The present invention generally relates to plasma-based light sources, and, more particularly, to a plasma-based light source with one or more transparent portions with graded absorption features.
As the demand for integrated circuits having ever-smaller device features continues to increase, the need for improved illumination sources used for inspection of these ever-shrinking devices continues to grow. One such illumination source includes a laser-sustained plasma source. Laser-sustained plasma light sources are capable of producing high-power broadband light. Laser-sustained light sources operate by focusing laser radiation into a gas volume in order to excite the gas, such as argon or xenon, into a plasma state, which is capable of emitting light. This effect is typically referred to as “pumping” the plasma. Traditional plasma lamps include plasma bulbs or cells for containing gas used to generate plasma, which are typically formed from a glass or crystalline material. During operation a plasma lamp may experience temperature gradients caused by the non-uniform heating of the plasma lamp by broadband radiation emitted by the plasma. Strong thermal gradients can cause stress within the plasma lamp, which in some cases cause mechanical failure. For example, when powerful broadband radiation passes through a window of a plasma lamp, thermal stress caused by preferential window heating in the center of the window can cause the window to crack. Therefore, it would be desirable to provide an apparatus, system and/or method for curing shortcomings such as those of the identified above.
An optical device having graded absorption characteristics is disclosed, in accordance with one or more embodiments of the present disclosure. In one embodiment, the optical device includes an optical component including at least one of a reflective element or a transmission element. In another embodiment, the optical device includes one or more graded absorption layers disposed on one or more surfaces of at least one of the reflective element or the transmission element. In another embodiment, the one or more graded absorption layers control heating of at least one of the reflective element or the transmission element caused by the broadband radiation emitted by a plasma.
A laser-sustained plasma (LSP) lamp having graded absorption characteristics is disclosed, in accordance with one or more embodiments of the present disclosure. In one embodiment, the LSP lamp includes a gas containment structure configured to contain a volume of gas. In another embodiment, the gas containment structure is configured to receive pump illumination from a pump laser for generating a plasma within the volume of gas. In another embodiment, the plasma emits broadband radiation. In another embodiment, the gas containment structure includes one or more transmissive structures being at least partially transparent to at least a portion of the pump illumination from the pump laser and at least a portion of the broadband radiation emitted by the plasma. In another embodiment, the one or more transmissive structures have a graded absorption profile so as to control heating of the one or more transmissive structures caused by the broadband radiation emitted by the plasma.
A system for generating broadband laser-sustained plasma light is disclosed, in accordance with one or more embodiments of the present disclosure. In one embodiment, the system includes one or more pump lasers configured to generate illumination. In another embodiment, the system includes a plasma lamp. In another embodiment, the plasma lamp includes a gas containment structure configured to contain a volume of gas, the gas containment structure configured to receive pump illumination from a pump laser for generating a plasma within the volume of gas, wherein the plasma emits broadband radiation. In another embodiment, the gas containment structure includes one or more transmissive structures being at least partially transparent to at least a portion of the pump illumination from the pump laser and at least a portion of the broadband radiation emitted by the plasma. In another embodiment, the one or more transmissive structures have a graded absorption profile so as to control heating of the one or more transmissive structures caused by the broadband radiation emitted by the plasma. In another embodiment, the system includes one or more lamp optics arranged to focus the illumination from the one or more pump lasers into the volume of gas in order to generate a plasma within the volume of gas contained within the plasma lamp.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not necessarily restrictive of the invention as claimed. The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and together with the general description, serve to explain the principles of the invention.
The numerous advantages of the disclosure may be better understood by those skilled in the art by reference to the accompanying figures in which:
Reference will now be made in detail to the subject matter disclosed, which is illustrated in the accompanying drawings.
Referring generally to
The one or more graded absorption layers and/or bulk doping may be used in the context of any optical system requiring one or more transparent, semi-transparent and/or reflective interfaces. The one or more absorption layers may be used in any number of high temperature optical environments.
Lack of control of the light absorption in an optical component may result in strong thermal gradients in an optical component in close proximity to the plasma. Many of optical materials in use in LSP containers (e.g., plasma bulbs, cells, chambers) are relatively brittle and do not withstand strong thermal gradients. Strong thermal gradients can cause stress, especially on larger optical components that may ultimately lead to mechanical failure of the optical component.
For windows and other transmitting optical components, thermal management becomes important so to reduce stress caused by non-uniform heating. One of the main causes of stress in optical components, such as, but not limited to, transmission elements (e.g., window) of plasma cells or plasma bulbs is surface absorption of VUV light emitted by the plasma. For high intensity applications, thermal stress can exceed material strength of the transmission element, thereby causing catastrophic failure of the transmission element. The implementation of a graded absorption layer and/or the bulk doping of the transmission element to achieve graded absorption may provide for a controlled pattern of stress distribution.
The generation of a light-sustained plasma is also generally described in U.S. Pat. No. 7,435,982, issued on Oct. 14, 2008, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 7,786,455, issued on Aug. 31, 2010, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 7,989,786, issued on Aug. 2, 2011, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 8,182,127, issued on May 22, 2012, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 8,309,943, issued on Nov. 13, 2012, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 8,525,138, issued on Feb. 9, 2013, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 8,921,814, issued on Dec. 30, 2014, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Pat. No. 9,318,311, issued on Apr. 19, 2016, which is incorporated by reference herein in the entirety. The generation of plasma is also generally described in U.S. Patent Publication No. 2014/029154, filed on Mar. 25, 2014, which is incorporated by reference herein in the entirety. In a general sense, the various embodiments of the present disclosure should be interpreted to extend to any plasma-based light source known in the art. An optical system used in the context of plasma generation is described generally in U.S. Pat. No. 7,705,331, issued on Apr. 27, 2010, which is incorporated herein by reference in the entirety. The use of separate illumination and collection optics in a plasma source is described generally in U.S. patent application Ser. No. 15/187,590, filed on Jun. 20, 2016, which is incorporated above by reference in the entirety. The generation of plasma in a bulb-less light source is generally described in U.S. patent application Ser. No. 14/224,945, filed on Mar. 25, 2014, which is incorporated above in the entirety. A bulb-less laser sustained plasma light source is also generally described in U.S. patent application Ser. No. 12/787,827, filed on May 26, 2010, which is incorporated herein by reference in the entirety.
In one embodiment, the system 100 includes an illumination source 111 (e.g., one or more lasers) configured to generate illumination 109 of a selected wavelength or wavelength range, such as, but not limited to, infrared radiation or visible radiation. In another embodiment, the system 100 includes a plasma lamp 101 for generating, or maintaining, plasma 106. In another embodiment, the plasma lamp 101 includes one or more gas containment structures 103 (e.g., plasma bulb, plasma cell, plasma chamber, etc.) having one or more transmission elements 104 (e.g., transparent or semi-transparent optical element). For example, the one or more transmission elements 104 may include, but are not limited to, a transparent or semi-transparent window, wall of a plasma bulb, wall of a plasma cell and the like. In one embodiment, the transmission element 104 of the gas containment structure 103 of the plasma lamp 101 is configured to receive illumination from the illumination source 111 in order to generate a plasma 106 within a plasma generation region of a volume of gas 108 contained within the plasma lamp 101. In this regard, one or more transmission elements 104 of the gas containment structure 103 of the plasma lamp 101 are at least partially transparent to the illumination generated by the illumination source 111, allowing illumination delivered by the illumination source 111 (e.g., delivered via fiber optic coupling or delivered via free space coupling) to be transmitted through the transmission element 104 and into the plasma lamp 101. In another embodiment, upon absorbing illumination from illumination source 111, the plasma 106 emits broadband radiation (e.g., broadband IR, broadband visible, broadband UV, broadband DUV, broadband VUV and/or broadband EUV radiation). In another embodiment, one or more transmission elements 104 of the gas containment structure 103 of the plasma lamp 101 are at least partially transparent to at least a portion of the broadband radiation emitted by the plasma 106. It is noted herein that the one or more transmission elements 104 of the gas containment structure 103 of the plasma lamp 101 may be transparent to both illumination 107 from the illumination source 111 and broadband illumination 115 from the plasma 106.
In another embodiment, the plasma lamp 101 is equipped with one or more graded absorption features 102.
In one embodiment, the transmissive structure 107 includes the transmission element 104 (e.g., wall of bulb, wall of plasma cell, window, etc.) and one or more graded absorptive layers 102 disposed on a surface of the transmission element 104. For example, the transmission element 104 may include an otherwise generally non-absorptive transmission element, such as, but not limited to, a wall of a plasma bulb, a wall of a plasma cell, a window of a plasma chamber and the like. A graded absorptive layer 102 may be disposed on one or more surfaces of the transmission element 104 so to achieve the graded absorption profile of the transmissive structure 107.
It is noted that grade absorptive layer 102 may be formed to achieve a selected thermal distribution of the transmission element 104 (or other optical components).
In one embodiment, the absorptive layer 102 may be formed on a surface of the transmission element 104 so as to approximately inversely match the intensity profile of the broadband radiation 110 impinging on the transmission element 104. In this regard, the absorptivity of the absorptive layer 102 may vary inversely to the intensity profile of the broadband radiation 110 so as to reduce the thermal gradient along one or more directions (e.g., axial direction) of the transmissive structure 107 of the gas containment structure 103. Such an absorptivity distribution in the absorptive layer 102 may aid in achieving a uniform temperature distribution across the transmission element 104, thereby reducing stress in the transmission element 104 and also providing an appropriate temperature for solarization annealing. It is further noted that the achievement of uniform temperature along one or more directions (e.g., axial direction in cylindrical geometry) of the transmission element 104 (or other optical components) is particularly desirable in cases of brittle transmission elements 104 formed from materials such as, but not limited to, Al2O3, CaF2, MgF2 and the like.
In one embodiment, the absorptivity of the absorptive layer 102 may vary continuously along a selected direction (e.g., axial direction in the case of cylindrical geometry). For example, the absorptive layer 102 may be formed such that that the absorptivity of the absorptive layer is minimum at the point of maximum broadband radiation intensity 115, while being maximum at the point(s) of minimum broadband radiation intensity 113,117. For instance, in the case of a cylindrical gas containment structure 103, as shown in
The absorptive layer 102 may be disposed on the internal surface and/or the external surface of the transmission element 104 of the plasma lamp 101. It is also noted that application of the absorptive layer 102 on both sides (i.e., internal surface and external surface) of the transmission element 104 may serve to aid in managing longitudinal stress distribution in the transmission element 104.
In one embodiment, the absorptive layer 102 includes an absorptive coating deposited/formed on one or more surfaces of the transmission element 104. The absorptive layer 102 may be formed such that the absorptivity of the absorptive layer 102 varies along one or more directions as necessary to mitigate thermal gradients that would otherwise exist in the transmission element 104. The absorptivity of the layer 102 as a function of position along the transmission element 104 may be controlled by controlling the density of the material used to form the absorptivity layer. In another embodiment, multiple materials having different absorptivities may be used to control absorptivity as a function position along the transmission element 104.
The absorptive layer 102 may be deposited utilizing any thin film deposition process known in the art, such as, but not limited to, evaporation, sputtering, chemical vapor deposition (CVD), atomic layer deposition (ALD) and the like.
It is noted that the materials used to form the graded absorptive layer 102 may include any materials known in the optical arts for forming absorptive optical components coatings/layers. In some embodiments, the absorptive layer 102 may be formed from one or more materials that absorb all or a significant portion of the spectrum of the broadband radiation 110. For example, the absorptive layer 102 may be formed from such broadly absorbing materials as, but not limited to, aluminum or carbon. In other embodiments, the absorptive layer 102 may be formed from one or more materials that absorb a fraction of the spectrum of the broadband radiation 110. For example, the absorptive layer 102 may be formed from such fractionally absorbing materials as, but not limited to, hafnium.
It is further noted that the absorptive layer 102 may be formed from a material that has an absorption spectrum away from the usable spectral band of the LSP source 101. By limiting absorption by the absorptive layer 102 to non-usable spectral portions of the broadband radiation 110, stress in the transmission element 104 may be reduced, via thermal gradient reduction, while light output performance is not impacted. For example, in the case where visible light is collected from the plasma 106, a hafnium-based graded absorptive layer 102 may be implemented so to absorb non-usable UV light from the broadband output of the plasma 106.
where W is distribution of radiation flux on the transmission element 104 (e.g., glass wall) of the gas containment structure 103 and is given by:
where Q is the power density absorbed by the transmission element 104 of the gas containment structure e.g., glass wall(s) of gas containment structure) and is given by:
Q=A
glass
·W
where Aglass is the absorptivity of the glass cylindrical transmission element 104 of the gas containment structure 103.
While much of the above disclosure has focused on the implementation of a graded absorption layer (or bulk doping) to reduce temperature gradients in the transmissive portions of a plasma lamp 101, these examples should not be interpreted as a limitation on the scope of the present disclosure. Rather, it is noted herein that the implementation of a graded absorption layer and/or the doping of a bulk transparent material may be extended to any type of optical component where temperature gradients may be formed in the given optical component via the absorption of light, as discussed previously herein. For example, the implementation of the graded absorption layer and/or the doping of a bulk material with absorbing material may be extended to any transmissive and/or reflective optical component known in the art including, but not limited to, a window, a lens, a mirror, a beam splitter and the like.
Referring again to
It is contemplated herein that the system 100 may be utilized to initiate and/or sustain plasma 106 in a variety of gas environments. In one embodiment, the gas used to initiate and/or maintain plasma 106 may include an inert gas (e.g., noble gas or non-noble gas) or a non-inert gas (e.g., mercury). In another embodiment, the gas 108 used to initiate and/or maintain plasma 106 may include a mixture of gases (e.g., mixture of inert gases, mixture of inert gas with non-inert gas or a mixture of non-inert gases).
It is further noted that the system 100 may be implemented with a number of gases. For example, gases suitable for implementation in the system 100 of the present disclosure may include, but are not limited, to Xe, Ar, Ne, Kr, He, N2, H2O, O2, H2, D2, F2, CH4, one or more metal halides, a halogen, Hg, Cd, Zn, Sn, Ga, Fe, Li, Na, Ar:Xe, ArHg, KrHg, XeHg, and the like. The system 100 of the present disclosure should be interpreted to extend to any architecture suitable for light-sustained plasma generation and should further be interpreted to extend to any type of gas suitable for sustaining a plasma within a plasma lamp
The transmission element 104 (e.g., wall of the plasma bulb, wall of a plasma cell, window, etc.) of the plasma lamp 101 of system 100 may be formed from any material known in the art that is at least partially transparent to radiation generated by plasma 106. In one embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to VUV radiation generated by plasma 106. In one embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to DUV radiation generated by plasma 106. In another embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to EUV light generated by plasma 106. In another embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to UV light generated by plasma 106. In another embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to visible light generated by plasma 106.
In another embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to the pumping illumination 109 (e.g., IR radiation) from the illumination source 111. In another embodiment, the transmission element 104 of plasma lamp 101 may be formed from any material known in the art that is at least partially transparent to both radiation 109 from the illumination source 111 (e.g., IR source) and broadband radiation 110 (e.g., VUV radiation, DUV radiation, EUV radiation, UV radiation and/or visible radiation) emitted by the plasma 106 contained within the volume of transparent portion 102 of plasma lamp 101. In some embodiments, the transmission element 104 of plasma lamp 101 may be formed from a low-OH or high-OH content fused silica glass material. For example, the transmission element 104 of plasma lamp 101 may include, but is not limited to, SUPRASIL 1, SUPRASIL 2, SUPRASIL 300, SUPRASIL 310, HERALUX PLUS, HERALUX-VUV, and the like. In other embodiments, the transmission element 104 of plasma lamp 101 may include, but is not limited to, calcium fluoride (CaF2), magnesium fluoride (MgF2), lithium fluoride (LiF2), crystalline quartz or sapphire. It is noted herein that materials such as, but not limited to, CaF2, MgF2, crystalline quartz and sapphire provide transparency to short-wavelength radiation (e.g., λ<190 nm). Various glasses suitable for implementation in the transparent portion 102 of plasma cell 101 of the present disclosure are discussed in detail in A. Schreiber et al., Radiation Resistance of Quartz Glass for VUV Discharge Lamps, J. Phys. D: Appl. Phys. 38 (2005), 3242-3250, which is incorporated herein by reference in the entirety.
The transmission element 104 (e.g., wall of bulb, wall of plasma cell, etc.) of the plasma lamp 101 may take on any shape known in the art. In the case where the plasma lamp 101 is a plasma cell, the transmission element 104 may have a cylindrical shape. In another embodiment, although not shown, the transmission element 104 may have a spherical or ellipsoidal shape. In another embodiment, although not shown, the transmission element 104 may have a composite shape. For example, the shape of the transmission element 104 may consist of a combination of two or more shapes. For instance, the shape of the transmission element 104 may consist of a spherical or ellipsoidal center portion, arranged to contain the plasma 106, and one or more cylindrical portions extending above and/or below the spherical or ellipsoidal center portion, whereby the one or more cylindrical portions are coupled to the one or more flanges. In the case where the transmission element 104 is cylindrically shaped, as shown in
In settings where the plasma lamp 101 is a plasma bulb, the transmission element 104 of the plasma bulb may also take on any shape known in the art. In one embodiment, the plasma bulb may have a cylindrical shape. In another embodiment, the plasma bulb may have a spherical or ellipsoidal shape. In another embodiment, the plasma bulb may have a composite shape. For example, the shape of the plasma bulb may consist of a combination of two or more shapes. For instance, the shape of the plasma bulb may consist of a spherical or ellipsoidal center portion, arranged to contain the plasma 106, and one or more cylindrical portions extending above and/or below the spherical or ellipsoidal center portion.
In another embodiment, the one or more absorptive layers 102 of the present disclosure may be formed on one or more of the curved surfaces of the transmission element 104 of the plasma lamp 101. For example, in the case of a plasma bulb or plasma cell, the one or more absorptive layers 102 may be formed on the internal surface and/or the external surface, which may both be curved in the case of the plasma bulb shapes described previously herein.
In another embodiment, the system includes one or more lamp optics. For example, as shown in
For example, the collector element 105 may collect at least one of VUV broadband radiation, DUV radiation, EUV radiation, UV radiation and/or visible radiation emitted by plasma 106 and direct the broadband illumination 110 to one or more downstream optical elements. In this regard, the plasma lamp 101 may deliver VUV radiation, DUV radiation, EUV radiation, UV radiation and/or visible radiation to downstream optical elements of any optical characterization system known in the art, such as, but not limited to, an inspection tool or a metrology tool. It is noted herein the plasma lamp 101 of system 100 may emit useful radiation in a variety of spectral ranges including, but not limited to, VUV radiation, DUV radiation, EUV radiation, UV radiation, and/or visible radiation.
In an alternative and/or additional embodiment, the one or more lamp optics may include a set of illumination optics for directing and/or focusing illumination 109 from the illumination source 102 into the volume of gas contained within the plasma lamp 101 to ignite and/or sustain the plasma 106. For example, the set of illumination optics may include a set of reflector elements (e.g., mirrors) configured to direct an output from the illumination source 111 to the volume of gas within the plasma lamp 101 to ignite and/or sustain the plasma 106. In addition, the one or more lamp optics may include, but are not limited to, a set of collection elements (e.g., mirrors) for collecting broadband radiation 110 emitted by the plasma 106 and directing the broadband radiation 110 to one or more additional optical elements. The use of separate illumination and collection optics in a plasma source is described generally in U.S. patent application Ser. No. 15/187,590, filed on Jun. 20, 2016, which is incorporated above by reference in the entirety.
In one embodiment, system 100 may include various additional optical elements. In one embodiment, the set of additional optics may include collection optics configured to collect broadband light emanating from the plasma 106. For instance, the system 100 may include a dichroic mirror 121 (e.g., cold mirror) arranged to direct illumination from the reflector element 105 to downstream optics, such as, but not limited to, a homogenizer 125.
In another embodiment, the set of optics may include one or more lenses (e.g., lens 117) placed along either the illumination pathway or the collection pathway of system 100. The one or more lenses may be utilized to focus illumination from the illumination source 111 into the volume of gas 108 within the plasma cell 101. Alternatively, the one or more additional lenses may be utilized to focus broadband light emanating from the plasma 106 onto a selected target (not shown).
In another embodiment, the set of optics may include a turning mirror 119. In one embodiment, the turning mirror 119 may be arranged to receive pumping illumination 107 from the illumination source 111 and direct the illumination to the volume of gas 108 contained within the plasma lamp 101 via reflector element 105. In another embodiment, the reflector element 105 is arranged to receive illumination from mirror 119 and focus the illumination to the focal point of the collection element 105 (e.g., ellipsoid-shaped reflector element), where the plasma lamp 101 is located.
In another embodiment, the set of optics may include one or more filters 123 placed along either the illumination pathway or the collection pathway in order to filter illumination prior to light entering the plasma lamp 101 or to filter illumination following emission of the light from the plasma 106. It is noted herein that the set of optics of system 100 as described above and illustrated in
In another embodiment, the illumination source 111 of system 100 may include one or more lasers. The illumination source 111 may include any laser system known in the art. For instance, the illumination source 111 may include any laser system known in the art capable of emitting radiation in the infrared, visible and/or ultraviolet portions of the electromagnetic spectrum. In one embodiment, the illumination source 111 may include a laser system configured to emit continuous wave (CW) laser radiation. For example, the illumination source 111 may include one or more CW infrared laser sources. For instance, in settings where the gas within the plasma bulb 101 is or includes argon, the illumination source 111 may include a CW laser (e.g., fiber laser or disc Yb laser) configured to emit radiation at 1069 nm. It is noted that this wavelength fits to a 1068 nm absorption line in argon and, as such, is particularly useful for pumping argon gas. It is noted herein that the above description of a CW laser is not limiting and any laser known in the art may be implemented in the context of the present invention.
In another embodiment, the illumination source 111 may include one or more modulated lasers configured to provide modulated laser light to the plasma 106. In another embodiment, the illumination source 111 may include one or more pulsed lasers configured to provide pulsed laser light to the plasma.
In another embodiment, the illumination source 111 may include one or more diode lasers. For example, the illumination source 111 may include one or more diode lasers emitting radiation at a wavelength corresponding with any one or more absorption lines of the species of the gas contained within the plasma bulb 101. In a general sense, a diode laser of the illumination source 111 may be selected for implementation such that the wavelength of the diode laser is tuned to any absorption line of any plasma (e.g., ionic transition line) or any absorption line of the plasma-producing gas (e.g., highly excited neutral transition line) known in the art. As such, the choice of a given diode laser (or set of diode lasers) will depend on the type of gas contained within the plasma bulb 101 of system 100.
In another embodiment, the illumination source 111 may include an ion laser. For example, the illumination source 111 may include any noble gas ion laser known in the art. For instance, in the case of an argon-based plasma, the illumination source 111 used to pump argon ions may include an Ar+ laser.
In another embodiment, the illumination source 111 may include one or more frequency converted laser systems. For example, the illumination source 111 may include a Nd:YAG or Nd:YLF laser.
In another embodiment, the illumination source 111 may include one or more non-laser sources. In a general sense, the illumination source 111 may include any non-laser light source known in the art. For instance, the illumination source 111 may include any non-laser system known in the art capable of emitting radiation discretely or continuously in the infrared, visible or ultraviolet portions of the electromagnetic spectrum.
In another embodiment, the illumination source 111 may include two or more light sources. In one embodiment, the illumination source 111 may include or more lasers. For example, the illumination source 111 (or illumination sources) may include multiple diode lasers. By way of another example, the illumination source 111 may include multiple CW lasers or pulsed lasers. In a further embodiment, each of the two or more lasers may emit laser radiation tuned to a different absorption line of the gas or plasma within the plasma lamp 101 of system 100.
The herein described subject matter sometimes illustrates different components contained within, or connected with, other components. It is to be understood that such depicted architectures are merely exemplary, and that in fact many other architectures can be implemented which achieve the same functionality. In a conceptual sense, any arrangement of components to achieve the same functionality is effectively “associated” such that the desired functionality is achieved. Hence, any two components herein combined to achieve a particular functionality can be seen as “associated with” each other such that the desired functionality is achieved, irrespective of architectures or intermedial components. Likewise, any two components so associated can also be viewed as being “connected”, or “coupled”, to each other to achieve the desired functionality, and any two components capable of being so associated can also be viewed as being “couplable”, to each other to achieve the desired functionality. Specific examples of couplable include but are not limited to physically interactable and/or physically interacting components.
It is believed that the present disclosure and many of its attendant advantages will be understood by the foregoing description, and it will be apparent that various changes may be made in the form, construction and arrangement of the components without departing from the disclosed subject matter or without sacrificing all of its material advantages. The form described is merely explanatory, and it is the intention of the following claims to encompass and include such changes. Furthermore, it is to be understood that the invention is defined by the appended claims.
The present application claims benefit under 35 U.S.C. §119(e) and constitutes a regular (non-provisional) patent application of U.S. Provisional Application Ser. No. 62/263,663, filed Dec. 6, 2015, entitled GRADED COATINGS FOR TEMPERATURE CONTROL OF BULBS AND VUV OPTICAL, naming as inventors Ilya Bezel, Anatoly Shchemelinin, Ken Gross, Matthew Panzer, Anant Chimmalgi, Lauren Wilson and Joshua Wittenberg, which is incorporated herein by reference in the entirety.
Number | Date | Country | |
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62263663 | Dec 2015 | US |