Claims
- 1. A method for introducing charged particles into a device comprising the steps of:
a) generating ions in a relatively high pressure region external to the device and b) directing said ions through at least one aperture extending into the device, and c) further directing said ions through an ion funnel within the interior of the device having a jet disturber positioned within said ion funnel.
- 2. The method of claim 1 wherein the device is provided as a mass spectrometer.
- 3. The method of claim 1 wherein the at least one aperture is a multicapillary inlet.
- 4. The method of claim 1 wherein said relatively high pressure region is at between 10−1 millibar and 1 bar
- 5. The method of claim 1 wherein the charged particles are generated with an electrospray ion source.
- 6. An apparatus for introducing charged particles generated at a relatively high pressure into a device maintained at a relatively low pressure comprising an ion funnel having a jet disturber positioned within said ion funnel.
- 7. The apparatus of claim 6 further comprising a multicapillary inlet extending into the device, whereby charged particles generated in the relatively high pressure region move through the multicapillary inlet and into the ion funnel.
- 8. The apparatus of claim 6 wherein the device is a mass spectrometer.
- 9. The apparatus of claim 6 wherein said relatively high pressure region is at between 10−1 millibar and 1 bar.
- 10. The apparatus of claim 7 further comprising an electrospray ion source interfaced with the plurality of apertures.
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT
[0001] This invention was made with Government support under Contract DE-AC06-76RLO 1830 awarded by the U.S. Department of Energy. The Government has certain rights in the invention.