J. B. Pallix et al., Depth Profiling Using Intense UV Laser Ionization of Sputtered Neutrals, pp. 1-9, 1988, North-Holland, Amsterdam. |
C. H. Becker, On the Use of Nonresonant Multiphoton Ionization of Desorbed Species for Surface Analysis, pp. 1181-1185, Jul./Aug. 1987. |
C. M. Stahle et al., Quantitative Measurements of the Stoichiometry of Anodic Oxides Grown on Hg.sub.0.78 Cd.sub.0.22 Te, pp. 521-523, Sep. 1, 1985. |
C. H. Becker et al., Nonresonant Multiphoton Ionization as a Sensitive Detector of Surface Concentrations and Evaporation Rates, pp. 1063-1065, Nov. 15, 1984. |
Christopher H. Becker et al., Surface Analysis by Nonresonant Multiphoton Ionization of Desorbed or Sputtered Species, pp. 1671-1674, 1984. |