The present invention relates to a laser processing apparatus that irradiates a workpiece with a laser beam to execute processing.
A wafer on which multiple devices such as integrated circuits (ICs) and large-scale integrations (LSIs) are formed on a front surface in such a manner as to be marked out by multiple planned dividing lines that intersect each other is divided into individual device chips by a dicing apparatus or a laser processing apparatus, and the device chips obtained by the dividing are used for pieces of electrical equipment such as mobile phones and personal computers.
Furthermore, a technique is also implemented in which a small hole is formed in the back surface of an electrode pad formed on a device chip and thereafter an electrically-conductive member is buried in the small hole to form a via hole and the device chips are vertically stacked to intend enhancement of functions of a device. The present assignee has proposed a technique for irradiating the back surface of a device chip corresponding to an electrode pad with a laser beam and properly forming a small hole (refer to Japanese Patent No. 6034030).
In the technique described in the above-described Japanese Patent No. 6034030, plasma light emitted due to irradiation with the laser beam from the back surface of a substrate on which devices are formed on the front surface is detected. In addition, the irradiation with the laser beam is stopped when plasma light emitted due to reaching of the laser beam to the electrode pad is detected. This can form a proper small hole without opening an unintended through-hole in the electrode pad.
Incidentally, it has turned out that the following problem exists. The spot shape of the laser beam with which a workpiece is irradiated does not become an exact circle but becomes an elliptical shape, for example, in some cases, and the amount of processing in the major axis direction becomes large compared with the amount of processing in the minor axis direction. Thus, even when irradiation with the laser beam is executed along the outer edge of a small hole that is a processing shape to be formed, the shape of the small hole does not become the desired shape but becomes distorted, which lowers the quality of a device chip. Such a problem is not limited to the case of processing the inside of the processing shape as an unnecessary region as in the processing of the above-described small hole. A similar problem possibly occurs also in the case of processing the outside of the processing shape as an unnecessary region.
Thus, an object of the present invention is to provide a laser processing apparatus that allows processing into a desired shape even when the spot shape of a laser beam is a distorted shape like an elliptical shape, for example.
In accordance with an aspect of the present invention, there is provided a laser processing apparatus including a chuck table having a holding surface that holds a workpiece and is defined by an X-axis direction and a Y-axis direction, and a laser beam irradiation unit that irradiates the workpiece held by the chuck table with a laser beam. The laser beam irradiation unit includes a laser oscillator that emits the laser beam, an fθ lens that focuses the laser beam emitted by the laser oscillator on the workpiece held by the chuck table, an X-axis optical scanner that is disposed between the laser oscillator and the fθ lens and induces the laser beam emitted by the laser oscillator in the X-axis direction, a Y-axis optical scanner that is disposed between the laser oscillator and the fθ lens and induces the laser beam emitted by the laser oscillator in the Y-axis direction, and a controller. The controller includes a spot shape storing section that stores a shape of a spot of the laser beam with which the workpiece held by the chuck table is irradiated, and a processing shape storing section that stores X-coordinates and Y-coordinates on a processing shape to be formed in the workpiece held by the chuck table. When the workpiece held by the chuck table is irradiated with the laser beam, the controller controls the X-axis optical scanner and the Y-axis optical scanner on the basis of the shape of the spot and the X-coordinates and Y-coordinates on the processing shape and irradiation with the laser beam is executed in such a manner that the contour of the shape of the spot is positioned to an X-coordinate and Y-coordinate on the processing shape and a tangent line to the spot and a tangent line to the processing shape at the X-coordinate and Y-coordinate correspond with each other.
Preferably, the spot is positioned to the inside of the processing shape when the inside of the processing shape is deemed as unnecessary, and the spot is positioned to the outside of the processing shape when the outside of the processing shape is deemed as unnecessary.
According to the laser processing apparatus of the present invention, even when the shape of the spot of the laser beam is a distorted shape like an elliptical shape, for example, processing into the desired processing shape is possible and a problem that the processing shape that should be formed becomes distorted is eliminated. This can eliminate, for example, a problem that the quality of device chips in which small holes are formed corresponding to electrode pads lowers.
The above and other objects, features and advantages of the present invention and the manner of realizing them will become more apparent, and the invention itself will best be understood from a study of the following description and appended claims with reference to the attached drawings showing a preferred embodiment of the invention.
A laser processing apparatus of an embodiment of the present invention will be described in detail below with reference to the accompanying drawings.
In
Furthermore, the laser processing apparatus 1 includes a movement mechanism 4 including an X-axis feed mechanism 41 that moves the chuck table 35 in the X-axis direction and a Y-axis feed mechanism 42 that moves the chuck table 35 in the Y-axis direction, a frame body 5 including a vertical wall part 5a erected on a lateral side of the movement mechanism 4 on the base 2 and a horizontal wall part 5b extending in the horizontal direction from an upper end part of the vertical wall part 5a, an imaging unit 7 that images the wafer 10 held by the chuck table 35 and executes alignment, and a controller 100. An input unit, a display unit, and so forth that are not illustrated are connected to the controller 100.
As illustrated in
The X-axis feed mechanism 41 converts rotational motion of a motor 43 to linear motion through a ball screw 44 and transmits the linear motion to the X-axis direction movable plate 31 to move the X-axis direction movable plate 31 in the X-axis direction along a pair of guide rails 2a disposed along the X-axis direction on the base 2. The Y-axis feed mechanism 42 converts rotational motion of a motor 45 to linear motion through a ball screw 46 and transmits the linear motion to the Y-axis direction movable plate 32 to move the Y-axis direction movable plate 32 in the Y-axis direction along a pair of guide rails 31a disposed along the Y-axis direction on the X-axis direction movable plate 31.
An optical system that configures the above-described laser beam irradiation unit 6, and the imaging unit 7 are housed inside the horizontal wall part 5b of the frame body 5. A light collector 61 that configures part of the laser beam irradiation unit 6 and irradiates the wafer 10 with a laser beam LB is disposed on the lower surface side of a tip part of the horizontal wall part 5b. A normal charge coupled device (CCD) camera that executes imaging by a visible beam is used as the imaging unit 7 in general. However, in the present embodiment, an infrared camera that can image an electrode pad formed on the front surface of a device 12 from a back surface 10b of the wafer 10 is employed and is disposed at a position adjacent to the above-described light collector 61 in the X-axis direction.
In
The controller 100 is configured by a computer and includes a central processing unit (CPU) that executes calculation processing in accordance with a control program, a read only memory (ROM) that stores the control program and so forth, a readable-writable random access memory (RAM) for temporarily storing a calculation result and so forth, an input interface, and an output interface. To the controller 100, the laser beam irradiation unit 6 (X-axis optical scanner 64, Y-axis optical scanner 65), the imaging unit 7, the X-axis feed mechanism 41, the Y-axis feed mechanism 42, and so forth are connected.
When the wafer 10 that is a workpiece is irradiated with the laser beam LB oscillated by the laser oscillator 62 by the above-described laser beam irradiation unit 6, the X-axis optical scanner 64 and the Y-axis optical scanner 65 are controlled by the controller 100. In addition, in conjunction with this, the above-described X-axis feed mechanism 41 and Y-axis feed mechanism 42 are also controlled. This makes it possible to position the chuck table 35 directly under the light collector 61 and precisely position the center position of a spot S of the laser beam LB to be described later to a desired X-coordinate/Y-coordinate position on the wafer 10 held by the chuck table 35 and execute irradiation.
In
When the wafer 10 is processed by the laser processing apparatus 1 of the present embodiment, as illustrated in
As illustrated in
The shape and dimensions of the spot S of the laser beam LB stored in the spot shape storing section 110 of the above-described present embodiment are what are measured by an experiment and are stored in advance, and are, for example, an elliptical shape in which the length of the major axis is 15 μm and the length of the minor axis is 10 μm as illustrated in
As illustrated in
As is understood from
The laser processing apparatus 1 of the present embodiment has a configuration that is substantially as described above. Functions and operation thereof will be described below.
After the wafer 10 integrated with the annular frame F, which is described on the basis of
Subsequently, the X-axis feed mechanism 41 and the Y-axis feed mechanism 42 are actuated, and the wafer 10 is positioned directly under the imaging unit 7. Then, the wafer 10 is imaged by the imaging unit 7 including the infrared camera, and alignment to detect the device 12 formed on the front surface 10a of the wafer 10 and the planned dividing line 14 is executed. As described above, the multiple bumps 13 are formed on each of the devices 12 formed on the wafer 10. Position coordinates corresponding to the respective bumps 13 are detected and are stored in the controller 100. In the above-described alignment, the positions of the bumps 13 do not need to be directly detected. By storing the positions at which the bumps 13 are formed on the device 12 in advance and identifying the position and orientation of the device 12, the position coordinates of the bumps 13 formed on the device 12 can also be identified.
After the position coordinates of the bumps 13 formed on the device 12 are detected as described above, the X-axis feed mechanism 41 and the Y-axis feed mechanism 42 are actuated, and the chuck table 35 is positioned directly under the light collector 61. Subsequently, the laser oscillator 62 is actuated, and the X-axis optical scanner 64 and the Y-axis optical scanner 65 of the above-described laser beam irradiation unit 6 are controlled on the basis of the X-coordinates and Y-coordinates (x1′, y1′) to (xm′, ym′) of the centers Sc1 to Scm of the spot S calculated on the basis of the shape of the spot S and information relating to the X-coordinates and Y-coordinates on the processing shape G described above. Thus, as illustrated in
Laser processing conditions when the above-described laser processing is executed are set as follows, for example.
In the above-described laser processing, irradiation with the laser beam LB is executed in such a manner that the centers Sc1 to Scm of the spot S are along the first locus E1 illustrated by the one-dot chain line as illustrated in
According to the above-described embodiment, even when the shape of the spot S of the laser beam LB is a distorted shape like an elliptical shape, for example, processing into the desired processing shape G is possible, and the problem that the shape of the small hole that should be formed becomes distorted to lower the quality of device chips formed through dividing the wafer 10 is eliminated.
The present invention is not limited to the above-described embodiment. In the above-described embodiment, the small hole for which the inside of the processing shape G is deemed as unnecessary is formed. However, for example, as illustrated in
The processing shape G of the embodiment illustrated in
Moreover, although examples in which the processing shape G is an exact circle have been explained in the above-described embodiments, the present invention is not limited thereto and it is also possible to set the processing shape G as an optional shape.
The present invention is not limited to the details of the above described preferred embodiment. The scope of the invention is defined by the appended claims and all changes and modifications as fall within the equivalence of the scope of the claims are therefore to be embraced by the invention.
Number | Date | Country | Kind |
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2022-101243 | Jun 2022 | JP | national |