFYING FLAWS AND BUGS IN INTEGRATED CI...
- Publication number 20230080463
- Publication date Mar 16, 2023
- International Business Machines Corporation
- Arun Joseph
- G01 - MEASURING TESTING
Information Patent Application
REDUCED SIGNALING INTERFACE METHOD & APPARATUS
- Publication number 20230058458
- Publication date Feb 23, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-Die Debug Stop Clock Trigger
- Publication number 20230025207
- Publication date Jan 26, 2023
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Application
DEBUG SYSTEM AND DEBUG METHOD
- Publication number 20220413042
- Publication date Dec 29, 2022
- XEPIC CORPORATION LIMITED
- Tsair-Chin Lin
- G01 - MEASURING TESTING
Information Patent Application
Voltage Monitoring Circuit for Interface
- Publication number 20220397604
- Publication date Dec 15, 2022
- Apple Inc.
- Fabien S. Faure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Debug Trace Fabric for Integrated Circuit
- Publication number 20220374326
- Publication date Nov 24, 2022
- Apple Inc.
- Charles J. Fleckenstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR REAL-TIME FIRMWARE CONFIGURATION AND DEBUGGING APPARATUS
- Publication number 20220334179
- Publication date Oct 20, 2022
- Realtek Semiconductor Corp.
- YUE-FENG CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SECURED DEBUG
- Publication number 20220317184
- Publication date Oct 6, 2022
- STMicroelectronics (Alps) SAS
- Franck Albesa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE SYSTEM FOR INTERCONNECTED DIE AND MPU AND COMMUNICATION M...
- Publication number 20220276304
- Publication date Sep 1, 2022
- 58th Research Institute of China Electronics Technology Group Corporation
- Jinghe Wei
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION METHOD AND ITS SYSTEM BETWEEN INTERCONNECTED DIE AND...
- Publication number 20220276306
- Publication date Sep 1, 2022
- 58th Research Institute of China Electronics Technology Group Corporation
- Jinghe Wei
- G01 - MEASURING TESTING
Information Patent Application
DEBUG TRACE MICROSECTORS
- Publication number 20220196735
- Publication date Jun 23, 2022
- Intel Corporation
- Sean R. Atsatt
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DEBUGGING INTEGRATED CIRCUIT SYSTEMS USING...
- Publication number 20220187369
- Publication date Jun 16, 2022
- Western Digital Technologies, Inc.
- Amir Segev
- G01 - MEASURING TESTING
Information Patent Application
DEBUG SYSTEM PROVIDING DEBUG PROTECTION
- Publication number 20220170985
- Publication date Jun 2, 2022
- Realtek Semiconductor Corp.
- JIEYU WANG
- G01 - MEASURING TESTING
Information Patent Application
INPUT-OUTPUT DEVICE WITH DEBUG CONTROLLER
- Publication number 20220113353
- Publication date Apr 14, 2022
- Aruni P. Nelson
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD TO SUPPORT COMMUNICATION OF TEST, DEBUG O...
- Publication number 20220082617
- Publication date Mar 17, 2022
- Intel Corporation
- Rolf H. Kuehnis
- G01 - MEASURING TESTING

Debugging aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Debug trace fabric for integrated circuit

Apparatus and method for electrically coupling a unit under test wi...

Methods and systems for remote access hardware testing

Interface system for interconnected die and MPU and communication m...

Method for analyzing a simulation of the execution of a quantum cir...

Multi-die debug stop clock trigger

Techniques to enable integrated circuit debug across low power states

Voltage monitoring circuit for interface

Debug and trace circuit in lockstep architectures, associated metho...

Joint test action group transmission system capable of transmitting...

Reduced signaling interface method and apparatus

Integrated circuit with reduced signaling interface

Systems and methods for intellectual property-secured, remote debug...

Methods and systems for identifying flaws and bugs in integrated ci...

Embedded logic analyzer and integrated circuit including the same

Interfaces for wireless debugging

Device, system and method to support communication of test, debug o...

Debug system providing debug protection

Debug tool for test instruments coupled to a device under test

Method for real-time firmware configuration and debugging apparatus

Scan apparatus capable of fault diagnosis and scan chain fault diag...

JTAG bus communication method and apparatus

Device such as a connected object provided with means for checking...

Reduced signaling interface circuit

Extended JTAG controller and method for functional debugging using...

Authenticated debug for computing systems

Method and apparatus for debugging integrated circuit systems using...

Secure debug architecture

Multi-die debug stop clock trigger

Test method and test system

Patents Applicationslast 30 patents

ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT

STORAGE SYSTEM AND AN OPERATING METHOD THEREOF

METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING

TECHNOLOGIES FOR A UNIFIED TEST AND DEBUG ARCHITECTURE

INFIELD TEST AND DEBUG

TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES

TECHNIQUES FOR DEBUG, SURVIVABILITY, AND INFIELD TESTING OF A SYSTE...

SEMICONDUCTOR DEVICE, DEBUG SYSTEM, AND DEBUG METHOD

MEMORY, MEMORY SYSTEM AND METHOD OF CONTROLLING STORAGE DEVICE

METHODS AND SYSTEMS FOR REMOTE ACCESS HARDWARE TESTING

PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...

INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

APPARATUS AND METHOD FOR ELECTRICALLY COUPLING A UNIT UNDER TEST WI...

ERROR DIAGNOSIS CIRCUIT AND METHOD FOR OPERATING A DEVICE

TEST AND DEBUG SUPPORT WITH HBI CHIPLET ARCHITECTURE

METHODS AND SYSTEMS FOR IDENTIFYING FLAWS AND BUGS IN INTEGRATED CI...

REDUCED SIGNALING INTERFACE METHOD & APPARATUS

Multi-Die Debug Stop Clock Trigger

DEBUG SYSTEM AND DEBUG METHOD

Voltage Monitoring Circuit for Interface

Debug Trace Fabric for Integrated Circuit

METHOD FOR REAL-TIME FIRMWARE CONFIGURATION AND DEBUGGING APPARATUS

SECURED DEBUG

INTERFACE SYSTEM FOR INTERCONNECTED DIE AND MPU AND COMMUNICATION M...

COMMUNICATION METHOD AND ITS SYSTEM BETWEEN INTERCONNECTED DIE AND...

DEBUG TRACE MICROSECTORS

METHOD AND APPARATUS FOR DEBUGGING INTEGRATED CIRCUIT SYSTEMS USING...

DEBUG SYSTEM PROVIDING DEBUG PROTECTION

INPUT-OUTPUT DEVICE WITH DEBUG CONTROLLER

DEVICE, SYSTEM AND METHOD TO SUPPORT COMMUNICATION OF TEST, DEBUG O...