Number | Name | Date | Kind |
---|---|---|---|
5228045 | Chiles | Jul 1993 | A |
5331274 | Jarwala et al. | Jul 1994 | A |
5343478 | James et al. | Aug 1994 | A |
5355369 | Greenberger et al. | Oct 1994 | A |
5428624 | Blair et al. | Jun 1995 | A |
5428750 | Hsieh et al. | Jun 1995 | A |
5483518 | Whetsal | Jan 1996 | A |
5498972 | Haulin | Mar 1996 | A |
5544309 | Chang et al. | Aug 1996 | A |
5574730 | End, III et al. | Nov 1996 | A |
5581541 | Whetsel | Dec 1996 | A |
5586270 | Rotier et al. | Dec 1996 | A |
5617430 | Angelotti et al. | Apr 1997 | A |
5640521 | Whetsel | Jun 1997 | A |
5649224 | Scheer | Jul 1997 | A |
5694399 | Jacobson et al. | Dec 1997 | A |
5751736 | Deroux-Dauphin et al. | May 1998 | A |
Entry |
---|
IEEE Computer Society, “IEEE Standard Test Access Port and Boundary-Scan Architecture” IEEE Std. 1149.1-1990, Copyright 1993 by the Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017. |